Time Dependent Physics of Single Surface Multipactor by Multiparticle Monte Carlo Simulations Asif 1. Motivation 2. Single Surface Multipactor Susceptibility Geometry = πΈ!"$ sin ππ‘ + π + π½πΈ!"$ sin πππ‘ + π + πΎ πΈ# = normal electric field π· = relative strength of the 2nd carrier mode πΈ = relative phase of the 2nd carrier mode π = ratio of the two carrier frequencies [need NOT be an integer] π = initial angle of electron flight π£$ = initial velocity π = impact angle Dual frequency susceptibility boundaries "π × ππ¦ππ±π/πππππ "π/π π· = π, π = π, Relative phase πΈ is kept constant over time [4] ππ«π [ππ/π¦]× π/ππππ³ John a,b Verboncoeur , Peng a Zhang 3. Multiparticle Monte Carlo (MC) Model Ø Multipactor [1,2] is a nonlinear phenomenon in which an electron avalanche driven by a high frequency rf field sustains itself by an exponential charge growth through secondary electron emission from a metallic or dielectric surface Ø Avoiding multipactor is a major concern for high power microwave (HPM) sources, rf accelerators, and space-based communication systems Ø Study of the time-dependent physics [3] offers a better understanding of the multipactor dynamics Ø Multipactor susceptibility on a single dielectric surface for two carrier frequencies [4] of the rf electric field is significantly different from that of single carrier frequency Ø RF fieldà πΈ!" a Iqbal , Ø Previous MC models§ Single particle approach: Simple implementation [1,2] § Variable number of particles approach: Better statistics in growing discharge [3] Ø Multiparticle MC model§ large number of macroparticles § number of macroparticles kept fixed § charge in the impacting macroparticle changed and normal electric field updated at each impact § less costly implementation than variable number of particles approach, better statistics than single particle approach § time intervals between subsequent bounces of particles on the surface calculated exactly 4. Simulation Results Single frequency temporal study Ø Single rf frequency operation: "π × ππ¦ππ±π /πππππ "π/π Ø Multipactor susceptibility boundaries depend on the relative strength π½ and relative phase πΎ of the second carrier mode Ø The dependence of susceptibility boundaries on relative phase πΎ is not as prominent as shown in ref [4] Ø The conclusions of ref [4] about the trend of this dependence remains valid Square-shape rf field Ø For π!" = 1πΊπ»π§, normal surface field (πΈ# ) saturates without oscillation Ø For π!" = 10πΊπ»π§, prominent glitches appear in the πΈ# curve when rf field switches between positive and negative levels 5. Conclusion Ø For the dual frequency mode of the rf electric field, the saturation level and oscillation pattern of the normal electric field change from those of the single frequency mode Ø These changes are due to the modification of the rf envelope and the susceptibility boundaries of the dual frequency mode Ø Normal field profiles have been studied for square wave rf field at different rf frequencies 6. Future Work Ø Normal surface field (E# ) and secondary electron emission (πΏ) oscillates at twice the rf frequency [3] in steady state. Ø At saturation, πΏ%&' = 1 Dual frequency temporal study π½ = 1, πΎ = 0, π = 2 Ø Temporal study for different combinations of relative strength π½, relative phase πΎ and frequency ratio π for dual frequency operation Ø Temporal study for different non-sinusoidal rf waveshapes Ø Study of multi-frequency operation 7. Reference π· = π, π = π, Relative phase πΈ evolves with time ππ±[ππ/π¦]× π/ππππ³ 4. Simulation Results (continued) Ø Temporal profiles of normal surface field (E# ) and secondary electron emission (πΏ) oscillates at four times the fundamental rf frequency, with πΏ%&' = 1 at saturation Ø Saturation level of normal surface field (E# ) higher than single frequency operation Ø Instantaneous E# stays at a lower value for longer duration during an rf period [1] R. A. Kishek and Y. Y. Lau, Phys. Rev. Lett. 80, 193 1998. [2] L. K. Ang, Y. Y. Lau, R. A. Kishek, and R. M. Gilgenbach, IEEE Trans. Plasma Sci. 26, 290 1998. [3] H. C. Kim and J. P. Verboncoeur, Physics of Plasmas 12, 123504 2005. [4] Asif Iqbal, John Verboncoeur, and Peng Zhang, Physics of Plasmas 25, 043501 2018. Work was supported by AFOSR MURI Grant No. FA9550-18-10062, and in part by an MSU Foundation Strategic Partnership Grant. (a) Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, USA (b) Department of Computational Mathematics, Science and Engineering, Michigan State University, East Lansing, MI 48824, USA Email: iqbalas3@egr.msu.edu johnv@egr.msu.edu pz@egr.msu.edu