references - Shodhganga

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RESEARCH PUBLICATIONS FROM THIS THESIS
[1]
P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P.
Singh,“Wavelet Transform approach for Detection and Location of
Faults in HVDC System”, IEEE Region 10 colloquium and the third
ICIIS, Kharagpur, India, December 8-10, 2008, pp. 1-6
[2]
P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,
“HVDC transmission System fault Diagnosis and location using
Artificial Neural Networks” International Conference on Energy and
Environment, EnviroEnergy 2009, March 19-21, 2009, pp. 847851.
[3]
P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,
“Internal Fault Diagnosis of HVDC Converter Transformer using
wavelet Transform Technique”, 16th International Symposium on
High Voltage(ISH-2009), Capetown, South Africa, 24th – 28th Aug
2009. pp. 1611-1614.
[4]
P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,
“Classification of internal faults of a converter transformer using
Wavelet Transforms”, Third International Conference on Power
Systems (ICPS-2009), Kharagpur, India, 27-29 December, 2009.
(Accepted for oral presentation)
[5]
P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,
“Location of faults in HVDC converter transformer using wavelet
techniques”, TRAFOTECH-2010. Accepted for presentation
[6]
Pannala Krishna Murthy, J. Amarnath, S. Kamakshaiah and
B.
Murali Krishna, “Recognition of faults in HVDC system by wavelet
analysis” J. Curr.Sci. 12(1), (2008), Pp. 33-42.
409
[7]
P Krishna Murthy, J. Amarnath and B.P. Singh, “Reconstruction of
HVDC
Converter
Wavelet”,
Indian
Transformer
Electrical
Neutral
and
Current
Electronics
using
Gabor
Manufacturers
Association (IEEMA JOURNAL), JUNE 2009, pp.118-121.
[8]
P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,
“ANN
Based
Transformer”
Internal
Fault
International
Diagnosis
Journal
of
of
HVDC
Applied
converter
Engineering
Research (IJAER)" Vol.4 No.6, 2009, pp 867-876.
[9]
P Krishna Murthy, J. Amarnath, and S. Kamakshaiah, “HVDC
transmission line fault location using FFT analysis”, International
Journal of Applied Engineering Research (IJAER) Communicated.
410
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