The Online Journal on Electronics and Electrical Engineering (OJEEE) Vol. (2) – No. (3) Estimation of the Lifetime of Electrical Components in Distribution Networks M. Mamdouh Abd El Aziz, Senior Member, IEEE, Doaa Khalil Ibrahim, Member, IEEE and Hany Araby Kamel Electrical Power and Machines Department, Faculty of Engineering, Cairo University Abstract- The aim of this paper is to establish a reference system of the reliability models which may also be applied for different utilities. Due to the large amount of electrical equipments and the costs of an individual diagnosis in distribution networks, a life assessment of the representative electrical components is necessary. Several models are used to estimate the life time of each component but introduced model can estimate the life time for every component in general. The data of historical failure events from distribution networks is collected and evaluated in a special failure statistic and ageing phenomenology is taken into account. For such a purpose, the relationship between lifetime, electrical stress, mechanical stress and temperature as well as their effects on ageing processes and on reliabilities of electrical components are studied. A review of models of transformer and cables will be introduced for comparison. Keywords- ageing, failure statistic, lifetime, transformer, cable. I. INTRODUCTION In the liberalized market, an optimized asset management should consider the reliability of supply and other power quality aspects as well as the reduction of maintenance and capital costs, the key question is to find an acceptable balance between cost effectiveness and supply quality. Power system is composed of a number of components, such as lines, cables, transformers, circuit breakers, disconnectors etc. Every component in a power system has an inherent risk of failure. In addition, outside factors influence the possibility of component failure; e.g. the current loading of the component, damage by third parties (human or animal), trees and atmospheric conditions–temperature, humidity, pollution, wind, rain, snow, ice, lightning and solar effect [1]. It is often taken for granted that the lifetime of installed electrical equipment is less than 40 years [2]. The statistical failure rates rise over the years according to the increasing right wing of the well-known bathtub curve [3]. Models used for estimation life time are based on stress tests (electrical, mechanical, thermal) such as Arrhenius, Inverse Power models, loading cycle, analysis of furfurals, degree of polarization (DP) and the others are based on historical outage data and Markove model of mean time to first fail [410]. Proposed model is electro-thermo-mechanical life model Reference Number: W10-0002 derived from a suitable combination of single-stress models, e.g. the Inverse-Power- model and the Arrhenius model [11]. On the basis of the probabilistic approach, the application of special analysis is carried out; the fitted curves are only a mathematical simulation that is not concerned with any information about the technical parameters of electrical equipment and the operating conditions of networks, thus they can not give a complete understanding of the physical implications of failures. Extensive basic research work has detected the ageing phenomena and ageing processes of typical insulating materials under test or working conditions [12]. However, the experimental data can only describe sparse and incomplete ageing behaviors of electrical components in distribution networks. Therefore, a new approach should not only reflect and respond to the way electrical equipment fail but also deduce the failure consequences by connecting statistical data to durable evaluation models. II. PHENOMENOLOGICAL AGEING THEORY According to IEC, ageing can be defined as "irreversible deleterious change to the serviceability of insulation systems. Four types of parameters have been defined as ageing factors by IEC; temperature, electrical stress, mechanical stress, and environmental factors. When an insulation system is subjected to one or several of these ageing factors, deleterious changes will take place at certain rates characteristics for the particular combination of ageing factors. Models for thermal, electrical and mechanical stresses, singly applied, have been available as Arrhenius model for thermal stress: LT L0 exp(BT ) , T=1/ θ0-1/ θ (1) where LT is life time, B = AE /k, AE is the activation energy of the degradation process, k is the Boltzmann constant, θ , θ0 are the absolute and reference temperature and L0 is the life time at temperature θ0. The Inverse Power model for electrical stress is: LE=L0 (E/E0)-n (2) where E0 is the value of electrical stress below which electrical ageing can be neglected and failure under multistress conditions is the consequence of ageing produced by the other stresses, Lo is life for E = Eo and n is the voltage endurance coefficient for the inverse-power models.In the next sections, life models for two main electrical component: transformers and cables are introduced in details. 269 The Online Journal on Electronics and Electrical Engineering (OJEEE) Transformer fails due to insulation failures caused by pyrolosis (heat), oxidation, acidity, moisture, design and manufacturing errors caused by loose or unsupported leads, loose blocking, poor brazing, inadequate core insulation, inferior short circuit strength, foreign objects left in the tank, oil contamination, corrosive sulfur, carbon tracking, overloading, fire or explosion, line surge, maintenance /operation, flood, and loose connections [19-21]. Some models used for estimation of transformer life are [4-20, 21]: 1-Transformer insulation life according to IEEE standard: Beginning with the most recent IEEE Standard C57.911995 Per unit life 9.8 10 –18 e (15,000/(T _ hs 273)) (3) where 110 °C is the reference temperature (T_hs is the hotspot temperature) so for a reference temperature of 120 °C, 15,000/ T Per unit life 2.65 10 –17 e _ hs 273 (4) For older transformers with 55 °C average winding rise insulation systems with a rated hottest-spot rise over ambient of 65 °C and a 30 °C ambient, the reference temperature is 95 °C. The equations for per unit life are: Per unit life 2.00 108 e 15,000/(T _ hs 273) For IEEE C67115-1991 that assumes 110 reference: Log . life hours of life 13.391 6972.15 T _ hs (5) o C as instant t1 to time instant t2, in integral form or according to the expression (7) in a discrete form, depending on the featured measurement data are: L 1t 2 V .dt t t1 T 3- There is other models which simulate the ambient temperature as long-term temperature drift neglected method, long term temperature drift included and alternate approach for life estimation; that are used in the previous models of IEEE and IEC to estimate the elapsed life [8]. 4- Elapsed Life of Oil-Immersed Power Transformers (OIP) based on the DP (Degree of Polarization): 6 3 2 8 .8 _ hs 273 The more important byproducts of the processes leading to thermal degradation of OIP are carbon oxides (COx) and a class of hydrocarbons including what are called furans. The life model is [9]: In transformers constructed according to IEC 60076, the hot spot temperature, at which there is normal ageing rate equals 98 0C at nominal load and ambient temperature of 20 0 C. The relative ageing rate can be expressed in the following manner: HS 98 6 (7) where θHS is the hot spot temperature and V is the relative loss of life. The relative ageing, over a time period from time Reference Number: W10-0002 Hot spot 0C Figure 1: Ageing rate (pu.) depending on the hot spot temperature according to IEEE and IEC 2- Loss of Life with 55°C or 65°C winding rise according to IEC Standards [7, 9]: V 2 (8) 6 3 2 8 .8 _ hs 273 For the 55 C insulation systems T 1 N Vn N n 1 (6) 0 Log. life = 1 1 . 9 6 8 L where n is the number of each time interval, N is the total number of equal time intervals, Vn is relative ageing rate and t is time. The loss of life according to IEEE equals 180000 hours, and in the IEC standards the total loss of life is not defined, but it is usually mentioned that the transformer loss of life is 30 years. The difference existing in the dependence of the ageing rate on the hot spot temperature as shown in Figure 1. For ANSI/IEEE C57.91-1981, at 65 0C insulation systems: Log. life = 1 1 . 2 6 9 and Ageing rate (pu) III. LIFE MODELS FOR TRANSFORMERS Vol. (2) – No. (3) 1100 Elapsed life 20.5 ln DP year (9) The empirical formula given is based on an initial value of mean DP of about 1100, for a fresh transformer paper. 5- Emsley Method: This method concluded that a so-called ‘thermally activated’ kinetic process that can describe paper ageing as: 1 1 E A exp t DPold DPnew R (T 273) (10) 270 The Online Journal on Electronics and Electrical Engineering (OJEEE) where T is the temperature, E is the activation energy, A is a parameter depending upon the chemical environment, R' is the molar gas constant, and t is the elapsed ageing time. Here DPold and DPnew are, respectively, the DP-values after and before ageing period where the new paper will have a DP of about 1200. Ageing experiments approved that model is: 1 1 DPend DPstart 13350 Expected Life exp A 8760 T 273 (11) IV. LIFE MODELS FOR CABLES The majority of cable failures are mainly due to natural ageing of insulation, cable imperfections or water treeing. Other failure modes involve corrosion or damage to the concentric neutral and metallic ground shields, and the loss of good contact between metallic shield and the semiconducting shield. Some models used for estimation of life are: 1- Physical models: The search for physical models are based on the description of specific degradation mechanisms assumed as predominant within proper ranges of applied stresses. Such models are characterized by “physical” parameters that can, at least in principle, be determined by measuring directly physical quantities. Some examples of physical models are following [10, 14-18]: a. Field emission model. b. Treeing growth models which describe the treeing growth period and, thus, hold only during that period. Some examples are the models proposed by Bahder, Dissado and by Montanari. c. Thermodynamic models which are based on the concept of thermally-activated degradation reactions that are responsible for material ageing. They are Crine’s model, Electrokinetic Endurance (EKE) Model and Space-charge model. 2- Models with Full Size Cables as Zhurkov model and Arrhenius-IPM model. 3- VLF (voltage low frequency) Method: this model is used to estimate the remaining life of XLPE cable by VLF test [18]. V- LIFE ESTIMATION BASED ON FAILURE STATISTICS The introduced method is suitable for all electrical components but it requires practical information about the available failure statistic from distribution networks, and by using the electro-thermo-mechanical life model as following: Reference Number: W10-0002 Vol. (2) – No. (3) E L L0 E0 ( n bT ) M . M0 m .exp( BT ) (12) where E, M, T and L are electrical, mechanical, thermal stresses, and lifetime respectively. E0 and M0 are the scale parameters for the lower limit of electrical and mechanical stresses respectively (below which the ageing can be neglected) and L0 is the corresponding lifetime. n, m and B are the voltage-endurance coefficient, the mechanical stress endurance coefficient and the activation energy of thermal degradation reaction, respectively, b is the correct coefficient which takes into account the reaction of materials due to combined stress application. T=1/θ -1/ θ0. Where: θ and θ0 are the absolute and reference temperatures. The failure probability of an electrical component is expressed under the influences of ageing, electrical, and mechanical stresses as [11]: E ( n bT ) M m P (L ) 1 exp E0 M0 L BT e L0 (13) where α is the shape parameter; the probabilistic failure density f(t), the failure rate h(t) and the expected lifetime μ(L) can be determined by the failure probability P(L): (t ) d P (t L ) / dt (14) h (t ) d P (t L ) / [1 P (t L ).dt (15) (L ) Lf (L ) dL (16) 0 Table 1: Parameters of equation (13) B (K) 17000 M0(N/mm2) 10-4×2.4 b (K) 6000 E0 (kV/mm) 5.0 m 2.3 θ0(K) 298 n 7.0 L0(year) 4.5×104 In this case, the parameters of equation (13) are optimized at α = 1, θ = 25°C, E = E0 and shown in Table 2. Table 2: Parameters of equation (13) for random failure interrupter joint D-transformer VPE- cable 39 M0 39 M0 35 M0 31 M0 T-transformer housing paper-cable conductor 29 M0 29 M0 25 M0 23 M0 About 120.000 failure data of historical events in the special failure statistic from the year 1920 to 2005 is collected as shown in Table 3 [21]. 271 The Online Journal on Electronics and Electrical Engineering (OJEEE) Table 3: Failure statistics Table 5: Calculated results for each component Electrical Mech. random failure failure failure Component Failure location Overhead line Conductor 3% 64% 33% Paper-cable VPE-cable Joint Termination Housing D-transformer Interrupter CB T-transformer Disconnector 60% 35% 93% 96% 1% 32% 48% 9% 20% 4% 1% 1% 2% 1% 86% 48% 41% 85% 67% 94% 39% 64% 5% 3% 13% 20% 11% 6% 13% 2% Cable system Secondary substation Switchgear station Vol. (2) – No. (3) Component Conductor Paper-cable VPE-cable Joint Termination D-transformer Housing Interrupter CB T-transformer Disconnector Failure probability for 15 years 0.3 0.16 0.57 0.07 0.002 0.14 0.07 0.09 0.004 0.007 0.016 Failure probability for 30 years 0.54 0.57 0.88 0.58 0.49 0.53 0.24 0.31 0.44 0.39 0.64 Lifetime (year) 31 27.3 16 27.6 28.6 29.5 31 30 29.4 30 26.6 Component Conductor Paper-cable VPE-cable Joint Termination D-transformer Housing Interrupter CB T-transformer Disconnector α E M θ 8.1 8.2 6.6 4.5 9.2 9.9 9.3 13.3 8.3 11.6 7.1 2.6 1.3 1.5 1.3 1.3 2 1 2.1 2 2.2 1 22.5 1 1 1 1 7.4 22.5 7 7.2 6.8 24.2 25 60 60 60 60 40 25 40 40 40 25 The calculated failure probability for the above components for 15 and 30 years are introduced in Table 5 in addition to the estimated life time. The failure rate and failure probability of some components are shown in figures 2, 3. Time (year) Figure (2) The failure probability of D-Transformer, housing and interrupter D-transformer Failure rate = 1/ year Table 4: Parameters of equation (13) of different components Failure Probability Using tabulated parameters shown in Table 4 for E, M, α and θ of different components: conductor, paper-cable, VPEcable, joint, Termination, D-transformer, housing, interrupter, CB, T-transformer, and disconnector to calculate failure probability and estimated life time. Time (year) Figure (3) The failure rate of D-Transformer VI. THE EFFECT OF COOLING AND RELATIVE COST The thermal effect is the most ageing factor affects on the life of insulation material; IEC recommends absolute hot spot temperature not more than 98°C. 6°C deviations on the hot Reference Number: W10-0002 272 The Online Journal on Electronics and Electrical Engineering (OJEEE) spot will double the aging rate. In our electro-thermalmechanical model the temperature taken from statistical history for distribution transformers is 40oC which gives 29.5 years as an expected life time. If this temperature is reduced by 2oC will increase the life to 39 years by good cooling for transformer; also the well ventilation will lead to this result taking into account the cost of the cooling. The cost of 1000 KVA self cooled transformer is 23,640.00 $, the hot spot temperature 55oC, the average losses 9.1 kW. The ventilation required to conserve the temperature at 38oC is 2000 m3/hr from the cook book for indoor transformer ventilation. The fan used is SODECA HCD-40-4M, the cost of fan is 500.0 $ including the running and maintenance cost. Then: [4] The cost without cooling = 23,640.00/29.5 = 801.4 $/year [9] [5] [6] [7] [8] The cost with cooling = (23,640.00 +500)/39= 619 $/year The saving cost / year = 801.4-619= 182.4 $/ year. [10] [11] VII. CONCLUSION On the basis of the ageing mechanisms occurring in different materials, simple phenomenological and statistical reliability models are proposed in this work. The models provide a means of connecting physical and statistical processes of component failures. This approach appears to be a useful tool to assess the component reliability, as it can clarify how those consequences of failure result from different kinds of failure causes. The typical ageing of insulating materials in electrical components often contributes to the failure due to the presence of degradation stresses such as electrical, thermal, mechanical and environmental stresses. Therefore the ageing processes are transferred into a life model, which is represented by several models. In reliability calculations, the multi-model from the life model and the probabilistic model is applied to provide effective predictions for the lifetime. 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