www.keithley.com
Measurement solutions for
nanotech
nanoscale device and materials characterization
A
G R E A T E R
M E A S U R E
O F
C O N F I D E N C E
Mapping the boundaries of nanotechnology
from research to production
At nanoscale dimensions, some materials exhibit entirely
new properties associated with quantum physical
phenomena. These properties have applications in
biotechnology, molecular electronics, alternative energy
sources, and dozens of other disciplines. Although
important breakthroughs have been made, a lot of
uncharted territory remains. Keithley is helping to
advance nanotechnology with sensitive instruments
optimized for measuring the extremely small electrical
signals associated with nanoscale devices and materials.
Keithley helps you gather data quickly,
accurately, and with greater confidence
Why choose Keithley instrumentation
for your nanotechnology application?
We’re low level measurement instrumentation experts.
We bring more than a half-century of experience to our low level
measurement solutions, so you can be confident of the accuracy of the
results you get from Keithley instruments. We also design measurement
solutions so that you don’t have to be a measurement expert to use
them. Just as important, our applications engineers are trained to help
you choose the most cost-effective solution for your application.
We can help you transfer your discoveries from the lab to
the fabrication environment. Keithley measurement solutions
aren’t confined to the R&D lab—they also offer the speed, robustness,
and communications capabilities that high throughput production
environments demand. We also have decades of experience in
transferring measurement technologies from the lab to the production
floor. That ensures you’ll get high correlation in your test results.
We partner with other industry leaders. Keithley has
developed working partnerships with leading suppliers of nanotech
fixturing, probing, and scanning hardware so we can provide you with
more complete test and measurement solutions.
I-V CHARACTERIZATION
of nanoelectronics
Helping nanotech pioneers
around the world characterize
next-generation electronics
Just imagine what you could discover about Carbon
Nanotubes (CNTs), Single Electron Transistors
(SETs), and other exotic nano-scale devices if you
weren’t limited by your instrumentation. Keithley’s
I-V characterization tools offer wide sourcing and
measurement ranges to help you unlock the secrets
of next generation components like these,
accelerating the jump from the research lab into
commercial production.
For further reading, download the Keithley White Paper, "Improving Low Current Measurements
on Nanoelectronic and Molecular Electronic Devices," from www.keithley.com.
Model 4200-SCS Semiconductor Characterization System
• Fully integrated characterization system combines precision
voltage and current sourcing and measurement in one easy-tooperate package.
• Built-in Project Navigator organizes tests and automates test
sequencing, eliminating the need to write code.
• System connects directly to the DUT or can be interfaced to a
variety of nanotech probe stations, nanomanipulators,
Transmission Electron Microscopes (TEMs), Scanning Electron
Microscopes (SEMs), etc.
• Optional preamps provide sub-femtoamp sensitivity for
characterizing experimental devices.
• Nanotech Toolkit for the Model 4200-SCS includes 16 interactive
test modules for characterizing the seven most common
nanodevice structures. Available at www.keithley.com.
®
• Intuitive Windows -based GUI minimizes system-specific training
requirements and allows even first-time users to acquire data quickly.
Device Under Test
Application Needs
Keithley’s Solutions
Molecular electronic cells
Molecular transistors
Model 4200-SCS Semiconductor
Characterization System
Model 6430 Sub-Femtoamp
Remote SourceMeter
Instrument
Series 2400 SourceMeter
Instruments
Single electron transistors Ultra-sensitive
I-V measurements
Model 4200-SCS
Model 6430
Carbon nanotube transistors,
I-V measurements
switches, and arrays
Nano-bioelectronics
Molecular diodes
Nano-photovoltaics
Breakdown voltage, I-V curves,
conductance
Model 4200-SCS
Model 6430
Series 2400
I-V, C-V measurements
Model 4200-SCS
Model 590 C-V Analyzer
Model 6430
Series 2400
“The Model 4200-SCS makes it simple to obtain and analyze data, so we can
learn the electronic characteristics of nano-devices almost immediately. It's a very
user-friendly design—it's easy to set up and operate with no training needed.”
Dr. Iwao Ohdomari, Professor of Science & Engineering, Waseda University, Japan
SourceMeter® Instruments
• Each SourceMeter instrument is a complete,
single-channel DC parametric tester.
• Tightly coupled source/measure engine minimizes test
station development, set-up, and maintenance time.
• Choose from a variety of measurement ranges and
functions to suit specific application needs:
Model 2400 (general-purpose), Model 2410 (high
voltage), Model 2420 (3A), Model 2425 (100W),
Model 2430 (pulse mode), Model 2440 (5A),
Model 6430 (sub-femtoamp resolution).
• Free LabTracer software (downloadable from
www.keithley.com) can coordinate the operation of
up to four Series 2400 SourceMeter instruments at
once, and collect voltage and/or current readings
from any of the instruments, as well as a timestamp
for each measurement set.
For more information on characterization of nanoelectronics,
look on the back cover for the Keithley nanotechnology expert in your area.
CONDUCTIVITY AND TRANSPORT
of nanotubes and
Image courtesy of Zyvex Corporation.
Ensuring high integrity
resistance measurements
Understanding how nanotubes, nanowires, and
nanofibers will perform in tomorrow's electronic
interconnections demands instrumentation that's
optimized for making measurements over a wide
range of resistances and conductivities. Whether
you're measuring nano-ohms or tera-ohms,
Keithley’s line of resistance measurement tools
ensures greater accuracy by reducing or eliminating
common sources of error at these extremes.
For further reading, download Keithley Application Note #312,
”High Resistance Measurements," from www.keithley.com.
Model 6517A Electrometer/High Resistance Meter
• Built-in 1kV source and low current sensitivity make it
ideal for measuring high resistance nanomaterials.
• 1fA–20mA current measurement range, with <20µV
burden voltage on lowest current ranges.
• 200TΩ input resistance ensures high accuracy voltage
and resistance measurements.
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• Measures resistances up to 10 Ω.
• Voltage reversal technique enhances the accuracy of
extremely high resistance measurements and volume
and surface resistivity measurements.
• Optional software simplifies remote programming via
a computer and simplifies optimizing test parameters
for the material or device under test.
nanowires
Device Under Test
Carbon nanotube wires
Application Needs
Keithley’s Solution
I-V measurements, conductivity,
low resistance measurements
Model 4200-SCS Semiconductor
Characterization System
Series 2400 SourceMeter
Instruments
Models 6220/6221 Current
Sources/Model 2182A
Nanovoltmeter Combo
(1Ω → 100kΩ)
Semiconductor nanowires
(1Ω → 100Ω)
Copper nanowires
(1µΩ → 10Ω)
Polymer nanofibers and
nanowires
I-V measurements, conductivity/
resistivity, high resistance
measurements, low current
measurements
(1MΩ → 1x10
Ω)
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Model 4200-SCS
Model 6430 Sub-Femtoamp
Remote SourceMeter
Instrument
Model 6487 Picoammeter/
Voltage Source
Model 6517A Electrometer/
High Resistance Meter
Models 6220/6221 current
sources/Model 2182A
Nanovoltmeter Combo
For further reading, download the Keithley White Paper,
"Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage
Applications," from www.keithley.com.
Models 6220/6221 Current Sources and
Model 2182A Nanovoltmeter Combination
• Measure resistances from 10nΩ to 100MΩ.
• High performance alternative to
AC resistance bridges and lock-in amplifiers
for measuring resistances.
• Industry’s first turn-key differential conductance
measurement solution.
• Measure differential conductance up to 10X faster
and with lower noise than traditional, user-assembled
setups based on lock-in technology.
• Perform pulsed I-V measurements, reducing the
likelihood of damaging heat-sensitive devices.
• Current noise as low as 400fA p-p.
• Source AC currents from 1pA to 100mA over a
frequency range of 1mHz to 100kHz (6221 only).
To learn more about solutions for testing the conductivity and transport of nanotubes and
nanowires, look on the back cover for the Keithley nanotechnology expert in your area.
MATERIALS RESEARCH
on nanoparticles and comp
Gold nanoparticle array forms device structure photo courtesy of K. Elteto and X.M. Lin, The University of Chicago
Instruments that expand
your field of creative vision
Keithley’s innovative instruments and systems
reveal the unique properties of carbon
nanotubes, nanoparticles, and advanced
composites. Characterizing properties like
thermal conduction, electrical conductivity,
and mechanical performance helps researchers
create the next generation of materials with
capabilities never before imagined.
“The capabilities of the 6430 allow us to measure with a resolution
and ease that was previously unavailable in this type of experiment.”
—Heinrich Jaeger, Professor of Physics, The University of Chicago
Model 6430
Sub-Femtoamp Remote SourceMeter
• Four-quadrant sourcing plus measurement sensitivity
down to sub-femtoamp and micro-volt levels.
• Industry-leading low noise and drift performance
make it ideal for studying highly resistive nanowires.
• Remote PreAmp design minimizes cable and noise
effects that reduce measurement accuracy.
• Offers sensitivity, noise, and input resistance
specifications superior to electrometers.
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• Measures currents with 400aA (400x10 A) sensitivity.
• Allows measuring resistance with either the constantvoltage or constant-current method.
• Measures resistances from 1µΩ to >1TΩ.
• Compatible with free Keithley LabTracer software.
osites
Materials
Carbon nanotube (CNT)
composites and structures
Application Needs
I-V measurements, conductivity,
resistivity, thermal conduction
Nanoparticles, composites,
and structures
Nanomanipulation, elastic
constants, Young’s Modulus,
cantilever force, I-V
characteristics
Self assembly
Source V, measure I
Source I, measure V
Keithley’s Solution
Model 4200-SCS Semiconductor
Characterization System
Model 6430 Sub-Femtoamp
Remote SourceMeter Instrument
Series 2400 SourceMeter
Instruments
Model 6485 Picoammeter
Model 6487 Picoammeter/
Voltage Source
Model 6517A Electrometer/
High Resistance Meter
Models 6220/6221 Current
Sources/Model 2182A
Nanovoltmeter Combo
*Zyvex S100 Nanomanipulator
Model 4200-SCS
Model 6430
Series 2400
*Zyvex Corporation is a Keithley nanotechnology solutions partner.
For further reading, download Keithley Application Note #2481,
Zyvex S100 Nanomanipulator
• Positioning and testing tool for micro- and
nano-scale R&D, device quality/failure analysis,
MEMS/IC or microstructure R&D, surface
science experiments, assembly, and manipulation.
• Ideal test fixture for use with the
Model 4200-SCS.
• Accommodates up to four positioners,
which grasp, move, test and position samples
in Scanning Electron Microscopes (SEMs) and
Focused Ion Beam systems (FIBs).
• 5nm positioner resolution.
• Supports probe diameters <20nm.
See the back cover for the Keithley nanotechnology experts in your area. They’ll help you
select instrumentation that’s ideal for materials research on nanoparticles and composites.
Image courtesy of Zyvex Corporation.
"I-V Measurements of Nanoscale Wires and Tubes with the Model 4200-SCS and Zyvex S100
Nanomanipulator," from www.keithley.com.
SOLUTIONS
for tomorrow’s nanotech challenges
Image courtesy of Zyvex Corporation.
Making the leap
from imagination to
commercialization
Model 6485 Picoammeter/Model 6487
Picoammeter/Voltage Source
• Cost-effective, low current measurement solution
with 20fA RMS noise.
• <200µV burden voltage ensures accurate low
current measurements, even in circuits with very low
source voltages.
• An analog output that’s compatible with chart recorders
and other plotters makes it easy to spot kinks or other
anomalies in a device’s output.
• High accuracy, 2nA–20mA measurement range, and
51⁄2-digit resolution make the Model 6485 ideal for
SEM beam current experiments and use in focused
ion beam systems (FIBSs) for nano-scale imaging,
micromachining, and mapping.
• The Model 6487 adds a 500V bias source to all the
capabilities of the Model 6485 for use in high resistance
and resistivity measurements. An Alternating Voltage
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method supports resistance measurements to 10 Ω.
Whether you’re developing the next
generation of displays, exploring exotic energy
sources, or refining hazard alert sensors,
Keithley’s measurement solutions for I-V
characterization and optical measurements turn
today’s ideas into tomorrow’s commercial
technologies. Our advanced research products
are engineered for reliability and flexibility, so
you can transform the products of your
imagination into the products of the future.
Device Under Test
Carbon nanotube (CNT)
field emission
Nanobatteries, energy
Quantum scale sensors
and detectors,
nanobiosensors
Quantum dot light sources,
nanophotonics
Application Needs
I-V measurements,
high voltage sourcing
Keithley’s Solution
Model 4200-SCS Semiconductor
Characterization System
Model 6430 Sub-Femtoamp
Remote SourceMeter Instrument
Series 2400 SourceMeter
Instruments
Model 6485 Picoammeter
Model 6487 Picoammeter/
Voltage Source
Model 6517A Electrometer/
High Resistance Meter
I-V measurements,
charging/discharging
Model 4200-SCS
Model 6430
Series 2400
I-V measurements
Model 4200-SCS
Model 6430
Series 2400
I-V measurements, optical
power measurements
Model 4200-SCS
Series 2400
Models 6220/6221 Current Source
Model 2520 Pulsed Laser Diode
Test System
Model 2520INT Integrating Sphere
Model 2502 Photodiode Meter
Pulsed I-V
For further reading, download Keithley Application Note #2428,
"Pulsed LIV Testing of Low Power Optical Devices with an Amplified Integrating Sphere and the
Model 2520," from www.keithley.com.
Model 2520 Pulsed Laser Diode Test System
• Combines high speed, precision pulsing and
measurement capabilities to prevent destructive
device self-heating.
• Remote test head minimizes cable effects and
maximizes the signal-to-noise ratio for greater
pulse measurement accuracy.
• Programmable pulse on time from 500ns to 5ms
up to 4% duty cycle.
• Pulse capability up to 5A, DC capability up to 1A.
See the back cover for the Keithley nanotechnology expert near you for assistance in
choosing solutions to tomorrow’s nanotech challenges.
LET KEITHLEY HELP YOU
set new standards for nanotech measurements
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We invite you to visit
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download materials from
our growing library of
FREE nanotech literature,
including articles,
application notes, white
papers, online demonstrations, and webcasts.
Need somebody to talk to?
There's a Keithley applications engineer ready with advice on
configuring a test system for your nanotechnology application.
Call us toll free at 1-888-KEITHLEY (534-8453) (US only)
or call your local Keithley sales office and ask to speak with
one of our nanotech instrumentation specialists.
Specifications are subject to change without notice.
All Keithley trademarks and trade names are the property of Keithley Instruments, Inc.
All other trademarks and trade names are the property of their respective companies.
For Keithley’s help with measurement solutions for nanoscale device and
materials characterization, contact one of the experts listed below.
A
G R E A T E R
M E A S U R E
O F
C O N F I D E N C E
Keithley Instruments, Inc.
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© Copyright 2004 Keithley Instruments, Inc.
Printed in U.S.A
No. 2492
60415KAGS