Course Outline 1 1. Chapter 1: Signals and Amplifiers 2. Chapter 3: Semiconductors 3. Chapter 4: Diodes 4. Chapter 5: MOS Field Effect Transistors (MOSFET) 5. Chapter 6: Bipolar Junction Transistors (BJT) EE 3110 Microelectronics I Suketu Naik 2 Chapter 6: BJTs Part I EE 3110 Microelectronics I Suketu Naik 3 Learning Objectives 1) The physical structure of the bipolar transistor and how it works. 2) How the voltage between two terminals of the transistor controls the current that flows through the third terminal, and the equations that describe these current-voltage relationships. 3) How to analyze and design circuits that contain bipolar transistors, resistors, and dc sources. 4) How the transistor can be used to make an amplifier EE 3110 Microelectronics I Suketu Naik Introduction 4 BJT (Bipolar Junction Transistor) bipolar junction transistor BJT was invented in 1948 at Bell Telephone Laboratories Ushered in a new era of solid-state circuits It was replaced by MOSFET as predominant transistor used in modern electronics Still used today in Emitter-Coupled Logic (ECL): very fast logic integrated circuits EE 3110 Microelectronics I Suketu Naik 5 Comparison: MOSFET and BJT BJTs are more robust: can operate in severe environmental conditions Popular in discrete design Good performance at very high frequencies (GHz range*) High current driving capability BJTs are not symmetrical: EBJ (emitter to base junction) is fixed and can only be operated in specific way BJTs have lower 1/f (flicker noise) but higher thermal noise * These devices are called Heterojunction Bipolar Transistors (HBT); they have high MOSFETs have to be tailored for harsh environments: not common Popular in IC design Significant parasitic effect at very high frequencies Low current driving capability MOSFETs are symmetrical: source and drain are interchangeable MOSFETs have higher 1/f (flicker noise) but lower thermal noise gain and low noise at frequencies in the order of several hundred GHz EE 3110 Microelectronics I Suketu Naik 6.1. Device Structure and Physical Operation 6 Figure 6.1. shows simplified structure of BJT BJT consists of three semiconductor regions: emitter region (n-type) base region (p-type) collector region (n-type) Operating mode depends on biasing active mode – used for amplification cutoff and saturation modes – used for switching EE 3110 Microelectronics I Suketu Naik 6.1. Device Structure and Physical Operation 7 NPN PNP EE 3110 Microelectronics I Suketu Naik Mode of Operation Amplifier Mode EBJ CBJ Cutoff Reverse Reverse Active Forward Reverse Saturation Forward Forward EE 3110 Microelectronics I 8 Suketu Naik 6.1.2. Operation of the npn-Transistor in the Active Mode 9 Active mode is most important Two external voltage sources are required for biasing to achieve it Figure 6.3: Current flow in an npn transistor biased to operate in the active mode. (Reverse current components due to drift of thermally generated minority carriers are not shown.) EE 3110 Microelectronics I Suketu Naik Current Flow 10 Forward bias on emitter-base junction will cause current to flow This current has two components: 1) electrons injected from emitter into base 2) holes injected from base into emitter. First of the two (e flow from E to B) is desirable. This is achieved with heavy doping of emitter, light doping of base. EE 3110 Microelectronics I Suketu Naik Current Flow 11 Emitter current (iE) – is current which flows across EBJ Flows “out” of emitter lead Minority carriers – in p-type region. These electrons will be injected from emitter into base. Opposite direction Because base is thin, concentration of excess minority carriers within it will exhibit constant gradient EE 3110 Microelectronics I Suketu Naik 6.1.3. Structure of Actual Transistors 12 Collector virtually surrounds entire emitter region. This makes it difficult for electrons injected into base to escape collection. Device is not symmetrical. As such, emitter and collector cannot be interchanged. Device is uni-directional. EE 3110 Microelectronics I Suketu Naik np ( x )concentration of minority carriers a position x (where 0 represents EBJ boundary)np 0 np 0 thermal-equilibrium value of minority carrier (electron) concentration in base regionnp 0 vBE voltage applied across base-emitter junctionnp 0 VT thermal voltage (constant)np 0 (eq6.1) np 0 np 0 evBE / VT 13 Straight line represents constant gradient. EE 3110 Microelectronics I Suketu Naik Current Flow Concentration of minority carrier np at boundary EBJ is defined by (6.1). Concentration of minority carriers np at boundary of CBJ is zero. Positive vCB causes these electrons to be swept across junction 14 np ( x )concentration of minority carriers a position x (where 0 represents EBJ boundary)np 0 np 0 thermal-equilibrium value of minority carrier (electron) concentration in base regionnp 0 vBE voltage applied across base-emitter junctionnp 0 VT thermal voltage (constant)np 0 (eq6.1) np 0 np 0 evBE / VT EE 3110 Microelectronics I Suketu Naik Current Flow Tapered minority-carrier concentration profile exists. It causes electrons injected into base to diffuse through base toward collector. As such, electron diffusion current (In) exists. 15 AE cross-sectiona area of the base-emitter junction q magnitude of the electron charge Dn electron diffusivity in base W width of base dnp x (eq6.2) In AE qDn dx dnp 0 (eq6.2) In AE qDn W this simplification may be made if gradient assumed to be straight line EE 3110 Microelectronics I Suketu Naik 16 Current Flow Some diffusing electrons will combine with holes (majority carriers in base): since Base is thin, however, and recombination is minimal Recombination does, however, cause gradient to take slightly curved shape EE 3110 Microelectronics I Suketu Naik The Collector Current It is observed that most diffusing electrons will reach boundary of collector-base (CBJ) depletion region. Because collector is more positive than base, these electrons are swept into collector (even though concentration profile reduces) Collector current (iC) is approximately equal to In. iC = In 17 (eq6.3) iC IS evBE / VT AE qDn np 0 saturation current: IS W AE qDn ni2 (eq6.4) IS W NA ni intrinsic carrier density NA doping concentration of base AE = Cross sectional area of EBJ q = electron charge Dn = electron diffusivity into base W = width of base ni = intrinsic carrier density NA = doping concentration in the base = number of acceptor atoms=number of holes EE 3110 Microelectronics I Suketu Naik The Collector Current 18 Magnitude of iC is independent of vCB As long as collector is positive, with respect to base Saturation current (IS) – is inversely proportional to W and directly proportional to area of EBJ Typically between 10-12 and 10-18A Also referred to as scale current EE 3110 Microelectronics I Suketu Naik The Base Current 19 Base current (iB) – composed of two components: transistor parameter iB1 – due to holes injected from base region i into emitter. (eq6.5) iB C iB2 – due to holes that have to be supplied by external circuit to replace those recombined. Common-emitter current gain () – is IS v / V (eq6.6) iB e influenced by two factors: width of base region (W) relative doping of base emitter regions (NA/ND) High Value of thin base (small W in nano-meters) lightly doped base / heavily doped emitter (small NA/ND) BE EE 3110 Microelectronics I T Suketu Naik The Emitter Current 20 this expression is generated through combination of (6.5) and (6.7) 1 1 (eq6.8/6.9) iE iC IS evBE / VT All current which enters transistor must leave. iE = iC + iB iC (eq6.10) iC iE this parameter is reffered to as common-base current gain (eq6.11) 1 , (eq6.13) 1 I (eq6.12) iE S evBE / VT EE 3110 Microelectronics I Suketu Naik Large Signal Models: Active Mode 21 Positive vBE causes iC (exponentially relation ) to flow in the Collector for vCB > 0 In active mode, collector behaves as a constant-current source Base current, iB = iC /β Emitter current, iE = iC /α ; α = β/ (β + 1 ) ≈ 1 Collector current iC = Is ev /V BE T Note: α = common-base current gain and β = common-emitter current gain EE 3110 Microelectronics I Suketu Naik 6.1.5. The pnp Transistor EE 3110 Microelectronics I 22 Suketu Naik pnp: Large Signal Models in Active mode EE 3110 Microelectronics I 23 Suketu Naik 6.2.1. Circuit Symbols and Conventions 24 Active Mode EE 3110 Microelectronics I Suketu Naik Table 6.2 EE 3110 Microelectronics I 25 Suketu Naik 6.2.2. Graphical Representation of Transistor Characteristics 26 Figure 6.15/16: (left) The iC-vBE characteristic for an npn transistor. (right) Effect of temperature on the iC-vBE characteristic. Voltage polarities and current flow in transistors biased in the active mode. EE 3110 Microelectronics I Suketu Naik 6.2.3. Dependence of iC on Collector Voltage – The Early Effect 27 When operated in active region, practical BJT’s show some dependence of collector current on collector voltage. As such, iC-vCB characteristic is not “straight”. EE 3110 Microelectronics I Suketu Naik 28 Large Signal Models with the Early Effect Figure 6.18: Large-signal equivalent-circuit models of an npn BJT operating in the active mode in the common-emitter configuration with the output resistance ro included. EE 3110 Microelectronics I Suketu Naik 29 Figure 6.19: Common-emitter characteristics. (a) Basic CE circuit; note that in (b) the horizontal scale is expanded around the origin to show the saturation region in some detail. A much greater expansion of the saturation region is shown in (c). EE 3110 Microelectronics I Suketu Naik 30 6.1.4. Operation in Saturation Mode For BJT to operate in active mode, CBJ must be reverse biased: active mode operation of npn-transistor may be maintained for vCB down to approximately - 0.4V CBJ will conduct once vCB < - 0.4 V: Saturation Saturation Mode: iC reduces, β reduces, iB increases EE 3110 Microelectronics I Suketu Naik 31 6.1.4. Operation in Saturation Mode ISC collector current (eq6.14) : iC IS evBE / VT ISC evBC / VT in saturation region this terms plays bigger role as vBC exceeds 0.4V base current IS vBE / VT (eq6.15) : iB e ISC evBC / VT in saturation region Tunable current ratio iC (eq6.16) forced : forced iB saturation As vBC is increased, the value of is forced lower and lower. EE 3110 Microelectronics I Suketu Naik 32 6.1.4. Operation in Saturation Mode Two tests ⑴Is CBJ forward biased by more than 0.4 V (reverse biased by less than -0.4 V)? ⑵Is the ratio iC / iB less than β? EE 3110 Microelectronics I Suketu Naik 6.1.4. Operation in Saturation Mode 33 Two questions must be asked to determine whether BJT is in saturation mode, or not: Is the CBJ forward-biased by more than 0.4V? Is the ratio iC/iB less than ? EE 3110 Microelectronics I Suketu Naik Saturation Mode: simplified equivalent-circuit model EE 3110 Microelectronics I 34 Suketu Naik Exercises 6.1, 6.3, 6.11, D6.12 EE 3110 Microelectronics I 35 Suketu Naik