1601 North A.W. Grimes, Suite B
Round Rock, TX 78665
e-mail: info@ptitest.com
(512) 244-3371 Fax: (512) 244-1846
January 20, 2012
Mr. Bobby Wollard
Dynamic Flow Computers
12603 Southwest Freeway
Suite 320
Stafford, Texas 77477
Dear Bobby:
Thank you for allowing Professional Testing (EMI) Inc. the opportunity to perform testing on the E-chart
Plus by Dynamic Flow Computers. Enclosed is the Electromagnetic Compatibility Test Report, which
demonstrates compliance with IEC 61000-4-17: 2002 and IEC 61000-4-29: 2000. If you have any
questions, please contact us.
Sincerely,
Jeffrey A. Lenk
President
Enclosure
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Project Number: 13042-10
Electromagnetic Compatibility & Environmental Test Report
Dynamic Flow Computers
E-chart Plus
Prepared for:
Dynamic Flow Computers
12603 Southwest Freeway
Suite 320
Stafford, Texas 77477
By
Professional Testing (EMI), Inc.
1601 North A.W. Grimes Blvd., Suite B
Round Rock, Texas 78665
January 20, 2012
13042-10
Reviewed by
Written by
Robert McCollough
Director of Testing Services
Tara Duval
Technical Writer
January 20, 2012
Page 2 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table of Contents
Title Page ......................................................................................................................................................... 1
Certificate of Compliance ................................................................................................................................ 4
Introduction .......................................................................................................................................... 5 1.0 1.1 Scope ................................................................................................................................................ 5 1.2 Description of EUT .......................................................................................................................... 5 1.3 EUT Operation ................................................................................................................................. 5 1.4 Modifications to Equipment............................................................................................................. 5 2.0 Applicable Documents ..................................................................................................................... 6 3.0 Immunity Testing ................................................................................................................................. 7 3.1 Performance Criteria ........................................................................................................................ 7 3.2 Ripple on DC Input Power Port Immunity ...................................................................................... 7 3.2.1 Test Procedures ............................................................................................................................ 7 3.2.2 Performance Criteria .................................................................................................................... 7 3.2.3 Test Results .................................................................................................................................. 8 3.3 Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity .. 14 3.3.1 Test Procedures .......................................................................................................................... 14 3.3.2 Performance Criteria .................................................................................................................. 14 3.3.3 Test Results ................................................................................................................................ 14 Appendix A: Policy, Rationale, and Evaluation of EMC Measurement Uncertainty................................... 29 Appendix B: Accreditations .......................................................................................................................... 31 End of Report ................................................................................................................................................. 32 NOTICE:
(1) This Report must not be used to claim product endorsement, by NVLAP, NIST, the FCC or any other Agency. This
report also does not warrant certification by NVLAP or NIST.
(2) This report shall not be reproduced except in full, without the written approval of Professional Testing (EMI), Inc.
(3) The significance of this report is dependent on the representative character of the test sample submitted for evaluation
and the results apply only in reference to the sample tested. The manufacturer must continuously implement the
changes shown herein to attain and maintain the required degree of compliance.
13042-10
January 20, 2012
Page 3 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Certificate of Compliance
Applicant:
Applicant’s Address:
Dynamic Flow Computers
12603 Southwest Freeway
Suite 320
Stafford, Texas 77477
Model:
Serial Number:
PTI Project Number:
E-chart Plus
EPC10-905
13042-10
The E-chart Plus by Dynamic Flow Computers was tested utilizing the following documents and found
to be in compliance with the required criteria on the indicated test date.
Standard Test Type IEC 61000‐4‐17: 2002 Ripple on DC Input Power Port Immunity IEC 61000‐4‐29: 2000 Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Criterion Test Date A December 15, 2011
B December 16, 2011
I, Jeffrey A. Lenk, for Professional Testing (EMI), Inc., being familiar with the IEC 61000-4-17 and
IEC 61000-4-29 test procedures, have reviewed the test setup, measured data, and this report, and believe
them to be true and accurate.
Jeffrey A. Lenk
President
This report has been reviewed and accepted by Dynamic Flow Computers. The undersigned is responsible
for ensuring that the E-chart Plus by Dynamic Flow Computers will continue to comply with the
applicable rules.
__________________________________
Dynamic Flow Computers Representative
13042-10
January 20, 2012
Page 4 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
1.0
Introduction
1.1
Scope
The purpose of the EMC testing was to determine compliance with specific immunity standards. This
report describes the extent to which the equipment under test (EUT) conformed to the standards to which it
was tested and the manner in which that testing was conducted.
1.2
Description of EUT
The equipment under test (EUT) is the E-chart Plus by Dynamic Flow Computers. The E-chart Plus is
an explosion-proof computer powered by solar panel or direct 14.5 or 24-volt power input.
Manufacturer 1.3
Model Serial Number 32.760 kHz EPC10‐905 Processor Dynamic Flow Computers E‐chart Plus Oscillator Frequency EUT The system tested consisted of the following:
Description Explosion‐proof flow computer powered by 14.5 or 24 VDC 16 MHz EUT Operation
The EUT was exercised in a manner consistent with normal operations. It can be powered by solar panel in
remote areas or by 14.5 or 24 VDC inside facilities with power supply. For testing purposes, it was
powered with both 14.5 and 24 VDC power supplies. The EUT was visually monitored for anomalies
during testing and checked for functionality upon completion of each test.
1.4
Modifications to Equipment
No modifications were made to the EUT during the performance of the test program.
13042-10
January 20, 2012
Page 5 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
2.0
Applicable Documents
The following documents were used as reference for the test procedures specified herein.
Document Title IEC 61000‐4‐17 Description Electromagnetic compatibility (EMC) – Part 4‐17: Testing and measurement techniques – Ripple on DC input power port immunity test Date of Publication
2002 IEC 61000‐4‐29 Electromagnetic compatibility (EMC) – Part 4‐29: Testing and measurement techniques – Voltage dips, short interruptions and voltage variations on DC input power port immunity tests 2000 13042-10
January 20, 2012
Page 6 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
3.0
Immunity Testing
3.1
Performance Criteria
EUT performance during testing was classified by the following criteria:
Performance Criteria A
Normal performance within equipment specifications.
Performance Criteria B
Degradation or loss of function or performance that is self-recoverable
when the interfering signal is removed.
Performance Criteria C
Degradation or loss of function or performance that requires system
reset or operator intervention when the interfering signal is removed.
3.2
Ripple on DC Input Power Port Immunity
Ripple on DC Input Power Port Immunity testing was performed using the procedures of IEC 61000-4-17.
3.2.1
Test Procedures
The EUT was tested connected to a programmable test generator. An AC voltage of 2.4 VAC was
superimposed on the input lines. The test was run for 5 minutes at 10% ripple. A diagram showing the test
setup is given as Figure 3.2.1.1.
Figure 3.2.1.1: Ripple on DC Input Power Port Immunity Test Setup Diagram 3.2.2
Performance Criteria
Only performance criterion A was allowed during the performance of the test. Performance criteria B and
C were not allowed.
13042-10
January 20, 2012
Page 7 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
3.2.3
Test Results
The EUT was subjected to ripple on DC input power port immunity testing on December 15, 2011. The
EUT maintained normal operation during 5 minutes exposure to voltage ripple. No adverse indications
were
noted
during
the
performance
of
the
test.
Therefore,
the
EUT
met
IEC 61000-4-17 performance criterion A.
Table 3.2.3.1: Ripple on DC Input Power Port Immunity Test Equipment Professional Testing, EMI, Inc.
Test Method:
Section
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐17: 2002 – Ripple on DC Input Power Port Immunity Test
5
EUT Serial #:
12/15/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Ripple on DC Input Power Port Immunity Test Equipment List
Software Version:
MxGui Version 5.01
Test Profile:
4‐17
Asset #
Manufacturer
Model
Equipment Nomenclature
Serial Number
Calibration Due Date
1925
Agilent
DSOX2012A
Oscilloscope, 2 ch, 100 MHz
MY51135809
4/12/2012
1860
PTI
N/A
Switch, On‐Off
N/A
N/A
1766
1936
NI
GBIP‐USB‐HS, GBIP Adapter, USB
HA8497503
N/A
Ametek
MX45
AC/DC Power Source, 45 kVA
1123A00439
6/21/2012
13042-10
January 20, 2012
Page 8 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.2.3.2: Ripple on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC Professional Testing, EMI, Inc.
Test Method:
Section:
In accordance with:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐17: 2002 – Ripple on DC Input Power Port Immunity Test
5
Section:
0
5
EUT Serial #:
12/15/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Ripple on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC
13042-10
50 Hz Calibration – Scope AC Coupled
50 Hz Calibration – Scope DC Coupled
60 Hz Calibration – Scope AC Coupled
60 Hz Calibration – Scope DC Coupled
January 20, 2012
Page 9 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.2.3.3: Ripple on DC Input Power Port Immunity Test Results – 14.5 VDC Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐17: 2002 – Ripple on DC Input Power Port Immunity Test
5
EUT Serial #:
12/15/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Ripple on DC Input Power Port Immunity Test Results – 14.5 VDC
EUT Line Tested:
14.5 VDC
EUT Source Voltage
14.5
VDC
Line Tested
EUT Mode of Operation
Ripple Frequency
Test Duration
Test Results
14.5 VDC
Normal
50 Hz
5 Minutes
Pass, Criterion A
14.5 VDC
Normal
60 Hz
5 Minutes
Pass, Criterion A
13042-10
January 20, 2012
Page 10 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.2.3.4: Ripple on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐17: 2002 – Ripple on DC Input Power Port Immunity Test
5
EUT Serial #:
12/15/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Ripple on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC
13042-10
50 Hz Calibration – Scope AC Coupled
50 Hz Calibration – Scope DC Coupled
60 Hz Calibration – Scope AC Coupled
60 Hz Calibration – Scope DC Coupled
January 20, 2012
Page 11 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.2.3.5: Ripple on DC Input Power Port Immunity Test Results – 24 VDC Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐17: 2002 – Ripple on DC Input Power Port Immunity Test
5
EUT Serial #:
12/15/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Ripple on DC Input Power Port Immunity Test Results – 24 VDC
EUT Line Tested:
24 VDC
EUT Source Voltage
24
VDC
Line Tested
EUT Mode of Operation
Ripple Frequency
Test Duration
Test Results
24 VDC
Normal
50 Hz
5 Minutes
Pass, Criterion A
24 VDC
Normal
60 Hz
5 Minutes
Pass, Criterion A
13042-10
January 20, 2012
Page 12 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.2.3.6: Ripple on DC Input Power Port Immunity Test Setup Photographs Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐17: 2002 – Ripple on DC Input Power Port Immunity Test
5
EUT Serial #:
12/15/2011
EPC10‐905
EUT Part #:
None
Dynamic Flow Computers
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Ripple on DC Input Power Port Immunity Test Setup Photographs
Ripple on DC Input Power Port Immunity Test Setup
EUT
Switch
13042-10
January 20, 2012
Page 13 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
3.3
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port
Immunity
Voltage dips, short interruptions, and voltage variations on DC input power port immunity testing was
performed using the procedures of IEC 61000-4-29.
3.3.1
Test Procedures
The EUT was tested while connected to a programmable test generator. The shortest power supply cable
suitable to the application of the EUT was attached. The EUT was subjected to a voltage dip of 60% for
20 mS and a voltage dropout of 100% for 20 mS. A diagram showing the test setup is given as
Figure 3.3.1.1.
Figure 3.3.1.1: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Setup Diagram 3.3.2
Performance Criteria
Performance criterion A and performance criterion B were allowed during the performance of the voltage
dip and voltage dropout tests. Performance criterion C was not allowed.
3.3.3
Test Results
The EUT was subjected to voltage dips, short interruptions, and voltage variations on DC input power port
immunity testing on December 16, 2011. During the performance of the test, EUT cycled power, then
rebooted and continued normal operation. Therefore, the EUT met IEC 61000-4-29 performance
criterion B.
13042-10
January 20, 2012
Page 14 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.1: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Equipment Professional Testing, EMI, Inc.
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
None
Dynamic Flow Computers
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Equipment List
Software Version:
MxGui Version 5.01
Test Profile:
4‐29
Asset #
Manufacturer
Model
Equipment Nomenclature
Serial Number
1925
Agilent
DSOX2012A
Oscilloscope, 2 ch, 100 MHz
MY51135809
Calibration Due Date
4/12/2012
1860
PTI
Switch, On‐Off
N/A
N/A
1766
1936
NI
N/A
GBIP‐USB‐HS, GBIP Adapter, USB
HA8497503
N/A
Ametek
MX45
AC/DC Power Source, 45 kVA
1123A00439
6/21/2012
13042-10
January 20, 2012
Page 15 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.2: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC, Page 1 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC
13042-10
Page:
1 of
5
40% for 10 mS Calibration Waveform
40% for 30 mS Calibration Waveform
40% for 100 mS Calibration Waveform
40% for 300 mS Calibration Waveform
Page 16 of 32
January 20, 2012
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.3: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC, Page 2 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC
13042-10
Page:
2 of
5
40% for 1 Sec Calibration Waveform
80% for 0.1 S Calibration Waveform
80% for 0.3 S Calibration Waveform
80% for 1 Sec Calibration Waveform
Page 17 of 32
January 20, 2012
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.4: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC, Page 3 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC
80% for 3 Sec Calibration Waveform
3 of
5
80% for 10 Sec Calibration Waveform
120% for 0.1 Sec Calibration Waveform
13042-10
Page:
January 20, 2012
120% for 0.3 Sec Calibration Waveform
Page 18 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.5: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC, Page 4 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC
13042-10
Page:
4 of
5
120% for 1.0 Sec Calibration Waveform
120% for 3 Sec Calibration Waveform
120% for 10 Sec Calibration Waveform
0% for 0.01 Sec Calibration Waveform
Page 19 of 32
January 20, 2012
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.6: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC, Page 5 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 14.5 VDC
0% for 0.03 Sec Calibration Waveform
13042-10
Page:
5 of
5
0% for 1 Sec Calibration Waveform
January 20, 2012
Page 20 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.7: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Results – 14.5 VDC Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Results – 14.5 VDC
EUT Line Tested:
Test Test Level #
(% of Nominal)
14.5 VDC
Test Level
(VDC)
EUT Source Voltage
Test Duration # Applied
(seconds)
14.5
VDC
Performance Criterion Required
Performance Criterion Achieved
Test Result
1
40%
5.8
0.01
3
B
A
Pass
3
40%
5.8
0.03
3
B
A
Pass
4
40%
5.8
0.10
3
B
A
Pass
5
40%
5.8
0.30
3
B
A
Pass
6
40%
5.8
1.00
3
B
A
Pass
7
80%
11.6
0.10
3
A
A
Pass
8
80%
11.6
0.30
3
A
A
Pass
9
80%
11.6
1.00
3
A
A
Pass
10
80%
11.6
3.00
3
A
A
Pass
11
80%
11.6
10.00
3
A
A
Pass
12
120%
17.4
0.10
3
A
A
Pass
13
120%
17.4
0.30
3
A
A
Pass
14
120%
17.4
1.00
3
A
A
Pass
15
120%
17.4
3.00
3
A
A
Pass
16
120%
17.4
10.00
3
A
A
Pass
17
0%
0
0.01
1
B
B, see note 1
Pass
18
0%
0
0.03
1
B
B, see note 1
Pass
19
0%
0
1.00
1
B
B, see note 1
Pass
Note 1: EUT cycled power, then rebooted and continued normal operation.
13042-10
January 20, 2012
Page 21 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.8: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC, Page 1 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC
13042-10
Page:
1 of
5
40% for 10 mS Calibration Waveform
40% for 30 mS Calibration Waveform
40% for 100 mS Calibration Waveform
40% for 300 mS Calibration Waveform
Page 22 of 32
January 20, 2012
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.9: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC, Page 2 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC
13042-10
Page:
2 of
5
40% for 1 Sec Calibration Waveform
80% for 0.1 S Calibration Waveform
80% for 0.3 S Calibration Waveform
80% for 1 Sec Calibration Waveform
Page 23 of 32
January 20, 2012
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.10: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC, Page 3 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC
80% for 3 Sec Calibration Waveform
3 of
5
80% for 10 Sec Calibration Waveform
120% for 0.1 Sec Calibration Waveform
13042-10
Page:
January 20, 2012
120% for 0.3 Sec Calibration Waveform
Page 24 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.11: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC, Page 4 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC
13042-10
Page:
4 of
5
120% for 1.0 Sec Calibration Waveform
120% for 3 Sec Calibration Waveform
120% for 10 Sec Calibration Waveform
0% for 0.01 Sec Calibration Waveform
Page 25 of 32
January 20, 2012
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.12: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC, Page 5 Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Calibration Waveforms – 24 VDC
0% for 0.03 Sec Calibration Waveform
Page:
5 of
5
0% for 1 Sec Calibration Waveform
13042-10
January 20, 2012
Page 26 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.13: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Results – 24 VDC Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
None
Dynamic Flow Computers
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Results – 24 VDC
EUT Line Tested:
Test Test Level #
(% of Nominal)
24 VDC
Test Level
(VDC)
EUT Source Voltage
Test Duration # Applied
(seconds)
VDC
24
Performance Criterion Required
Performance Criterion Achieved
Test Result
1
40%
9.6
0.01
3
B
A
Pass
3
40%
9.6
0.03
3
B
A
Pass
4
40%
9.6
0.10
3
B
A
Pass
5
40%
9.6
0.30
3
B
A
Pass
6
40%
9.6
1.00
3
B
A
Pass
7
80%
19.2
0.10
3
A
A
Pass
8
80%
19.2
0.30
3
A
A
Pass
9
80%
19.2
1.00
3
A
A
Pass
10
80%
19.2
3.00
3
A
A
Pass
11
80%
19.2
10.00
3
A
A
Pass
12
120%
28.8
0.10
3
A
A
Pass
13
120%
28.8
0.30
3
A
A
Pass
14
120%
28.8
1.00
3
A
A
Pass
15
120%
28.8
3.00
3
A
A
Pass
16
120%
28.8
10.00
3
A
A
Pass
17
0%
0
300.00
1
B
A
Pass
18
0%
0
300.00
1
B
B, see note 1
Pass
19
0%
0
300.00
1
B
B, see note 1
Pass
Note 1: EUT cycled power, then rebooted and continued normal operation.
13042-10
January 20, 2012
Page 27 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 3.3.3.14: Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Setup Photographs Professional Testing, EMI, Inc.
Test Method:
Section:
Test Date(s):
Customer:
Project Number:
Purchase Order #:
Equip. Under Test:
IEC 61000‐4‐29: 2000 – Voltage dips, short interruptions, and voltage variations on DC input power port immunity test
5
EUT Serial #:
12/16/2011
EPC10‐905
EUT Part #:
Dynamic Flow Computers
None
Test Technician:
13042‐10
Joseph Peters
Supervisor:
3616
Erik Ray
Witness' Name:
E‐chart Plus
None
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity Test Setup Photographs
Voltage Dips, Short Interruptions, and Voltage Variations on DC Input Power Port Immunity EUT
Switch
13042-10
January 20, 2012
Page 28 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Appendix A: Policy, Rationale, and Evaluation of EMC Measurement Uncertainty
All uncertainty calculations, estimates and expressions thereof shall be in accordance with NIST policy.
Since PTI operates in accordance with NIST (NVLAP) Handbook 150-11: 2007, all instrumentation
having an effect on the accuracy or validity of tests shall be periodically calibrated or verified traceable to
national standards by a competent calibration laboratory. The certificates of calibration or verification on
this instrumentation shall include estimates of uncertainty as required by NIST Handbook 150-11.
1. Rationale and Summary of Expanded Uncertainty.
Each piece of instrumentation at PTI that is used in making measurements for determining conformance to
a standard (or limit), shall be assessed to evaluate its contribution to the overall uncertainty of the
measurement in which it is used. The assessment of each item will be based on either a type A evaluation
or a type B evaluation. Most of the evaluations will be type B, since they will be based on the
manufacturer’s statements or specifications of the calibration tolerances, or uncertainty will be stated along
with a brief rationale for the type of evaluation and the resulting stated uncertainties.
The individual uncertainties included in the combined standard uncertainty for a specific test result will
depend on the configuration in which the item of instrumentation is used. The combination will always be
based on the law of propagation of uncertainty. Any systematic effects will be accommodated by
including their uncertainties, in the calculation of the combined standard uncertainty; except that if the
direction and amount of the systematic effect cannot be determined and separated from its uncertainty, the
whole effect will be treated as uncertainty and combined along with the other elements of the test setup.
Type A evaluations of standard uncertainty will usually be based on calculating the standard deviation of
the mean of a series of independent observations, but may be based on a least-squares curve fit or the
analysis of variance for unusual situations. Type B evaluations of standard uncertainty will usually be
based on manufacturer’s specifications, data provided in calibration reports, and experience. The type of
probability distribution used (normal, rectangular, a priori, or u-shaped) will be stated for each Type B
evaluation.
In the evaluation of the uncertainty of each type of measurement, the uncertainty caused by the operator
will be estimated. One notable operator contribution to measurement uncertainty is the manipulation of
cables to maximize the measured values of radiated emissions. The operator contribution to measurement
uncertainty is evaluated by having several operators independently repeat the same test. This results in a
Type A evaluation of operator-contributed measurement uncertainty.
A summary of the expanded uncertainties of PTI measurements is shown as Table 1. These are the worstcase uncertainties considering all operative influence factors.
13042-10
January 20, 2012
Page 29 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Table 1: Summary of Measurement Uncertainties for Site 45 Type of Measurement Mains Conducted Emissions Telecom Conducted Emissions Radiated Emissions 13042-10
Frequency Range Meas. Dist. 150 kHz to 30 MHz 150 kHz to 30 MHz 30 to 1,000 MHz 1 to 18 GHz N/A N/A 10 m 3 m January 20, 2012
Expanded Uncertainty U, dB (k=2) 2.9 2.8 4.8 5.7 Page 30 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
Appendix B: Accreditations
Laboratory Accreditation
NVLAP accreditation to ISO/IEC 17025: 2005 with the following scope of accreditation: Lab code
200062-0.

IEC 61000-4-17, Edition 1.1 (2002-07)
Agency Testing Approvals/Registration

Federal Communications Commission (FCC) Type 2.948 listed test firm for measuring devices
subject to certification under Parts 15 & 18.

Industry Canada O.A.T.S. filing number 3036B-1 for 3 m chamber and 10 m chamber.

Voluntary Control Council for Interference (VCCI) registration for Japan for the following scope:
o Mains Ports Conducted Interference Measurement (Registration number C-2701)
o Telecom Ports Conducted Interference Measurement (Registration number T-1692)
o Radiated Interference Measurement (Registration number R-2461)
o Radiated Interference Measurement > 1 GHz (Registration number G-283)
13042-10
January 20, 2012
Page 31 of 32
Dynamic Flow Computers – E-chart Plus Electromagnetic Compatibility Test Report
End of Report
(This page intentionally left blank.)
13042-10
January 20, 2012
Page 32 of 32