Uploaded by Nguyen Trong Cong

Huawei LTE KPI Introduction

advertisement
LTE KPI Introduction
HUAWEI TECHNOLOGIES CO., LTD.
Contents
 KPI Overview
 Performance KPI Details
 Drive test KPI
 Capacity Monitoring
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 2
Classification of KPI Measurement
• The quality of network performance is mainly evaluated by KPI (Key Performance
Index)
› Drive Test KPI/ Stationary Test: Some KPIs should be attained by drive test, such as
such as coverage KPI and latency KPI, measurement results are coming from driver test tools.
› Performance Measurement KPI: Most of KPIs are attained by this approach, such as
RRC success Rate, HHO success rate, eg, these KPIs are coming from eNodeB
performance statistic.
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 3
eRAN Performance KPI Overview
Huawei eRAN KPIs
Accessability
Retainability
Mobility
• RRC Setup Success Rate
• Call Drop Rate
• LTE HO Success Rate
• Average Number of User
• Radio Network Availability
• eRAB Setup Success Rate
• L2U HO Success Rate
• Cell DL Traffic
• RB utilizing rate
• S1 SIG Setup Success Rate
• LTE Inter eNodeB
Handover (HO) via S1
• Cell UL Traffic
• LTEInter eNodeB
Handover (HO) via X2
Integrity
Availability
Utilization
• Cell DL Throughput
• Cell UL Throughput
• User DL Throughput
• User UL Throughput
• BLER
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 4
Measurement KPI - Attributes
Measurement
Scope
Description
KPI name
Measurement KPI
Formula
Associated
Counters
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 5
Performance Measurement System
Measurement Object
Measurement
Measurement Unit 1
Measurement Unit 2
Measurement
……
……
Family 1
Counter 1
Family 2
Counter 2
Counter 3
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Counter 4
Counter 5
Counter 6
Counter 7
Page 6
……
……
Performance Measurement Counter
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 7
Contents
2. Performance KPI Details
2.1 Accessibility KPI
2.2 Retainability KPIs
2.3 Mobility KPIs
2.4 Service Integrity KPIs
2.5 Utilization/Availability KPIs
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 8
Accessibility- RRC Setup Success Rate
KPI Name
RRC Setup Success Ratio
Measurement Scope
Network Level
Measurement Period
Network Busy Hour
Formula
L.RRC.ConnReq.Succ/L.RRC.ConnReq.Att*100%
Associated
Counters
A: L.RRC.ConnReq.Att
C: L.RRC.ConnReq.Succ
Unit
Percentage (%)
Target
99%
Remark
KPI 2.03
RRC Overall
RRC Setup
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 9
Accessibility- RRC Setup Success Rate (Service)
KPI Name
E UTRAN RRC Setup Success Ratio
(Service)
Measurement Scope
Network Level
Measurement Period
Network Busy Hour
Unit
(L.RRC.ConnReq.Succ.Emc+L.RRC.ConnReq.Succ.Hig
hPri+L.RRC.ConnReq.Succ.Mt+L.RRC.ConnReq.Succ.
MoData+L.RRC.ConnReq.Att.DelayTol)/(L.RRC.ConnRe
q.Att.Emc+L.RRC.ConnReq.Att.HighPri+L.RRC.ConnRe
q.Att.Mt+L.RRC.ConnReq.Att.MoData+L.RRC.ConnReq.
Succ.DelayTol)*100%
A:
(L.RRC.ConnReq.Att.Emc+L.RRC.ConnReq.Att.HighPri
+L.RRC.ConnReq.Att.Mt+L.RRC.ConnReq.Att.MoData+
L.RRC.ConnReq.Att.DelayTol))
C:
(L.RRC.ConnReq.Succ.Emc+L.RRC.ConnReq.Succ.Hig
hPri+L.RRC.ConnReq.Succ.Mt+L.RRC.ConnReq.Succ.
MoData+L.RRC.ConnReq.Succ.DelayTol)
Percentage (%)
Target
Monitoring
Remark
KPI 2.031
RRC Service
Formula
Associated
Counters
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
RRC Setup
Page 10
Accessibility- RRC Setup Success Rate (Signaling)
KPI Name
E UTRAN RRC Setup Success Ratio
(Signaling)
Measurement Scope
Network Level
Measurement Period
Network Busy Hour
Formula
L.RRC.ConnReq.Succ.MoSig/L.RRC.ConnReq.Att.M
oSig*100%
Associated
Counters
A: L.RRC.ConnReq.Att.MoSig
C: L.RRC.ConnReq.Succ.MoSig
Unit
Percentage (%)
Target
Monitoring
Remark
KPI 2.032
RRC Signaling
RRC Setup
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 11
Accessibility- S1 SIG Setup Success Rate
KPI Name
S1 SIG Setup Success Rate
Measurement Scope
Network Level
Measurement Period
Network Busy Hour
Formula
L.S1Sig.ConnEst.Succ / L.S1Sig.ConnEst.Att *100%
Associated
Counters
A: L.S1Sig.ConnEst.Att
B: L.S1Sig.ConnEst.Succ
Unit
Percentage (%)
Target
98.5%
Remark
KPI 2.04
S1 Setup
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 12
Accessibility- eRAB Setup Success Rate
KPI Name
eRAB Setup Success Rate
Measurement Scope
Network Level
Measurement Period
Network Busy Hour
Formula
L.E-RAB.SuccEst/L.E-RAB.AttEst *100%
Associated
Counters
A: L.E-RAB.AttEst
B: L.E-RAB.SuccEst
Unit
Percentage (%)
Target
99%
Remark
KPI 2.05
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Initial Context Setup
Page 13
eRAB Setup
Accessibility- eRAB Setup Success Rate (QCI=i)
KPI Name
eRAB Setup Success Rate
(QCI=i)
Measurement Scope Network Level
Measurement
Period
Network Busy Hour
Formula
L.E-RAB.SuccEst.QCI.i/L.ERAB.AttEst.QCI.i*100%
A: L.E-RAB.AttEst.QCI.i
B: L.E-RAB.SuccEst.QCI.i
(i=1,2,3,…,9)
Associated
Counters
Unit
Percentage (%)
Target
Monitoring
Remark
KPI 2.051
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Initial Context Setup
Page 14
eRAB Setup
Retainability- LTE Service Normal Release Rate
KPI Name
LTE Service Normal Release
Rate
Measurement Scope
Network Level
Measurement Period
Network Busy Hour
Formula
(1-L.E-RAB.AbnormRel /(L.ERAB.AbnormRel + L.E-RAB.NormRel))*
100%
Associated
Counters
L.E-RAB.AbnormRel
L.E-RAB.NormRel
Unit
Percentage (%)
Target
98.5%
KPI 2.14
Abnormal Release Cause:
L.E-RAB.AbnormRel.Radio
L.E-RAB.AbnormRel.TNL
L.E-RAB.AbnormRel.Cong
L.E-RAB.AbnormRel.HOFailure
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
eNodeB Release (Abnormal)
UE Release (Abnormal)
eNodeB Release (Normal)
UE Release (Normal)
Page 15
Retainability- LTE Service Normal Release Rate (QCI=i)
KPI Name
LTE Service Normal Release
Rate (QCI=i)
Measurement Scope
Network Level
Measurement Period
Network Busy Hour
Formula
1-(L.E-RAB.AbnormRel.QCI.i/(L.ERAB.AbnormRel.QCI.i+L.ERAB.NormRel.QCI.i))*100%
Associated
Counters
L.E-RAB.AbnormRel.QCI.i
L.E-RAB.NormRel.QCI.i
Unit
Percentage (%)
Target
Monitoring
Remark
KPI 2.141
i=1,2,3,…,9
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
eNodeB Release (Abnormal)
UE Release (Abnormal)
eNodeB Release (Normal)
UE Release (Normal)
Page 16
Mobility- LTE Intra-Frequency Handover Success Rate
KPI Name
LTE Intra-Frequency Handover
Success Rate
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Formula
Associated
Counters
Unit
(L.HHO.IntraeNB.IntraFreq.ExecSuccOut+L.H
HO.IntereNB.IntraFreq.ExecSuccOut)/(L.HHO.
IntraeNB.IntraFreq.ExecAttOut+L.HHO.Intere
NB.IntraFreq.ExecAttOut) *100%
B: L.HHO.IntraeNB.IntraFreq.ExecAttOut
C: L.HHO.IntraeNB.IntraFreq.ExecSuccOut
B: L.HHO.IntereNB.IntraFreq.ExecAttOut
C: L.HHO.IntereNB.IntraFreq.ExecSuccOut
Intra eNode B Handover
Percentage (%)
S1 Handover
Target
98%
Remark
KPI 2.16
Intra-Frequency Outgoing Handover
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
X2 Handover
Page 17
Mobility- LTE Inter-Frequency Handover Success Rate
KPI Name
LTE Inter-Frequency Handover
Success Rate
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Formula
Associated
Counters
(L.HHO.IntraeNB.InterFreq.ExecSuccOut+L.H
HO.IntereNB.InterFreq.ExecSuccOut)/(L.HHO.
IntraeNB.InterFreq.ExecAttOut+L.HHO.Intere
NB.InterFreq.ExecAttOut) *100%
B: L.HHO.IntraeNB.InterFreq.ExecAttOut
C: L.HHO.IntraeNB.InterFreq.ExecSuccOut
B: L.HHO.IntereNB.InterFreq.ExecAttOut
C: L.HHO.IntereNB.InterFreq.ExecSuccOut
Unit
Percentage (%)
Target
98%
Remark
KPI 2.17
LTE Inter-Frequency Outgoing Handover
Intra eNode B Handover
S1 Handover
X2 Handover
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 18
Mobility- L2U Handover Success Rate
KPI Name
L2U Handover Success Rate
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Formula
L.IRATHO.E2W.ExecSuccOut /
L.IRATHO.E2W.ExecAttOut *100%
Associated
Counters
C: L.IRATHO.E2W.ExecSuccOut
B: L.IRATHO.E2W.ExecAttOut
Unit
Percentage (%)
Target
95%
Remark
KPI 2.18
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 19
Mobility- LTE Inter eNodeB Handover via S1
KPI Name
LTE Inter eNodeB Handover via S1
Measurement Scope
Network Level
Measurement Period
Network Busy Hour
(L.HHO.IntereNB.IntraFreq.ExecAttOut+L.HHO.Inter
eNB.InterFreq.ExecAttOutL.HHO.X2.IntraFreq.ExecSuccOutL.HHO.X2.InterFreq.ExecSuccOut)/(L.HHO.IntereN
B.IntraFreq.ExecSuccOut+L.HHO.IntereNB.InterFre
q.ExecSuccOut-L.HHO.X2.IntraFreq.ExecAttOutL.HHO.X2.InterFreq.ExecAttOut) * 100%
B: (L.HHO.IntereNB.IntraFreq.ExecSuccOutL.HHO.X2.IntraFreq.ExecAttOut)
(L.HHO.IntereNB.InterFreq.ExecSuccOutL.HHO.X2.InterFreq.ExecAttOut)
C: (L.HHO.IntrerNB.IntraFreq.ExecAttOutL.HHO.X2.IntraFreq.ExecSuccOut)
(L.HHO.IntrerNB.InterFreq.ExecAttOutL.HHO.X2.InterFreq.ExecSuccOut)
Formula
Associated
Counters
Unit
Percentage (%)
Target
98%
Remark
KPI 2.19
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Inter eNodeB Handover via S1
Page 20
Mobility- LTE Inter eNodeB Handover via X2
KPI Name
LTEInter eNodeB Handover via X2
Measurement Scope
Network Level
Measurement Period
Network Busy Hour
Formula
(L.HHO.X2.IntraFreq.ExecSuccOut +
L.HHO.X2.InterFreq.ExecSuccOut)
/(L.HHO.X2.IntraFreq.ExecAttOut +
L.HHO.X2.InterFreq.ExecAttOut) *100%
Associated
Counters
B: L.HHO.X2.IntraFreq.ExecAttOut
L.HHO.X2.InterFreq.ExecSuccOut
C: L.HHO.X2.IntraFreq.ExecSuccOut
L.HHO.X2.InterFreq.ExecAttOut
Unit
Percentage (%)
Target
98%
Remark
KPI 2.20
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Inter eNodeB Handover via X2
Page 21
Integrity- Average Number of User and RB Utilization
KPI Name
Average Number of User
KPI Name
RB Utilization
Measurement
Scope
Network Level
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Measurement
Period
Network Busy Hour
Formula
L.Traffic.User.Avg
Formula
L.ChMeas.PRB.UL.Used.Avg /50 *100%
L.ChMeas.PRB.DL.Used.Avg /50 *100%
Associated
Counters
L.Traffic.User.Avg
Associated
Counters
L.ChMeas.PRB.UL.Used.Avg
L.ChMeas.PRB.DL.Used.Avg
Unit
None
Unit
None
Target
Monitoring
Target
Monitoring
Remark
KPI2.31
Monitoring KPI
Remark
KPI 2.24
Monitoring KPI
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 22
Integrity- DL /UL Payload
KPI Name
DL Payload
KPI Name
UL Payload
Measurement
Scope
Network Level
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Measurement
Period
Network Busy Hour
Formula
L.Thrp.bits.DL / (1000*1000*1000)
Formula
L.Thrp.bits.UL / (1000*1000*1000)
Associated
Counters
L.Thrp.bits.DL
Associated
Counters
L.Thrp.bits.UL
Unit
Gb
Unit
Gb
Target
Monitoring
Target
Monitoring
Remark
KPI 2.32
Monitoring KPI
Remark
KPI2.33
Monitoring KPI
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 23
Integrity- Cell DL/UL Throughput
KPI Name
Cell DL Throughput
KPI Name
Cell UL Throughput
Measurement
Scope
Network Level
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Measurement
Period
Network Busy Hour
Formula
L.Thrp.bits.DL /
L.Thrp.Time.Cell.DL.HighPrecision / 1000
Formula
L.Thrp.bits.UL /
L.Thrp.Time.Cell.UL.HighPrecision / 1000
Associated
Counters
L.Thrp.bits.DL
L.Thrp.Time.Cell.DL.HighPrecision
Associated
Counters
L.Thrp.bits.UL
L.Thrp.Time.Cell.UL.HighPrecision
Unit
mbps
Unit
mbps
Target
Monitoring
Target
Monitoring
Remark
KPI2.23
Monitoring KPI
Remark
KPI2.23
Monitoring KPI
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 24
Integrity- User DL/UL Throughput
KPI Name
User DL Throughput (mbps)
KPI Name
User UL Throughput (mbps)
Measurement
Scope
Network Level
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Measurement
Period
Network Busy Hour
Formula
(L.Thrp.bits.DLL.Thrp.bits.DL.LastTTI)/L.Thrp.Time.DL.RmvL
astTTI/1000
Formula
(L.Thrp.bits.ULL.Thrp.bits.UE.UL.LastTTI)/L.Thrp.Time.UE.U
L.RmvLastTTI/1000
Associated
Counters
L.Thrp.bits.DL
L.Thrp.bits.DL.LastTTI
L.Thrp.Time.DL.RmvLastTTI
Associated
Counters
L.Thrp.bits.UL
L.Thrp.bits.UE.UL.LastTTI
L.Thrp.Time.UE.UL.RmvLastTTI
Unit
mbps
Unit
mbps
Target
Monitoring
Target
Monitoring
Remark
KPI2.34
Monitoring KPI
Remark
KPI2.35
Monitoring KPI
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 25
DL / UL BLER
KPI Name
DL / UL BLER
Measurement Scope
Network Level
Measurement Period
Busy Hour
DL:
(L.Traffic.DL.PktUuLoss.Loss.QCI.1+L.Traffic.DL.PktUuLoss.Loss.QCI.2+L.Traffic.DL.PktUuLoss.Loss.QCI.3+L.
Traffic.DL.PktUuLoss.Loss.QCI.4+L.Traffic.DL.PktUuLoss.Loss.QCI.5+L.Traffic.DL.PktUuLoss.Loss.QCI.6+L.Traf
fic.DL.PktUuLoss.Loss.QCI.7+L.Traffic.DL.PktUuLoss.Loss.QCI.8+L.Traffic.DL.PktUuLoss.Loss.QCI.9) /
(L.Traffic.DL.PktUuLoss.Tot.QCI.1+L.Traffic.DL.PktUuLoss.Tot.QCI.2+L.Traffic.DL.PktUuLoss.Tot.QCI.3+L.Traffic
.DL.PktUuLoss.Tot.QCI.4+L.Traffic.DL.PktUuLoss.Tot.QCI.5+L.Traffic.DL.PktUuLoss.Tot.QCI.6+L.Traffic.DL.PktU
uLoss.Tot.QCI.7+L.Traffic.DL.PktUuLoss.Tot.QCI.8+L.Traffic.DL.PktUuLoss.Tot.QCI.9)
UL:
(L.Traffic.UL.PktUuLoss.Loss.QCI.1+L.Traffic.UL.PktUuLoss.Loss.QCI.2+L.Traffic.UL.PktUuLoss.Loss.QCI.3+L.
Traffic.UL.PktUuLoss.Loss.QCI.4+L.Traffic.UL.PktUuLoss.Loss.QCI.5+L.Traffic.UL.PktUuLoss.Loss.QCI.6+L.Traf
fic.UL.PktUuLoss.Loss.QCI.7+L.Traffic.UL.PktUuLoss.Loss.QCI.8+L.Traffic.UL.PktUuLoss.Loss.QCI.9)/(L.Traffic.
UL.PktUuLoss.Tot.QCI.1+L.Traffic.UL.PktUuLoss.Tot.QCI.2+L.Traffic.UL.PktUuLoss.Tot.QCI.3+L.Traffic.UL.PktU
uLoss.Tot.QCI.4+L.Traffic.UL.PktUuLoss.Tot.QCI.5+L.Traffic.UL.PktUuLoss.Tot.QCI.6+L.Traffic.UL.PktUuLoss.To
t.QCI.7+L.Traffic.UL.PktUuLoss.Tot.QCI.8+L.Traffic.UL.PktUuLoss.Tot.QCI.9)
L.Traffic.DL.PktUuLoss.Loss.QCI.i, L.Traffic.DL.PktUuLoss.Tot.QCI.i
L.Traffic.UL.PktUuLoss.Loss.QCI.i, L.Traffic.UL.PktUuLoss.Tot.QCI.i (i=1,2,3,…,9)
Percentage (%)
Formula
Associated Counters
Unit
Target
Remark
0.5%
KPI 2.15
SP: Report period of counter, Unit: minute
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 26
Radio Network Availability
KPI Name
Radio Network Availability
Measurement Scope
Network Level
Measurement Period
24 Hours, Busy Hour
Formula
{1-sum of (L.Cell.Unavail.Dur.Sys)/no. of cells * {SP}*60}
Associated
Counters
L.Cell.Unavail.Dur.Sys
Unit
Percentage (%)
Target
99.999%
Remark
KPI 2.21
SP: Report period of counter, Unit: minute
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 27
Contents
 KPI Overview
 Performance KPI
 Drive test KPI
 Capacity Monitoring
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page28
Page
28
Page28
Coverage-RSRP & SINR
KPI Name
RSRP
KPI Name
Measurement Scope
Cluster DT
Measurement Scope Cluster DT
Measurement Period
NA
Measurement Period NA
Formula
RS Received Power
Formula
RS Signal to Interference and Noise Ratio
Associated
Event
NA
Associated
Even
NA
Unit
dBm
Unit
dB
Target
90% >=-103dBm
Target
70% >=10dB (DU)
1% < 0dB (Unloaded)
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
SINR
Remark
Page 29
Accessibility- EPS Attach Success Rate
KPI Name
EPS Attach Success Rate
Measurement
Scope
Cluster DT
Measurement
Period
NA
Formula
Attach Complete / Attach Request *100%
Associated
Event
Attach Request
Attach Complete
Unit
%
Target
99%
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 30
Accessability- LTE Service Request Success Rate
KPI Name
LTE Service Request Success Rate
Measurement Scope
Cluster DT
Measurement Period NA
Formula
EPS bearer allocation success / EPS bearer
allocation attempt* 100%
Associated
Event
EPS bearer allocation success
EPS bearer allocation attempt
Unit
%
Target
98%
Remark
RF condition: RSRP > -110dBm and SINR > -3dB
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 31
Accessibility- CSFB Setup
KPI Name
CSFB_Voice Call Setup
Success Rate
KPI Name
CSFB_Voice Call Setup Time
Measurement Scope
Cluster DT
Measurement Scope
Cluster DT
Measurement Period
NA
Measurement Period
NA
Formula
CSFB Call Setup/CSFB Request *100%
Formula
Talerting- Tesr
Associated
Event
CSFB Call Setup
CSFB Request
Associated
Event
Alerting
ESR
Unit
%
Unit
s
Target
>98.5%
Target
95% calls <6s
Remark
RF condition: RSRP > -110dBm and
SINR > 0dB
Remark
RF condition: RSRP > -110dBm and SINR
> 0dB
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 32
Mobility- LTE Handover 1
KPI Name
Intra-eNodeB / Inter-eNodeB
Handover Success Rate
KPI Name
Inter-RAT Redirection success
rate from LTE to UMTS
Measurement
Scope
Cluster DT
Measurement
Scope
Cluster DT
Measurement
Period
NA
Measurement
Period
NA
Formula
RAU Success/L2U Redirection Attempt *100%
Formula
Handover Complete / Handover
Command*100%
Associated
Event
Handover Complete
Handover Command
Associated
Event
RAU Success
L2U Redirection Attempt
Unit
%
Unit
%
Target
98%
Target
97%
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Remark
Page 33
Mobility- LTE Handover 2
KPI Name
Handover Interruption Time on Uplane
KPI Name
The success Rate of 4G-> 3G
Data Handover
Measurement
Scope
Cluster DT
Measurement
Scope
Cluster DT
Measurement
Period
NA
Measurement
Period
NA
Formula
Tsrcelllastpacket-Ttgtcellfirstpacket
Formula
L2U HO Complete/L2U HO Command*100%
Associated
Event
Tsrcelllastpacket
Ttgtcellfirstpacket
Associated
Event
L2U HO Complete
L2U HO Command
Unit
ms
Unit
%
Target
90ms
Target
95%
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Remark
Page 34
Retainability- PDP Context Call Drop Rate
KPI Name
PDP Context Call Drop Rate
Measurement Scope
Cluster
Measurement Period
NA
Formula
LTE RRC connection dropped / RRC connection
connected*100%
Associated
Event
LTE RRC connection dropped
RRC connection connected
Unit
%
Target
1%
Remark
RF condition: RSRP > -110dBm and SINR > -3dB
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 35
Integrity - Single user Downlink/Uplink TCP throughput
KPI Name
Single UE DL Throughput
KPI Name
Single UE UL Throughput
Measurement
Scope
Cluster
Measurement
Scope
Cluster
Measurement
Period
NA
Measurement
Period
NA
Throughput DL Total Size / Throughput DL
Formula
Formula
Throughput UL Total Size / Throughput UL
Total Time
Total Time
Associated
Event
Throughput DL Total Size
Throughput DL Total Time
Associated
Event
Throughput UL Total Size
Throughput UL Total Time
Unit
%
Unit
%
Target
Average: will be provided in delivery stage
Excellent Coverage (RSRP> 80dBm,SINR>28dB): 65Mbps
Bad Coverage (RSRP> -110dBm,SINR>0dB):
4Mbps
Target
Average: will be provided in delivery stage
Excellent Coverage (RSRP> 80dBm,SINR>28dB): 15Mbps
Bad Coverage (RSRP> -110dBm,SINR>0dB):
1Mbps
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Remark
Page 36
Integrity- Round Trip Time
KPI Name
Round Trip Time
Measurement Scope
Feature Test
Measurement Period
NA
Formula
Round Trip Time
Associated Event
NA
Unit
ms
Target
Ping 32B: 30ms
Remark
Unloaded
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 38
Contents
 KPI Overview
 Performance KPI
 Driver test KPI
 Capacity Monitoring
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 39
Capacity Monitoring
eNodeB Resource
Connected User
License
Traffice Volume
License
Paging
Resource
Transport
Resouce
Board
Resource
Cell Resource
PRB
Resource
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
PDCCH
Resource
PRACH
Resource
Page 40
eNode B – Connected User License
KPI Name
RRC Connected User
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Formula
L.Traffic.eNodeB.User.Max/Licensed RRC*100%
Associated
Counters
L.Traffic.eNodeB.User.Max
Unit
%
Monitoring
Threshold
>70%
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 41
eNode B – Traffic Volume License
KPI Name
eNode B Traffic Volume Utilization
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Formula
Sum of (L.Thrp.bits.UL + L.Thrp.bits.DL) all cells /
(Traffic License*3600)/(1000*1000)*100%
Associated
Counters
L.Thrp.bits.UL
L.Thrp.bits.UL
Unit
%
Monitoring
Threshold
>80%
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 42
eNode B – Paging Resource
KPI Name
Paging Utilization
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Formula
Sum of (L.Paging.S1.Rx) all cells /3600/750 *100%
Associated
Counters
L.Paging.S1.Rx
Unit
%
Monitoring
Threshold
>60%
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 43
eNode B – Board Resource
KPI Name
Average Main processor load
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Formula
VS.BBUBoard.CPULoad.Mean
Associated
Counters
VS.BBUBoard.CPULoad.Mean
Unit
%
Monitoring
Threshold
70%
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 44
eNode B - Transport Resource
KPI Name
Transmission Rate
KPI Name
Reception Rate
Measurement
Scope
Network Level
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Measurement
Period
Network Busy Hour
Formula
VS.FEGE.TxMaxSpeed/(1000*1000)
Formula
VS.FEGE.RxMaxSpeed/(1000*1000)
Associated
Counters
VS.FEGE.TxMaxSpeed
Associated
Counters
VS.FEGE.RxMaxSpeed
Unit
Mbps
Unit
Mbps
Monitoring
Threshold
Monitoring
Threshold
Remark
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 45
Cell – PRB Resource
KPI Name
DL Resource Block Utilization
KPI Name
UL Resource Block Utilization
Measurement
Scope
Network Level
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Measurement
Period
Network Busy Hour
Formula
L.ChMeas.PRB.DL.Used.Avg/L.ChMeas.P
RB.DL.Availx100% )
Formula
L.ChMeas.PRB.UL.Used.Avg/L.ChMeas.PRB.
UL.Availx100%
Associated
Counters
L.ChMeas.PRB.UL.Used.Avg
L.ChMeas.PRB.UL.Avail
Associated
Counters
L.ChMeas.PRB.DL.Used.Avg
L.ChMeas.PRB.DL.Avail
Unit
%
Unit
%
Monitoring
Threshold
DL RB Utilization >70% &
L.Thrp.bits.DL/L.Thrp.Time.DL/1000 <
2Mbps
Monitoring
Threshold
UL RB Utilization >70% &
L.Thrp.bits.DL/L.Thrp.Time.DL/1000 < 512kps
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Remark
Page 46
Cell – PRACH Resource
KPI Name
Random Preamble Utilization
KPI Name
Dedicated Preamble Utilization
Measurement
Scope
Network Level
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Measurement
Period
Network Busy Hour
Formula
(L.RA.GrpA.Att+L.RA.GrpB.Att) /3600/50*
100%
Formula
L.RA.Dedicate.Att/3600/100*100%
Associated
Counters
L.RA.GrpA.Att
L.RA.GrpB.Att
Associated
Counters
L.RA.Dedicate.Att
Unit
%
Unit
%
Monitoring
Threshold
>75%
Monitoring
Threshold
>75%
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Remark
Page 47
Cell – PDCCH Resource
KPI Name
CCE Utilization
Measurement
Scope
Network Level
Measurement
Period
Network Busy Hour
Formula
(L.ChMeas.CCE.CommUsed +
L.ChMeas.CCE.ULUsed +
L.ChMeas.CCE.DLUsed)/L.ChMeas.CCE.Avail
Associated
Counters
L.ChMeas.CCE.CommUsed
L.ChMeas.CCE.ULUsed
L.ChMeas.CCE.DLUsed
L.ChMeas.CCE.Avail
Unit
%
Monitoring
Threshold
> 80%
Remark
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 48
Thank You
HUAWEI
TECHNOLOGIES
CO., LTD.
HISILICON
SEMICONDUCTOR
Page 49
Download