Edward Brorein Applications Specialist Optimize Your Mobile Device Run-time using Innovative Battery Drain Analysis Techniques Copyright © 2008 Agilent Technologies A Growing Need for Battery Drain Analysis in R&D • In Development, optimize battery operating time: • Evaluate and optimize overall device and its sub circuits • Validate and optimize battery power management system • Identify high peak drain anomalies and their root causes • In Software Development, validate new code builds: • Run application code regression test suites, impact on battery drain • In Design Integration and Validation: run suites of benchmark tests: • Current drain for channels & transmit (TX) power level combinations, & main op modes • Validate operating time with product’s battery (run-down test) • Check HW, L1/L2/L3, OS & application interactions on battery drain (stress test) Benefits: • Bring smaller, longer running, more competitive products to market • Faster time-to-market and at lower expense by reducing development time HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis Page 2 1 Typical System for Battery Drain Measurement & Analysis Challenges: • Sourcing power with characteristics of a battery • Accurate current measurements • Digitizing and data streaming & management • Effective software for analyzing long-term battery drain data • Software development effort that yields a flexible & capable system Representative System Platform for Battery Drain Measurement & Analysis Page 3 HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery and DUT Real World Characteristics DUT Electrical Model Contact & protector resistance IL(Vbattery) + V-bat (V) 4.5 Vbattery(IL) * LDO regulators Cell voltage Power Amp V2 Display Vn Non-ideal voltage source: •Charge-dependent resistance •Charge-dependent voltage Resistance mOhms I - DUT (mA) 600 120 400 110 200 100 . . . + * DC/DC converters V1 . . . Cell internal resistance Power management IC Audio Amp Voltage-dependent current drain characteristic 4.0 V-mp 3.5 3.0 R-mp 0% 50% 100% % Discharged 3.0 3.5 4.0 4.5 V-bat (V) • DUT current, battery voltage, and battery resistance are interdependent •Two types of testing: Fixed battery mid-point and battery run-down HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis Page 4 2 Fixed Mid-point Test; Importance of Emulating a Battery Response to a GSM Handset in TX Mode General Purpose Power Supply Response Actual Battery Voltage Response Battery Voltage GP-PS Voltage Instability Agilent 66319 DC Source Response BE-PS Voltage Unloading Overshoot Battery Current GP-PS Current Battery mid-point resistance: 150 milliohms Resultant current drain does not match the battery • 10% higher drain • Instability & overshoot BE-PS Current Battery Emulator output set to 150 milliohms • Performance comparable to a battery • Unlike a battery parameters are controlled HSDS, Battery Drain Copyright © 2008 Agilent Technologies Page 5 Specialized Solution for Measurement Challenges High Speed, high crest factor pulsed current drain signals and micro ampere to ampere levels of digital wireless devices pose measurement challenges Agilent 66319D DC Source simplifies battery drain measurements by eliminating separate instruments with integrated, specialized current measurement system: • Accurate Integrated Current Measurement • Multiple current ranges (5 A, 1 A, and 0.02 A) • Can source full current while in low measurement ranges • High-Speed Digitizing System • High-speed DSP, 16-Bit, 64 kHz ADC and 4,096 byte buffer for waveform digitization with flexible triggering and data processing • Works with the 14565B software to continuously process and stream current drain measurement data for long term data logging HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis Page 6 3 Specialized Solution for Analysis Challenges Creating a solution for effective visualization and detailed analysis of long-term, high speed sampled current drain data is a large and challenging software effort The Agilent 14565B battery drain analysis software is a easy-to-use graphical interface that works with the Agilent 663xxB/D Mobile Communications dc Sources: • Source, measure, data log, visualize, and analyze current drain • Three modes of operation 1. Waveform Capture and Analysis (short-term capture) 2. Data Logging and Analysis (long-term capture) 3. CCDF Statistical Distribution Capture and Analysis (longterm capture) • Automation: Control the 14565B from other programs to automate and synchronize DUT activity with its current drain measurements Page 7 HSDS, Battery Drain Copyright © 2008 Agilent Technologies Setup for RF and DC Stimulus and Measurement PC running E6568C Wireless Test Manager (WTM) SW which is controlling the E5515C and 14565B SW, and the 14565B SW in turn controlling the 66319D GPGP-IB RF antenna cable 8960 Wireless Communications Test Set emulates base station and sets up mobile device test conditions HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis DC power Device Under Test 66319D Mobile Communications DC Source with high speed digitizer measures the battery current drain Page 8 4 Agilent 14565B Waveform Capture and Analysis of a GSM TX Pulsed Current • Oscilloscope-like view of battery current drain • Measurements permit estimating operating time and current drain • Measurements include average, pulse high and peak levels, and timing values • Zoom and markers for analysis 14565B software displaying a GSM TX current waveform Page 9 HSDS, Battery Drain Copyright © 2008 Agilent Technologies Insightful Real World Battery Run-down Testing Output set to 0 volts Iload Zero-burden active shunt concept - out - out + out + ILOAD - in Vin = Vbattery + in Iload VDROP = ZERO RSHUNT DVM in B+ DUT battery VSHUNT - + out ILOAD + (1 x VSHUNT) - B- Agilent 66319B DC source output set to zero volts and connected in series becomes zero burden (zero ohm) active shunt: • Use actual DUT battery, real world results • No shunt V drop, DUT sees full battery voltage • DUT sees actual battery impedance only • DC source output logs actual battery run-down current • DVM input (D-suffix option) logs actual battery run-down voltage • See application note AN 1427 (5988-8157EN) for details • Gain insight through measuring DUT together with its battery as a system HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis Page 10 5 Battery Run-down Test, Data Logging and Analysis • 10 ms integration reduces data while maintaining accurate avg. (esp. for zoom) battery voltage • Capturing battery voltage & current gives greater insights beyond run time: peak current •Tracking peak current identifies anomalies •Achieved capacities in application vs. battery spec average current minimum current •Low voltage shutdown details GSM handset battery run-down test data log HSDS, Battery Drain Copyright © 2008 Agilent Technologies Page 11 Battery Run-down Test, Analyzing Low Battery Shutdown • Zoom to final minutes of operation • Shutdown at max current but not anomalously high • 3.50 V shutdown point appears high • 3.67V after shutdown indicates battery resistance is OK • Voltage and current trajectories indicate near end of battery capacity GSM handset battery run-down test, low battery shutdown HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis Page 12 6 Integrating Feature Reduces Data in Real Time Normal Digitizing Current Agilent Data Integration/reduction Current Up to 64,000 points Æ 1 data set Max Avg Min Up to 64,000 data points time 15.6 μs 0.005 to 1 sec Sampled at 64 KHz during 0.005 to 1 sec time • 0.005 to 1 second programmable integration period provides a minimum, maximum, and average value for each period of 64 kHz sampled data. • Manageable data files for post analysis and export (5 MB per 100 hours) • Logs data to the disk to reduce loss of test data if test is interrupted HSDS, Battery Drain Copyright © 2008 Agilent Technologies Page 13 Agilent 14565B Complementary Cumulative Distribution Function CCDF Capture and Analysis • CCDF is an alternate form of a histogram useful for visualization and analysis of complex signals • Displays current or voltage on x-axis versus % occurrence on y-axis • Horizontal shifts indicate amplitude related changes • Vertical shifts indicate time related changes • Zoom, markers, save, recall and compare for analysis • Accumulates from 10 seconds to 1000 hours • Captures details with sampling at 64 kHz CCDF graph of a Bluetoothtm headset talk mode current drain HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis Page 14 7 A CCDF Graph Analysis Example: GSM DTX Operation • Comparing DTX-off (red trace) to DTXon (blue trace) • The time-related difference is quickly observed and quantified DTX off 12.5% DTX on 1.5% • Transmit burst occurrence drops from 12.5% to 1.5% • Overall average current drain drops from 319mA to 94mA (71% drop!) HSDS, Battery Drain Copyright © 2008 Agilent Technologies Page 15 Why Automate Current Drain Measurements? Some Examples of Where Automation is Useful: • In Design Validation: • Test suite of current drain vs. transmit (TX) power levels & channels • In Software Development: • Validate against current drain with regression test suites • Timestamp current drain behavior synchronized to specific DUT activity • In Integration and Verification : • Stress testing designs to find issues early in the design cycle • Perform realistic network testing before network drive tests • Ensure Product’s meet published specifications & industry benchmarks • Ensure Product’s meet Service provider sourcing requirement specification Benefits: • Reduce Time-to-market - Get product out more quickly and with less resources • Test early and more thoroughly - Perform tests previously not practical to do HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis Page 16 8 Agilent 14565B Automation Interface Highlights • Full set of commands implemented using Component Object Model (COM) automates the 14565B functionality from a client environment • Client languages include: Client programs include: • Visual C++ using MFC Agilent VEE • Visual Basic for Apps. National Instruments Lab View • Visual Basic 6.0 Agilent Wireless Test Manager (WTM) • Visual C# (.NET) • Visual Basic (.NET) • WTM Driver and integration guide • Complete programmer’s development folder includes; • Programming guides, starter programs, automation examples, automation help file, C++ wrapper, WTM driver and test steps, and more Page 17 HSDS, Battery Drain Copyright © 2008 Agilent Technologies SW for Current Drain vs. Channel & TX Level Automation Example E6568C Define Test Plan Test Steps • RF parameters • Current Drain • Custom Test Plan • Build RF & Battery Drain test steps into a test plan E6568C Run Test Plan • Sets TX level & Channel • Measures TX level & battery drain • Increments & repeats Program calls automate battery drain measurements Benefit: Days/weeks of manually setting & running tests reduced to a couple of hours for setup HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis Battery drain data returned 14565B Battery Drain Measurements Page 18 9 Summary: A Growing Need for Battery Drain Analysis • In Development, optimize battery operating time: • Evaluate and optimize overall device and its sub circuits • Validate and optimize battery power management system • Identify high peak drain anomalies and their root causes • In Software Development, validate new code builds: • Run application code regression test suites, impact on battery drain • In Design Integration and Validation: run suites of benchmark tests: • Current drain for channels & power level combinations, & main op modes • Validate operating time with product’s battery (run-down test) • Check impact of HW, L1/L2/L3, OS & application interactions on battery drain Benefits: • Bring smaller, longer running, more competitive products to market • Faster time-to-market and at lower expense by reducing development time HSDS, Battery Drain Copyright © 2008 Agilent Technologies Battery Drain Analysis Page 19 10