GeoLas new 07.06.1999 14:11 Uhr Seite 1
L A S E R S Y S T E M
G M B H
AFFILIATED WITH LAMBDA PHYSIK AND JENOPTIK
GEOLAS
The High Resolution UV Laser
Ablation System for Element Analysis
of Geological Samples
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Excimer Laser Ablation System for ICP Mass Spectrometry
Laser Ablation Inductively Coupled Plasma Mass
Spectrometry (LA-ICP-MS) has become a powerful
technique for trace element analysis in solids,
especially for studies of geological samples.
Applications in LA-ICP-MS have demonstrated the
capabilities of UV wavelengths to improve the
ablation characteristics for reproducible and
accurate element determination. Especially the
excimer laser wavelength of 193 nm opens new
opportunities for the analysis of highly transparent
geological samples as fluorites and quartz. Other
minerals are as well ablated with controlled
characteristics.
GEOLAS ablates:
• Quartz
• Fluorites
• Apatites
• Calcite
• Zircons
• Clinopyroxene
• Orthopyroxene
• Olivine
• Garnets
GEOLAS is the most versatile instrument for geological analysis. The build-in petrographic microscope
(Zeiss, Germany) allows on-line observation of the
sample using reflected or transmitted light. Small
inclusions can thus be found easily and ablated
with unsurpassed spatial resolution and homogeneity. GEOLAS features:
• a very homogeneous beam profile
• high energy density
• adjustable pit size, independent on other
parameters.
• high magnification sample observation
GEOLAS offers the following advantages:
• strongly reduced fractionation
• homogeneous ablation over the whole area
• reduced matrix dependence of the ablation
GEOLAS has been designed and tested in a joined
effort by Professor Detlef Günther from the Swiss
Federal Institute of Technology (ETH) Zurich,
Switzerland, and MicroLas Lasersystem GmbH,
Göttingen, Germany. Its performance is proven
and has been described in several papers, as for
instance:
• D. Günther, R. Frischknecht, C.A. Heinrich, H.-J.
Kahlert, in „Capabilities of an Argon Fluoride
193 nm Excimer Laser for Laser Ablation
Inductively Coupled Plasma Mass Spectrometry
Microanalysis of Geological Materials“, J. Anal.
At. Spectrom. 1997, Vol 12, p. 939 – 944
• A. Audetat, D. Günther, C.A. Heinrich, in „The
Formation of a Magmatic – Hydrothermal Ore
Deposit: New Insights with LA-ICP-MS Analysis
of Fluid Inclusions“, Science 1998, Vol. 279,
p. 2091 – 2094.
• D. Günther, A. Audetat, R. Frischknecht, C.A.
Heinrich, in „Quantitative Analysis of Major,
Minor and Trace Elements in Fluid Inclusions
Using Laser Ablation - Inductively Coupled
Plasma Mass Spectrometry“, J. Anal. At.
Spectrom. 1998, Vol. 13, p. 263 – 270.
• D. Günther, R. Frischknecht, H.-J. Müschenborn,
C.A. Heinrich, in „Direct Liquid Ablation: A
New Calibration Strategy for Laser Ablation-ICPMS Microanalysis of Solids and Liquids“,
Fresenius J. Anal. Chem. 1997, Vol. 359, p.
390 – 393.
left: SEM picture of a „drill cascade“ using sequentially smaller aperture sizes to sample a 10 µm pit
about 100 µm below the sample surface.
right: 40 µm pit in NIST standard glass. The flat
bottom indicates a very homogeneous beam profile.
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The Systems
The Zeiss microscope with Schwarzschild objective (black tube) and sample
chamber. The homogenized laser beam enters from the rear.
The GEOLAS systems consist of the following main
modules:
• a specially developed optical beam forming
system
• a homogenizer for very high beam uniformity
• a variable aperture to adjust the pit size
• a Schwarzschild objective (GEOLAS 200
systems)
• an imaging doublet (GEOLAS 100)
• a specially modified petrographic Zeiss microscope (GEOLAS 200 systems)
• a CCD camera with a „long distance“ microscope objective (GeoLas 100)
• specially adapted sample chambers
• beam path cover with purging capability
Block Diagram of the GEOLAS 200
The excimer laser and the ICP mass
spectrometer are not part of the GEOLAS system.
Recommendations can be given. GEOLAS has
been designed to be combined with a Lambda
Physik COMPex 100 series excimer laser.
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System Specifications
GEOLAS 200 Q
GEOLAS 200 M
GEOLAS 100 M
application
high resolution local
analysis of highly transparent and other minerals
high resolution local
analysis of non – transparent minerals
medium resolution bulk
analysis of non – transparent minerals
energy density
up to 35 J/ cm2
up to 20 J/ cm2
up to 20 J/ cm2
pit size
4 – 120 µm
4 – 120 µm
30 – 300 µm
UV optics
18 x 18 element
homogenizer, Schwarzschild lens, attenuator,
beam path purge possible
9 x 9 element
homogenizer, Schwarzschild lens, attenuator,
beam path purge possible
telescope, doublet
projection lens, attenuator,
beam path purge possible
observation
through the Schwarzschild lens by CCD
camera and binocular,
microscope with reflected
and transmitted illumination
through the Schwarzschild lens by CCD
camera and binocular,
microscope with reflected
and transmitted illumination
CCD camera with „long
distance“ microscope
objective
sample chamber
2“ and 3“ diameter
2“ and 3“ diameter
2“ and 3“ diameter
layout
frame for laser, OEM
microscope and UV optics
mounted on table, optics
system covered up to the
microscope
frame for laser, OEM
microscope and UV optics
mounted on table, optics
system covered up to the
microscope
frame for laser, optics
table to mount UV optics,
optics system covered up
to the microscope
Worldwide Sales Representatives
Germany and Europe
USA
Japan
Lambda Physik GmbH
Hans-Böckler-Str. 12
D - 37079 Göttingen
Tel.: 0551 – 6938 -0
Fax.: 0551 – 6 86 91
Lambda Physik Inc.
3201 West Commercial Blvd.
Fort Lauderdale, Fl 33308, USA
Tel.: (954) – 486 – 1500
(800) EXCIMER
Fax.: (954) – 486 – 1501
Lambda Physik Japan Co., Ltd.
German Industry Center
1-18-2, Hakusan, Midoriku
Yokohama 226, Japan
Tel.: (045) 9 39 - 7848
Fax.: (045) 9 39 - 7849
MICROLAS LASERSYSTEM GMBH
ROBERT-BOSCH-BREITE 10
37079 GÖTTINGEN, GERMANY
AFFILIATED WITH
LAMBDA PHYSIK
AND JENOPTIK
TEL.: 49 - (0) 551 - 50559 - 0
FAX: 49 - (0) 551 - 50559 60
e-mail: Microlas@t-online.de
06/99
www.microlas.de