276 Chapter 7 • Signal/Power Integrity Interactions high. Furthermore, effectiveness of stitching decoupling capacitors is low at high frequencies compared to stitching vias. Link-level time domain analysis was also performed and key conclusions were confirmed at the system level. Finally, a routing guideline for a platform design was recommended for stitching vias and caps. Here, a 100-mil stitching via distance is recommended if AC common-mode specification for I/O circuits and EMI specifications are tight. However, this rule may be significantly relaxed if AC common mode noise and its induced EMI issue is only a slight concern. Table 7.1 System Level Simulation Results on an 8-Inch 6.4Gbps Microstrip System No CM Injection With CM Injection DM EH (mV) DM EW (ps) DM EH (mV) DM EW (ps) AC CM (mV) No Transition 73 100 69 98 37 2 decap, 100 mil 65 96 60 94 38 1 decap, 600 mil 65 96 61 95 41 Source: M. Wang and W. H. Ryu, “System Level Impact of Stitching Vias and Capacitors for High-Speed Differential Links,, 57th ECTC © [2007] IEEE. 7.8 EMI Trade-Off Chapter 3, “Electromagnetic Effects,” described the various electromagnetic aspects of a signaling system that must be considered in detail to achieve the high speeds required in systems today and in the future. An optimized design can be achieved only by designing for power integrity, signal integrity, and EMC early in the design cycle [18]. 7.8.1 Power Islands Radiation Power plane shapes need to be carved out in the layers of the motherboard to reduce the reference plane transitions that cause noise coupling into the signals. However, these plane shapes need to be properly designed to prevent excessive radiation. Due to the noise current of switching I/O buffers, the radiation from power-ground plane resonance of multilayer PCBs can cause a large amount of emission. Although it is well known that the peak frequencies of radiated emissions are related to cavity-mode frequencies, many theories about the location and 7.8 EMI Trade-Off 277 size of decoupling capacitors have been studied in relation to board size, thickness, and frequency of interest. Power islands for DDR3 devices running at 1066MT/s and motherboard (MB)/DIMMs can be a source of radiation not only because of the multilayer power-ground cavity but also because of the microstrip antenna (also called patch antenna) that may be associated with the geometry [12, 13]. Edge radiated coupling phenomenon and cavity resonances can be reduced by using adequate remedies [14, 15]. The isolation between the ground and power areas shown in Figure 7.48 can be achieved by having a large gap and series impedance between the coplanar ground-power pair [16]. When far away from the cavity resonances of the power/ ground pair, the coupling between the two islands is weak because the gap capacitance is extremely low, compared to the interplane capacitance. However, at frequencies where the power bus structure is resonant, it is possible to obtain relatively good coupling between planes, and the isolation can be significantly reduced. Other constraints may not allow mitigation techniques, such as having a symmetric stack up or no open edges. The study of the radiation mitigation of a multilayer stackup with powerislands is performed starting from the analysis of cavity resonances and radiating frequencies. Figure 7.48 (a) has been studied as a starting point in a two-layer configuration, whereas Figure 7.48 (b), which is a more complex and realistic geometry, has been studied with the four-layer stack-up configuration, as shown in Figure 7.48 (c). The two conducting plates of Figure 7.48 (a) have width W = 1.4-inch and length L = 5.3-inch, conductivity V = 5.7e7 S/m, and are separated by a dielectric of relative permittivity Hr = 4.2 and loss tangent tan G = 0.002. The separation distance is h = 3.9mils. The plates have been excited by a voltage source Vs = 20mV with a small series resistance Rs = 50m:, representing the noise voltage due to the SSO of the memory controller on the board. The voltage source is inserted at x = 0.1-inch, y = 0. The frequency range of interest is 200MHz to 3GHz. The ground plane dimensions are 12"u13". A bare board analysis with no components other than the voltage source Vs provides insight about the cavity resonances and the radiation emission levels associated with them. As expected, all the peak resonances in the radiation spectrum are related to the cavity resonance frequencies of the power-bus: fr = 523MHz, 1.05MHz, 1.58GHz, 1.99GHz, 2.06GHz, 2.11GHz 2.26GHz, 2.55GHz, and 2.65GHz. 278 Chapter 7 • Signal/Power Integrity Interactions A y A x Power Ground (a) A y A x Power Ground (b) (c) Figure 7.48 stackup Power-bus structure (geometric details) for a two- and four-power-layer board Edward K. Chan, Mauro Lai, Myoung Joon Choi, and Woong Hwan Ryu, “Concurrent Analysis of Signal-Power Integrity and EMC for High-Speed Signaling Systems,” IEEE EMC © [2007] IEEE. 7.8 EMI Trade-Off 279 The analysis of the emission profile measured in dBμV/m at 3 meters shows that without using any EMI precaution, this simple structure can radiate beyond the FCC Class B open-box limits. The radiation can be reduced by 3 to 10dB by using 8 to 10 decoupling capacitors (C = 10nF, ESL = 0.5nH and ESR = 22m:), by increasing the gap size from 16mils to 30mils, and by adding a well-connected ground filling area around the power island. Figure 7.49 shows the reduction in the emission level obtained. The following table depicts a number of the beforeand-after peak emissions: Old Values 680 MHz 1.18 GHz 1.67 GHz 2.18 GHz 2.7 GHz 64 69 66 67 66 New Values 780 MHz 1.2 GHz 1.7 GHz 2.3 GHz 2.7 GHz 59 60 58 60 59 The more complex shape in Figure 7.48 (b) has dimensions W1 = 1.4" W2 = 0.9", length L1 = 5.3", L2 = 4" (with the indexes 1 and 2 indicating the shortest and longest segments, respectively). The separation distance is different for each of the power/ ground pairs and varies from h = 3.9mils to h = 20mils. The plates have been excited by a voltage source Vs = 10mV with a small series resistance of Rs = 50m:. The frequency range of interest in this case is 150MHz to 1.5GHz. The ground plane extent is 12"u13". The 3D Finite Element Method has been used to perform the simulations shown in Figure 7.50. The bare board (no vias or decoupling capacitors between power and ground) emission level is above the FCC Class B open box limits. By adding ground connections, and stitching vias, and inserting an adequate number of decoupling capacitors, 22 in this case (C = 10nF, ESL = 0.5nH, ESR = 22mOhm), it has been possible to dramatically reduce the emission level of the board. The location of the decoupling capacitors has been based on the electric field map at the peak frequency of 1.35GHz, as shown in Figure 7.51, and capacitors have been located where the electric field was denser, offering a return path to the currents. An optimization algorithm can be applied to better locate the decoupling capacitors and to automatically determine the value of the decoupling capacitors. EMI has to be taken into consideration early in the design process to avoid problems later. The multilayer parallel-plate configuration can be studied with a combined cavity/patch-antenna approach. By means of simulation results, it has been shown how significant the impact of radiations can be if precautions and 280 Chapter 7 • Signal/Power Integrity Interactions (a) (b) Figure 7.49 2D Finite Elements Method simulation results for rectangular two-layer bare (a) and modified (b) board Edward K. Chan, Mauro Lai, Myoung Joon Choi, and Woong Hwan Ryu, “Concurrent Analysis of SignalPower Integrity and EMC for High-Speed Signaling Systems,” IEEE EMC © [2007] IEEE. 7.8 EMI Trade-Off 281 Figure 7.50 3D Finite Elements Method simulation results for complex shape on four-layers boards; comparison with and without EMI mitigation Edward K. Chan, Mauro Lai, Myoung Joon Choi, and Woong Hwan Ryu, “Concurrent Analysis of Signal-Power Integrity and EMC for High-Speed Signaling Systems,” IEEE EMC © [2007] IEEE. design strategies are not taken into consideration. Simulation investigation can provide insights about the amount and nature of the radiations. Because the radiated field is proportional to the spacing between the planes, the cavity resonance or the patch-antenna mechanism plays different roles depending on the thickness of the board [17]. Reducing emissions has a cost in terms of space allocation on the board, along with manufacturing and components costs; therefore, early stage simulations and analysis can show if remedies are needed or not. This simulation work has shown that by considering similar structures and similar remedies, the potential gain achieved in terms of mitigation of radiation level can be quite significant. In this chapter, we described the power delivery to signal coupling mechanisms. The power noise can be coupled to the signal traces through driver circuitry and reference transitions and can get amplified by channel resonances. The effect of stitching vias and decoupling capacitors on the signal performance was also discussed. Interconnect structures play a major role in power integrity effects on signaling performance. Identifying these power and signal integrity interaction issues at the beginning of the design process is very important, to make the noise mitigation techniques simpler, cost-effective, and more straightforward. Chapter 8, “Signal/Power Integrity Co-Analysis,” explains how to translate these interaction effects into eye voltage/timing margin. 282 Chapter 7 • Signal/Power Integrity Interactions Figure 7.51 3D Finite Elements Method simulation results for complex shape on four-layers boards showing regions of high electric fields suggesting the locations where the decoupling capacitors are needed Edward K. Chan, Mauro Lai, Myoung Joon Choi, and Woong Hwan Ryu, “Concurrent Analysis of Signal-Power Integrity and EMC for High-Speed Signaling Systems,” IEEE EMC © [2007] IEEE. References 1. Jinjun Xiong and Lei He, “Full-chip multilevel routing for power and signal integrity Design,” Proceedings of Automation and Test in Europe Conference and Exhibition, Vol. 2, pp 1116–1121, February 2004. 2. J. Kim, M.D. Rotaru, K.C. Chong, J. Park, M.K., and Iyer, J. Kim, “Coupling of simultaneous switching noise to interconnecting lines in high-speed systems” Proceedings of Electronic Components and Technology, Vol. 1, pp 568–574, June 2004. References 283 3. J. Park, H. Kim, J. S. Pak, Y. Jeong, S. Baek, J. Kim, J. Lee, and J. Lee, “Noise coupling to signal trace and via from power/ground simultaneous switching noise in high speed double data rates memory module,” Proceeding of EMC, Vol. 2, pp 592–597, August 2004. 4. Jun So Pak, et al, “Coupling of Through-Hole Signal Via to P/G Resonance and excitation of edge radiation in Multi-layer PCB,” Electromagnetic Compatibility, 2003 IEEE International Symposium, Aug. 2003. 5. Junho Lee, et al, “Effect of Decoupling Capacitor on Signal Integrity in Applications with Reference Plane Change,” Electronic Components and Technology Conference, 2003. 6. P. Fornberg, M. Kanda, M. Piket-May, and S. Hall, “The Impact of a Nonideal Return Path on Differential Signal Integrity,” IEEE Transactions on Electromagnetic Compatibility, February 2002, pp 11–15. 7. H. Johnson and M. Graham, High-Speed Digital Design: A Handbook of Black Magic. Englewood Cliffs, NJ: Prentice-Hall, 1993. 8. Woong Hwan Ryu and Min Wang, “A Co-design Methodology of Signal Integrity and Power Integrity,” DesignCon2006, February 6–9, 2006. 9. Min Wang, Xiaoning Ye, Russell Shryock, and Woong H. Ryu, “System Level Impact of Stitching Vias and Capacitors for High-Speed Differential Links,” 57th Electronic Components and Technology Conference 2007, May 2007, pp 357–363. 10. R. Schmitt, J. H. Kim, and C. Yuan, “Frequency-Domain Figures-of-Merit for the Design of Interface Supply Networks,” 2006 IEEE International Symposium on Electromagnetic Compatibility, Volume 2, 14-18 Aug. 2006, pp 383–388. 11. J. Kim; M. D. Rotaru, S. Baek, J. Park; M. K. Iyer, and J. Kim, “Analysis of noise coupling from a power distribution network to signal traces in highspeed multilayer printed circuit boards”, IEEE Transactions on Electromagnetic Compatibility, Volume 48, Issue 2, May 2006, pp 319–330. 12. T. H. Hubing, J. L. Drewniak, T. P. Van Doren, and D. Hockanson, “Power Bus Decoupling on Multilayer Printed Circuit Boards,” IEEE Transactions on Electromagnetic Compatibility, Vol. EMC-37, No. 2, May 1995, pp 155–166. 284 Chapter 7 • Signal/Power Integrity Interactions 13. T. H. Hubing, J. Chen, J. L. Drewniak, T. P. Van Doren, Y. Ren, J. Fan, and R. DuBroff, “Power bus noise reduction using power islands in printed circuit board designs,” in Proc. 4th Int. Symp. Electromagn. Compat., Tokyo, Japan, May 1999, pp 1–4. 14. M. Xu, T. H. Hubing, J. Drewniak, T. VanDoren, and R. DuBroff, “Modeling printed circuit boards with embedded decoupling capacitance,” in Proc. 14th Int. Symp. Electromagnetic Compatibility, Zurich, Switzerland, 2001, pp 515–520. 15. M. Montrose, E.P. Li, H.F. Jin, and W.L. Yuan, “Analysis on the Effectiveness of the 20-H Rule for Printed-Circuit-Board Layout to Reduce EdgeRadiated Coupling,” IEEE Transactions on Electromagnetic Compatibility, Vol 47, No. 2, May 2005. 16. W. Cui, J. Fan,Y. Ren, H. Shi, J. Drewniak, and R. DuBroff, “DC Power-Bus Noise Isolation With Power-Plane Segmentation,” IEEE Transactions on Electromagnetic Compatibility, Vol. 45, No. 2, May 2003. 17. H. W. Shim and T. H. Hubing, “A Closed-Form Expression for Estimating Radiated emissions From the Power Planes in a Populated Printed Circuit Board”, IEEE Transactions on Electromagetic Compatibility, Vol. 48, No. 1, February 2006. 18. Edward K. Chan, Mauro Lai, Myoung Joon Choi, and Woong Hwan Ryu, “Concurrent Analysis of Signal-Power Integrity and EMC for High-Speed Signaling Systems,” IEEE International Symposium on Electromagnetic Compatibility, 2007. EMC 2007. 9–13 July 2007 pp. 1–8.