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IEE 591 DOE/SPC for Semiconductor Processing Spring 2000 Week Date 1/18 Lecture Topics Course overview/review of syllabus/student information Role of statistics in engineering (1-1 through 1-5) Data summary and presentation and random variables (rv’s) (2-1 through 3-2) Probability, probability density functions of continuous rv’s, and the normal distribution (3-3 through 3-5) 1 1/25 2 2/1 3 2/8 Probability plots, probability mass functions of discrete rv’s, and the binomial distribution (3-6 through 3-8) Poisson and exponential distributions Correlation and independence, random sampling, and the central limit theorem (CLT) (3-9, 3-11 and 3-12) Note: skip 3-10 Statistical inference, point estimation, and hypothesis testing, inference on the mean of a population for the variance known (4-1 through 4--4) 4 2/15 5 6 Inference on the mean of a population for the variance unknown, inference on the variance of a normal population Inference on a population proportion, review summary table of inference procedures for a single sample (4-5 through 4-7) Inference for a difference in two means with known and unknown variances, variances of two normal populations, two population proportions, and review summary table for two-sample inference procedures, paired t-test (5-1 through 5-7) Midterm Exam Analysis of variance (ANOVA) for more than two means (5-8) 2/22 2/29 3/8 Introduction to empirical models and least squares estimation - simple linear regression (6-1 through 6-2.1) Multiple linear regression, properties of least squares estimators and estimation of variance, and hypothesis testing for significance of regression (6-2.2 through 6-5) 7 8 3/14 Predicting new observations and assessing the adequacy of regression models (6-6 and 6-7) Spring break Week Date Lecture Topics 3/21 Introduction of design of experiments (DOE) and the 2k factorial design (7-1 through 7-4.1) 3/28 Beavis and Butthead videotape 22 and 2k designs for k 3 factors (7-4.2 through 7-5) 4/4 Single replicate of a 2k design (7-6) Addition of center points to a 2k design (7-7), blocking, fractional replication of a 2k design (7-8 and blocking material) 4/11 4/18 Response surface methods (7-9) Midterm Exam Introduction to statistical process control (SPC) Control charting, and the X R control chart (8-1 through 8-5) Rational subgroups, control charts for individuals (8-6) 9 10 11 12 13 14 4/25 15 5/2 5/9 1 Process capability (8-7) Attribute control charts (8-8) Last class May 2 Control chart performance and special topics (8-9) Final Exam Tuesday, May 9, 4:40-6:30 Students are responsible for reading designated chapter sections (as noted in parentheses) ahead of applicable lecture - topics/dates are subject to adjustment as semester progresses.