OCTOBER 19, 2015 LASER DIFFRACTION LAB REPORT ABEL J JAIME (DW5835), JOSHUA KIRBY (FW8822), JAKE AMATO (FX4974) BE 1310 Tensile Test Lab Report Page 1 INTRODUCTION The way that light diffracts can be estimated based on the light’s wavelength and the geometry of the object that is diffracting the light. Upon diffracting, light is sent at different levels of intensity. This lab measures the intensity of diffracted light based on position for different diffraction patters. The goal of the lab is to investigate the relationship between slit width/pattern spacing, double slit separation and pattern spacing, intensity as a function of distance for both single and double slit diffraction, and effective light wavelength of all patterns. MATERIALS Red Diffraction Laser, Diffraction Slit System Dynamics Track High Sensitivity Light Sensor. Data-collection Software METHODS The dynamics track was set up with the laser on one end and the light sensor on the other. Once the set up of the dynamics track, laser, and sensor the distance from the sensor to the laser was measured and recorded. A slide with multiple slits (different quantity, sizes, and spacing) was provided and it was placed in front of the laser in order to diffract the light. Three trials were conducted for each of the following: a = 0.04 one slit a = 0.08 one slit a = 0.04 two slits a = 0.08 two slits Data for each of the trials is recorded in the Results/Discussion section. Once the slide was inserted on the appropriate a-value and slit quantity the data-collection software was initiated. Before data collection, the sensor and software were allowed to calibrate by setting the value of a white light background to zero intensity. In order to collect accurate data, calibration was conducted before each sample and each trial. After calibration, data collection was initiated. To collect the intensity data of the diffracted laser one of the students steadily pulled the sensor across the track. Pulling the sensor along the track while collecting data yielded the intensity graphs that are plotted in the Results/Discussion section. Tensile Test Lab Report Page RESULTS / DISCUSSION Trial 1 2 3 AB 14.85 14.14 14.68 CD 28.32 23.37 25.11 EF 35.80 30.48 38.46 Average AB Experimental Value AB Theoretical Value 14.56 14.28 Average AB Experimental Value AB Theoretical Value 7.59 7.14 Table 1, a=0.04 , D=0.9, =635 Trial 1 2 3 AB 7.41 7.92 7.43 CD 14.77 15.58 14.52 EF 21.12 22.35 20.87 Table 2, a=0.08 , D=0.9, =635 Trial 1 2 3 Average AB Experimental Value AB Theoretical Value Width of Central Section 15.02 14.11 14.45 14.53 14.28 AB Theoretical Value 7.14 AB Table 3, a=0.04, d=0.25 , D=0.9, =635 Trial 1 2 3 Average AB Experimental Value Width of Central Section 7.56 7.34 7.23 7.38 AB Table 4, a=0.08, d=0.25 , D=0.9, =635 2 Tensile Test Lab Report Page Figure 1 - Slit size: a= 0.04 Figure 2 - Slit size: a= 0.08 (Single Slit) Figure 3 - Slit size: a= 0.04 (Double Slit) Figure 4 - Slit size: a= 0.08 (Double Slit) 3 Tensile Test Lab Report Page 4 Laser diffraction can be tested within a lab, but it can also be found through the use of equations; given in the lab manual are several equations that can be used to theoretically find the width of the center sections of the graphs. This lab requires the knowledge of the wavelength (λ) of the laser, the slit width (a), the angle from the center pattern to m (θ), and the maximum intensity (Im). Through the use of these variable the theoretical peak distances can be found and compared to the results found through the trial of each diffraction to see the consistencies and inconsistencies between the two. Through the use of the Diffraction Apparatus, it is seen that the differences in the single and double slit diffractions have a large difference; while the single slit diffractions (using λL/a) shows one large peak with several smaller hills, the double slit diffractions (using λL/d) show many peaks and valleys on the graphs. While the results of these graphs may vary from error, the overall shape of the graphs should be very similar to the results shown above. Some examples of what may have been a cause for the changes in these graphs may be the speed in which the light sensor was moved across the track; if the sensor was moved too quickly, the results of that change in speed would give the apparatus not enough time for it to collect data. Because this type of problem may occur, the lab asks the user to take approximately thirty seconds to finish each trial. Another way the results may be skewered is the lack of properly calibrating the apparatus to start at an intensity of zero percent. This will cause a change in the collection of the data causing the graph to shift along the “Intensity” axis (y-axis). These result will not only shift the graph but cause the results to differ from the theoretical data for the central sections of the graphs positioning; without perfect conditions, the results will differ from the theoretical data found through the use of the equations of laser diffraction. CONCLUSION This lab successfully measured the intensity vs. position for double slit and single slit diffraction. Graphs that plotted the position vs. intensity for each of the runs matched the theoretical calculations. Tensile Test Lab Report Page 5 CITATIONS Callister, W. (2005). Fundamentals of materials science and engineering: An integrated approach (2nd ed.). Hoboken, NJ: John Wiley & Sons. Diffraction Apparatus order cod DAK, Vernier Software & Technology, 2014 Tensile Test Lab Report Page APPENDIX Matlab Code: %Graphing of the different sample information. Change the lxsread () information, boundaries, and labels for the different test samples. [t1] = xlsread('double .08 trial 1.csv', 'double .08 trial 1', 'B66:C349'); I1 = t1(:,1); P1= t1(:,2); subplot(1,3,1) plot(P1, I1) ylim([-.1 45]) title('.08 trial 1') ylabel('Intensity %') xlabel('Position (mm)') [t2] = xlsread('double .08 trial 2.csv', 'double .08 trial 2', 'B83:C329'); I2 = t2(:,1); P2= t2(:,2); subplot(1,3,2) plot(P2, I2) ylim([-.1 45]) title('.08 trial 2') ylabel('Intensity %') xlabel('Position (mm)') [t3] = xlsread('double .08 trial 3.csv', 'double .08 trial 3', 'B67:C336'); I3 = t3(:,1); P3= t3(:,2); subplot(1,3,3) plot(P3, I3) ylim([-.1 45]) title('.08 trial 3') ylabel('Intensity %') xlabel('Position (mm)') %calculations for finding the AB theoretical Data function[AB] = functAB(w,D,a) AB = (w*10^-3*D)/(a); end functAB(635, 0.9, 0.04) ans = 14.2875 >> functAB(635, 0.9, 0.08) ans = 7.1437 a = 0.04 or 0.08; %laser slit distance in meters. Lam = 635; %Wavelength m = 7.27; D = 110; %cm y = (m.*Lam.*D)./a; Y1 = (900.*(635.*10.^-9)) / (.04.*10.^-2).*(1); 6 istribution of the patterns, or as a simpler search for the locations of k fringes. The basic models are provided here. n with Theory5 stribution th the Diffraction Apparatus are of typically done as a afull model of Test Lab Report erference intensityTensile as a function angle for slitseither of width and tribution of the patterns, or as a simpler search for the locations of given by fringes. The basic models are provided here. 5 rison with Theory Y1 = 5 14.28; %mm ison with Theory ribution %Maximum intensity single slit = Im.*(sinalpha/alpha)^2; nts with the Diffraction Apparatus are typically done either as a full model of nts the Diffraction Apparatus are done a full model of %Maximum intensity Double Slit =either Im(cosBeta)^2 .* rference intensity as apatterns, function ofas angle for slits of width aasand ity with distribution of the or a typically simpler search for the locations of(sinalpha/alpha)^2; ty distribution of the patterns, or as a simpler search for the locations of %Sintheta = Y / L; dgiven dark by fringes. The basic models are provided here. dark fringes. The %alpha basic models are=provided here. sintheta m.*lambda y Distribution %dsintheta = m2.*lambda; itDistribution interference as a function angleλ for slitslight of width a and mum intensity, intensity and is anas overall scale of factor. is the wavelength. a function Equations Used: of angle for slits of width a and nt dinterference is given byintensity d is given raction for by a slit of width a is given by Page 7 um intensity, and is an overall scale factor. λ is the light wavelength. action width a is given by n with for dataa slit fromofthe Diffraction Apparatus, you will need to apply the proximation. 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This is normal. cifications Fundamentals of Physics, 9thmodel, edition,adjust Halliday Resnick, Wiley, 2011. are experimental data with theand overall ht Sensor Full Scale635 Ranges: 1, 10, and 100 µW scale of the model to Laser Wavelength: ±5 nm re experimental data with model, adjust the overall of with the model data, and add a horizontal offset to bring the modelscale in line the to ear Position Sensor range:offset 150532 mm onal Green Laser Wavelength ±1 nm data, and add a horizontal to bring the model in line with the ntal data, which will not be centered on zero. ear Position Sensor resolution: 40and µm data, which willRanges: not be centered on100 zero. ttal Sensor Full Scale 1, 10, µW 8 ar Position Sensor range: mmthis Fundamentals of Physics, 9 150 edition, Halliday her Products for Use with Kitand Resnick, Wiley, 2011. th ar Position Sensor resolution: 40 µm mbination 1.2 m Dynamics Track/Optics Bench (TRACK) ercsProducts forfor Use this Kit bench required usewith with Diffraction Apparatus. The same part is 89ththe from with Fundamentals of Physics, edition, uded the Vernier Dynamics SystemHalliday (VDS).and Resnick, Wiley, 2011. bination 1.2 m Dynamics (TRACK) rom Fundamentals of Physics, 9thTrack/Optics edition, HallidayBench and Resnick, Wiley, 2011. en Diffraction Laser (GDL-DAK) s bench required for use with the Diffraction Apparatus. The same part is ded the Vernier Dynamics System an with optional second laser wavelength the Diffraction Apparatus. 532 ±1 nm. 8 to(VDS). the same power supply as the Red Diffraction Laser. 8 n Diffraction Laser (GDL-DAK) placement Screen forwavelength Optics Expansion Kit (SCRN-OEK) n optional second laser to the Diffraction Apparatus. 532 ±1 nm. optional white screen forRed qualitative viewing of diffraction and interference heansame power supply as the Diffraction Laser. erns. The same screen is a part of the Optics Expansion Kit (OEK). acement Screen for Optics Expansion Kit (SCRN-OEK) n optional white screen for qualitative viewing of diffraction and interference ns. The same screen is a part of the Optics Expansion Kit (OEK). Warranty Vernier warrants this product to be free from defects in a period of five years from the date of shipment to the c Warranty not cover damage the product by defects abuse orinimp Vernier warrants thistoproduct to be caused free from ma a period of five years from the date of shipment to the cust not cover damage to the product caused by abuse or impro