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N OT
MEASUREMENT
MVF
MIL-STO -1D5E
10 MAY 1989
SUPERSEDIN G
MIL-STD-1D5D
29 APRIL
1963
MILITARY’ STANDARD
SAMPLING
PROCEDURES
AND TABLES
FOR INSPECTION
BY AITRIBUTES
I
AMSC
~~.
N/A
AREA
A p prove d
for
public
rele ese;
dlstrlbutlon
is
Q CIC
unlimite d.
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MIL-STO-1O5E
DEP~
OF DEFENSE
Washington,EC 20301
SN-lPL13K
PRKEDUWS AND TABLESFOR INSPECTIONBY ~
1. ‘his militarystaxiardis approvedfor use by all Ceprwmts
of * ~t
of Mf==e.
and Agencies
2. Ikneficial ~ts
(recmmmdations,additions,deletims) and any
prtinent data whiti may be of use in inprovingthis documnt shouldbe
addressedto:
Ccmmnder
Us. Army Armment Researdn,Develop-rent
and
Enginerinq Center
ATIN: SKAR-BAC-S/BldcJ
.6
PicatinnyArsenal,NJ 07806-5000
by using &“ self-addressed
Standardization
~t
(ODForm 1426) am=ring at the md of this dommnt
ii
-r ovww.ntProposal
or letter.
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MII-S’ID-105E
‘ItLis
p.blitationprovidez.sampliqproceduresand referene tables for use in
planningand conductinginspectionby attributes. ‘Thesamplingconceptis based
on the prokbilistic reaxrente of eventshhen a seriesof lots or Mxhes are
prtducedin a stableenvimrmmt.
‘Mis publicationshouldix used to guide the user in the rk?velqzwntof an
~ion
strategythat prmides a cost effectiveq+math to attw
amfidmm
in prcchxtanpliance with con-~actualtechn.iral
rquimmnts.
Tne
user is wrned of the asmmxl risks relativeco *
rhozen sanplesize ad
MKMili@
~ifications should~t ~t~
requmrents
.”
for use of wfic
ssIIQling
plans, nor shouldthey provideAQL’s or Ll?D’sas a requimmnt.
Sal@ing plans for continuous,ratherthan lot ~ion,
are containedin
MllAIV-1235, “’Single
and Mlci-Level ContinuousSanplingPmcedxes and Tables
for Inscectionby
.
Attrihxes”.
iii
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MIL-STC-105E
——..
Paragraph
1.
SCOPE...............................................
1.1
1.2
2.
-se
....................................-.”.”-”
A@ication .......................................
REmwKED
2.1
3.
3.1
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
3.10
3.11
3.12
3.13
3.14
3.15
3.16
3.17
3.18
3.19
3.20
3.21
3.22
3.23
4.
4.1
4.2
4.3
4.4
4.4.1
4.4.2
4.4.3
lxKuMmrs.................................
1
1
1
Non applicable
....................................
1
DEFIMTICMS
................... ......................
1
_t*leCmlity-1
(ML) ....................
AverageCutgoi.rq@a.lity
(~) ....................
AverageGutgoingQualityLimit (=L) .............
Classification
of Defects.........................
CriticalDefect...................................
CriticalDefective
...........:....................
Cefect............................................
Defective
..........................................
DefectsPer Hul@redun.its
.........................
Inspection.
.......................................
..........................
Inspectionby Attributes
I_ctor Bat* ......................................
I.mor EatchSize.................................
Major Defect......................................
Major Defective
...................................
Minor Defect......................................
MinorEefective.
..................................
PercentDefective
..........................
........
P-ss
Average...................................
Sanpl e....
........................................
Sa@e SizeCede Letter...........................
san@ing Plan.....................................
Unit of Prcdmt...................................
GmJ=m~s
-------------------------------
WrittenProcedures
................................
Noncunformnm ....................................
Formtirm and Identification
of lots or Batches...
...............................................
ML
AQL Use...........................................
Limitation
........................................
Chasing ins.................. ...................
iv
2
2
2
2
2
2
2
3
3
3
3
3
3
3
3
3
3
4
4
.4
4
4
4
4
4
4
5
5
5
5
5
.,
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mL?S’m-lo5s
C@m2?l’s - C Q ntinue d.
q
Pa.ragra@
4.5
4.5.1
4.5.2
4.5.3
4.6
4.7
4.7.1
4.7.2
4.7.3
4.7.4
4.8
4.9
4.9.1
4.9.2
4.9.3
4.9.4
4.10
4.10.1
4.10.1.1
4.10.1.2
4.10.1.3
4.10.1.4
4.10.2
4.11
4.12
4.12.1
4.12.2
5.
Table
sa71Qlhg
.........................................
Representative
Sanding....
......................
Tim20f S.a@@ .................................
~&irrP&tiple
Saupling
......................
............................
.SwitchiqP~
.............................
Mxm.lco
Tightened............. .................
Ti@tened to Norml ..............................
Noz-mlto Famed ................................
Reducedtot+xm.l..
.............. ................
DkxmtinuationofI
nspection. ...................
San@ing Plans...................................
~ion==l..
................... ............
Clxk?l.ettera
.....................................
Maining sanplin Golan.........................
TYF=of*l%l
Plens..........................
Determination
ofkxeptabi.lity.
...................
PercentDefectiveInspection..
...................
SingleSa@ingP lab........... ..................
CoubleSamplingPlan.............................
tiltipleSa@ingP lab.......... .................
Sp2CialProce&re for RdweclIr
section. ....... .
D!2fects
Per HuI@redUnits In.sp3ction.
.............
L.imiting
Omlity Protectkn..
. ...................
...........................................
-t%-=-i=ic
~
..................
AverageSa@e Size Curvea.:.....................
5
:
5
6
6
6
6
6
6
7
1
7
7
7
8
8
8
8
8
t!
9
,9
9
9
9
TABLES...............................................
11
San@e SizeCede I.etters
.........................
Shgle SenpMng Plans for Nonm.1
~ion
Mster table)....................:.
SingleSaWMng Plans for Tight&
InspectionMaster table)......................
SingleSanpM.ngPlans for Reduced
Irqection (M3stertable)......................
CoubleSamplingPlans for Normal
~ion
043stertable)......................
CuubleSanplingPlans for Tightened
~ion
(Mastertable)......................
CoubleSa@ing Plans for Reduced
I~ion
(Masterteble)......................
13
I.
II-A.
II-B.
11<.
III-A.
III-B.
III-C.
v
14
15
16
17
18
19
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MTL-S’IC-105E
CcNIENrs - Cclnthuled
.
Table
IV-A.
M.dtipleSapling Plans for Nornksl
~im
(~ert~le) ................... ...
IV-B.
MiltipleSamplingPlans for Tightened
Inspection(Msstertable)......................
Iv-c.
l@.ltiple
S.an@ingPlans for Reduced
~im
(Msstertable)......................
V-A.
AveragzDutgoingQualityLimit FacLorsfor
Normal ~ion
(Stiglesampling)
............
V-B.
Average@tgoing @ality Limit Factorsfor
TightenedIn-ion
(SingleSan@ng) .........
\T-A.
Limittig(Xality (inPercentDefective)for
which a Pa = 10% (forNormal ~ion,
Singlesanplti g).............................
LimitingQuality (inCefectsper Hundred
VI-B.
Units)for which the Pa = 10% (forNormal
~im,
Stigle Sa@ing) ...................
VII-A.
limiting@it y (inPercentDefective)for
which the Pa = 5% (forNormsl I.nsp?ction,
Singlesanplin g).............................
Ltitk.g CMality (inDefectsper Hundred’
VII-B.
Wits) for whiti the Pa = 5% (forNormsl
~ction,
Si.ngle*ling) ....................
Limit Nun&rsfor P&ducaiInspection.
............
VIII.
AverageSa@e Size Cumes for Doubleand
Ix.
tWltipleSampling...............................
Sa@ing Plans and ~rating Characteristic
Curves (andData) for:
X-A.
Sa@e SizeCc& I.etter
A........................
X-B.
San@e SizeCode b?tterB........................
x-c.
SanpleSizeCa5e LetterC...:....................
X-D.
San’ple
SizeCcxieLetterD........................
X-E .
Sa@e SizeCede LetterE........................
X-F.
San@e SizeCede LetterF........................
x-G.
Sa@e SizeCo& LetterG........................
X-H.
San@e SizeCode I.etter
H........................
X-J.
San@e SizeCock LetterJ........................
X-K.
SanpleSizeCcrZeI.etter
K........................
X-L.
San@e SizeCo& LetterL........................
x-M.
Sa@e SizeCcck LetterM........................
X-N.
San@e SizeCode Lectern........................
x-P.
SanpleSizeCode LetterP........................
x-Q.
San@e S$zeCmie IetterQ........................
X-R.
San@e SizeCock LetterR........................
vi
20
22
24
26
27
28
29
/
30
31
32
33
34
36
38
40
42
44
46
48
50
52
54
56
58
60
62
64
/’
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MR-.5TD-1OSE
)
CmnENrs
- amnued.
~
x-s .
Sa@e
Size Cc@e Letters.......
.................
66
PanCJraph
6.
6.1
6.2
6.3
twnzs............................................
61
IntendedUse...................................
SubjectTezm (keywozd) Listing................
67,
_fmp=viousIs
:
sue.,.
...............
...
aNmlDIrK tamRIAL ..............................
vii
68
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W*1OSE
AND TAEES
sJueLIK P~
FCR lNSP~ICM BY ATmmlm2S,
1. -DE
1.1 Purpose. ~s publicationestablisheslot or batch sanplingplans ad
prcesiuresfor inspectionby attributes.‘mis @limtion shall not be “inter
me Wrds
pretedco ~
or am flictwith any contractualm@xwmtS.
‘Bae”’, “~”,
“~tile”,
etct refer ~y to ~
~tr~o~s
use of
theqling
plarscontainedin thisstandard ~donotitrplym
agre9mntby
the @vernmm
to Saept any prcduct. Eeterndnationof acceptabilityby the
GOVS17X~ Shallk as &scri&d in amtrectual doam-ems. me San@ing plans
describsdin this standsd are S@iable
to A(2L’sof .01~rcent or higherand
are thereforenot suitablefor a@i~tions where qualitylemls in the &fective
parts p millioprange can be realized.
1.2 lwl:~$.
ML not lmt
San@ing plans &signat.e3in this publi=tion are eppli~le,
, to impection of Ule follcwing:
a. Fml itens.
c. *rations or services.
d. Materialsin pmmss.
e. Su@ies
in storage.
f. Maintenanceqerstions.
9. Data or remrds.
h. Adniniszrative
procecbres.
lWse plans are intendsd primsrilyto M used for a continuingseries of 10CS
or bat-.
l?h2plans my also be used for the inspectionof isolatedlotsor
bacchss,but, in this lattercase, the user is cautionedto consultthe qx3rSting
characteristic
cumes to finda plan wh.itiwill yield the &sired protection
(Sse4.11).
2. PEm@Km
IxnMNcs
‘
2.1 Not ~licable.
3. DEFINITI@JS
,,
1
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mL-s’Imlo5E
3.1 AcceptableCualityLevel (ML). m
a continuousseriesof lots is
considered,the AQL is the qualitylevelwhich, for the purpses of sanpling
inspection,is the ltit of a satisfactory
processaverage (See3.19).
Nc7rE:A sanplingplan and an AQL are tisen in accordaro?with the risk assunsd.
Use of a value of AQL for a ~ain
defector group of defectsindicatesthat the
s~ling Pl~ till athe -t
~joritY of @
lots or batP**
processaveragelevel of percat &fective (ordefectspar hundredunits)in these
lots or batchesbe no greaterthanthe designatedvalue of AQL. Tnus, the AQL is
hurdredunits) for which
a desiqaatedvalue of p2rcentdsfective(ordefects~
lotswill be acceptedITOStof the tfi by the sapling prcedure being used. The
aanplingplans providedhereinare so arrangedthat the prdability of acceptance
at the designatedAQL value deps!nds
upon the sanplesize, ~ing 9enerallYhi~er
for large s.snples
than for smallones, for a givenAQL. The AQL done does not
identifythe chancesof accqZing or rejectingindividuallots or batchesM nure
directlyrelatesto what mightte exp+ctedfran a seriesof lots or batches,
providedthe steps indicatedin this publicationare taken. It is necessarYto
referto the ~ating
&aracteristiccurve of the plan to deterndnethe relative
risks.
3.2 Average GutgoingGuality (AD2)
. For a particularprocessaverage,the 7@ is
the averagequalityof o~tgoingprcductincludingall acceptedlots or batches,
plus all reject+ lots or bat&es aftertinerejected’
lots or batcheshave keen
effectively100 ~rcent irqxcted and all defective replacedby non-rkf
ectives.
3.3 Average cXIt90ing
C?JdityLimit (ACQL)
. TheJKX)Lis the n-axhrnAD2 fora
given a~ptance Sa@ing plan.Factorsfor -t
ing AD2L VS1= ~ 9iven in
TableV-A for each of the singlesapling plans for normal inspectionand in
TableV-B for earh of the singlesanplingplans for tightenedinqection.
3.4 Classification
of Defects. A classification
of defectsis the emneration Of
Pssible defecLsof the unit of prcductclassifiedaccordingto their seriousness.
3.5 Criti& Eefect. A criticaldefect is a defectthat jud-t
and experience
indicatewould result in hazardousor unsafeconditionsfor indivitialsusing,
maintaining,or ciqendingupon the product,or a defectthat judgmt
ard
~rien=
indimte is likelyto prevent~rformsne of the tacticalfunctionof a
major end item such as a ship, aircraft,tank, missile,or spacevehicle.
3.6 CriticalDefective. A critid defectiveis a unit of productwhich
containsone or mre criticsldefectsand nay also concainIMjor and/or&or
defects.
3.7 ,~fe.
A defect is any nonconformance
of the unit of productwith
ef~d
requirements.
2
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MIL-mlosE
3.8 Cefectiw. A defectiveis a unit of procbctwhid containsone or nure
defects.
3.9 Defectspr Hundr@5Units. Ibe nurberof defectsper hundredunits of any
givenquantityof units of productis one hundrd tires .ttienu-&erof tkfects
anltainedtherein (oneor nure defems bsing ~ssible in any unit of product)
dividedby the total nunbsrof tics of product,i.e.:
Defectsper
lmldredunits
.
Nun&r of defects x 100
Nun&r of units impe@sd
3.10 -ion.
Inspectionis the protessof mssuring,
or ~se
~in9
the tit of prtckm with the requirsfmts.
,
, testing
3.11 ~on
Whersby
by Attributes
. ~ion
by atcri.butes
is ~on
“
eitherthe uruc of prcduct1s classifiedsinplyas defectiveor non-defective,
or
the rnm&r of defectsin the unit of prcductis wunted, with respct to a givz2n
~~t
or set or rqi~ts.
3.12 LOK or Batd. The term lot or batch shallnean “inspectionlot”or
“’-Lion
batch-,i.e.,a collectionof units of productfrom which a sapie
is to be drawn and irspsctedad ray differ fran a collection
. . of unitsdesignatd
. .. . .
..
as a..La—..—.
or oacm ror ouer pupses (e.
g., prooucuon, snqnent, etc.).
3.13 E
or Bst~ Size. The lot or batch size is the nunberof unitsof prcduct
in a lot or batch.
3.14 Msjor Defect. A mjor defect is a &fect, otherthan critical,that is
likelyto result in failure,or to A=
mterially the usabilityof the unit
of prcduct for its intendedprpose.
3.15 N!ajorCefective. A mjor defectiveis a unit of prtductwhich containsone
or mre msjor *fects, and ray also containminor defectsbut containsno critical
defect.
3.16 minor Defect. A minordefect is a defectthat is not likelyto reduce
materiallythe usabilityof the unit of praiuct for its intendedpupose, or is a
-=
frm establiah05stmhrds littlebearingon the effectiveuse or
qeration of the unit.
3.17 Minor Defective. A minor defectiveis a unit of productwhi& containsone
or nxxe minor defectsbut mains
no critid or m jor defect.
3
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MIL-STD-105E
3.18 PercentDefective: The percent&fective of any given quantityof units
of productis one hundredtk
the nun-her
of defectiveunits of prcductcontained
thereindividsdby the totalrnnnker
of unitsof product,i.e.:
PercentDefective
=
Nwber of defective x 100
Nun&r of units inspected
3.19 Pnxess Average. The p-ss
averageis the averageprcent defectiveor
averagenu&er of defectsper hundredunits (whitiever
is .s@icable) of produ~
subnittedby the sqplier for originalinspection.Original~ion
is the
first inspectionof a particularquantityof prcductas distinguishedfrcanthe
-tiion
of PrOdUCttiti has keen resuhn.itted
afterprior rejection.
3.20 Sanple. A .sa@e consistsof one or !mre units of prduct drawn fra a lot
or batti,the units of the sanplebeing selectedat rancbnwithoutregardto their
quality. The ntnrberof units of productin the sa@e is the sa.nple
size.
3.21 SanPle Size Cede Letter. The sanplesize code letter is a deviceused
alongwith the AQL for locating’
a sanplingplan on a table of san’pling
plans.
3.22 SanplingPlan. A sanplingplan indicatesthe nunber of units of prcduct
fran each lot or batti whi& are to be inspscted(sanplesize or seriesof
sa@e sizes) and the criteriafor *tennining the acceptabilityof the lot or
batti (arreptanm and rejectionn-rs) .
3.23 Unit of Product. The unit of productis the thing inspsctedin orderto
as defedive or non-defectiveor to count the nunber
determineits classification
of defects. It nBy be a stiglearticle,a pair, a set, a length,an ~,
an
opsratia, a volm, a ccsrponent
of an end product,or the end prcductitself.
The unit of prcductIMY or nBy not k the sam as the unit of pur&ase, aqply,
production,or shipt.
4.1 WrittenProcedures. Writtenproceduresare o~ily
develo@ and mde
availablefor the ~t
representative’s
review,upon request. Wnen the
writtenp~
indicateuse of this stadard, they Shall DYl@y with the
~S
of this standardand referenceappropriateparts as necY2s.SaZy.
4.2 Nonconfonnanm. The extentof noncnnfonrance
of product shallbe exprersed
either in terms of percentdefective‘orin termsof defectsper hundredunits.
4
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FKL+TW105S
4.3 Forrnatian
ad Ick!ntif
irationof &s or Batches. The prcductshallb
fiablelots,sublets,batches,oriniuti other mrun2ras
asssn’bled
into icknt.i
may b? prescribed. Each lot or Mtch shall,as far as is practicable,consist
of units of productof a singlet~, grack,class,size, and crqosition,
manufactureduncisressentially
t.& sane ainditians,and at essentiallyt& saue
tim . Tis310tsor bstchesshallbei&ntified bytheamtractor andshall be kept
intactin i@quate and suitablestoragespace.
4.4 —
AQL.
4.4.1.AQL use. ‘Me AQL, tqsther with the Sa@e
~
-1*
Plm provi&d hareixl.
Size Co& b?tter,is LEA for
4.4.2 Limitation. The sele&n or use of an AQL shallnot iK@y that the
contractorhas t& rightto sqply any &fective.unit of produa.
DifferentAQ1.sray be chosen for gruupsof &fects
Ziis%%%%%iy,
or for indivicha.1
&fects. An AQL for a group of &f_
my Ix chosen in ackiition
to AQIa for individualdefects,or s@roups, within
that gfoup. AQL valussof 10.0 or less way be eqxassed titherin prcent
defectiveor in defectspsr llundrqdt5; those over lo.o shallbeeqress@k
defectsper hundredunitsonly.
4.5 San@inq.
4.’5.1@xesentative C3tratif
ied) SallQlinq
. When ~ropriate, the nunterof
units in the sanpleshallEe selectedin ~rtim
to the size of subletsor
Su&bStCkS, or parts of the lot or hat*, identifiedby m
rationalcriterion.
When reprasentatives.a@irq ia used,the units frm eati -lot, s&-batdl or
part of the lot or batd shall& sel~”.edat randan.
4.5.2 Tine of SamJ1inq A .sanplemy be drati after all the units culprisiirq
tk lot or batch have &en assmlsd, or aanpleunitsmay be drawn duringassenbly
of the lot or batch, in whiticase the size of the 10C or batti will be determined
&fore any ample units are drawn.If tl-e.5an@eunits are drawn during~ly
of the lot or htti, and if ths rejectionnun&r is reachedbeforethe lot *
Cnl@eta
that pxtian of the lot alreadyclxlpleted
shallbe rejected. m
cause
of the defectiveprcductal
be determinedand wrrective actiontaken,after
which anewlotorbatch~h
begun.
4.5.3 Lhuble or FldtipleSaq3Ml-q hhen double or multiplesanplingis to be
Ussd, Sach sarpleshallbe selecttiover the entire lot or batch.
5
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MIL-S’ID-1O5E
Inspection P~.
Normal~ion
will ke used at the start of
Normal,tightenedor reducedimpction shall continueunchangedfor
~ion.
each classof defectsor defective on succf2ssive
lots or batchesexceptwherethe
P~
s~l
switdd.ngpmcedums given below require&ange. The tit-9
be a@ied to each class of defectsor defective independently.
4.6
4.7 switdimq Procedures
.
4.7.1 Normalto Tightened. When normalinspction is in effect,tightened
~ion
shallbe institutedwhen 2 out of 2, 3, 4, or 5 consecutivelots or
bat&es have been rejettedon originalinspction (i.e., ignoringresutxnitted
lots
or batchesfor this procdure)4.7.2 Tigirtemdto Normal. When tightenedin-ion
is .tieffeet,normal
~ion
shallEe institutedwhen 5 consecutivelots or batcheshave been
consideredaceptable on origti inqection.
to Reduced. t?nennormalinspectionis in effect,reducedinspection
shallke institutedprovidedthat all of the followingconditionsare satisfied:
4.7.3 Nod
preceding10 lots or bazches“(ormore, as indicated by the note to
a. T’FIS
TableVIII) have been on norrnslinspectionand all have been acepted on origha.1
~ion;
and
The total number of *f ectives (ordefects)in *
samles frm the
pm&”
10 lots or batde.s (orsuti onmber as used for conditim “a”
amve) is qua.1 to or.less than the appliwble n-r
gi- in Table~11. If
doubleor mltiple san@ing is in use, all sanplesinspectedshouldte ticluded,
not “first”sanplesonly; and
c. Productionis at a stezdyrate; and
d.’ Reducedinspectionis consickreddesirable.
to Nor&l. men reducedinspectionis in effect,norml inspection
shallbe institutedif any of the followingoccuron originalinspction:
4.7.4 RducA
a. A lot or batch is rejected;or
b. A lot or batch is cmsidered acceptableunder the proceduresOf
4.10:1.4,or
c. Productionkecmes irregularor delayed;or
d. Other conditionswarranttit normal in~~~ion
6
shallbe instituted.
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~-S’ID-105E
4.8 Discontinuation
of Inspect
ion. If the cumnul.atimrnnrber
of lots mt
a~~
in a sequenceof mnsecutive lots on originaltightened~ion
reachesfive,the acqxanoe pmcedums of this sllamlard
shallbe dismntilnled
.
~ion
w
e
p~sions of this stmdard shallnot be resumeduntil
correctiveactionhas teen taken. TigthenedinspecU“onshall thenteusdasif
4.7.1had keen invciked.
~.
4.9
mg Plans. .
4.9.1 Inspectionlevel: me inspection
“
level&termines the relationship
ketu=en
the lot or t.atchsize and the ssnplesize. mehsp2ction levelto be used for
. -Y Particuk Ze@mnent till be as prescribedby the mmractor’s written
prceddres. l?ireeirqection levels:I, II, and III, are given in TableI for
genemiluse (s&4.1). Normally,InspectionEvel II is used. However,
Inspectionml
I my & used when lessdiscrimination
is needsd,or I.@_dIII
my * used for greauerdiscrimination.Four additionalsfeciallevels:
S-1, S-2, S-3, and S-4, are given in the dam table and my ~ used khre
relativelysm.11 sanplesizesare ~sary
and large sanplingrisks~ or rust
be tolerated.
In the selectionof inspectionlevelsS-1,co S-4, ~
rust be ex-~ised to
avoidAQ1.sincnnsist4ntwith +ase impection levels. In”othsrwords,the purpsa
of the special ~ion
“
levelsis to keep sanplessmll wtiennem.ssary. For
~=,
tb5 CO& letterSun&r S-1 go no furtherthan D, equivalentto a Si.@e
sampleof size 8, but it is of no use to -Se
S-1
if tha AQL is 0.10 peromr for
wfi~ the mininnmsampleis 125.
NYIE:
~
4.9.2 ~
~ters.
Ssnplesizes are &signatej by-tzxb?letters. Table I shall
be used to find the applicablecode letterfor the ~icu.lar lot or batdlsize
ad the prescrikesl
irqection level.
4.9.3 Cbta.Wq SanplingPlan. ‘lk AQLandthe cods lettershall be usedto
obtainthe sartpling
plan .&m Tables II, 111, or IV. Wnen no smpling plan iS
am.ilablefor a given combinationof AQL and co& letter,the tablesciinxZthe
user to a differentletter. Tne San@esize tokusd
is given bythenewade
letter,not by the originalletter. If this p~
leads to differentsanple
sizes for differentclassesof defems, the cede letteraimespmdq
to *
_
~le
size -ie
my ke used for all CI.SSSCS
of ckfeci.s.k an
alternativeto a singlesanplingplan with an a~
nurr&rofo, the plan
nm&r
of
1
with
its
cor~
ly
largersanple
size for a
witi m ~
-igqated AQL (whereavailable),may be used.
Downloaded from http://www.everyspec.com
MIL-S’ID-1OSE
4.9.4 Typ2S of SalIpling
Plans. Threet~s of sanpltigplans: Single,Eooble,
and mltiple, are given in TablesII, III, and IV, respectively.When several
typesof plans am2 availablefor a givenAQL and code letter,any one my ke used.
A decisionas to type of plan, eithersingle,double,or nultiple,when amilable
for a givenAQL and ccxieletter,willusyallyhe based upon the cmparison betthe administrative
diffim.ltyand the averagesanple sizes of the availableplans.
Tne averageaanplesize of mltiple plans is less than for double (exceptiri.
the
case correqmndingto singleacce@nce nmber 1) and both of these are always
less thm a singlesanple size (seeTable IX). Usuallythe ~Stiatim
difficultyfor single sanplingand the met per unit of the .san@eare less than
for doubleor multiple.
4.10 Determinationof ~
ability.
4.10.1 PercentDefectiveInspection. To determineacceptabilityof a lot or
batchunder perrsmtdef=hive inspection,
the a@icable sanplingplan ehallbe
used in accordancewith 4.1O.1.1,4.10.1.2,4.10.1.3,and 4.10.1.4.
4.10.1.1 SingleSaq3ltig Plan. The nunbarof sampleunits inspectedshallbe
equalto the ~le
size givenby the plan. If the number of defective found in
the sanpleis equal to or lessthanthe acceptancenumber,the lot or bst@ Shall
be considereda-ptable.
If the nunkerof defective is equal to or greaterti
the rejectionnunbr, the lot or batti shallbe rejected.
4.10.1.2 DoubleSap 1’
q Plan. A n-r
of sanpleunits equal to the first
sanplesize given by the plan shallk ~ed.
If the numberof defective
foundin the first eanple is equalto or less than the first accqtanm number,
the lot or bat~ shall be mnsidered acceptable. If the nuntxr of defective
foundin the first .san@e is equalto or greaterthan the first rejectionrmbert
the lot or batti shall be rejected. If the nmber of defective found h the
~irstsmple is ketweenthe firstaccqtane and rejectionnumbers;a second
smple of the same size shallbe insp3cted. The nurber of defective found in
the firstand second sanplesshallM acnnmlated. If the cumlative nmber of.
defective is equal to or less thanthe secondaqane
number,the lot or batd
shall* mnsidered acceptable. If the emulative nunter of defective is W
to or greaterthan the ae.mndrej-ion nunber,the lot or batch shall&
rejetted.
4.10.1.3 ~tiple Sanple Plan. Undermltiple sapling, the proedure shall m
similarto that specifiedin 4.10.1.2,exceptthat the nmber of suassive
sanplesrequiredto reach a ckcisionmy be as many as seven.
4.10.1.4 ~al
Procedurefor -cd
Irqectim. Under tied
insp52tion,the
Swim
P~
~Y terminatewithouteitheracceptanceor rejectioncriteria
hatig teen mt. In these circmstantes,the lot or batch will k considered
a~able,
but normal impsction will k reinstatedstartingwith the nx
lot or
batch (See4.7.4.b).
8
Downloaded from http://www.everyspec.com
MIL+3IW1OSE
“ ity of a
4.10.2 Oefectsp
HundredUnits Inspect
ion. To determinet+? a
~~fid
lotorbatch un&r*fectspsr hundredunits inspection,the promdum
for permnt defective inSpettiM
aiwve
shall& used, exceptthat the word
“defects”shallk substitutesfor “Ck!fectives”
.
wity
Protection.IIY2~hg
plans W ~a~
P~
-s publimtion =
&signed for use where the units of productare
~XG
in a continuingseriesof lots or batchesover a period of tim2.‘Mouemr,
if the lot or batcA is of an isolatedrbstum,it is cksirableto limitthe
se.kcdon of sanplingplansto those,associatedwith a dsal~t~
_ ~~1
~t
prcmt& not less than a specifiedlimitingqualityprotection. Ssnplingplans for
this PUZFOSScm * seksed by -sing
a Limiting~ity
(UD - a ~’s
risk to te associatedwith it. TablesVI antiVII give values of LQ for the
the Cxmnnly used comumr’s risks of 10 percentand 5 ~t
respectively.If a
differentvalue of comunT#s risk is rquired, tk O.C. curves ardtkirtilatedvalues my be use5. Tmmncept ofmmlyalsobe usem
inspacify+lgthe
AOL and I~im”
Levelsfor a seriesof lots or bat-s, thus fixingndsumnn
.sanple
size where there is Sam reason for avoiding (~fi mm ~
a 9i=
mnsmer’s risk)ITCIre
than a limitingproportionof &fecti(orc@f~s) in -Y
singlelot or batti.
4.11 Limiting
4.12 Curves.
for
4.12.1 @crating maramsristic cumes. ‘me oparating~eristic
~
norml irqection, shown in Table X,
mte the percentageof lots or batdes
whichmay be enp2rtedto be arceptedunder the variousSS@ing plans for a given
proa?ssquality. T& mrves ahcnm are for singleSa@ing; cumes for dmble and
mlciple ssa@ing are retchedas closelyas practicable. The O.C. ~
for AOLs greaterthan 10.0am based on the Poissondistributionad are a#icable for defectsper hundredunits inspe&cion;those for AQLs of 10.0 or less and
~le
SiZeS of 80 or 1=s are based on the binonialdistrilmtim ad are
qlirable for permnt defectiveinspection;those for ~
of 10.0 or less @
sa m ple sizes largerthan 80 are based the Poissondistributionand are S@icable
eitherfor defectsp3r hurdredunits ~ion,
or for parent defective
-on
(* poissm -him
being an adequateapproximation
to the
to
binmual distributionunderthese mnd.itiona)
. Tabulatedvalues,~
4-4
VS-hIasor pmbabiliciesof ~anm
(pa,in percent)are given for eati
Ofthealrvee shown,m
in addition,for tighten@ inspection,h
for ~f~
p2r lnmiredunits for AQIs of 10.0 or less and San@e sizes of 80 or 1-.
4.12.2 Awsraqe~le
SizeCumes. AverageSan@e Size C@FSS for =le
and
multipleaa!plingare in Table IX. These show the averagesamplesizesuhirhmy
be ~ed
to ocmr underthe variousaanplingplans for given levelsof prcKJ2SS
quality. lhe curvesassureno curtailrmntof insertion arslare ~roximte to
the extent that they are baseclupon tttePoissondistribution,and that the Sa@e
sizes for doubleand mltiple aanplingare assuredto be O.631n and O.25n
~itiY,
tie n is the equim.km qle
size.
9,
Downloaded from http://www.everyspec.com
MIL-STD-105E
=ICN
5
TABI&SANDmInlES
11
c
c
s
so
1200
3203
. to
to
to
to
10
10
to
to
to
10
10
md
26
51
91
1s1
281
sol
iml
3?0)
lmol
3s001
Isoool
S00301
over
Woooo
IW303
mooo
Imoo
S30
280
1s0
93
A
D
D
II
c
c
B
B
D
B
A
A
A
to
15
16
0
s. I
la
,
aim
to
bmb
2
cu
9
lxx
“fABLE
t
E
E
0
IJ
II
G
G
F
F
E
D
D
c
E
.0
“c
o
u
A
A
s-3
c
c
c
B
D
D
A
A
A
s-2
level,
!ipecid
i.qwcdon
Jizecode /eflers
1’— .$amph
II
J
G
II
K.
J
1
N
N
N
u
n
o
P
N
P
N
N“
K
L
1!
L
L
J
K
N
G
G
J
G
F
E
F
E
E
K
G
F
o.
D
F
E
c
c
E
1)
c
0
c
u
111
c
.C
B
A
II
hwda
0
A
A
I
Inspection
D
A
A
S-4
Gencr81
(see4.9.1ad 4.9.2)
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1:1,
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14
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-
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TIGHTENED
k
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B
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.
6
table)
(see
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ad
4.9.4)
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=
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TABLE
0
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lulde)
(see 4.9.3
and
I
4-9.41
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MULTIPLE
TIGHTENED
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AOQL
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5
8
13
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125
21m
315
500
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I250
2000
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32
50
80
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Sample
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0,29
D.27
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0.73
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—
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).46
D,53
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1.43
0.78
1,8
0,67
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—
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),59
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3.84
1.1
1.2
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2.0
—
—
2.77
0.94
—
1.2
I .3
1.7
—
2.0
4,5
l..
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1.0
1.2
1.5
1.9
2.1
2,7
3.1
6.9
0.65
1.4
1.6
1.9
2,4
2,9
3.3
4.3
4.8
11
Level
0,40
Acceptable Qu.lity
2.3
2,5
3,1
3.7
4.6
5.4
6.5
7.6
16
1.0
/or which Pa
Single sampling)
0,1( 0.15 0.2
—
—
—
—
1.49
I .2
0.06
—
0.04
—
Inspection,
Quality (in@rcent dejectiue)
(jor Normal
VI-A — Limiting
0.0100.01 0,02
—
—
TABLE
=
.
3.5
4,0
4.9
5.9
7.4
0.2
10
12
25
].:
10 Percent
30
36
41
68
6.:
—
14
19
—
16
22
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