[1] S. J. Zeng, G. Z. Ren, Q. B. Yang, Fabrication, formation

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[1] S. J. Zeng, G. Z. Ren, Q. B. Yang, Fabrication, formation mechanism and optical properties of
novel single-crystal Er3+ doped NaYbF4 micro-tubes, Journal of Materials Chemistry, 2010,
20: 2152-2156
[2] S. J. Zeng, G. Z. Ren, W. Li, C. F. Xu, Q. B. Yang, Highly uniform Tm3+ doped NaYbF4
microtubes: controlled synthesis and intense ultraviolet photoluminescence, Journal of
Physical Chemistry C, 2010, 114 (24): 10750-10754
[3] M. Zeng, H. L. Du, Z. G. Chen, and L. Tan, Hierarchical buckling on surfaces of soft laminae,
Journal of Physical Chemistry C, 2010, 114: 16439-16442
[4] T. F. Yin, D. W. Liu, Y. Ou, F. Y. Ma, S. H. Xie, J. F. Li, and J. Y. Li, Nanocrystalline
Thermoelectric Ca3Co4O9 Ceramics by Sol-Gel Based Electrospinning and Spark Plasma
Sintering, J. Phys. Chem. C, 2010, 114: 10061-10065
[5] S. J. Zeng, G. Z. Ren, C. F. Xu, Q. B. Yang, High uniformity and monodispersity of sodium
rare-earth fluoride nanocrystals: controllable synthesis, shape evolution, and optical
properties, Cryst Eng Comm, 2010
[6] Z. F. Zhou, Y. C. Zhou , Y. Pan, C. F. Xu, Melting of Ni nanowires with and without oxide
capping, Acta Materialia, 2010, 58: 3059-3067
[7] Y. Zhang, X. L. Zhong, J. B. Wang, H. J. Song, Y. Ma, and Y. C. Zhou, The electrical and
switching properties of a metal-ferroelectric (Bi3.15Nd0.85Ti3O12)-insulator (Y2O3-stabilized
ZrO2)-silicon diode, Applied Physics Letters, 2010, 97: 103501
[8] Y. Y. Liu, and J. Y. Li, Space charges and size effects in semiconducting ferroelectric BaTiO3
/SrTiO3 superlattices, Applied Physics Letters, 2010, 97: 042905
[9] F. Liu, Y. Ma, F. Yang, and Y. C. Zhou, Schottky barrier height and conduction mechanisms
in ferroelectric bismuth titanate, Applied Physics Letters, 2010, 96: 052102
[10] M. Liao, X. L. Zhong, J. B. Wang, S. H. Xie, and Y. C. Zhou, Structure and electrical
properties of Bi3.15Nd0.85Ti3O12 nanofibers synthesized by electrospinning and sol-gel method,
Applied Physics Letters, 2010, 96: 012904
[11] Y. Q. Chen, X. J. Zheng, W. Li, Modeling of flexoelectric effect on capacitor-voltage and
memory window of metal-ferroelectric-insulator-silicon capacitor, Applied Physics Letters,
2010, 96: 233501
[12] J. Zhang, M. H. Tang and J. He, Doping concentration and thickness effects in ferroelectric
thin films, Applied Physics Letters, 2010, 96: 122905
[13] J. Sun, X. J. Zheng, W. Yin, M. H. Tang, and W. Li, Space-charge-limited leakage current in
high dielectric constant and ferroelectric thin films considering the field-dependent
permittivity, Applied Physics Letters, 2010, 97: 242905
[14] Y. Q. Chen, X. J. Zheng, X. Feng, The fabrication of vanadium-doped ZnO piezoelectric
nanofiber by electrospinning, Nanotechnology, 2010, 21: 055708
[15] X. J. Zheng, Y. Q. Chen, T. Zhang, B. Yang, C. B. Jiang, B. Yuan, Z. Zhu, Photoconductive
semiconductor switch based on ZnS nanobelts film, Sensors and Actuators B., 2010, 147:
442-446
[16] Y. Zhang, X. J. Zheng, T. Zhang, L. J. Gong, S. H. Dai, Y. Q. Chen, Humidity sensing
properties of the sensor based on Bi0.5K0.5TiO3 powder, Sensors and Actuators B., 2010, 147:
180-184
[17] X. S. Cui, W. Li, On the possibility of superhydrophobic behavior for hydrophilic materials,
Journal of Colloid and Interface Science, 2010
[18] X. J. Zheng, Y. Q. Chen, T. Zhang, C. B. Jiang, B. Yang, B. Yuan, S. X. Mao, W. Li, A
photoconductive semiconductor switch based on an individual ZnS nanobelt, Scripta
Materialia, 2010, 62: 520-523
[19] Y. Ren, Y. Y. Dai, B. Zhang, Q. F. Liu, D. S. Xue, J. B. Wang,Tunable agnetic properties of
heterogeneous nanobrush: From nanowire to nanofilm, Nanoscale Res Lett, 2010, (5):
853-858
[20] Y. Y. Liu, Z. X. Zhu, J. F. Li, J. Y.
Li,Misfit strain modulated phase structures of epitaxial
Pb(Zr1-xTix)O3 thin films: The effect of substrate and film thickness, Mechanics of Materials,
2010, 42: 816-826
[21] L. M. Jiang, Y. C. Zhou, H. X. Hao, Y. G. Liao, C. S. Lu, Characterization of the interface
adhesion of elastic-plastic thin film/rigid substrate systems using a pressurized blister test
numerical model, Mechanics of Materials, 2010, 42: 908-915
[22] G. S. Yu, J. G. Lin, W. Li, Z. W. Lin, Structural relaxation and serrated flow due to annealing
treatments in Zr-based metallic glasses, Journal of Alloys and Compounds, 2010, 489:
558-561
[23] D. Z. Zhang, X. J. Zheng, X. Feng, T. Zhang, J. Sun, S. H. Dai, L .J. Gong, Y. Q. Gong, L. He,
Z. Zhu, J. Huang, X. Xu, Ferro-piezoelectric properties of 0.94(Na0.5Bi0.5)TiO3-0.06BaTiO3
thin film prepared by metal-organic decomposition, Journal of Alloys and Compounds, 2010,
504: 129-133
[24] X. J. Zheng, G. C. Yu, Y. Q. Chen, S. X. Mao, T. Zhang, Photoinduced stiffening and
photoplastic effect of ZnS individual nanobelt in nanoindentation, Journal of Applied Physics,
2010, 108: 094305
[25] Y. Q. Chen, X. J. Zheng, S. X. Mao, W. Li, Nanoscale mechanical behavior of vanadium
doped ZnO piezoelectric nanofiber by nanoindentation technique, Journal of Applied Physics,
2010, 107: 094302
[26] B. Li, J. B. Wang, X. L. Zhong, F. Wang, and Y. C. Zhou, Room temperature electrocaloric
effect on PbZr0.8Ti0.2O3 thin film, Journal of Applied Physics, 2010, 107: 014109
[27] M. H. Tang, J. Zhang, X. L. Xu, Hiroshi Funakubo, Yoshihiro Sugiyama, Hiroshi
Ishiwara, and J. Li, Electrical properties and X-ray photoelectron spectroscopy studies of
Bi(Zn0.5Ti0.5)O3 doped Pb(Zr0.4Ti0.6)O3 thin films, Journal of Applied Physics, 2010, 108 (8):
084101
[28] S. H. Xie, Y. M. Liu, X. Y. Liu, Q. F. Zhou, K. K. Shung, Y. C. Zhou, and J. Y. Li, Local
two-way magnetoelectric couplings in multiferroic composites via scanning probe
microscopy, Journal of Applied Physics, 2010,108: 054108
[29] Y. N. Ge, W. B. Song, X. F. Wang, Z. C. Luo, W. Li, J. G. Lin, Temperature and strain rate
dependence of deformation behavior of Zr65Al7.5Ni10Cu17.5, Materials Chemistry and Physics,
2010
[30] X. J. Zheng, Y. F. Rong, D. Z. Zhang, T. Zhang, L. He, X. Feng, Enhancement on effective
piezoelectric coefficient d33 of Bi3.15Dy0.85Ti3O12 ferroelectric thin films, Materials Letters,
2010, 64: 618-621
[31] X. L. Zhong, H. Liao, Z. S. Hu, B. Li, J. B. Wang, Leakage current characteristics of
Bi3.15Nd0.85Ti3-xZrxO12 thin films, Materials Letters, 2010, 64: 2644-2647
[32] Y. Q. Chen, X. J. Zheng, W. Li, Size effect of mechanical behavior for
lead-free(Na0.82K0.18)0.5Bi0.5TiO3 nanofibers by nanoindentation, Materials Science and
Engineering A, 2010, 527: 5462-5466
[33] Y. Q. Chen, X. J. Zheng, X. Feng, S. H. Dai, D. Z. Zhang, Fabrication of lead-free
(Na0.82K0.18)0.5Bi0.5TiO3 piezoelectric nanofiber by electrospinning, Materials Research
Bulletin, 2010, 45: 717-721
[34] M. H. Tang, J. W. Hou, J. Zhang, G. J. Dong, and W. Shu, The giant dielectric tunability
effect in bulk La2NiMnO6 around room temperature, Solid State Communications, 2010, 150:
1453-1456
[35] X. M. Feng, Y. Y. Liu, Q. C. Kong, J. S. Ye, X. H. Chen, J. Q. Hu, Z. W. Chen, Direct
electrochemistry of myoglobin immobilized on chitosan-wrapped rod-constructed ZnO
microspheres and its application to hydrogen peroxide biosensing, J Solid State Electrochem,
2010, 14: 923-930
[36] W. G. Mao, Q. Chen, C. Y. Dai , L. Yang, Y. C. Zhou, C. Lu, Effects of piezo-spectroscopic
coefficients of 8 wt.% Y2O3 stabilized ZrO2 on residual stress measurement of thermal barrier
coatings by Raman spectroscopy, Surface & Coatings Technology, 2010, 204: 3573-3577
[37] W. G. Mao, J. P. Jiang, Y. C. Zhou, C. Lu, Effects of substrate curvature radius, deposition
temperature and coating thickness on the residual stress field of cylindrical thermal barrier
coatings, Surface & Coatings Technology, 2011, 205: 3093-3102
[38] J. G. Lin, J. Xu, W. W. Wang, W. Li, Electrochemical behavior of partially crystallized
amorphous Al86Ni9La5 alloys, Materials Science and Engineering B, 2010, 176: 49-52
[39] X. J. Zheng, J. F. Peng, Y. Q. Chen, L. He, X. Feng, D. Z. Zhang, L. J. Gong, Q. Y. Wu,
Enhancement on effective piezoelectric coefficient of Bi3.25Eu0.75Ti3O12 ferroelectric thin
films under moderate annealing temperature, Thin Solid Films, 2010, 519: 714-718
[40] C. Y. Wu, Y. H. Xin, X. F. Wang, J. G. Lin, Effects of Ta content on the phase stability and
elastic properties of  Ti-Ta alloys from first-principles calculations, Solid State Sciences,
2010, 12: 2120-2124
[41] X. J. Zheng, S. H. Dai, X. Feng, T. Zhang, D. Z. Zhang, Y. Q. Gong, Y. Q. Chen, L. He,
Structural and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films deposited on LaNiO3
and Pt bottom electrodes, Applied Surface Science, 2010, 256: 3316-3320
[42] Z. Zhu, X. J. Zheng, W. Li, Multilayer growth of BaTiO3 thin films via pulsed laser
deposition: An energy-dependent kinetic Monte Carlo simulation, Applied Surface Science,
2010, 256: 5876-5881
[43] J. S. Wang, X. J. Zheng, H. Zheng, Z. Zhu, S. T. Song, Evaluation of the substrate effect on
indentation behavior of film/substrate system, Applied Surface Science, 2010, 256:
5998-6002
[44] Q. Chen, W. G. Mao, Y. C. Zhou, C. Lu, Effect of Young’s modulus evolution on residual
stress measurement of thermal barrier coatings by X-ray diffraction, Applied Surface Science,
2010, 256: 7311-7315
[45] G. S. Yu, J. G. Lin and W. Li, A new approach for measuring the pressure sensitivity index of
Zr-based metallic glasses using indentation tests, Philosophical Magazine Letters, 2010,
90(6): 393-401
[46] J. S. Wang, X. J. Zheng , H. Zheng, S. T. Song, Z. Zhu, Identification of elastic parameters of
transversely isotropic thin films by combining nanoindentation and FEM analysis,
Computational Materials Science, 2010, 49: 378-385
[47] H. Zheng, X. J. Zheng, J. S. Wang, G. C. Yu, Y. Li, S. T. Song, C. Han, Evaluation the effect
of aspect ratio for Young’s modulus of nanobelt using finite element method, Materials and
Design, 2011, 32: 1407-1413
[48] B. Yuan, X. J. Zheng, Y. Q. Chen, B. Yang, T. Zhang, High photosensitivity and low dark
current of photoconductive semiconductor switch based on ZnO single nanobelt, Solid-State
Electronics, 2011, 55: 49-53
[49] X. J. Zheng, Q. Y. Wu, J. F. Peng, L. He, X. Feng, Y. Q. Chen, D. Z. Zhang, Annealing
temperature dependence of effective piezoelectric coefficients for Bi3.15Eu0.85Ti3O12 thin
films, J. Mater. Sci., 2010, 45: 3001-3006
[50] M. H. Tang, G. J. Dong, Y. Sugiyama, and H. Ishiwara, Frequency-dependent electrical
properties in Bi(Zn0.5Ti0.5)O3 doped Pb(Zr0.4Ti0.6)O3 thin film, Semiconductor Science and
Technology, 2010 , 25: 035006
[51] G. S. Yu, J. G. Lin, W. Li, A new approach for measuring the pressure sensitivity index of
Zr-based metallic glasses using indentation tests, Philosophical Magazine Letters, 2010, 90:
393-401
[52] Y. Q. Chen, X. J. Zheng, L. He, X. Feng, Annealing temperature-dependent piezoelectric
properties of Bi3.15Nd0.85Ti3O12 ferroelectric thin films, Phys. Status Solidi A, 2010, 207:
1240-1244
[53] Y. Y. Huang, Y. C. Zhou, Y. Pan, Effects
of
hydrogen
adsorption
on
the
surface-energy anisotropy of nickel, Physica B, 2010, 405: 1335-1338
[54] L. N. Lan, S. H. Xie, L. Tan and J. Y. L, Sol-Gel based soft lithography and piezoresponse
force microscopy of patterned Pb(Zr0.52Ti0.48)O3 microstructures, J. Mater. Sci. Technol.,
2010, 26(5): 439-444
[55] L. Z. Ling, S. G. Long, et al, Numerical study on the effects of equi-biaxial residual stress on
mechanical properties of Nickel film by means of nanoindentation, Journal of Materials
Science and Technology, 2010, 26(11): 1001-1005
[56] J. G. Lin, X. F. Wang and C. Wen, Theoretical study on behaviour of superplastic
forming/diffusion bonding of bulk metallic glasses, Materials Science and Technology, 2010,
26(3): 361-366
[57] L. B. Zhang, M. H. Tang, and F. Yang, Sixteen resistive states of a tunnel junction with a
composite barrier, The European Physical Journal-Applied Physics, 2010, 51: 10604
[58] 周益春, 刘奇星, 杨丽, 吴多锦, 毛卫国, 热障涂层的破坏机理与寿命预测, 固体力学学
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[59] Y. Q. Gong, X. J. Zheng, L. J. Gong, Y. Ma, D. Z. Zhang, S. H. Dai, X. J. Li, Effects of
annealing
temperature
on
microstructure
and
ferroelectric
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of
Bi0.5(Na0.85K0.15)0.5TiO3 thin films, Trans. Nonferrous Met. Soc. China, 2010, 20: 1906-1910
[60] H. P. Hu, S. H. Dai, X. J. Zheng, Y. C. Zhou, X. Feng, D. Z. Zhang, L. He, Thermal and
piezoelectric properties of Bi3.15Nd0.85Ti3O12 thin film prepared by metal organic
decomposition, Trans. Nonferrous Met. Soc. China, 2010, 20: 1424-1428
[61] Z. F. Zhou, Y. Pan, W. X. Lei, Ni nanocomposite films formed by Ni nanowires embedded in
Ni matrix using electrodeposition, Trans. Nonferrous Met. Soc. China, 2010, 20: 637-642
[62] 吴波,郑学军,李东海,周益春,压电薄膜表面贯穿裂纹的有限元分析,计算力学学报,
2010, 27: 688-693
[63] M. H. Tang, Y. G. Xiao, L. B. Zhang, X. L. Xu, J. Zhang, J. X. Tang, Transient effects of
graded-channel partially depleted SOI nMOSFET,2010 10th IEEE International Conference
on Solid-State and Integrated Circuit Technology Proceedings (ICSICT2010), IEEE PRESS,
2010: 818-820
[64] S. A. Yan, D. E. Li, L. M. Wang, Y. G. Xiao, M. H. Tang, A novel methodology of layout
design by applying euler path, 2010 10th IEEE International Conference on Solid-State and
Integrated Circuit Technology Proceedings (ICSICT2010), IEEE PRESS, 2010: 1792-1795