Chinese Journal of Electrical Engineering, Vol.4, No.2, June 2018 A New Active Gate Driver for MOSFET to Suppress Turn-Off Spike and Oscillation Yanfeng Jiang, Chao Feng, Zhichang Yang, Xingran Zhao, and Hong Li* (School of Electrical Engineering, Beijing Jiaotong University, Beijing 100044, China) Abstract: MOSFETs are widely used in power electronics converters. Due to the high di/dt and dv/dt of the MOSFET and parasitic parameters in the circuit, drain voltage spikes and oscillations will be generated during turn-off, which can affect the safety of the device and degrade the system's electromagnetic compatibility. This paper first studies the relationship between drain voltage spike and gate voltage during turn-off. Based on the effect of gate voltage on drain voltage spike, a new active gate driver that optimizes gate voltage is proposed. The proposed active gate driver detects the slope of the drain voltage and generates a positive pulse in the drain current fall phase to increase the gate voltage, thereby suppressing drain voltage spike and oscillation. In order to verify the effectiveness of the proposed active gate driver, a simulation circuit and an experimental platform are constructed and compared with the conventional gate driver. Simulation and experimental results show that the new active gate driver can effectively suppress the drain voltage spike and oscillation of MOSFETs, and can effectively reduce high-frequency EMI. Keywords: Active gate driver, electromagnetic interference, voltage spike, oscillation. 1 Introduction In high frequency power converters, MOSFETs generate severe voltage spikes and oscillations during turn-off due to high dv/dt, di/dt, and circuit parasitic parameters. Excessive voltage spikes and oscillations can not only damage the MOSFET, increase switching losses, but also cause serious electromagnetic interference (EMI)[1-3]. In order to suppress voltage spikes and oscillations during turn-off, many methods have been proposed in the existing literatures[4-9]. Among them, the commonly used methods are active clamp circuit[4], soft switches[5-6] and snubber circuit[7-9].However, additional capacitance and inductance are needed in these methods, which will reduce the switching frequency and increase switching losses[10]. Compared to those methods, drive circuit can be well balanced in switching losses and electromagnetic compatibility(EMC), which is a good choice to optimize the switching process[11]. Conventional gate driver(CGD) reduce voltage spikes and oscillations by increasing drive resistance, but the switching losses will increase significantly[12]. Based on the problem of CGD, active gate driver(AGD) is proposed to suppress voltage spikes and oscillations, which has little effect on MOSFET switching speed and losses of MOSFET[13]. Due to the advantages of AGD, it has been studied by many scholars. There are many active drive schemes reported in literatures. By changing the gate resistance in different switching phases, the charging and discharging speeds of MOSFET during the switching process can be controlled. Thereby, the voltage spikes and oscillations can be effectively suppressed[14-17]. However, the range *Corresponding Author, E-mail:hli@bjtu.edu.cn. Supported in part by the General Program of National Natural Science Foundation of China under Grant 51577010, 51777012, in part by the Fundamental Research Funds for the Central Universities under Grant 2017JBM054. of values of the drive resistors is limited, so the suppression effect of voltage spikes and oscillations is limited. Although the drive resistance is continuously adjustable in [18], the high-speed clock is required in these circuit, which increases the cost of the drive circuit. On the other hand, the switching speed of the MOSFET can be controlled effectively by controlling the drive current. The di/dt of MOSFET can be reduced by appropriately reducing the drive current during the drain current fall phase[19-21]. However, control process of the controllable current source driving circuit is complicated. Compared to the analog current source circuits, a digital current source drive is proposed in [22], whose control process is easy. But the speed of ADC or DAC to collect the switching information makes it difficult to use in high-frequency converters. In addition to controlling the drive resistance and drive current, the switching transition can also be controlled by controlling the gate voltage[21-29]. The influence of the gate voltage on the drain voltage spike and oscillation is deduced theoretically in [23], but the corresponding solution are not given. The active closed-loop voltage gate drive in [24] makes up for the shortcomings of [23]. But the value of the passive devices is difficult to determine. The closed-loop controller is designed in [25-27], which uses the error of the drain voltage and the reference voltage to make the switching waveform close to idea voltage. However, it is difficult to perform well under different DC bus voltages at fixed reference voltage. Contrary to the closed loop control, the multi–level drive pulses to improve the switching characteristics has been studied in [28-29]. However, this circuit in [28] can only be used for switches with a drive level of -5V to 15V. In order to overcome the shortcomings of the above-mentioned active drive circuit, a new active gate driver(NAGD) is designed based on the causes of voltage spike and oscillation. The general principle of 44 Chinese Journal of Electrical Engineering, Vol.4, No.2, June 2018 the NAGD is that, by detecting the dvd /dt, the gate voltage is raised at a certain point during the rise of the drain voltage and held until the end of the MOSFET is turned off to suppress voltage spike and oscillation. The gate-source voltage is raised at a certain point during the rise of the drain-source voltage The NAGD has a simple control process, requires fewer components, and is easy to implement in the actual circuit. 2 Analysis of MOSFET turn-off process The causes of the voltage spike and oscillation during turn-off process are analyzed based on a chopper circuit, as shown in Fig.1. The MOSFET in the Fig.1 consists of an ideal MOSFET, gate-drain capacitance Cgd, gate-source capacitance Cgs, drain-source capacitance Cds, and an internal diode; Ld is the parasitic inductance of the MOSFET; Lf is the parasitic inductance of the freewheeling diode(FWD); L and R are inductive loads; Rg is the drive resistance; Udc is the DC bus voltage. According to the behavior of the voltage and current, the turn-off process is divided into four phases, as shown in Fig.2. Phase 1: the turn-off delay phase (t0~ t1) At this phase, the gate-source capacitance Cgs of the MOSFET is discharged through the gate resistor. And the gate-source voltage begins to decrease until t1. According to Kirchhoff law, the expression of the gate-source voltage and current are shown in equation (1)~(2): ugt Rg ig U gs 0 Theoretical analysis of voltage spike and oscillation in turn-off process This part analyzes the turn-off process of the MOSFET and gives the mathematical equations of voltage spike and oscillation. Based on the causes of the voltage spike and oscillation, a method of suppressing the voltage spike and oscillation is proposed. 2.1 2.1.1 ig Cgs 2.1.2 dU gs (1) (2) dt Phase 2: the voltage rise phase(t1~ t2) This phase is also called miller plateau phase. The MOSFET gate-source voltage remains unchanged, and the drain-source voltage begins to rise until it equals the DC bus voltage. During this process, Cgd starts reverse charging after completing discharge and the MOSFET enters the saturation region from the linear resistive region. 2.1.3 Phase 3:the current fall phase(t2~ t3) At this phase, the drain current begins to fall and the load current is transferred from the MOSFET to the FWD. At this time, MOSFTE operates in the saturation region, and the value of the drain current depends on the gate-source voltage, as shown in equation (3): id g m (U gs U th ) (3) The first derivative of equation (3) is equation (4): dU gs did gm dt dt (4) where gm is the admittance of the MOSFET. Equation (5) can be derived from equation (1)~ (4)[23]: Fig.1 Chopper circuit with inductive load id U th U gt did gm C dt Rg iss gm (5) According to Kirchhoff voltage law, the KVL equation of the power loop can be obtained, as shown in equation (6): U dc U dc ( Ld Lf ) did U FWD dt (6) where UFWD is the forward conduction voltage of the freewheeling diod. Since the did /dt is less than zero, the –(Ld +Lf)·did /dt is greater than zero. Therefore, the voltage spike expression due to the parasitic inductance can be obtained as shown in (7): Fig.2 Schematic of turning off process U ds U dc ( Ld Lf ) did U FWD dt (7) Y. Jiang et al.: A New Active Gate Driver for MOSFET to Suppress Turn-Off Spike and Oscillation 2.1.4 Phase 4: the oscillation phase(t3~ t4) At this phase, since the gate-source voltage drops below the threshold voltage, the MOSFET will be completely turned off. Because of the presence of parasitic parameters in the power loop, the drain current forms a damping oscillation. Accordingly, the drain voltage will form a damping oscillation according to (7)[23]. Based on the above analysis, large did/dt in the current fall phase is the cause of voltage spike and oscillation during the turn-off process of the MOSFET, which makes that a large voltage spike is formed on the circuit parasitic inductance. A damping oscillation of the current is caused by the parasitic inductance, which causes the drain-source voltage forming a damping oscillation. 2.2 Method of suppressing spike and oscillation The magnitude of the voltage spike is determined by the did /dt of the current fall phase and the parasitic inductance of the circuit. For a particular circuit, the circuit inductance is fixed. So reducing voltage spike can be achieved by reducing the did /dt. From equation (5), it can be seen that, under the threshold of the gate voltage, the did/dt can be reduced by raising the gate-source voltage. According to the cause of the voltage oscillation during the turn-off process, reducing the did /dt in the current fall phase can also suppress voltage oscillation effectively. 3 45 Active drive circuit design According to the method of suppressing voltage spike and oscillation and as far as possible without affecting turn-off loss, the normal gate-source voltage should be maintained during the turn-off delay phase, and the gate-source voltage should be raised to suppress the did /dt during the current fall and voltage oscillation phase. However, the current fall phase is too fast to respond to in time. Considering the delay time of the detection circuit, a positive pulse can be generated by detecting the rise of the drain-source voltage and the amplitude of it should be held until the end of the voltage oscillation phase[30]. Based on the above analysis, a NAGD is proposed to suppress voltage spike and oscillation, which mainly consists of three parts: slope detection of drain-source voltage part[22]; proportional amplification circuit; push- pull circuit . (1) Detection circuit of voltage slope[22]: it contains a differentiator AMP1 and a comparator Comp. AMP1 is used to detect the dvd /dt. The output voltage of the AMP1 is compared with the reference voltage Vref of the Comp after being divided by the resistor. The value of Vref should be a little than the voltage of R4 when MOSFET is completely turned on or off. The output voltage waveform of the Amp1 is shaped by the comparator to generate a positive pulse during the current fall phase. The output voltage of the AMP1 is determined by equation (8): U Amp1-out Vcm dU ds R2 C1 dt (8) Fig.3 Active drive gate circuit schematic (2) Proportional amplification circuit: this part is used to further amplify the output pulse amplitude of the comparator so that Bipolar Junction Transistor(BJT) in the push-pull circuit works in the cutoff or saturation region. The amplification of the proportional amplifier circuit is shown in equation(9). U AMP2-ou t R 1 6 U AMP2-in R5 (9) (3) Push-pull circuit: it is used to isolate the front stage circuit and raise the gate voltage when the comparator outputs a positive pulse. The maximum value of its output voltage is determined by the supply voltage VCC of Push-pull circuit when it working in the switching state. The higher the value of VCC is, the higher the amplitude of the gate voltage is raised and the better the suppression of voltage spike and oscillation will be. Fig.4 shows the simulated waveform of the NAGD in the simulation software PSpice. It can be seen that the gate-source voltage of the turn-off process is divided into three parts. In the first part, the output voltage of the comparators is low and the MOSFET maintains normal turn off. In the second part, during the period from the drain drain-source rise to the oscillation phase, the output voltage of differentiator is the dvd /dt, and is shaped by the comparator to generate a positive pulse. The amplitude of the positive pulse is further amplified through the proportional amplification circuit so that the push-pull circuit operates in cutoff or saturation region. Adjusting the voltage amplitude of VCC can get different amplitude output voltages. The output voltage raises the gate voltage through the push-pull circuit. The higher the supply voltage of VCC is, the larger the value of the gate voltage is raised, and the more obvious the effect on suppression of the voltage spike and oscillation. In the third part, the output voltage of the comparators is low and the gate-source voltage is kept at zero potential to ensure the MOSFET is reliably turned off. 4 Simulation verification In this section, a CGD and a NAGD circuit are built in PSpice to verify the effectiveness of the NAGD for improving the dynamic characteristics of MOSFET. The 46 Chinese Journal of Electrical Engineering, Vol.4, No.2, June 2018 Fig.4 Simulation waveform of NAGD amplifier and comparator adopt the TI high-speed device, which are respectively THS3062 and TLV3501. The MOSFET is IRF620 and diode is HAF25TB60. The simulation models are all provided by the official website. The parameters of simulation circuit are shown in Table 1. According to the analysis of the push-pull circuit in the NAGD, the suppression effect of voltage spike and oscillation depends on the magnitude of the gate-source voltage being raised. The gate-source and drain-source voltage waveforms are shown in Fig.5 and Fig.6 under CGD and NAGD. It can been seen that the gate-source voltage is raised to 2.701V, the drain-source voltage spike amplitude decreases by 23.64% and the oscillation is significantly reduced. Table 1 Parameters of simulation circuit Parameters DC bus voltage Udc /V Load inductance L/H Load Resistance R/ Drive resistance Rg/ Switching fs/kHz Supply voltage of push-pull circuit VCC/V MOSFET drain parasitic inductance Ld/nH Freewheeling diode parasitic inductance Lf /nH Fig.5 Fig.6 In order to verify that under the threshold voltage, the higher the gate-source voltage is, the better suppression of voltage spike and oscillation is, Fig.7 shows the gate-source and the drain-source voltage waveform when the VCC is increased from 5V to 8V. Compared to Fig.6, the gate-source voltage increases from 2.701V to 3.07V, and the voltage spike decreases by 12.27%. It proves that under the threshold voltage, the higher the gate-source voltage is, the better the suppression effect of voltage spike and oscillation will be. It is necessary to verify that the NAGD can still effectively suppress voltage spike and oscillation with large parasitic inductance. The parasitic inductance Ld is increased from 60nH to 112nH, and the V C C is maintained at 8V. The gate-source and drain-source voltage waveform are shown in Fig.8 and Fig.9 under CGD and NAGD. It can been seen that the gate-source voltage is raised to 3.201V, and the voltage spike amplitude decreases by 38.75%, which proves that the NAGD can still suppress the voltage spike and oscillation effectively under large parasitic inductance. It is so common for power converters to change DC bus voltage. Accordingly, it is necessary to verify that the NAGD can work well at different DC bus voltages. The DC bus voltage increases from 60V to 100V, and Value 60 330 10 10 100 5 60 10 Fig.7 U ds and U gs voltage waveform of NAGD at VCC=8V U ds and U gs voltage waveform of CGD at Udc=60V Fig.8 U ds and U gs voltage waveform of CGD at L d =112nH U ds and U gs voltage waveform of NAGD at Udc=60V Fig.9 Uds and Ugs voltage waveform of NAGD at Ld=112nH Y. Jiang et al.: A New Active Gate Driver for MOSFET to Suppress Turn-Off Spike and Oscillation the VCC maintains 8V. The gate-source and drain-source voltage waveform are shown in Fig.10 and Fig.11 under CGD and NAGD. It can been seen that the gate-source is raised to 3.201V, and the voltage spike amplitude decreases by 42.29% and the oscillation is suppressed effectively. In order to show the effectiveness of NAGD more intuitively, the drain-source voltage waveforms of the CGD and NAGD are compared when the parasitic inductance Ld = 60nH and the VCC=8V, as shown in Fig.12. Fig.13 shows the spectrum waveform comparison result of the drain-source voltage under CGD and NAGD. From Fig.12, it is known that the frequency of the drain-source voltage oscillation obtained by calculation is 50MHz. From Fig.13 it can be seen that the spectrum peak of the drain-source voltage is 51MHz, which is basically consistent with the frequency of the drain-source voltage oscillation. Compared to CGD, NAGD reduces the EMI 19.4dBμV caused by voltage spike and oscillation during turn-off. The amplitude of the spectrum is effectively reduced from 30MHz to 80MHz. Simulation results show that NAGD has a good effect on the suppression of EMI in high frequency. Fig.10 Uds and Ugs voltage waveform of CGD at Udc=100V Fig.11 Uds and Ugs voltage waveform of NAGD at Udc=100V Fig.12 Comparison of U ds between CGD and NAGD Fig.13 5 47 Spectrum waveform comparison of U ds between CGD and NAGD Experimental verification The experiment platform of chopper circuit with inductive load is built to verify the effectiveness of the NAGD for the suppression of voltage spike and oscillation, as shown in Fig.14 The setting of experimental parameters is consistent with the simulation. The gate-source and the drain-source voltage waveform are shown in Fig.15 and Fig.16 when the VCC is 0V and 5V. It can been seen that the gate-source voltage is raised to 2.7V, the drain-source voltage spike amplitude decreases by 27.27%, and the oscillation is suppressed effectively. Compared to Fig.16, the VCC in Fig.17 is increased from 5V to 8V. It can been seen that the gate-source voltage increases from 2.7V to 3.6V and the voltage spike decreases by 7.28%, which proves that under the threshold voltage, the higher the gate-source voltage is, the better the suppression effect of voltage spike and oscillation will be. This section is used to verify that the NAGD can work well in large parasitic inductance. The parasitic inductance Ld is increased from 60nH to 112nH. The gate-source and drain-source voltage waveform are shown in Fig.18 and Fig.19 under CGD and NAGD. Fig.14 Fig.15 Experiment platform of chopper circuit U ds and U gs voltage waveform of CGD at U dc =60V 48 Chinese Journal of Electrical Engineering, Vol.4, No.2, June 2018 Time(200ns/div) Fig.16 Uds and Ugs voltage waveform of NAGD at Udc=60V Time(200ns/div) Fig.20 Uds and Ugs voltage waveform of CGD at Udc=100V Fig.21 Uds and Ugs voltage waveform of NAGD at Udc=100V Time(200ns/div) Time(200ns/div) Fig.17 Uds and Ugs voltage waveform of NAGD at VCC=8V Time(100ns/div) Fig.18 Uds and Ugs voltage waveform of CGD at L d =112nH 6 Conclusion In order to solve the problem of voltage spikes and oscillations caused by the high frequency switching of MOSFETs in power electronic converters, the NAGD is proposed to suppress voltage spikes and oscillations in the turn-off process. The simulation and experimental results show that under the threshold of the gate voltage, the higher the gate voltage is, the better the suppression effect of voltage spike and oscillation will be. At the same time, for higher parasitic inductance and bus voltage, not only can voltage spike and oscillation be effectively suppressed, EMI at high frequencies can also be effectively suppressed. In addition, the control of the NAGD is simple and requires fewer additional components, which is beneficial to the realization of the circuit. References [1] Time(100ns/div) Fig.19 Uds and Ugs voltage waveform of NAGD at Ld=112nH It can been seen that the gate-source voltage is raised to 3.201V, and the voltage spike amplitude decreases by 44.87%, which proves that the NAGD can still suppress the voltage spike oscillation effectively under large parasitic inductance. Fig.20 shows the gate-source voltage and drainsource voltage waveform under CGD when the DC bus voltage is increased from 60V to 100V. The voltage spike amplitude is 134V with a certain oscillation. Fig.21 is the gate-source and the drain-source voltage waveform with the VCC being 8V and other parameters consistent with Fig.20. 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Li, and J. Shi, "Active closed-loop gate voltage control method to mitigate metal-oxide semiconductor field-effect transistor turn-off voltage overshoot and ring," IET Power Electronics, vol. 6, no. 8, pp. 1715-1722, 2013. P. R. Palmer, and H. S. Rajamani, "Active voltage control of IGBTs for high power applications," IEEE Transactions on Power Electronics, vol. 19, no. 4, pp. 894-901, 2004. X. Yang, Y. Yuan, X. Zhang, and P. R. Palmer, "Shaping high-power IGBT switching transitions by active voltage control for reduced EMI generation," IEEE Transactions on [27] [28] [29] [30] 49 Industry Applications, vol. 51, no. 2, pp. 1669-1677, 2015. T. Cui, Q. Ma, P. Xu, and Y. Wang, "Analysis and optimization of power MOSFETs shaped switching transients for reduced EMI generation," IEEE Access, vol. 5, pp. 20440-20448, 2017. H. C. P. Dymond, D. Liu, J. Wang, J. J. O. Dalton, and B. H. Stark, "Multi-level active gate driver for SiC MOSFETs," IEEE Energy Conversion Congress and Exposition, 2017, pp. 51075112. Y. zhang, Y. L. Yun, and B. Li, "Research on optimization of MOSFET driving based on dynamic power source," Transactions of China Electrotechnical Society, vol. 28, no. 12, pp. 269-275, 2013. L. Shu, J. Zhang, F. Peng, and Z. Chen, "Active current source IGBT gate drive with closed-loop di/dt and dv/dt control," IEEE Transactions on Power Electronics, vol. 32, no. 5, pp. 3787-3796, 2017. Yanfeng Jiang was born in Anhui province, China, in 1993. He received the B.S. degree in electrical engineering from North University of China, Taiyuan, China, in 2017. He is currently working toward the M.S. degree in electrical engineering at the School of Electrical Engineering, Beijing Jiaotong University, Beijing, China. His current research interests is electromagnetic compatibility in power electronics. Chao Feng was born in Shanxi province, China, in 1993. He received the B.S. degree in electrical engineering from Taiyuan University of Technology, Taiyuan, China, in 2016. He is currently working toward the M.S. degree in electrical engineering at the School of Electrical Engineering, Beijing Jiaotong University, Beijing, China. His current research interests is electromagnetic compatibility in power electronics. Zhichang Yang(S’15) was born in Chifeng, China, in 1991. He received the B.S. degree in electrical engineering from Beijing Jiaotong University, Beijinng, China, in 2013, where is currently working toward the Ph.D. degree in electrical engineering in the School of Electrical Engineering. His current research interests include power electronics, electromagnetic interference, and chaos control and its applications. Xingran Zhao was born in Hebei province, China, in 1994. She received the B.S. degree in electrical engineering from Beijing Jiaotong University, Beijing, China, in 2016. She is currently working toward the M.S. degree in electrical engineering at the School of Electrical Engineering, Beijing Jiaotong University, Beijing, China. Her research interest is simulation and modeling of wide band gap power devices. Hong Li (S’07-M’09-SM’18) received her B.Sc., M.Sc., and Ph.D. degrees from Taiyuan University of Technology, South China University of Technology, and FernUniversität in Hagen, Germany, in 2002, 2005 and 2009, respectively. Currently, she is a Professor of Electrical Engineering School, Beijing Jiaotong University, China. Her research interests include nonlinear modeling, analysis and its applications, EMI suppressing methods for power electronic systems, wide band gap power devices and applications. She is Associate Editor of IEEE Transactions on Industrial Electronics, Associate Editor of the Chinese Journal of Electrical Engineering, Vice Chairman of Electromagnetic Compatibility Specialized Committee in China Power Supply Society. She has published 1 book, 30 journal papers, and 39 conference papers. She has also applied 20 patents.