Spectral characteristics and spectra simulations for high-resolution X-Ray diagnostic at JET Presented by Jacek Rzadkiewicz Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 Outline Introduction Spectral characteristics of KX1 diagnostic at JET - Crystal bending - X-ray energy (wavelength) bandwidth - Integrated reflectivities Spectra simulations at the x-ray energy range of KX1 diagnostic at JET. Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 Spectral measurements The high-resolution X-ray crystal spectrometer (KX1) is set to measure X-ray spectra in two diagnostic channels dedicated for Ni and W emission. The KX1 measurements are based on the Ni+26 resonance line at 7.806 keV W46+ line at 2.387 keV and continuum radiation. From the KX1 measurements one can obtain: impurity concentrations (Ni and W) ion temperature The entire spectral range of the KX1 spectrometer for two diagnostic channels and toroidal rotation velocity for central JET plasmas. Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 KX1 beam line The spectrometer is operated in Johann geometry with the Rowland circle radius of about 12.5 m giving an extremely high energy resolution. Horizontal cross-section of the x-ray crystal spectrometer (KX1) on JET The X-ray photons emitted by plasma are reflected by crystals and register in two diagnostic channels (divided in the vertical direction by a septum) by T-GEM detectors with energy and spatial resolution. ‘W’ channel ‘Ni’ channel T-GEM detectors mounted on KX1 diagnostics Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 T-GEM detectors • The T-GEM detectors with a detection area of 206x92 mm2 are energy and position sensitive • The detector readout plane consists of 256 strips of 96mm length with 0.8 mm pitch • Detection efficiencies above 40% and around 20% for Ni and W monitor X-ray detectors have been achieved by use of 12 mm (Ni monitor) and 5 mm (W monitor) mylar windows Structure of the T-GEM X-ray detector for JET diagnostics •The detector position resolution has been found to be to not worse than 1 strip width (0.8 mm). Charge position distribution for X-ray source (X-ray tube 2.5 kV, 100 mA) with a 0.7mm diameter collimator Photon detection efficiencies as a function of photon energy Rzadkiewicz et al., NIM A 2013 Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 KX1 crystal bending CURVED CRYSTAL(S) • In order to bent both crystals cylindrically to a curvature of 24.98 m, a reflecting metrology were applied • The use of the laser and 200 mm pinhole, mirrors, the crystal bending jig with four back micrometers and 1D CCD camera (DxCCD=7mm) enabled to obtain the reflected image in a distance corresponding to the crystal radius of curvature. The best sharpness of the reflection image was obtained at distance 2R=24.98±0.10 m • The analogical measurements performed for Ge crystal confirmed this value 3k 2R=24.828 2R=25.134 2R=24.982 Spatial intensity of the fringe pattern for different crystal-detector distances Photons / ms R=25.134 m 2k R=24.982 ± 0.144 m 1 mm SiO2 1k 4.0k 6.0k 8.0k 10.0k 12.0k 14.0k 12.0k 14.0k Ge Channel Images of SiO2 bent crystal focus Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 KX1 instrumental resolving power DqINS = F(DqCry, DqDet , Dqdefocus, Dqabber) DqDet~Dx/R – detector broadening SiO2 (101) Total 0.20 Bandwith (eV) DqCry - FWHM of crystal rocking curve 0.25 Crystal 0.15 W 0.10 Dqdefocus~Dd/R2 – defocusing broadening 46+ Defocusing Detector 0.05 Aberration Dqabber~W2(H2)/R2 2.34 2.36 2.38 2.40 2.42 2.44 Emission energy [keV] 0.5 Ge: E/DE~20 040, Gins~0.35 eV, G(Ti=3 keV) ~4.3 eV, Ge (440) Bandwidth (eV) SiO2: E/DE~12 380, Gins~0.2 eV, G(Ti=3 keV) ~0.7-1.0 eV 0.4 0.3 Total Defocusing 26+ Ni Detector 0.2 Crystal 0.1 Abberation 7.8 Jacek Rzadkiewicz ADAS workshop 7.9 8.0 8.1 8.2 Emission energy (keV) Warsaw, 29-30.09.2014 KX1 crystal reflectivity 12 Ge (440) @ 7.76-8.28 keV 9 -5 Rint (10 rad) Calculations of integrated reflectivities for KX1 were performed by means of the multi-lamellar method (XOP code) The calculations require the decomposition of a crystal into a series of perfect crystal layers, each oriented slightly differently, following the cylindrical surface of the crystal j 1 r j ( 0 t k e mS K ri and ti are the reflectivity and transmission ratios, μ is the X-ray absorption coefficient, and SK is the X-ray path inside the K-th layer. Mosaic Perfect bent Perfect flat 49 ) 6.0 -5 n j 1 3 Rint (10 rad) R tot 6 Ni 50 51 Angle (deg) 26+ at 7.80 keV 52 53 SiO2 (101) @ 2.32-2.48 keV 4.5 3.0 W 46+ @ 2.38 keV Mosaic Perfect bent Perfect flat 1.5 49 50 51 Angle (deg) 52 53 Caciuffo et al., RSI1990 Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 KX1 crystal reflectivity and KX1 sensitivity The theoretical reflectivities have been used in calculations of sensitivity for W and Ni measurement channels are 1.6x10-11 and 6.5x10-11 cnts.ph-1m2sr. This gives W and Ni concentrations in the range: 10-6-10-4. These values use the multi-lamellar reflectivity calculations, that are expected to give the most accurate results. Inclusion of experimentally determined line broadening for the mosaic calculations in the future will verify the sensitivities. Shumack et al., RSI 2014 Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 KX1 line identification and impurity concentration • Two 3p-4d lines have been identified for W46+ and W45+ • Laser-blow-off experiments confirmed that the central two spectral lines originate from Mo32+ (3p-2s) • It was found that the W and Mo concentrations are in the range of 10-5 and 10-7, respectively, both in non-seeded and in N2 or Ne seeded ELMy Hmode JET plasmas. • The ratio of cMo / cW concentration is ~2.5%-10%. • Mo concentration seems to be proportional to the W concentration Jacek Rzadkiewicz ADAS workshop Nakano et al., EPS 2014 Warsaw, 29-30.09.2014 Comparison with VUV and SXR diagnostic Comparison of the W concentration from the X-ray spectrometer with that from the VUV spectrometer in plasmas with low toroidal rotation velocity showed good agreement. The W concentration from the SX measurement is about a factor of seven higher than that from the KX1 spectrometer, and this discrepancy is larger than the uncertainty of the sensitivity of the KX1 spectrometer. Nakano et al., EPS 2014 Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 Spectra simulations Proper spectra simulations require information on the fractional abundance of tungsten ions along the LOS of the diagnostic. For central plasma transport processes weakly affect the ionization equilibrium of W. Assumed impurity diffusion coefficient D(r)=0.1 m2s-1 allows to reproduce the experimental values within factor of 2. Larger transport coefficients do not change sihnificantly the abundant ionization stages of W for Te=4.1 keV Putterich et al., 2008 Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 Spectra simulations Different sets of ionization and recombination rates can be used for the W ionization equilibrium. Putterich et al., 2008 ADPAK: Post et al 1977 At. Data Nucl. Data Tables CADW Loch et al 2005 Phys. Rev. A Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 Spectra simulations Putterich et al., 2008 For the W45+ and W46+ ionization states the CADW+ADPAK model underestimates the line intensities for the unmodified case by up to a factor of 50 and the modifications* reduce this discrepancy to a factor of 10. Electron-impact ionization cross section for W45+ has a threshold around 2.5 keV. *Recombination rates scaled by temperature independent factors Jacek Rzadkiewicz ADAS workshop Loch PRA 2005 Warsaw, 29-30.09.2014 FAC spectra simulations Motivation The FAC code not only allows to compute atomic data, such as energy levels and transition probabilities for radiative transitions and auto-ionization, but also cross sections for excitation and ionization by electron impact and the inverse processes (e.g., radiative recombination and dielectronic capture). The FAC package contain three main components which determine the radiation from a unit plasma volume: (1) the energy and emission probability of a photon by a radiative transition from some excited state; (2) how many ions exist in the various excited states in the plasma; and (3) what is the rate of the emitted photons. Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 FAC spectra simulations Motivation L x-ray spectra for molybdenum can have significant contribution in the same region as the M x-ray spectra for tungsten and therefore both elements should be included in the interpretation of the highresolution x-ray spectra registered on JET using KX1 spectrometer. Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 Summary and outlook Motivation Updated T-GEM detectors register X-ray spectra from specific reflection order KX1 diagnostic achieved an excellent instrumental resolving power Sensitivity function determine with high precision Preliminary analysis of W impurity level and comparison with other diagnostics (VUV and SXR) have been performed Preliminary FAC spectra simulations have been performed Data acquisition system verification Crystal vertical adjustment and mosaicity verification Ti analysis More precise W and Mo spectra simulations (FA verification) Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014 Thank you for your attention! M. Chernyshova, T. Czarski, T. Nakano, M. Polasik, J. Rzadkiewicz, K. Słabkowska, A Shumack, Ł. Syrocki, E. Szymańska Jacek Rzadkiewicz ADAS workshop Warsaw, 29-30.09.2014