20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)
David G. Castner
Citation: Biointerphases 11, 02A101 (2016); doi: 10.1116/1.4945800
View online: http://dx.doi.org/10.1116/1.4945800
View Table of Contents: http://scitation.aip.org/content/avs/journal/bip/11/2?ver=pdfcov
Published by the AVS: Science & Technology of Materials, Interfaces, and Processing
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20th International Conference on Secondary Ion Mass Spectrometry
(SIMS XX)
David G. Castnera)
Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, Washington 98195-1653
(Received 28 March 2016; accepted 29 March 2016; published 7 April 2016)
[http://dx.doi.org/10.1116/1.4945800]
The 20th International Conference on Secondary Ion
Mass Spectrometry (SIMS XX) was held in Seattle, WA,
from September 13–18, 2015. The SIMS conference is held
every 2 years and rotates between venues in North
America, Europe, and Asia. A total of 292 people from 22
different countries attended the conference. A wide range
of topics were covered in 23 oral sessions and two poster
sessions. In recent years, the number of biological related
presentations at the SIMS Conferences has increased significantly. SIMS XX was no exception to this trend, with
numerous biological presentations in topics such as 3D
Imaging, Biological Imaging, Cluster Ions, Complementary
Techniques, Organic Depth Profiling, Data Processing,
Image and Data Fusion, In situ Liquid SIMS, Life Sciences,
Medical Applications, Nanomaterials, Polymers, Surface
and Interface Analysis, Sample Preparation, and Ultrahigh
a)
Spatial Resolution. The In Focus issue on SIMS in this
issue of Biointerphases provides a good overview of the
range of the SIMS biological studies that were discussed at
SIMS XX. SIMS has proven to be a powerful technique for
characterizing biological cells and tissue sections. The
combination of the high spatial resolution and chemical
specificity of SIMS with the ability of giant cluster beams
that can molecularly depth profile biological materials has
produced information-rich 3D images of cells and tissues,
as highlighted by the papers in this issue of Biointerphases.
SIMS also is an essential technique for investigating a wide
range of topics beyond biological materials. Papers that
cover those topics along with recent advances in SIMS
instrumentation were also discussed at SIMS XX and are
covered in the SIMS Special Issue in the May 2016 issue of
the Journal of Vacuum Science and Technology B.
Electronic mail: castner@uw.edu
02A101-1 Biointerphases 11(2), June 2016
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