ELEC2104!–!SEMESTER&2" Microelectronic*Circuit*Elements* Diodes"and"Transistors"are"nonlinear"devices"and"form"the"basic"microelectronic"circuit"elements."" Circuit*Element* Description* Diodes* • Allows"current"to"flow"only"in"one"direction" • Forms"basis"of"voltage"limiters,"voltage"doublers,"half= wave"and"full=wave"rectification" • Forms"basis"of"most"digital"and"analogue" microelectronic"circuits"" • Either:"Bipolar(Junction(Transistors((BJT)("and" Complementary(metal–oxide–semiconductor((CMOS)( Transistors" * Transistors* • Equation* BJT$Equation:$ Used"in:"switches,(logic(gates,(flipAflops,(amplifiers,( opamps" $ $ CMOS$Equation:$ " BJT* " * * CMOS* " Domains*of*Processing*and*Circuit*Analysis*Review* Information"is"stored"in"terms"of"voltage"and"current"in"electric"circuits:" • Digital*circuits:"voltage"or"current"is"either"ON"or"OFF"==>"Information"is"represented"as"1s"and"0s"" • Analog*circuits:"voltage"or"current"is"present"at"continuous"levels"" " Continuous"Amplitude"(CA)"versus"Discrete"Amplitude"(DA)" Continuous"Time"(CT)"versus"Discrete"Time"(DT)" DTDA:"Digital"signal" processors"and"computers"" • Digitization"of"amplitude"makes"circuit"insensitive"to"analogue"imperfections" such"as"tolerance,"matching,"and"noise."" • Requires"sampling"in"the"time"domain"leading"to"aliasing" CTCA:"Amplifiers,"RF"front= end"of"mobile"phone" • Does*NOT"require"time"sampling"and"does"not"suffer"from"aliasing,"" • SENSITIVE"to"tolerance,"matching,"and"noise" DTCA:"Digital"camera"and" switched=capacitor"filters" • Suffers"from"both"aliasing"and"sensitivity"to"tolerance,"matching"and"noise" CTDA:"Spike=based"signal" processing"(human"brain)"" • Eliminates"aliasing"and"maintains"advantages"of"amplitude"quantization" • Research"area"for"electronic"devices" " Circuit*Elements:* Passive*Elements:* ! Unable"to"amplify"or"generate"energy""" ! e.g."resistors,"inductors,"capacitors"&"diodes" ! Able"amplify"or"generate"energy" ! Allow"us"to"amplify"or"switch"the"information"stored"in"voltage"or"current" ! e.g."independent"voltage/current"sources,"dependent"voltage/current" sources,"transistors"&"rectifiers"" * Active*Elements:* * " Linear*Versus*NonJLinear*Networks* Linear$circuit$elements"are"components"that"have"a"linear"relationship"between"current"voltage."(i.e."do"not"change"with" the"level"of"voltage"or"current)" Non:linear$circuit$elements"do"not"have"a"proportional"output."[A(light(bulb(filament(is(a(nonAlinear(resistor.((Increasing( the(voltage(applied(to(a(light(bulb(past(a(certain(point(will(not(make(the(light(any(brighter.((This(also(prevents(the(light( bulb(from(burning(out(too(quickly.] Example:"Compute"the"input"impedance"for"the"circuit"shown"below:"" " " " " " " " " " " Semiconductor*Physics* Solid=state"electronics:"Circuits"and"devices"are"built"out"of"solid"materials"(rather"than"vacuum"tubes)"" Physics*Overview:* The"electrons"in"an"atom"have"different"energy"levels,"called"atomic" orbitals""" The"energy"levels"are"really"waves,"represented"by"a"wavefunction,"which" indicates"where"electrons"are"allowed"to"be.""" " " Put"electrons"in"a"solid"and"you"get" gaps"in"the"quantized"energy"levels:" called"a"‘Band"Gap’."" " " Conductor*(metal)* SemiJMetal* SemiJconductor* Insulator* * * * Overlap*between* conduction*and*valence* band* * Small*Band*Energy*Gap* *We(can(dope(both(materials(to(change(their(properties.(As(well,(with(semiAmetals(putting(them(under(pressure(can( change(the(band(overlap.(( " Semiconductors:* Difference(between(metals(and(semiconductors:( A"semiconductor"will:( • "increase"in"conductivity"with"an"increase"in"temperature"or"electric"field"strength"since"more"electrons"have" more"energy"to"cross"bandgap"to"enter"the"conduction"band"" • have"the"number"of"free"electrons"increase"exponentially"with"temperature,"overriding"the"effect"of"the" scattering" A"metal"will:" • decrease"in"conductivity"with"an"increase"in"temperature"since"the"lattice"structure"of"the"metal"vibrates"and" scatters"the"electrons."These"vibrations"are"called"phonons."" " ! * * Silicon*Covalent*Bond*Model* • Near"absolute"zero,"all"bonds"are"complete."All"electrons"are"sitting"in"the"valence"band"and"no"electrons"are"in"the" conduction"band"" " Electron"Hole"Pairs:" • Increasing"temperature"adds"energy"to"the"system"and"breaks"bonds"in"the"lattice."For"each"bond"that"is"broken,"an" electron"enters"the"conduction"band."This"leaves"a"hole"in"the"valence"band."" • When"an"electron"leaves"a"hole"in"a"bond,"another"electron"can"leave"a"bond"to"fill"that"vacancy"" • Hole"propagates"and"charge"is"moved"across"the"silicon"" " " Free"electrons"in"the"conduction"band"and"empty"holes"in"the"valence"band"are"called"charge"carriers."" Intrinsic*Carrier*Concentration:* Fermi*Level*of*Semiconductor:*No."of"electrons"in"conduction"band"="No."of"holes"in"the"valence"band"since"the"electrons" have"to"leave"the"valence"band"to"enter"the"conduction"band.* " Since"the"No."of"electrons"in"conduction"band"="No."of"holes"in"the"valence"band,""we"can"equate"n"="p,"hence:" " Note:* • Number"of"intrinsic"carriers"is"a"semiconductor"is"exponentially"related"to"the"band=gap"energy." • A"smaller"band=gap"means"more"carriers."" Carrier*Drift/Drift*Current* • An"electric"field"is"directional:"positive"charges"===>"negative"charges"" • When"an"electric"field"applied"on"a"semi=conductor,"a"force"is"exerted"on"electrically"charged"objects"given"by:" " • Drift"current"is"the"result"of"the"movement"of"charged"particles"when"an"electric"field"is"applied"on"a"semiconductor"" " • At"low"E"fields,"carrier"drift"velocity"v"(cm/s)"is"proportional"to"electric"field"E"(V/cm)"by"the"mobility"m""" • Mobility"(µ)"is"a"measure"of"how"quickly"a"carrier"can"move"through"a"material"when"under"the"force"of"an"electric" field"and"is"determined"by"scattering" Hole"mobility"<"electron"mobility" • Hole"current"is"the"result"of"multiple"covalent"bond"hops." • Electrons"can"move"freely"about"the"crystal.""" Mathematically,"we"write:"" • " • vn and"vp ="electron"and"hole"velocity"(cm/s),"" " " µn"and" µp"="electron"and"hole"mobility"(cm2/V.s)"" " • Carrier"velocity"cannot"increase"indefinitely."" • At"high"fields,"carrier"velocity"saturates"because"of" scattering"and"this"effect"places"upper"limits"on"the" speed"of"solid=state"devices."" " Resistivity$and$Conductivity$ " Formulas*To*Remember:* Electron*Drift:* Hole*Drift:*" " " Resistance:*(R)" Resistivity:*(ρ)* " Conductivity:*(σ)* " " " " *Note:"n"="p"for"semi=conductors" Resistivity* " EXAMPLE:"Find"the"resistivity"of"intrinsic"silicon"at"room"temperature"and"classify"it"as"an"insulator,"semiconductor,"or" conductor."You"are"given:"" 10 3" • ni ="10 /cm at"room"temperature"" " 2 • µm ="1350"cm /Vs"" " 2 • µp ="500"cm /Vs"" " " " " " " " " " * EXAMPLE:"We"have"a"bar"of"pure"silicon"with"the"following"dimensions:" 1( µm(wide(x(1(µm(thick(x(1(cm(long( If"we"apply"a"6V"electric"field,"what"drift"current"will"be"present"in"the" material?"" " " " " " " More*Semiconductors:* Intrinsic/Extrinsic*Semiconductors* In"pure"silicon,"a"weak"insulator,"every"electron"that"is"excited"into"the"conduction"band"leaves"one"hole"in"the"valence" band""" no.$of$electrons$(n)(in(conduction(band(=(no.$of$holes$(p)(in(valence(band( To"increase"carrier"concentration"(i.e."make"it"a"better"conductor),"we"can:" 1) Increase*temperature"to"excite"more"electrons"into"conduction"band" 2) Use"light*energy* 3) Doping"==>"Adding"small"and"well=controlled"amounts"of"impurities"into"semiconductor"to"release"more"carriers," either"more(free(electrons"(donors)"or"more(free(holes"(acceptors)"whereby"the"semiconductor"material"remains" neutral"(no."of"protons"="no."of"electrons)" Doping"enables"us"to"vary"the"charge"carrier"density"to"change"the"resistivity"and"other"properties"of"the" semiconductor" " Semiconductor*Doping* NJType* Semiconductor* • Dope"with"Group"V"element"(e.g."P,"As)"with"5" valence"electrons"into"a"Si"lattice,"4"of"its"electrons" will"form"covalent"bonds"with"the"surrounding"Si" atoms"" • 5 "valence"electron"is"weakly"bound" • Energy"of"level"of"extra"donor"electron"(ED)"is"closer" to"conduction"band"(Ec)"than"valence"band"(about" 0.045"eV"for"phosphorous)" n">"p" Majority carrier = electrons • th " Result:"donor"electrons"move"up"to"conduction" band"more"easily" " PJType* Semiconductor* • Dope"with"Group"III"element"(e.g."B)"with"3"valence" electrons"into"a"Si"lattice,"its"electrons"will"form" covalent"bonds"with"3"of"the"surrounding"Si"atoms" • 4 "Si"atom,"there"will"be"a"hole"where"no"electron"is" bound"" • Donor"atoms"have"unfilled"covalent"bonds"with" energy"state"EA,"which"is"closer"to"EV"(about"0.044" eV"for"boron)" • Result:"valence"band"electrons"move"up"to"acceptor" sites"more"easily"to"form"covalent"bond"pairs" n"<"p" Majority carrier = holes th Note:$$ " • Majority"carrier"="carrier"with"the"larger"concentration" • Minority"carrier"="carrier"with"the"smaller"concentration" " " Compensated* Semiconductor* • Semiconductors"doped"with"both"n=type"and"p=type" dopants" • If"ND >"NA,"there"are"more"ND donor"levels."The" " " donor"electrons"fill"the"acceptor"sites."" • The"remaining"ND ="NA"electrons"are"available"for" " promotion"to"the"conduction"band" " " • Acceptors"and"donors"can"fill"energy"levels" introduced"by"doping" • Compensation"decreases"mobility"" Important*to*Remember:* For"both"intrinsic"and"extrinsic"(doped)"semiconductors,"the"mass*action*law"always"holds:" pn = ni2 Also,"the"sum"of"all"charges"is"zero:"" p"+"ND ="n"+"NA" " Semiconductor* Equation* Practical*Doping*Level* NJType*Semiconductor* n"≈""(ND"="NA)" ND large"means"n"≈"ND" " true only if: ND >> NA and n >> p PJType*Semiconductor* p"≈"(NA"="ND)" NA large"means"p"≈"NA" " true only if: NA >> ND and p >> n 14 3( 21 3 *Typical(doping(ranges(are(10 /cm to(10 /(cm ( • Majority"carrier"concentrations:"independent*of* temperature"(over"practical"temp."ranges)."" • Minority"carrier"concentrations:"dependent*on*temperature" 2 since"proportional"to"ni " • Mobility"of"carriers"degrades"with"doping"because"the" impurities"can"cause"electrons"and"holes"to"scatter"as"they" move"through"the"semiconductor"" " " Diffusion*Current* • Diffusion"current"can"be"generated"by"varying"the"doping"concentration"and/or"the"doping"type"across"a"region"of" semiconductor"allowing"carriers"to"move"from"high"concentration"regions"to"low"concentration"regions" • It"is:" • o negligible"in"metals"due"to"their"high"conductivity" o dependent"on"diffusion"constant"and"concentration"profile" o the"movement"of"either"electrons"or"holes" " Einstein’s*Relation:"Links"diffusion"constant"+"mobility"through"thermal" voltage"(moves"carriers"without"E"field)" " " • Carriers"move"in"a"direction"towards"regions"of"lower"concentration"until"it" crashes"into"another"carrier"whereby"the"diffusion"current"densities"are" proportional"to"the"carrier"gradient" " " " Semiconductor* NJType* Semiconductor* Equation*for*Drift* Equation*for*Diffusion* " " Dn ≡ electron diffusion constant (cm2/s) " PJType* Semiconductor* " " Diffusion currents in the presence of a concentration gradient 2 Dp ≡ hole diffusion constant (cm /s) " Total*current,"due"to"each*carrier*component*(holes*&*electrons),"is"the*sum*of*the*drift*and*diffusion*current:" " Hence,"the"total*current"in"semiconductor,"which"accounts*for*both*hole*and*electron*components,"is:" " * * 15" 3 EXAMPLE:"Pure"silicon"is"doped"with"2"×"10 arsenic"atoms/cm ."What"is"its"resistivity"at"room"temperature?"You"are" given:"" • • µm ="1320"cm2/Vs"" " µp ="460"cm2/Vs"" " * * * * * * DIFFUSION*CURRENT:*EXAMPLE*#1* What"is"the"electron"diffusion"current"density"at"room"temperature"for" the"following"region"of"silicon"if"the"electron"mobility"is"350"cm2/Vis"and" WB ="0.5"cm?"" " " * * * * DIFFUSION*CURRENT:*EXAMPLE*#2* What"will"the"total"current"be"at"x=0"if"we"apply"a"20V/cm"electric"field"to"this"same" material?"" The"electric"field"is"oriented"so"that"it"is"pointing"towards"x=0."" " " " " " " " "