Chapter 4. Switch Realization 4.1. Switch applications Single-, two-, and four-quadrant switches. Synchronous rectifiers 4.2. A brief survey of power semiconductor devices Power diodes, MOSFETs, BJTs, IGBTs, and thyristors 4.3. Switching loss Transistor switching with clamped inductive load. Diode recovered charge. Stray capacitances and inductances, and ringing. Efficiency vs. switching frequency. 4.4. Summary of key points Fundamentals of Power Electronics 1 Chapter 4: Switch realization SPST (single-pole single-throw) switches SPST switch, with voltage and current polarities defined Buck converter with SPDT switch: L 1 iL(t) + 1 + i 2 + – Vg C R V – v – with two SPST switches: 0 iA A L iL(t) + + vA – All power semiconductor devices function as SPST switches. Fundamentals of Power Electronics + – Vg 2 – vB + B iB C R V – Chapter 4: Switch realization Realization of SPDT switch using two SPST switches G G G G A nontrivial step: two SPST switches are not exactly equivalent to one SPDT switch It is possible for both SPST switches to be simultaneously ON or OFF Behavior of converter is then significantly modified —discontinuous conduction modes (chapter 5) Conducting state of SPST switch may depend on applied voltage or current —for example: diode Fundamentals of Power Electronics 3 Chapter 4: Switch realization Quadrants of SPST switch operation 1 + i Switch on state current A single-quadrant switch example: v ON-state: i > 0 – OFF-state: v > 0 0 Switch off state voltage Fundamentals of Power Electronics 4 Chapter 4: Switch realization Some basic switch applications Singlequadrant switch switch on-state current Currentbidirectional two-quadrant switch switch off-state voltage switch on-state current Voltagebidirectional two-quadrant switch Fundamentals of Power Electronics switch on-state current switch off-state voltage switch on-state current Fourquadrant switch switch off-state voltage 5 switch off-state voltage Chapter 4: Switch realization 4.1.1. Single-quadrant switches 1 + i Active switch: Switch state is controlled exclusively by a third terminal (control terminal). Passive switch: Switch state is controlled by the applied current and/or voltage at terminals 1 and 2. v – 0 SCR: A special case — turn-on transition is active, while turn-off transition is passive. Single-quadrant switch: on-state i(t) and off-state v(t) are unipolar. Fundamentals of Power Electronics 6 Chapter 4: Switch realization The diode • A passive switch i • Single-quadrant switch: 1 + • can conduct positive onstate current on i v off v – 0 Symbol instantaneous i-v characteristic Fundamentals of Power Electronics 7 • can block negative offstate voltage • provided that the intended on-state and off-state operating points lie on the diode i-v characteristic, then switch can be realized using a diode Chapter 4: Switch realization The Bipolar Junction Transistor (BJT) and the Insulated Gate Bipolar Transistor (IGBT) BJT C 1 i + • An active switch, controlled by terminal C i v • Single-quadrant switch: on – off 0 IGBT v • can block positive off-state voltage 1 i + C v – 0 • can conduct positive onstate current instantaneous i-v characteristic Fundamentals of Power Electronics 8 • provided that the intended on-state and off-state operating points lie on the transistor i-v characteristic, then switch can be realized using a BJT or IGBT Chapter 4: Switch realization The Metal-Oxide Semiconductor Field Effect Transistor (MOSFET) • An active switch, controlled by terminal C i on 1 i + C • Normally operated as singlequadrant switch: v off v – on (reverse conduction) 0 • can conduct positive on-state current (can also conduct negative current in some circumstances) • can block positive off-state voltage Symbol instantaneous i-v characteristic Fundamentals of Power Electronics 9 • provided that the intended onstate and off-state operating points lie on the MOSFET i-v characteristic, then switch can be realized using a MOSFET Chapter 4: Switch realization Realization of switch using transistors and diodes Buck converter example iA A L iL(t) + + vA – Vg + – – vB B C R V + Switch A: transistor iB – Switch B: diode iA SPST switch operating points Switch A on iB Switch B iL on Switch A Switch B off off Vg vA Switch A Fundamentals of Power Electronics –Vg iL vB Switch B 10 Chapter 4: Switch realization Realization of buck converter using single-quadrant switches iA + vA L – + Vg – vB + + – iL(t) vL(t) – iB iA Switch A on iB Switch B iL on Switch A Switch B off off Vg Fundamentals of Power Electronics vA –Vg 11 iL vB Chapter 4: Switch realization 4.1.2. Current-bidirectional two-quadrant switches • Usually an active switch, controlled by terminal C i 1 i on (transistor conducts) + C v – 0 BJT / anti-parallel diode realization Fundamentals of Power Electronics v off on (diode conducts) instantaneous i-v characteristic 12 • Normally operated as twoquadrant switch: • can conduct positive or negative on-state current • can block positive off-state voltage • provided that the intended onstate and off-state operating points lie on the composite i-v characteristic, then switch can be realized as shown Chapter 4: Switch realization Two quadrant switches switch on-state current i 1 + on (transistor conducts) i v off v switch off-state voltage – 0 Fundamentals of Power Electronics on (diode conducts) 13 Chapter 4: Switch realization MOSFET body diode i 1 i on (transistor conducts) + off v C v – on (diode conducts) 0 Power MOSFET characteristics Fundamentals of Power Electronics Power MOSFET, and its integral body diode 14 Use of external diodes to prevent conduction of body diode Chapter 4: Switch realization A simple inverter iA + Vg + – Q1 D1 vA – v0(t) = (2D – 1) Vg L iL + + Vg + – Q2 D2 v B – C R v0 – iB Fundamentals of Power Electronics 15 Chapter 4: Switch realization Inverter: sinusoidal modulation of D v0(t) = (2D – 1) Vg v0 Sinusoidal modulation to produce ac output: Vg D(t) = 0.5 + Dm sin (ωt) D 0 0.5 1 –Vg The resulting inductor current variation is also sinusoidal: iL(t) = Vg v0(t) = (2D – 1) R R Hence, current-bidirectional two-quadrant switches are required. Fundamentals of Power Electronics 16 Chapter 4: Switch realization The dc-3øac voltage source inverter (VSI) ia Vg + – ib ic Switches must block dc input voltage, and conduct ac load current. Fundamentals of Power Electronics 17 Chapter 4: Switch realization Bidirectional battery charger/discharger D1 L + + Q1 vbus vbatt D2 spacecraft main power bus – Q2 – vbus > vbatt A dc-dc converter with bidirectional power flow. Fundamentals of Power Electronics 18 Chapter 4: Switch realization 4.1.3. Voltage-bidirectional two-quadrant switches • Usually an active switch, controlled by terminal C + i • Normally operated as twoquadrant switch: i 1 on v v C off off (diode blocks voltage) (transistor blocks voltage) – 0 BJT / series diode realization instantaneous i-v characteristic • can conduct positive on-state current • can block positive or negative off-state voltage • provided that the intended onstate and off-state operating points lie on the composite i-v characteristic, then switch can be realized as shown • The SCR is such a device, without controlled turn-off Fundamentals of Power Electronics 19 Chapter 4: Switch realization Two-quadrant switches 1 i + switch on-state current i v on – 0 v 1 i + off off (diode blocks voltage) (transistor blocks voltage) switch off-state voltage v C – 0 Fundamentals of Power Electronics 20 Chapter 4: Switch realization A dc-3øac buck-boost inverter φa iL + vab(t) – φb Vg – + + vbc(t) – φc Requires voltage-bidirectional two-quadrant switches. Another example: boost-type inverter, or current-source inverter (CSI). Fundamentals of Power Electronics 21 Chapter 4: Switch realization 4.1.4. Four-quadrant switches switch on-state current • Usually an active switch, controlled by terminal C • can conduct positive or negative on-state current switch off-state voltage Fundamentals of Power Electronics 22 • can block positive or negative off-state voltage Chapter 4: Switch realization Three ways to realize a four-quadrant switch 1 1 i i 1 + 1 i + + v v v – – – + i v – 0 0 Fundamentals of Power Electronics 0 23 0 Chapter 4: Switch realization A 3øac-3øac matrix converter 3øac input 3øac output ia van(t) + – vbn(t) + – ib + – vcn(t) ic • All voltages and currents are ac; hence, four-quadrant switches are required. • Requires nine four-quadrant switches Fundamentals of Power Electronics 24 Chapter 4: Switch realization 4.1.5. Synchronous rectifiers Replacement of diode with a backwards-connected MOSFET, to obtain reduced conduction loss i + 1 1 i i + 1 i + C v v v – – – ideal switch conventional diode rectifier Fundamentals of Power Electronics (reverse conduction) v off on 0 0 0 on MOSFET as synchronous rectifier 25 instantaneous i-v characteristic Chapter 4: Switch realization Buck converter with synchronous rectifier iA + vA L – iL(t) Q1 Vg + – – vB + C C Q2 • MOSFET Q2 is controlled to turn on when diode would normally conduct • Semiconductor conduction loss can be made arbitrarily small, by reduction of MOSFET onresistances iB • Useful in low-voltage high-current applications Fundamentals of Power Electronics 26 Chapter 4: Switch realization 4.2. A brief survey of power semiconductor devices ! ! ! ! ! ! Power diodes Power MOSFETs Bipolar Junction Transistors (BJTs) Insulated Gate Bipolar Transistors (IGBTs) On resistance vs. breakdown voltage vs. switching times Minority carrier and majority carrier devices Fundamentals of Power Electronics 27 Chapter 4: Switch realization 4.3.1. Transistor switching with clamped inductive load iA + vA iL(t) – physical MOSFET + – vB gate + driver + – Vg – DTs Ts transistor waveforms L iL iA(t) ideal diode 0 0 iL iB iB(t) 0 transistor turn-off transition 1 2 t –Vg pA(t) W off = 0 vB(t) Vg iL = vA iA area Woff VgiL (t 2 – t 0) t0 Fundamentals of Power Electronics t diode waveforms Buck converter example vB(t) = vA(t) – Vg i A(t) + iB(t) = iL Vg vA(t) 28 t1 t2 t Chapter 4: Switch realization Switching loss induced by transistor turn-off transition Energy lost during transistor turn-off transition: W off = 1 2 VgiL (t 2 – t 0) Similar result during transistor turn-on transition. Average power loss: Psw = 1 Ts Fundamentals of Power Electronics pA(t) dt = (W on + W off ) fs switching transitions 29 Chapter 4: Switch realization p–n junction! Junction diode consisting of! • p-doped silicon! • n-doped silicon! • A p-n junction where the p- and n-material meet ! + v p + + + – + – + + + – n – – – + + – – – – p material contains n material contains mobile holes! mobile electrons! vo + p–n–junction! p + + Fundamentals of Power Electronics! + + + + + + + – – 1! – – – + + + + + E – – n – –Chapter 4: Switch realization! – – – – – + v – p Formation n – region" + + of depletion – – also called+ “space charge layer”!– + + + + – + + – – – – • At the junction, the concentrations of holes and electrons changes abruptly! • The holes and electrons diffuse in the direction of reducing concentration! Hole diffusion! Electron diffusion! p + + + + + + + + + – vo + –+ –+ –+ –+ –+ – – n – – – – – – – E • These holes and electrons leave behind charged atoms—a “depletion region”! – vo + • An electric in the vicinity – –of+the + junction! p field forms n – + + – opposes • This electric field constitutes an energy barrier that diffusion! – –++ – – + + – – + the + voltage + • The device+ comes to equilibrium when vo across the depletion – – – + +of charges across region is enough to stop further diffusion the junction! – + Fundamentals of Power Electronics! + + – –2! + + E – – – Chapter 4: Switch realization! + + + – + + + – + – – – + + – – – – The diode under reverse bias conditions! –v + o –+ – n – –+ – – + + –+ + + – – + • Application of an external voltage to the diode– causes + + reverse + – the depletion – – –+ region to increase! p + + • The external voltage is blocked by the E depletion region! • Increasing the reverse voltage requires that charge is added to the depletion region! – v + p + + + + + + + + + – – – – – – – – – – o + + + + + + + + + + – – n – – – – – – – E + – • “Junction capacitance”: depletion region charge vs. voltage characteristic! – vo + p n – + + – –3! + Fundamentals of Power Electronics! Chapter 4: Switch realization! – – + + –+ – – + + –+ – + + + – – E p + + + + + + + + + – – – – + + + + – – n – – – – – – – E – v + The diode under forward bias conditions! o ––++ – n – ––++ – – + + – – + + + + – ––++ – + + positive, + – • When the diode voltage is depletion is not large – – region voltage – –the ++ enough to prevent diffusion of charge across the junction! E the junction, and become minority • Holes from the p-region diffuse across carriers in the n-region, whose energy state is high enough to enable them to conduct! p + + + – • Similarly, electrons from n-region diffuse across the junction and become minority carriers in the p-region! – vo + p n – + + – –+ – – + + –+ – – + + –+ – + + + – – E Fundamentals of Power Electronics! 4! Chapter 4: Switch realization! – vo + p n – vo + p + + + + + + –+ –+ –+ charge Minority-carrier stored + + + – – – n – – – in forward-biased diode! – – – E Under forward-biased conditions, a hole enters the p-material from the external circuit. It then either (a) diffuses across junction, then recombines with an electron in the n-region, or (b) recombines in the p-region with a minority-carrier electron! – vo + p n + – + – Electron concentration Hole concentration The forward current of the diode consists entirely of recombination, either in the p- or n-region. The forward current continues as long as there is minority charge. To turn off the diode, the minority charge must be eliminated.! Fundamentals of Power Electronics! 5! Chapter 4: Switch realization! – vo + p n + – + – Charge-controlled behavior of the diode! The diode equation:! q(t) = Q0 e v(t) Hole concentration + – Electron concentration i v –1 p n + Charge control equation:! q(t) dq(t) = i(t) – dt L – + – Electron concentration Hole concentration with:! = 1/(26 mV) at 300 K! Area = total stored minority charge q! L = minority carrier lifetime! (above equations don t include current that charges depletion region capacitance)! In equilibrium: dq/dt = 0, and hence! i(t) = q(t) L (lumped-element charge control model with 1 lump)! Fundamentals of Power Electronics! 6! = Q0 L e v(t) – 1 = I0 e v(t) –1 Chapter 4: Switch realization! Removal of stored charge during reverse recovery! v(t) Distribution of minority charge on one side of p-n junction during reverse recovery! t0 t1 t2 t3 t4 t Minority charge t = t0 t1 0 x0 Voff i(t) t2 x3 t = t3 Ion 0 x Slope determines diffusion rate and hence current! Fundamentals of Power Electronics! 7! Chapter 4: Switch realization! Charge-control in the diode:" Discussion! • The familiar i–v curve of the diode is an equilibrium relationship that can be violated during transient conditions! • During the turn-on and turn-off switching transients, the current deviates substantially from the equilibrium i–v curve, because of change in the stored charge and change in the charge within the reverse-bias depletion region! • The reverse-recovery time tr is the time required to remove the stored charge in the diode and enable it to block the full applied negative voltage. The area of the negative diode current during reverse recovery is the recovered charge Qr! Fundamentals of Power Electronics! 8! Chapter 4: Switch realization! Inclusion of Switching Loss in the Averaged Equivalent Circuit Model The methods of Chapter 3 can be extended to include switching loss in the converter equivalent circuit model • Include switching transitions in the converter waveforms • Model effects of diode reverse recovery, etc. To obtain tractable results, the waveforms during the switching transitions must usually be approximated Things that can substantially change the results: • Ringing caused by parasitic tank circuits • Snubber circuits • These are modeled in ECEN 5817, Resonant and SoftSwitching Phenomena in Power Electronics 1 The Modeling Approach Extension of Chapter 3 Methods Sketch the converter waveforms – Including the switching transitions (idealizing assumptions are made to lead to tractable results) – In particular, sketch inductor voltage, capacitor current, and input current waveforms The usual steady-state relationships: vL = 0, iC = 0, ig = Ig Use the resulting equations to construct an equivalent circuit model, as usual 2 Buck Converter Example • • • • Ideal MOSFET, p–n diode with reverse recovery Neglect semiconductor device capacitances, MOSFET switching times, etc. Neglect conduction losses Neglect ripple in inductor current and capacitor voltage 3 Assumed waveforms Diode recovered charge Qr, reverse recovery time tr These waveforms assume that the diode voltage changes at the end of the reverse recovery transient • a “snappy” diode • Voltage of soft-recovery diodes changes sooner • Leads to a pessimistic estimate of induced switching loss 4 Inductor volt-second balance and capacitor charge balance As usual: vL = 0 = DVg – V Also as usual: iC = 0 = IL – V/R 5 Average input current ig = Ig = (area under curve)/Ts = (DTsIL + trIL + Qr)/Ts = DIL + trIL /Ts + Qr /Ts 6 Construction of Equivalent Circuit Model From inductor volt-second balance: vL = 0 = DVg – V From capacitor charge balance: iC = 0 = IL – V/R 7 Input port of model ig = Ig = DIL + trIL /Ts + Qr /Ts 8 Combine for complete model The two independent current sources consume power Vg (trIL /Ts + Qr /Ts) equal to the switching loss induced by diode reverse recovery 9 Solution of model Output: V = DVg Efficiency: = Pout / Pin Pout = VIL Pin = Vg (DIL + trIL /Ts + Qr /Ts) Combine and simplify: = 1 / [1 + fs (tr /D + Qr R /D2Vg )] 10 Predicted Efficiency vs Duty Cycle Switching frequency 100 kHz Input voltage 24 V Load resistance 15 Recovered charge 0.75 µCoul Reverse recovery time 75 nsec Buck converter with diode reverse recovery 100.00% 90.00% 80.00% (no attempt is made here to model how the reverse recovery process varies with inductor current) • Substantial degradation of efficiency • Poor efficiency at low duty cycle Efficiency 70.00% 60.00% 50.00% 40.00% 30.00% 20.00% 10.00% 0.00% 0 0.2 0.4 0.6 Duty cycle 11 0.8 1 Boost Converter Example Model same effects as in previous buck converter example: • Ideal MOSFET, p–n diode with reverse recovery • Neglect semiconductor device capacitances, MOSFET switching times, etc. • Neglect conduction losses • Neglect ripple in inductor current and capacitor voltage 12 Boost converter Transistor and diode waveforms have same shapes as in buck example, but depend on different quantities 13 Inductor volt-second balance and average input current As usual: vL = 0 = Vg – DV Also as usual: ig = IL 14 Capacitor charge balance iC = id – V/R = 0 = – V/R + IL(DTs – tr)/Ts – Qr /Ts Collect terms: V/R = IL(DTs – tr)/Ts – Qr /Ts 15 Construct model The result is: The two independent current sources consume power V (trIL /Ts + Qr /Ts) equal to the switching loss induced by diode reverse recovery 16 Predicted V/Vg vs duty cycle Boost converter with diode reverse recovery 8 7 With RL only 6 5 V/Vg Switching frequency 100 kHz Input voltage 24 V Load resistance 60 Recovered charge 5 µCoul Reverse recovery time 100 nsec Inductor resistance RL = 0.3 (inductor resistance also inserted into averaged model here) 4 3 2 1 With RL and diode reverse recovery 0 0 0.2 0.4 0.6 Duty cycle 17 0.8 1 Summary The averaged modeling approach can be extended to include effects of switching loss Transistor and diode waveforms are constructed, including the switching transitions. The effects of the switching transitions on the inductor, capacitor, and input current waveforms can then be determined Inductor volt-second balance and capacitor charge balance are applied Converter input current is averaged Equivalent circuit corresponding to the the averaged equations is constructed 18 4.2.1. Power diodes! A power diode, under reverse-biased conditions:! v + – p + + + { { low doping concentration n- – E v + n – – – depletion region, reverse-biased Fundamentals of Power Electronics! 9! Chapter 4: Switch realization! Forward-biased power diode! v + – i { conductivity modulation n- p + – + + + n + – + – minority carrier injection Fundamentals of Power Electronics! 10! Chapter 4: Switch realization! Diode in OFF state:" reversed-biased, blocking voltage! v(t) v + – t n– p i(t) + 0 { – E v n t Depletion region, reverse-biased • Diode is reverse-biased! • No stored minority charge: q = 0! (1) • Depletion region blocks applied reverse voltage; charge is stored in capacitance of depletion region! Fundamentals of Power Electronics! 12! Chapter 4: Switch realization! Turn-on transient! v(t) Diode conducts with low on-resistance t • charge to increase voltage across depletion region! Diode is forward-biased. Supply minority charge to n– region to reduce on-resistance Charge depletion region i(t) On-state current determined by converter circuit t (1) (2) Fundamentals of Power Electronics! 13! The current i(t) is determined by the converter circuit. This current supplies: ! • charge needed to support the on-state current! • charge to reduce onresistance of n– region! Chapter 4: Switch realization! Turn-off transient! v + – i (< 0) n- p n + + + + + + + + } Removal of stored minority charge q Fundamentals of Power Electronics! 14! Chapter 4: Switch realization! Diode turn-off transient" continued! v(t) t (4) Diode remains forward-biased. Remove stored charge in n– region (5) Diode is reverse-biased. Charge depletion region capacitance. i(t) tr 0 t di dt Area –Qr (1) (2) Fundamentals of Power Electronics! (3) (4) 15! (5) (6) Chapter 4: Switch realization! The diode switching transients induce switching loss in the transistor! iA + vA – fast transistor + – – + – Vg iL(t) vB + L transistor waveforms Qr Vg silicon diode 0 0 t diode waveforms • Diode recovered stored charge Qr flows through transistor during transistor turn-on transition, inducing switching loss! • Qr depends on diode on-state forward current, and on the rate-of-change of diode current during diode turn-off transition! iL vA(t) iB Fundamentals of Power Electronics! see Section 4.3.2! iA(t) iL iB(t) vB(t) 0 0 t area –Qr –Vg tr pA(t) = vA iA area ~QrVg area ~iLVgtr 16! t0 t1 t2 t Chapter 4: Switch realization! Types of power diodes! Standard recovery! Reverse recovery time not specified, intended for 50/60Hz! Fast recovery and ultra-fast recovery! Reverse recovery time and recovered charge specified! Intended for converter applications! Schottky diode! A majority carrier device! Essentially no recovered charge! Model with equilibrium i-v characteristic, in parallel with depletion region capacitance! Restricted to low voltage (few devices can block 100V or more)! Fundamentals of Power Electronics! 18! Chapter 4: Switch realization! Paralleling diodes! Attempts to parallel diodes, and share the current so that i1 = i2 = i/2, generally donʼt work.! i i1 i2 Reason: thermal instability caused by temperature dependence of the diode equation.! + + v1 v2 Increased temperature leads to increased current, or reduced voltage.! – – One diode will hog the current.! To get the diodes to share the current, heroic measures are required:! • Select matched devices! • Package on common thermal substrate! • Build external circuitry that forces the currents to balance! Fundamentals of Power Electronics! 20! Chapter 4: Switch realization! Ringing induced by diode stored charge! see Section 4.3.3! iL(t) L vi(t) + – vL(t) vi(t) + – silicon diode iB(t) + vB(t) – V1 t 0 –V2 C iL(t) • Diode is forward-biased while iL(t) > 0 • Negative inductor current removes diode stored charge Qr! • When diode becomes reverse-biased, negative inductor current flows through capacitor C.! • Ringing of L-C network is damped by parasitic losses. Ringing energy is lost.! Fundamentals of Power Electronics! 21! 0 t area – Qr vB(t) t 0 –V2 t1 t2 t3 Chapter 4: Switch realization! Energy associated with ringing! Recovered charge is! Qr = – t3 t2 iL(t) dt vi(t) V1 t 0 Energy stored in inductor during interval t2 ≤ t ≤ t3 :! t3 WL = vL(t) iL(t) dt t2 Applied inductor voltage during interval t2 ≤ t ≤ t3 :! di (t) vL(t) = L L = – V2 dt Hence,! t3 t3 diL(t) WL = L i (t) dt = ( – V2) iL(t) dt dt L t2 t2 –V2 iL(t) 0 vB(t) t 0 –V2 W L = 12 L i 2L(t 3) = V2 Qr t1 Fundamentals of Power Electronics! t area – Qr 22! t2 t3 Chapter 4: Switch realization! 4.2.2. The Power MOSFET Source • Gate lengths approaching one micron Gate n p n n p nn n • Consists of many small enhancementmode parallelconnected MOSFET cells, covering the surface of the silicon wafer • Vertical current flow • n-channel device is shown Drain Fundamentals of Power Electronics 46 Chapter 4: Switch realization MOSFET: Off state source n p – n • p-n- junction is reverse-biased n p n • off-state voltage appears across nregion depletion region nn drain Fundamentals of Power Electronics + 47 Chapter 4: Switch realization MOSFET: on state • p-n- junction is slightly reversebiased source n p n n p • drain current flows through n- region and conducting channel channel nn drain Fundamentals of Power Electronics n • positive gate voltage induces conducting channel drain current 48 • on resistance = total resistances of nregion, conducting channel, source and drain contacts, etc. Chapter 4: Switch realization MOSFET body diode • p-n- junction forms an effective diode, in parallel with the channel source n p n n p Body diode • negative drain-tosource voltage can forward-bias the body diode • diode can conduct the full MOSFET rated current nn • diode switching speed not optimized —body diode is slow, Qr is large drain Fundamentals of Power Electronics n 49 Chapter 4: Switch realization =1 DS • On state: VGS >> Vth V V =2 DS V 10A • Off state: VGS < Vth 0V 00V Typical MOSFET characteristics V DS ID =2 • MOSFET can conduct peak currents well in excess of average current rating —characteristics are unchanged on state 5A V DS = off state 1V V DS = 0.5V 0A 0V 5V 10V VGS Fundamentals of Power Electronics 50 15V • on-resistance has positive temperature coefficient, hence easy to parallel Chapter 4: Switch realization A simple MOSFET equivalent circuit D • Cgs : large, essentially constant • Cgd : small, highly nonlinear Cgd G • Cds : intermediate in value, highly nonlinear Cds • switching times determined by rate at which gate driver charges/discharges Cgs and Cgd Cgs S Cds(vds) = Fundamentals of Power Electronics C0 Cds(vds) ≈ C0 v 1 + ds V0 51 V0 C '0 vds = vds Chapter 4: Switch realization Switching loss caused by semiconductor output capacitances Buck converter example Cds + – Cj + – Vg Energy lost during MOSFET turn-on transition (assuming linear capacitances): W C = 12 (Cds + C j) V 2g Fundamentals of Power Electronics 52 Chapter 4: Switch realization MOSFET nonlinear Cds Approximate dependence of incremental Cds on vds : Cds(vds) ≈ C0 C '0 V0 vds = vds Energy stored in Cds at vds = VDS : V DS W Cds = vds i C dt = vds C ds(vds) dvds 0 V DS W Cds = 0 C '0(vds) vds dvds = 23 Cds(VDS) V 2DS — same energy loss as linear capacitor having value Fundamentals of Power Electronics 53 4 3 Cds(VDS) Chapter 4: Switch realization Characteristics of several commercial power MOSFETs Rated max voltage Rated avg current R on Qg (typical) IRFZ48 60V 50A 0.018Ω 110nC IRF510 100V 5.6A 0.54Ω 8.3nC IRF540 100V 28A 0.077Ω 72nC APT10M25BNR 100V 75A 0.025Ω 171nC IRF740 400V 10A 0.55Ω 63nC MTM15N40E 400V 15A 0.3Ω 110nC APT5025BN 500V 23A 0.25Ω 83nC APT1001RBNR 1000V 11A 1.0Ω 150nC Part number Fundamentals of Power Electronics 54 Chapter 4: Switch realization MOSFET: conclusions G G G G G G G A majority-carrier device: fast switching speed Typical switching frequencies: tens and hundreds of kHz On-resistance increases rapidly with rated blocking voltage Easy to drive The device of choice for blocking voltages less than 500V 1000V devices are available, but are useful only at low power levels (100W) Part number is selected on the basis of on-resistance rather than current rating Fundamentals of Power Electronics 55 Chapter 4: Switch realization Synchronous buck converter Q1 Main switch Q1 Synchronous rectifier Q2 D1 Gate driver circuitry: L Vg + – + vs(t) Q2 D2 – iL • Source of Q2 is connected to ground • Source of Q1 is connected to switch node Half-bridge gate driver + 12 V Q1 D1 Half-bridge gate driver: L + – + iL • Gate of Q2 is driven by low-side driver • Gate of Q1 is driven by high-side driver • High-side driver is powered by bootstrap power supply circuit • High voltage integrated circuit + 12 V vs(t) Q2 D2 – Logic input Logic input: • Commands ON/OFF state of MOSFETs • When Q1 is on, Q2 must be off, and viceversa • High-side control signal must be level-shifted • Non-overlapping control: insert dead times Modeling and understanding the gate driver circuit + 12 V Rth Thevenin equivalent model vth(t) A simple Thevenin-equivalent circuit: • vth(t) is open-circuit voltage produced by gate driver • Rth is effective output resistance of driver, approximately given by on-resistance of output-stage transistors within the driver • For a driver rated at 12 V and 1 A, = (12essentially V)/(1 A) = 12 Ω • CgsR: thlarge, constant + – A simple MOSFET equivalent circuit D • Cgd : small, highly nonlinear MOSFET, with capacitances and body diode explicitly shown Cgd G • Cds : intermediate in value, highly nonlinear Cds • switching times determined by rate at which gate driver charges/discharges Cgs and Cgd Cgs S Cds(vds) = Fundamentals of Power Electronics C0 Cds(vds) 5 C0 v 1 + ds V0 51 V0 C '0 vds = vds Chapter 4: Switch realization Switching transitions + 12 V Q1 vth(t) D1 L + – + Rth Cgd + Cgs vth(t) + (t) v gs – – Gate driver model iL vgs(t) vs(t) – vs(t) MOSFET model t 4.2.3. Bipolar Junction Transistor (BJT) Base • Interdigitated base and emitter contacts Emitter • Vertical current flow n p n n • minority carrier device • on-state: base-emitter and collector-base junctions are both forward-biased nn • on-state: substantial minority charge in p and n- regions, conductivity modulation Collector Fundamentals of Power Electronics • npn device is shown 56 Chapter 4: Switch realization BJT switching times vs(t) Vs2 –Vs1 VCC vBE(t) 0.7V RL iC(t) iB(t) vs(t) + – RB + vBE(t) – –Vs1 + iB(t) IB1 vCE(t) 0 – –IB2 vCE(t) VCC IConRon iC(t) ICon 0 (1) (2) (3) Fundamentals of Power Electronics 57 (4) (5) (6) (7) (8) (9) t Chapter 4: Switch realization Ideal base current waveform iB(t) IB1 IBon 0 t –IB2 Fundamentals of Power Electronics 58 Chapter 4: Switch realization Current crowding due to excessive IB2 Base Emitter –IB2 p – – n – + + – – n- – p can lead to formation of hot spots and device failure n Collector Fundamentals of Power Electronics 59 Chapter 4: Switch realization BJT characteristics IC n egio r e v acti 10A tion a satur i s a u q CE V CE = 5V saturation region slope =β 5A V CE = 200V V = 20V VCE = 0.5V • Off state: IB = 0 • On state: IB > IC /β • Current gain β decreases rapidly at high current. Device should not be operated at instantaneous currents exceeding the rated value VCE = 0.2V cutoff 0A 0V 5V 10V 15V IB Fundamentals of Power Electronics 60 Chapter 4: Switch realization Darlington-connected BJT • Increased current gain, for high-voltage applications Q1 Q2 D1 Fundamentals of Power Electronics • In a monolithic Darlington device, transistors Q1 and Q2 are integrated on the same silicon wafer • Diode D1 speeds up the turn-off process, by allowing the base driver to actively remove the stored charge of both Q1 and Q2 during the turn-off transition 62 Chapter 4: Switch realization Conclusions: BJT G G G BJT has been replaced by MOSFET in low-voltage (<500V) applications BJT is being replaced by IGBT in applications at voltages above 500V A minority-carrier device: compared with MOSFET, the BJT exhibits slower switching, but lower on-resistance at high voltages Fundamentals of Power Electronics 63 Chapter 4: Switch realization 4.2.4. The Insulated Gate Bipolar Transistor (IGBT) • A four-layer device Emitter • Similar in construction to MOSFET, except extra p region Gate n p n n n- n p minority carrier injection • compared with MOSFET: slower switching times, lower on-resistance, useful at higher voltages (up to 1700V) p Collector Fundamentals of Power Electronics • On-state: minority carriers are injected into n- region, leading to conductivity modulation 64 Chapter 4: Switch realization The IGBT collector Symbol gate Location of equivalent devices emitter C n Equivalent circuit n p i2 n p n i1 n- G i1 p i2 E Fundamentals of Power Electronics 65 Chapter 4: Switch realization Current tailing in IGBTs IGBT waveforms iL Vg vA(t) iA(t) C curr ent t } ail 0 0 iL t diode waveforms iB(t) 0 G 0 t vB(t) i1 –Vg i2 pA(t) E Vg iL = vA iA area Woff t t0 Fundamentals of Power Electronics 66 t1 t2 t3 Chapter 4: Switch realization Switching loss due to current-tailing in IGBT + vA iL(t) – iL physical IGBT vB + – Vg – + – DTs Ts L gate + driver Vg vA(t) iA(t) curr ent t ideal diode ail } iA IGBT waveforms 0 0 iB iL t diode waveforms Example: buck converter with IGBT iB(t) 0 t vB(t) transistor turn-off transition –Vg pA(t) Psw = 1 Ts 0 Vg iL = vA iA pA(t) dt = (W on + W off ) fs switching transitions area Woff t0 Fundamentals of Power Electronics 67 t1 t2 t3 t Chapter 4: Switch realization Characteristics of several commercial devices Part number Rated max voltage Rated avg current V F (typical) tf (typical) S i ng l e-chi p dev i ces HGTG32N60E2 600V 32A 2.4V 0.62µs HGTG30N120D2 1200V 30A 3.2A 0.58µs M ul t i p l e-chi p p o w er m o dul es CM400HA-12E 600V 400A 2.7V 0.3µs CM300HA-24E 1200V 300A 2.7V 0.3µs Fundamentals of Power Electronics 68 Chapter 4: Switch realization Conclusions: IGBT G G G G G G G Becoming the device of choice in 500 to 1700V+ applications, at power levels of 1-1000kW Positive temperature coefficient at high current —easy to parallel and construct modules Forward voltage drop: diode in series with on-resistance. 2-4V typical Easy to drive —similar to MOSFET Slower than MOSFET, but faster than Darlington, GTO, SCR Typical switching frequencies: 3-30kHz IGBT technology is rapidly advancing: G G 3300 V devices: HVIGBTs 150 kHz switching frequencies in 600 V devices Fundamentals of Power Electronics 69 Chapter 4: Switch realization 4.3.4. Efficiency vs. switching frequency Add up all of the energies lost during the switching transitions of one switching period: W tot = W on + W off + W D + W C + W L + ... Average switching power loss is Psw = W tot fsw Total converter loss can be expressed as Ploss = Pcond + Pfixed + W tot fsw where Fundamentals of Power Electronics Pfixed = fixed losses (independent of load and fsw) Pcond = conduction losses 89 Chapter 4: Switch realization Efficiency vs. switching frequency Ploss = Pcond + Pfixed + W tot fsw Switching losses are equal to the other converter losses at the critical frequency 100% dc asymptote fcrit 90% fcrit = 80% η This can be taken as a rough upper limit on the switching frequency of a practical converter. For fsw > fcrit, the efficiency decreases rapidly with frequency. 70% 60% 50% 10kHz Pcond + Pfixed W tot 100kHz 1MHz fsw Fundamentals of Power Electronics 90 Chapter 4: Switch realization Wide Bandgap Semiconductor Devices Why wide bandgap semiconductor materials can significantly improve the tradeoff between breakdown voltage, forward voltage drop, and switching speed Silicon Carbide (SiC) power devices • • Schottky diode MOSFET Gallium Nitride (GaN) power devices • HEMT Fundamentals of Power Electronics i Specific on-resistance Ron as a function of breakdown voltage VB Majority-carrier device: A VB Ec µn es University of Colorado Boulder 𝐴𝐴𝑅𝑅#$ 𝑘𝑘 / = 𝑉𝑉 , . 𝜇𝜇$ 𝜀𝜀) 𝐸𝐸+ device area device breakdown voltage critical electric field for avalanche breakdown electron mobility semiconductor permittivity 1 Comparison of Power Semiconductor Materials Material Bandgap [eV] Electron mobility µn [cm2/Vs] Critical field Ec [V/cm] Thermal conductivity [W/moK] Si SiC GaN 1.12 2.36-3.25 3.44 1400 300-900 1500-2000 (AlGaN/GaN 2DEG) 3 x 105 1.3-3.2 x 106 3.0-3.5 x 106 130 700 110 Wide-bandgap device advantages • Much larger Ec, hence much lower specific Ron at high breakdown voltages • Majority carrier devices: no current tail, no reverse recovery • Capability of operation at increased junction temperature University of Colorado Boulder 2 Comparison of Power Semiconductor Materials Material Bandgap [eV] Electron mobility µn [cm2/Vs] Critical field Ec [V/cm] Thermal conductivity [W/moK] Si SiC GaN 1.12 2.36-3.25 3.44 1400 300-900 1500-2000 (AlGaN/GaN 2DEG) 3 x 105 1.3-3.2 x 106 3.0-3.5 x 106 130 700 110 But: • SiC is inferior to Si at sub-600V voltages because of lower electron mobility • GaN devices are lateral (not vertical), more difficult to scale to higher voltages and currents • GaN substrate issues: GaN-on-Si University of Colorado Boulder 3 The SiC Schottky Diode Available at 600 V, 1200 V, and higher No reverse recovery Forward voltage drop 1.5 V – 2 V Comparison with p–n Si diode at same voltage: • • • • Much lower switching loss Higher conduction loss Overall higher efficiency More expensive Note that silicon Schottky diodes are restricted to < 100V Fundamentals of Power Electronics 4 The SiC MOSFET We have silicon MOSFETs at up to 600-700 V SiC MOSFETs now are available at 600V – 10kV 104 • Properties are similar to Si MOSFETs, but with low Ron at these higher voltages • p–n body diode has VF of 3-4 V Realization • Switch Allows much higher switching frequency than Si IGBT Table 4.4 Part number C3M0030090K C3M0075120K C2M0045170D SCT3022AL CPM3-0900-0010A Characteristics of several commercial SiC MOSFETs Rated maximum voltage Rated average current Ron Qg (typical) 900 V 1200 V 1700 V 650 V 900 V 63 A 30 A 72 A 93 A 196 A 30 m⌦ 75 m⌦ 45 m⌦ 22 m⌦ 10 m⌦ 87 nC 51 nC 188 nC 133 nC 68 nC Additionally, a wide bandgap directly influences the impact on switching time because 5 Fundamentals of Power Electronics improvement in specific on-resistance allows a reduction in device area while maintaining the Power GaN HEMT High Electron Mobility Transistor (HEMT) A heterojunction field effect transistor Source Gate Lateral device No oxide layers Drain AlGaN n-type AlGaN: low bandgap GaN: high bandgap GaN intrinsic Substrate Fundamentals of Power Electronics 6 The Two-Dimensional Electron Gas (2DEG) Source Gate Drain – – – + – + – + – – – – – AlGaN n-type + + + + – – – – 2DEG + + + + Substrate Fundamentals of Power Electronics GaN intrinsic + + + 7 The energy band diagram takes a step at the heterojunction. Under the correct conditions, a 2DEG forms at the surface of the GaN layer. These electronics exhibit very low resistivity (high mobility), and can conduct current between source and drain. A majority carrier device having: • High breakdown field • Low on resistance The HEMT is a JFET The basic device is a depletion-mode junction field-effect transistor: • Normally on • To turn off, reverse-bias gate • Gate-channel junction is a diode that can conduct current when forward-biased Additional semiconductor design can shift threshold voltage: • Enhancement-mode JFETs are available • Then device is off when vgs = 0 Fundamentals of Power Electronics 8 D G S Electrical Considerations On state: • vgs > Vth with Vth ~ 3.5 V • But don’t apply vgs that is too large: gate-source diode will become forward-biased and conduct large current. Off state: • vgs ≤ 0 Reverse conduction: • No body diode • Channel can conduct current in either direction • With vgs = 0, a negative vds (< – Vth) can turn device on • Behavior is similar to having a body diode, except • Large forward drop ~ Vth • No reverse recovery Fundamentals of Power Electronics 9 D G S State of the Art Device Comparison Example Voltage rating Ron at 25oC-150oC Qg at VDS = 400V Coss (energy eq.) Coss (time eq.) VSD Qrr trr University of Colorado Boulder Si MOSFET 600 V 24-60 mW 123 nC (10V) 184 pF 1900 pF 0.8 V 8.7 uC 440 ns GaN 650 V 25-65 mW 12 nC (6V) 177 pF 284 pF 4V - 10 State of the Art Device Comparison Example Voltage rating Ron at 25oC-150oC Qg at VDS = 400V Coss (energy eq.) Coss (time eq.) VSD Qrr trr Si MOSFET body diode reverse recovery University of Colorado Boulder Si MOSFET 600 V 24-60 mW 123 nC (10V) 184 pF 1900 pF 0.8 V 8.7 µC 440 ns GaN 650 V 25-65 mW 12 nC (6V) 177 pF 284 pF 4V - Qrr VDS fs = 350 W at 400V, 100 kHz 11