MULUNGUSHI UNIVERSITY
SCHOOL OF ENGINEERING AND TECHNOLOGY
PROGRAME: BACHELOR OF CIVIL ENGINEERING
NAME: NG’OMBE MPHATSO
STUDENT NUMBER: 202107097
COURSE NAME: MATERIAL SCIENCE AND ENGINEERING
COURSE CODE: EGM 241
TASK: ASSIGNMENT ONE (1)
LECTURER: ENGINEER G. MASHEKA
DUE DATE: MONDAY 25TH September, 2023
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MICROSCOPIC EXAMINATION TECHNIQUES OF MATERIALS
Microscopic examination of defects is crucial for quality control and failure analysis
in various industries. It is a useful tool in the study and characterization of materials.
This is an important tool that can be used to ensure the association between the
properties an structures are properly understood.
The following are the microscopic techniques and there importance;
Optical microscopy
In this technique the light microscope is use study micro-structures, while optical
and illumination system as its basic element. It is cardinal for quick and nondestructive inspection for surface defects, such as cracks, scratches and
discontinuities.
Electron microscopy
Consequently, some structural elements are too fine and small to permit optical
examination hence, the electron microscopy technique is introduced because of its
capability of much higher magnification of approximately 2000 time of optical
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microscopy. This technique is subdivide into Scanning electron microscopy and
Transmission electron microscopy.
Scanning electron microscopy
Provides high-resolution images by scanning a focused electron beam across the
sample surface. It is essential for detailed analysis of micro-structures, identification
of fractures and determining the elemental composition of defects.
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Transmission electron microscopy
It is used to examine the defects at the nanoscale. If gives information about
crystallography, defects in atoms lattices and interfaces.it is the best technique that
can be used to understand material behaviour at the atomic level.
Scanning Prob Microscopy
This is more advanced technique that does not use light or electrons to form an
image , rather the microscope generates topographical maps, on an atom scale, that
is a representation of features and characteristics of the specimen being examined.
This technique can be used for the examination of nanometre scale wit a
magnification of 109 X and much better resolutions are attainable.
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It can also be used in three dimensional magnification of images that provide
topological information about features of interest. However it provides an advantage
of particular specimens being examined in there most suitable environment.
It is through these techniques that engineers and scientists are able to improve
product quality, troubleshoot issues and advance materials science.
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References
William D. Callister, j., 2014. Microscopic examination. In: material science and engineering. united
states of America: John Willley and Sons, pp. 97-102.
Mark Hersam, 2022. Wikipedia. [Online]
Available at: https://en.m.wikipedia.org/wiki/microscopy
[Accessed 21 September 2023].
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