Think switching doesn’t matter much in your application?
Learn how high-speed, precision switching can make
a difference in your application.
Application:LLCR pin socket testing................................................... 2
solution:Switch/Multimeter Family............................................... 3
Application:Burn-in of switching power supplies................... 4
solution:Switch/DMM/Data Acquisition Systems.................. 5
Application:High speed semiconductor testing.......................... 6
solution:Semiconductor Switch Matrix Mainframes........ 7
Application:RF/microwave device testing....................................... 8
solution:Microwave Switch System.............................................. 9
Switch Mainframe Selector Guide....................................................... 10
INSIDE: Instant online access to:
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application: LLCR pin socket testing
Test low level contact resistance with confidence
Today’s CPUs draw more power, run at lower voltages, and have more pins than ever
before. With such large current draws, any significant contact resistance between the
CPU and the socket in which it’s placed can cause large voltage drops and excess heat,
rendering the CPU inoperable. Ensuring minimal contact resistance in sockets demands
thorough Low Level Contact Resistance (LLCR) testing. LLCR testing involves sourcing
low-level currents (1nA to 100mA) across the contacts being evaluated and measuring the
resulting voltage drop (typically just microvolts), so a high quality voltmeter is essential Each test on a socket is performed between two test pins, one of which acts as the HI
to obtain accurate readings. Learn more.
terminal of the DUT while the other acts as the LO, so the system must route the HI
source and sense lines of the test instruments to one test pin and the LO source and
sense lines to the other. This requires closing four crosspoints as shown here.
Want to learn more?
Discover how to configure an LLCR test system that can adapt
to new probe patterns without requiring manual rewiring.
Read our online application note.
Let us offer advice on your application.
Contact a test engineer online!
View our online demo.
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solution: Switch/Multimeter Family
Get instrument-grade switching integrated with low-noise, high performance
multimeter measurements with the Model 3706 System Switch/Multimeter
LLCR pin socket testing requires switch mainframes and cards that offer maximum
flexibility, like that offered by the six-slot Model 3706 Switch System/Multimeter
equipped with the Model 3732 Quad 4×28 Single Pole, Ultra-High Density
Matrix Card. This card’s four rows provide the exact number of lines required for
four-wire Kelvin connections and the single-pole crosspoints allow routing each signal
exactly where desired. But its switching capabilities are only part of the Model 3706’s
advantages. It offers a high performance, 7½-digit DMM option that provides a DC
reading rate from >14,000 readings/second at 3½-digits to 60 readings/second at
7½-digits to support a wide range of applications. The DMM is wired to the mainframe’s
analog backplane, ensuring a high quality signal path from each card channel to the
multimeter. An embedded TSP® processor and TSP-Link® interface simplify building
larger systems by making it easy to integrate the Model 3706 with Series 2600A System
SourceMeter® instruments.
Series 3700 measurement capabilities
Ready to request a quote or place an order?
The Model 3706’s optional DMM offers 13 built-in measurement functions.
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Need more detail?
Download the Series 3700 datasheet.
c o n f i d e n c e
Call 1-800-492-1955 and
n Press 1 to place an order, or email orders@keithley.com.
n Press 2 to receive help in selecting a product, or email inside_sales@keithley.com.
n Press 3 to receive product pricing or availability.
OR Contact us online.
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application: Burn-in of switching power supplies
Take on multiple devices at once
Highly accelerated stress screening (HASS) or “burn-in” is a common production step for switching
power supplies designed for computers and servers to ensure these products will continue to
function properly over their entire service life. Often, the biggest challenge in designing a test
system of this type is dealing with the number of channels it must monitor and the test system
surroundings. Multiple switching power supplies can produce tremendous amounts of electrical
noise, which can reduce the test system’s measurement performance significantly. Learn more.
Typical burn-in test cycle
Let us offer advice on your application.
Contact a test engineer online!
Want to learn more?
Learn how to test multiple
switching power supplies more
efficiently. Download our free
online application note.
View our online on-demand demo.
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solution: Switch/DMM/Data Acquisition Systems
Combine switching and measurement functions efficiently with
Integra Series mainframes
Integra Series systems combine precision
measurement, switching, and control in a single,
tightly integrated enclosure. A choice of 12 plugin switching and control modules simplifies
configuring a system with up to 80 differential input channels, applying a stimulus to the device under test, routing
signals, controlling system components, and making precision measurements with up to 14 functions. Scan rates up
to 500 channels/second (up to 3500 readings/second on a single channel) ensure high test productivity. The Model
2700 provides both GPIB and RS-232 interfaces; a built-in 10/100BaseTX Ethernet interface makes the Model 2701
the best choice for distributed data acquisition applications that demand stable, high precision measurements. For
lower-channel-count applications, both mainframes support three major
types of temperature sensors with built-in signal conditioning and 300V
isolation: thermocouples, RTDs, and thermistors.
Need more details about Integra mainframes?
Download our white paper, Making AST/Burn-in Testing
More Productive with Ethernet-based Instruments.
Ready to request a quote or place an order?
The Model 2701’s built-in web diagnostic interface simplifies
communication and debugging. It also makes it easy to read and set
network parameters such as IP address, subnet mask, gateway, MAC
address, calibration dates, and other data stored in the instrument.
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Call 1-800-492-1955 and
n Press 1 to place an order, or email orders@keithley.com.
n Press 2 to receive help in selecting a product, or email inside_sales@keithley.com.
n Press 3 to receive product pricing or availability.
OR Contact us online.
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application: High speed semiconductor testing
Switch your semi test applications from GPIB to something much faster
Semiconductor characterization labs, technology development labs, modeling labs, and reliability
labs often require several different source and measurement instruments as well as connections to
multiple devices. Switching ensures that test connections, and thus measurements, are made with
a high degree of repeatability. Although most semiconductor test applications require sensitivity, it
is rarely required for every measurement. This is especially critical for process control monitoring
applications, where testing must be done quickly to tweak manufacturing processes and minimize
product waste. Learn more.
Want to learn more?
Let us offer advice on your application.
Contact a test engineer online!
Learn how to design a high throughput switch
system for semiconductor measurements.
A typical semiconductor switch system configuration
Download our FREE online application note.
Take a semiconductor switching system tour.
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solution: Semiconductor Switch Matrix Mainframes
Gain greater throughput and maximize low current performance with the
Model 707B or 708B Semiconductor Switch Matrix Mainframe
The six-slot Model 707B and single-slot Model 708B Semiconductor Switch Matrix Mainframes slash the time from command to connection, offering significantly faster test sequences and
overall system throughput than earlier mainframe designs. They are specifically designed for the
requirements of both semiconductor lab and production test environments, delivering ultra low current switching performance using standard triax connectors and cables.
n Compatible with the popular plug-in cards designed for the 707A/708A mainframes
n Support for both remote (via LXI, USB, and GPIB interfaces) and manual (via front panel)
programming
n Embedded TSP® processor and TSP-Link®
interface simplify integrating Series 2600A System
SourceMeter instruments into a high speed, selfcontained tester
Need more details about the Model 707B or
708B Switch Matrix Mainframe?
Download the datasheet.
Ready to request a quote or place an order?
Call 1-800-492-1955 and
n Press 1 to place an order, or email orders@keithley.com.
n Press 2 to receive help in selecting a product, or email inside_sales@keithley.com.
n Press 3 to receive product pricing or availability.
OR Contact us online.
The Models 707B and 708B allow for a highly
efficient division of tasks in an optimized Switch/
SourceMeter configuration.
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application: RF/microwave device testing
Choose the switch configuration that optimizes your microwave/RF test system application
Switch systems for RF and microwave applications can range from simple to quite elaborate.
Microwave test systems often include one or more RF/microwave switches to allow automated
testing, as well as measurements on multiple devices under test (DUTs). When configuring a
high-frequency switching system for test applications, it is important to understand the type of
relay switch and multiplexer configuration options available, as well as the critical switch relay
specifications when choosing a switch system. Learn more.
Read more about switching
for RF/microwave testing.
Microwave relay performance characteristics such as contact resistance stability can
vary widely among relay manufacturers. Keithley microwave/RF test systems use
high peformance relays that provide excellent stability over the life of the relay.
Download our white paper.
Let us offer advice on your application.
Contact a test engineer online!
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solution: Microwave Switch System
Specify a microwave/RF switching system for today’s applications
that will adapt to tomorrow’s
Keithley’s S46 Microwave Switch System simplifies the automated switching needed
to test a wide range of telecommunications products and devices. The S46 can control 32
relay contacts in a package as small as a 2U high (3.5 in) full-rack enclosure. Semi-custom
configurations let you select a system that meets the specifications of your current
application without the expense of unnecessary switches or other features. This “just what
you need and no more” design philosophy allows S46 systems to provide outstanding
price/performance value. Later, it’s easy to reconfigure the system or add relay modules
to extend the life of the switch through many generations of devices under test.
n Built-in contact closure counter to monitor switch cycles and relay life
n Simple control with built-in GPIB/IEEE-488 interface bus
n Channel characterization data storage
n Frequency ranges up to 40GHz
Want to learn more about the Model S46 Microwave
Switch System’s “just what you need” philosophy?
Read our online article.
Ready to request a quote or place an order?
Here are examples of 3 possible multiplexer configurations. No matter
what configuration you start with, you can easily change it when your
requirements change.
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Call 1-800-492-1955 and
n Press 1 to place an order, or email orders@keithley.com.
n Press 2 to receive help in selecting a product, or email inside_sales@keithley.com.
n Press 3 to receive product pricing or availability.
OR Contact us online.
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Switch Mainframe Selector Guide
Explore Keithley’s broad line of high-performance switching mainframes
Series 3700 System Switch/
Multimeter Family
System Features/Benefits
Integra Switch/DMM/Datalogger Systems
Model 707B/708B Semiconductor Switch
Matrix Mainframe
S46 Microwave Switch System
• Six-slot system switch mainframe with
optional high performance DMM
• Combines functions of DMM, switch
system, and datalogger
• 708B mainframe controls a single 8×12
matrix card
• Compact RF/microwave switching
system only 2U high
• Remote PC control via Ethernet, USB, and
GPIB interfaces
• True 6½-digit measurement resolution
• 707B mainframe controls up to six 8×12
matrix cards
• Built-in contact closure counter to
monitor switch cycles
• Support for both remote (via LXI, USB,
and GPIB interfaces) and manual (via
front panel) programming
• Standard configuration allows up to 32
channels of switching
• Up to 576 two-wire or 720 one-wire
multiplexer channels in one mainframe
• Up to 2,688 one-pole matrix crosspoints in
one mainframe
• Up to 80 differential input channels for
measurement and control
• Ethernet, GPIB, RS-232 communications
capabilities
• Integrates seamlessly with the Model
4200-SCS for semiconductor I V and
C-V characterization via GPIB interface
• Embedded Test Script Processor (TSP®)
offers unparalleled system automation,
throughput, and flexibility
• Stores hundreds of switching
configurations and channel patterns in
non-volatile memory for reuse
• TSP-Link® master/slave connection provides
easy system expansion and seamless
connection to Series 2600A System
SourceMeter® instruments
• LXI Class C interface supports remote
programming and control
• Capable of over 14,000 readings per second
to memory with optional DMM
• 14 bits of digital I/O
• Simple control with built-in GPIB/IEEE488 interface bus
• Channel characterization data storage
• Frequency ranges up to 40GHz
• Terminated and unterminated switch
configurations
• Frequency ranges up to 40GHz for
unterminated switches and 26.5GHz for
terminated switches
• LXI Class B with embedded Web browser
interface for test setup, maintenance, and
basic application control
Compatible Cards
Series 3700 Plug-in Cards Selector Guide
Integra Series Module Selector Guide
• Model 7174A Low Current Matrix Card
N/A
• Model 7072 Semiconductor Matrix Card See data sheet for system configuration
options.
• Model 7072-HV High Voltage
Semiconductor Matrix Card
• Model 7173-50 High Frequency, 2-pole,
4×12 Matrix Card
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Consult with a Keithley applications engineer and learn how to get the
most from your Keithley products
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