IMPAGINATO XMD-300 NEW 30-04-2004 14:35 Pagina 1 XMD-300 Diffractometer Specifications X-ray tube voltage Up to 50 kV X-ray tube power Up to 50 W Target material options Cu, Cr and Mo Max. sample dimensions H 18 cm, W 20 cm, D 20 cm PC interface USB 2.0 Application and acquisition software Windows® XP based Overall dimensions H 83 cm, W 71 cm, D 78 cm Weight 75 kg Input supply 100 V to 275 V single phase (approx.) The XMD-300 Diffractometer range XMD-310 Phase analysis XMD-315 Phase and Element analysis XMD-320 Stress analysis 83cm XMD-325 Stress and Element analysis XMD-330 Phase, Stress and Element analysis 71cm 78cm Company profile Through its collaboration with the Institute for Roentgen Optics, an internationally renowned X-ray research centre, Unisantis is focused on forging breakthroughs in the field of applications for X-ray technology. Unisantis incorporates state of the art technology for X-ray beam collimation and/or focusing within its entire range of products, and is committed to the development of innovative solutions which incorporate a new spectrum of functions and user benefits. Innovative Utilising patented Kumakhov’s poly-capillary Optics the need for monochromator, collimators and slits is eliminated. Versatile The versatile design integrates convenient handling of large samples with a simple user interface into a compact, transportable desktop unit. Tel. +41 22 879 11 70 Fax +41 22 792 60 11 info@unisantis.com www.unisantis.com © 2004 Unisantis S.A. Unisantis is a trademark or registered trademark of the Unisantis Holding Company Limited. Specifications are subject to change without prior notice May 2004 300/1 Unisantis S.A. Avenue des Morgines 12 1213 Petit-Lancy Geneva Switzerland Multifunctional X-ray diffractometer for Phase, Stress and Element analysis Competitive price/performance ratio With combined XRD and XRF analysis capabilities, the XMD-300 series is the ideal instrument for quality control and research laboratories. XMD-300 IMPAGINATO XMD-300 NEW 30-04-2004 14:35 Pagina 3 XMD-300 Diffractometer Areas of application Technical features A multifunctional XRD/XRF instrument with a wide range of capabilities, ideally suited for a variety of quality control and research applications including: The analysis time is significantly reduced due to the beam collimating efficiency provided by patented Kumakhov’s poly-capillary Optics. • Engineering industries A new patented raster filter assembled with the detector improves the signal to noise ratio on data acquisition. 2 • University and educational laboratories Interchangeable X-ray tubes allows for different applications to be run on the same instrument in a matter of minutes. • Metallurgy • Geology and mining The sample spinner provides uniform analysis of powder samples. • Cement, chemical and fertilizer industries Z • Environmental monitoring Non-destructive analysis can be performed on a wide range of materials and manufactured parts and components. Analysis of manufactured components Type of analysis The air cooled low power X-ray tube significantly reduces maintenance cost. Ideal for qualitative and quantitative phase analysis, peak profi le analysis, residual stress determination and structure identification. Tube and detector positioning axes The XMD-300 series offers the unique option of analysing raw materials and manufactured components, without need of sample preparation. User benefits Intuitive operation of integrated hardware and software is controlled through a single USB 2.0 interface. In addition, the XMD-300 series facilitates the analysis of materials in a wide range of physical forms and states including solids, powders, pressed pellets, liquids, slurries, granules, films and coatings. The ergonomic and transportable design is ideal for performing on-site measurement and analysis. Element analysis Powder sample The XMD-300 series provides excellent sample accessibility and visibility due to a large sample chamber capacity and radio-opaque front door. Software features The software system is a complete suite of applications including instrument control, data acquisition and data analysis. Integrated control features allow the user to Phase analysis software includes profile fitting, search-match for qualitative phase analysis using the ICDD-PDF2 database and quantitative phase analysis using full-profile matching. constantly monitor the status of the instrument and to control the position of the X-ray tube and detectors. Stress analysis software enables Background Subtraction, Profile Fitting and Stress Determination. The instruments comply with IEC and EN standards and are covered by a 2 year limited warranty. Element analysis software provides qualitative and quantitative analysis of the chemical composition of elements. Intuitive interface Sample accessibility