Class 07: Layout and Rules

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Class 07: Layout and Rules
1. Introduction
2. CMOS Assumptions
3. Layout Layers for Transistor
4. CMOS Formation - P+ diffusion
5. CMOS Layout Example
6. List of Rules to be Considered
7. Layout and Cross Section - NMOS
8. Lambda Based Rules
9. Reasons behind Rules: Contacts, Poly
10. Reasons behind Rules: Poly, Diff
11. Reasons behind Rules: Poly, Diff
12. Reasons behind Rules: NWELL Width, Space
13. Reasons behind Rules: Poly
14. Reasons behind Rules: Diffusion and Tap, Width and Space
15. Reasons behind Rules: Diffusion and Tap, Enclosure-Spacing
16. Reasons behind Rules: Illegal Example
Joseph A. Elias, PhD
1
Class 07: Layout and Rules
CMOS Assumptions
Assumptions for CMOS:
•Substrate is p-type
•Gate material is made of polysilicon
•The process is single-well (nwell)
•CMOS (complementary MOS) uses n- and p-type
•CMOS process has a substrate (p-type) and
(usually) one well (nwell)
Joseph A. Elias, PhD
2
Class 07: Layout and Rules
Layout Layers for Transistor
Drawn layers used to create a transistor:
1) Well (aka substrate, tub, moat)
• nmos are in pwell, pmos are in nwell
2) Diffusion (aka diff)
•type of diffusion for Source/Drain set by well
•defines active vs. isolation (or field) regions
3) Poly (aka gate)
•gate material over diff defines W and L of transistor
4) Contact (aka ct)
•defines how the source, drain, gate, and tap are contacted to higher levels
5) Tap
•defines contact to substrate or well
•heavily doped, same type as sub/well (i.e., n-type in nwell, p-type in p-substrate)
Joseph A. Elias, PhD
3
Class 07: Layout and Rules
CMOS Formation - P+ diffusion (Martin p.45)
Pdiff
nwell
Diff-tap
poly
•Where and how many masks
•N-type are in what?
•P-type are in what?
Joseph A. Elias, PhD
4
Class 07: Layout and Rules
CMOS Layout Example (Martin p.55)
•Where are the transistors?
Joseph A. Elias, PhD
5
Class 07: Layout and Rules
List of Rules to be Considered
Layout Rules cover the following topics:
•intra layer, that is, within one layer
•width, spacing
•inter layer, that is, layer to layer
•spacing, enclosure, extension, overlap
Rules are going to be separated into the masks:
•NWELL
•DIFF/TAP (a.k.a. active, fom)
•POLY
•CONTACT
•METAL
Joseph A. Elias, PhD
6
Class 07: Layout and Rules
Layout and Cross Section - NMOS (Martin p.50)
Isolation
Region
Isolation
Region
Isolation
Region
Isolation
Region
Joseph A. Elias, PhD
How many masks are
in this picture? 7
Class 07: Layout and Rules
Lambda Based Rules (Martin p.50)
Based on the assumption of:
λ
half of the minimum feature size (a.k.a. ?)
0.75λ
worst case misalignment of a mask
1.5λ
worst case misalignment mask to mask
Gives the following rules for an NFET:
2λ
Minimum width of gate (a.k.a. channel ___)
2λ
Minimum width of contact
λ
Minimum enclosure of contact by diff
2λ
Minimum extension of poly beyond diff
2λ
Minimum space of contact to poly
And the following “derived” rules:
4λ
Minimum width of diff (a.k.a. channel ___)
5λ
Minimum length of diff
Joseph A. Elias, PhD
8
Class 07: Layout and Rules
Reasons behind Rules: Contacts, Poly (Martin p.51)
•If max misalignment is 1.5λ, and min
contact is 2λ, what is min contact to
gate spacing needed?
•If max misalignment is 1.5λ, and min
contact is 2λ, what is min enclosure
of contact by diff?
•If max misalignment is 1.5λ, what is
min extension of poly beyond diff?
What layers are misaligned? What to what?
Joseph A. Elias, PhD
9
Class 07: Layout and Rules
Reasons behind Rules: Poly, Diff (Weste p.151)
Grown diff
Shrunk poly
•What are the problems with the layout on the right?
•What would cause diff to grow or “bloat”
•What would cause poly to shrink?
Joseph A. Elias, PhD
10
Class 07: Layout and Rules
Reasons behind Rules: Poly, Diff (Weste p.151)
•Where is thin oxide?
•Where is isolation (a.k.a. _______ oxide)?
Joseph A. Elias, PhD
11
Class 07: Layout and Rules
Reasons behind Rules: NWELL Width, Space (Cypress)
nwell
Diff-tap
width
space
Minimum width
1) Peak doping concentration needs to be repeatable,
independent of width, or the lateral diffusion
2) Photoresist must have a minimum opening to
allow the implant. Since resist must be thick to
stop high energy implant, aspect ratio considered.
Minimum space:
1) Aspect ratio of resist width vs. length, and depth
2) Punchthrough of two separate wells
Joseph A. Elias, PhD
12
Class 07: Layout and Rules
Reasons behind Rules: Poly (Martin p.44, Runyan c.5, Cypress)
nwell
space
Diff-tap
poly
width
Minimum width
1) Resist critical dimension (CD) (related to what?)
2) control of poly resistance (for resistors)
Minimum space:
1) separation between transistors (shadowing)
2) separation of features
Poly on field to diff or tap:
•shadowing of implant
•Diff/Tap Contact to Poly on field
possible short
Joseph A. Elias, PhD
13
Class 07: Layout and Rules
Reasons behind Rules: Diffusion and Tap, Width and Space (Martin p.44, Cypress)
Pdiff
nwell
Diff-tap
poly
Minimum width:
1) Peak doping concentration needs to be repeatable,
independent of width, or the lateral diffusion
2) Photoresist must have a minimum opening to
allow the implant.
3) Must be wide enough to enclose a contact
Minimum space:
1) Aspect ratio of resist width vs. length, and depth
2) Punchthrough of two separate:
•diff to diff
•diff to tap
due to lateral diffusion of the implant and depletion
region variation with bias
Joseph A. Elias, PhD
14
Class 07: Layout and Rules
Reasons behind Rules: Diffusion and Tap, Enclosure-Spacing (Martin p.44, Cypress)
Pdiff
nwell
Enclosure of :
•p diff by nwell due to need to isolate pdiff from psub
•ntap by nwell for latchup and ESD concerns (good
Diff-tap
contact to the well)
poly
Spacing of:
•ndiff to nwell due to isolation, lateral diffusion
•ptap to nwell due to isolation, lateral diffusion,
but it is a reverse-biased junction
Joseph A. Elias, PhD
15
Class 07: Layout and Rules
Reasons behind Rules: Illegal Example (Weste p.151 , Cypress)
Poly cannot cross inner corners on diff
Besides catastrophic misalignments issues, what else would be difficult on this transistor?
Joseph A. Elias, PhD
16
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