International Cooperation Forum
Automotive IC-Design
Challenges – Strategies – Trends
Munich, Germany, October 25, 2005
Robustness and Reliability Facing new Quality Levels for Automotive ICs
with Design for Yield
Andreas Ripp
Vice President Sales & Marketing
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
MunEDA Company Overview
••
••
••
••
••
Company
CompanyStart
Start2002
2002
Spin
-off from
Spin-off
fromEDA
EDAInstitute
Instituteof
ofMunich
MunichTechnical
TechnicalUniversity
University
Worldwide
WorldwideTeam:
Team:>>25
25
Worldwide
WorldwideSales
Sales&&Support:
Support:Europe,
Europe,USA
USAand
andTaiwan
Taiwan
WiCkeD*:
-DFY-DFR EDA
WiCkeD*:Silicon
Siliconproven
provenDFM
DFM-DFY-DFR
EDASoftware
SoftwareSolution
Solution
*In USA also DesignMD
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Functionality covered by automotive electronic systems
Convenience
Electronics
Driver
Information
Communication
In-car entertainment
electronics
Automotive
Safety
► 25% average car value comprises of electrical & electronical
components in 2005 Æ half of this: semiconductors
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Automotive Semiconductor Market – stable growth
$ 25 Bn
$ 16 Bn
AAGR: 9%
2004
63%
MOS micro ICs
MOS memory
2009
► The $16-plus billion worldwide automotive semiconductor business
in 2004 will rise at an AAGR* of 9% through 2009 to nearly $25 billion
*AAGR: average annual growth rate
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Source: BCC Research
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Semiconductors in Automotives
Memory ICs
Discrete & Optoelectronics
• SRAM
• DRAM
• Flash
• EEPROM
• MRAM
• IGBT
• Power MOSFET
• Power Management
• Transistor
• IGBT Power, Bipolar, FET,
MOSFET, Small Signal
Bipolar, Power MOS
• Diode Rectifier
• Varistors
• Optoelectronics LED
Analog &
Mixed-Signal
• SDC
• Power IC
• ASSP
Logic ICs
Micro ICs & ASIC
Sensors
► Need for accurate, closed-loop, real-time control,
and processing of large volumes of data from multiple sensors
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Robustness & Reliability in automotive IC design
Robustness & Reliability
ICs/Circuits robust and stable against all
influences, variations, failures, and defects in
design, manufacturing, operation lifetime
►Goal: Maximum Yield & Sero-Defect-Rate
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Business & Technology Challenges in Automotive IC Design
Design Challenges
Business Challenges
Customers of Automotive ICs
Influenced by
Efficiency
Competitiveness
Quality &
Reliability
Delivery
Low
Price
Time to
market
Product
Accuracy
High
Volume
Low Cost
& Effort
Time to
Production
Time to
Volume
Design & Production
Reliability
Yield &
Robustness
- Design effort
- Design cost
- Respin quota
Design
Efficiency
Design
Complexity
Process
aware design
- Design time
- Design quality
- # Redesigns
- SoC
- Mixed-Signal
- Technology shrink
- Process variations
- Operating conditions
- Design specifications
► Design & Manufacturing effort, time, reliability and yield
main success drivers for automotive ICs
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Customer goals for automotive IC design
„8% efficiency improvement per year!“ *
Î i.e. design projects in 2010 require in average
only 60% of today‘s design time & effort
Effects ?!:
•
•
•
•
More time for running design projects
Lower design cost
Less bottle-necks in design projects
Higher number of simultaneous design projects
possible with same ressources
* Customer management
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Customer reality and vision
Customer IC project duration reality today (2005): ∅ 19 Months
First Design
Month 0
1st Production &
Test Cyle
6
9
1st Redesign
2nd Production
& Test Cyle
11
2nd Redesign
14
3rd Production
Delivery
& Test Cyle
16
19
Î Main influence on design time efficiency: Redesign
Customer Vision & Targets for IC Design & Manufacturing 2010 :
• First time silicon right !
• Redesign only in very exceptional cases !
• Multiple Redesigns not permitted !
Delivery
?
12
Month 0
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Target: - 33%
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Respins main risk for semiconductor time-to-market
Revenue
Production
Design + Fab + Test
Respin
1
Respin
2
Market Window
Time
Ò IBM quote: „3 months delay equals 500M$ loss !“
Source: Cadence, IBM
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Technical influence parameters on automotive IC designs
Integration Level:
System-on-chip (SoC)
Mixed-Signal
System-Level
Block-Level
Redundancy
Technology Level:
Nano-Technologies
Process Variations
Mismatch
Dependencies
Correlations,..
Constraints & Performances
Level:
Sizing Rules
Gain
Power
Phase, Phase Margin
Frequency, Noise
CMMR, PSRR, …
Operation Conditions
Level:
Temperature
Supply Voltage
Load
Voltage-/Current-Stability
Aging, Failure Safety,…
► Existing and new design challenges require innovative and
enhanced design, sizing and optimization methodologies
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Design of block-level circuits – using DFM DFY DFR methodology
time to market
Microchip-Development
Microchip-Production
Sales
Customerrequirements
Design
Layout
Fab
Test
Design of block-level components
Topologydesign
Change of DeviceParameter (Sizing)
Trash
Simulation
Until now by
hand
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Design of block-level circuits – using DFM DFY DFR methodology
time to market
Microchip-Development
Microchip-Production
More Sales
Customerrequirements
Design
Layout
Fab
Test
Higher
Yield
Design of block-level components
Topologydesign
Less Trash
Analysis and optimization
(sizing) of circuits on block-level
using MunEDA DFM DFY DFR technology
By factors
faster and much
more efficient
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Need of new design methodologies for automotive ICs
Methodology
Target
Focus on
Effects
DFM
DFY
DFR
Design for
Manufacturability
Design for
Yield
Design for
Reliability
Functionality
Yield,Volume
Reliability
IC Design
IC Manufacturing
IC Operation
- Effort (time&cost)
reduction
- Design accuracy
- Time-to-production
- Yield improvement
- Cost reduction
- Delivery safety
-Reliability
-Failure safety
-Robustness
► All three issues DFM, DFY and DFR can have
definitive & decisive influence on circuit design
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
MunEDA and WiCkeD – solutions for DFM DFY DFR
Application Field
WiCkeD Features
DFM – Design for
Manufacturability
- Circuit Structure Recognition & Analysis
- Constraint Management
- Feasibility Optimization
- Sensitivity Analysis
- Nominal Diagnosis & Performance Optimization
DFY – Design for
Yield
- Monte Carlo & Yield Analysis
- Yield Optimization & Design Centering
- Worst Case & Correlation Diagnosis
- Mismatch Analysis
DFR – Design for
Reliability
- Worst Case Operation
- Operation Condition Influence Analysis & Optimization
- Design reliability & accuracy analysis
* WiCkeD: Worst Case Distances
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
MunEDA Applied to Customer projects and technologies
Technologies:
Technologies:
Circuits:
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
Adiabatic Logic Gates
Bandgaps
Buffer chains
Bypass Filters
Cascode Gain Stages
CCOs
Charge Pumps
CML Converters
Comparators
Constant Voltage Sources
Current Mirrors
Current Sources
Current Mirror OpAmps
Differential Amplifiers
Filters
Folded-Cascode OpAmps
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
Fully Differential OpAmps
High Voltage Circuits
Latches
Level Shifters
Low Voltage Circuits
Operational Amplifiers
PLLs
Receivers
RF-Circuits
Ring Oszillators
Sens Amplifiers
Sensor Circuits
Single-Stage Amplifiers
Transceivers
VCOs
… and more
¾¾ 500n
500n
350n
350n
180n
180n
130n
130n
90n
90nCMOS
CMOS
¾¾ First
Firstprojects
projectsinin65n
65n
CMOS
started
CMOS started
¾¾ BiCMOS
BiCMOSand
andBipolar
Bipolar
Proven in more than 250 design and tape-out projects since 2002
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Customer Example 1: Yield & Robustness
IC: Operational Amplifier used as Voltage Regulator in
automotive communication system
Task:
Original circuit manufactured in 180 nm process
technology. Design reused, resizing & yield
ramp up for 130 nm.
DFM / DFY - Solution:
In three steps from 0% to 99% Yield
Feasibility Optimization
Nominal Diagnosis & Optimization
Yield Analysis & Optimization
Succesful Yield ramp up for new technology in 30 min simulation time!
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Customer Example 2: Design & Production Reliability
IC: BiCMOS operational amplifier for automotive
applications migrated to a new technology with e.g.
bipolar gain being lower than with older technology.
Status: Specifications are not fulfilled, especially not the
open-loop gain, A0.
Task – DFM-DFR Approach:
Within two steps to a robust and reliable design:
1.Fulfilling constraints and sizing rules
2.Nominal circuit optimization
Result:
Specification are now fulfilled for nominal process and operating
conditions. Further yield optimization results in high robustness
against temperature & voltage supply variations.
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Customer Example 3: Design Time & Effort Reduction
IC: Transimpedance Amplifier for automotive optoelectronic
system designed for 350nm process technology.
Problem:
• Tough operating requirements specified with
high bandwidth and stability.
• Performance maximization showed too
complex task for manual design. Automated
DFM, DFY & DFR methodologies applied.
Start
Design Time
Previousl
y Sized
Manually
WiCkeD
(1.5MHz)
WiCkeD
(4 MHz)
4 weeks
1 day
1 day
Bandwidth†
(MHz)
0.38
1.5
1.5
4.0
2nd Pole
(MHz)
83
250
500
457
† Bandwidth optimized while maintaining a minimum gain of 60dB
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Benefits:
ÒSignificant design time savings
Sizing time from 4 weeks to 1 day
ÒPerformance & robustness
improvement
Bandwidth increased from 0.38 to 4.0 MHz
Second pole raised from 83 to 457 MHz
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
Customer Project Example 4: Time to Volume Improvement
•
•
•
Circuit: Voltage reference in a flash memory product
Key issues: Low power, Vth mismatch, non-linear temperature curve
Yield on first silicon 20% even after trimming, due to parametric failures
Application of MunEDA technology:
•
•
•
Yield
Analysis:
Conclusion:
Conclusion:
Silicon results confirmed, predicted yield matches
measured data
With
DFM-DFY-DFR:
With
DFM-DFY-DFR:„First
„Firstsilicon
siliconright“.
right“.
Parameter Influence
Analysis:
Mismatch sensitive transistors identified, area
100
allocation modified
Yield Optimization: Fully automatic improvement
from 20% to 83% parametric yield.
Parametric yield improvement confirmed by
second silicon.
80
Yield
•
60
40
20
•
Indication for further topological change: expected
yield after modifications: 93%.
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
0
Initial
Opt1
Opt2
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com
MunEDA - benefits for Circuit Design and Manufacturing Process
MunEDA:
MunEDA: DFM
DFM DFY
DFY DFR
DFR -- Benefits
Benefits
for
for Circuit
Circuit Design
Design and
and Manufacturing
Manufacturing
Ò DFM - Reduce IC design time & cost
Ò DFY - Maximize IC yield & volume
Ò DFR - Guarantee IC reliability & robustness
Main
Main Goal:
Goal: First
First silicon
silicon right
right
Reduce
Reduce cost
cost and
and speed
speed up
up time-to-market
time-to-market !!
© 2001 - 2005 Copyright by MunEDA GmbH
All rights reserved. Product information is subject to change
without notice. All trademarks and registered trademarks are
property of their respective owners. Rev 09-2005
Sales & Support Europe & Asia
MunEDA GmbH - Notinger Weg 48
85521 Riemerling – Germany
Tel +49-89-60019033
Fax +49-89-66007386
Email info@muneda.com
Web http://www.muneda.com
Sales & Support America & Taiwan
ChipMD Inc. - 20863 Stevens Creek Blvd
Suite 400 – Cupertino - CA 95014 - USA
Tel +1-408-725-9580
Fax +1-408-725-9584
Email info@chipmd.com
Web http://www.chipmd.com