Materials Transactions, Vol. 47, No. 3 (2006) pp. 625 to 630 Special Issue on Shape Memory Alloys and Their Applications #2006 The Japan Institute of Metals Magnetic-Field Induced Two-Way Shape Memory Effect of Ferromagnetic Ni2 MnGa Sputtered Films Makoto Ohtsuka1 , Yuya Konno1; * , Minoru Matsumoto2 , Toshiyuki Takagi2 and Kimio Itagaki1 1 2 Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan Institute of Fluid Science, Tohoku University, Sendai 980-8577, Japan The shape memory effect (SME) induced by the magnetic field is interesting and important for physics and application. The ferromagnetic Ni2 MnGa films with various compositions were deposited on a poly-vinyl alcohol (PVA) substrate with a radio-frequency (RF) magnetron sputtering apparatus using four kinds of Ni–Mn–Ga targets. After separating from the substrate, the films were heat-treated at 1073 K for 3.6 ks for homogenization and aged at 673 K for 3.6 ks in a constraint condition. The reversible two-way SME by the thermal change was confirmed for the constraint-aged films with various compositions. The gradient of the strain–temperature curve, the amount of strain accompanied by the twoway SME and the width of thermal hysteresis were dependent on the composition of the films. The strain–temperature curve shifted to a high temperature region and the martensitic phase was stabilized by the applied magnetic field. Furthermore, the two-way SME by the magnetic field was observed around the martensitic transformation temperature on cooling for the constraint-aged film, which showed the large gradient and small thermal hysteresis in the strain–temperature curve. (Received September 21, 2005; Accepted December 15, 2005; Published March 15, 2006) Keywords: nickel–manganese–gallium alloy, sputtered film, ferromagnetic shape memory alloy, martensitic transformation, two-way shape memory effect, magnetic field, constraint-aging 1. Introduction For the typical shape memory alloy (SMA) such as Ni–Ti, the martensitic transformation occurs by temperature change and stress field, and the re-orientation of twin variant is induced by the stress field in the martensitic phase. On the other hand, for the ferromagnetic shape memory alloy (FSMA), the martensitic transformation and the re-orientation of twin variant are induced not only by temperature and stress but also by magnetic field (see, for a recent review1)). The ternary intermetallic compound Ni2 MnGa is an intelligent material, which has both a shape memory effect (SME) and a ferromagnetic property. It has the Heusler type structure at high temperature and some martensitic structures at low temperature.2–5) The martensitic transformation occurs in the ferromagnetic region below the Curie temperature (TC ). It can be controlled not only by temperature and stress but also by magnetic field.6) Recent researches on the Ni2 MnGa showed that large magnetic-field-induced strains can be generated either by re-orientation of martensitic variants7,8) or by shifting the martensitic transformation temperature.9,10) If the SME appears under magnetic field, its response will be faster than that of thermal one. However, the Ni2 MnGa bulk alloy is too brittle to be formed in a required shape. To solve this problem, use of the sputtered films has been proposed by the authors.11,12) They may be applied as actuators of micro-machines. Recently, free-standing Ni2 MnGa sputtered films have been implemented in micro-devices such as a micro-scanner13) and a micro-valve.14) The use of shape memory alloy films for an actuator of micro-machines is very attractive because of its large recovery force and quick response to the magnetic field. It has been found by the authors that the Ni2 MnGa films, prepared by the sputtering method and aged at various *Graduate Student, Tohoku University. Present address: Hiroshima Research & Development Center, Mitsubishi Heavy Industries, Ltd., Hiroshima 733-0036, Japan temperatures in a constrained condition after the heat treatment at 1073 K, have the two-way SME by thermal change.15,16) Furthermore, the magnetic-field induced SME was found for the constraint-aged films by shifting the martensitic transformation temperature.17,18) However, the effect of alloy composition on the two-way SME by temperature change for the ferromagnetic Ni2 MnGa constraint-aged films has not been clarified. In the present study, the effect of alloy composition on the two-way SME by temperature change was investigated with respect to the Ni2 MnGa constraint-aged films with different compositions. Furthermore, the two-way SME induced by the magnetic field was investigated. 2. Experiment 2.1 Specimens preparation The Ni2 MnGa films were deposited on a poly-vinyl alcohol (PVA) substrate (thickness: 14 mm) with a radiofrequency (RF) magnetron sputtering apparatus (Shibaura, CFS-4ES). Four kinds of Ni–Mn–Ga targets whose nominal compositions were Ni49:5 Mn28 Ga22:5 , Ni52:5 Mn22 Ga25:5 , Ni54 Mn20 Ga26 and Ni55 Mn18 Ga27 were used. The sputtering power (WS ) was 200 W and the substrate temperature was kept at 323 K by cooling water. The thickness of the deposited films attained to about 5 mm by controlling the sputtering time. After separating from the substrate, the films were fastened between straight alumina plates and heat-treated at 1073 K for 3.6 ks. The composition of the heat-treated films was determined by an inductively coupled plasma (ICP) spectrometry (PerkinElmer, Optima 3300). The composition and valence electron concentration (e=a) of these films are shown in Table 1. The valence electrons (e) were assumed to be 3d8 4s2 (e ¼ 10) for Ni, 3d5 4s2 (e ¼ 7) for Mn and 4s2 4p1 (e ¼ 3) for Ga. Hereafter, these films are called as N51(HT), N54(HT), N55(HT) and N57(HT) films using nickel content, respectively. HT means the heat treatment. 7.70 Table 2 Martensitic transformation temperatures and Curie temperature for the constraint-aged films with various compositions. Sample Ms Mf As Af TC N51(HT-AG) 329 K 321 K 329 K 336 K 368 K N54(HT-AG) N55(HT-AG) 306 K 348 K 290 K 338 K 298 K 345 K 315 K 345 K 342 K — N57(HT-AG) 368 K 356 K 358 K 358 K — The heat-treated films with a straight shape were cut into 5 mm 12 mm bands and bended to a cylindrical shape. The deformed films were fixed inside a silica tube whose inner diameter was 4 mm. The constraint films were aged at 673 K for 3.6 ks in a flow of argon gas, and then rapidly cooled to room temperature (R.T.). The martensitic transformation temperatures for the constraint-aged films were investigated using a differential scanning calorimeter (DSC, TA instruments, DSC 2910). The Curie temperature (TC ) was determined by a vibrating sample magnetometer (VSM). The martensitic transformation temperatures and the TC of the constraint-aged films are shown in Table 2. The martensitic transformation temperatures of these constraint-aged films were higher than R.T. and increased with increasing e=a ratio. The TC was also higher than R.T. Therefore, these films were in martensitic phase and ferromagnetic condition at R.T. Hereafter, the constraint-aged films are called as N51(HT-AG), N54(HTAG), N55(HT-AG) and N57(HT-AG), respectively. 2.2 Measurement of SME The SME by thermal change for the constraint-aged films was observed using a digital video camera (Sony, DCRPC120). The film was set in a thermostatic bath. One end of the film was fixed on a sample holder in the thermostatic bath and another end was free. The measurement was performed from 295 to 360 K. Heating and cooling rates were 3:3 102 K/s. Furthermore, the shape change under a magnetic field for the constraint-aged films was also observed at a constant temperature using a camera with a charge-coupled imaging device (CCD) and recorded on a video tape. The magnetic field was applied parallel to the film surface up to 5 T using a super-conductor magnet (Sumitomo heavy industries, HF%– 100VT–50HT). 3. Results and Discussion 3.1 Structural characterization Figures 1(a) and (b) show the X-ray diffraction (XRD) profiles at R.T. in scattering angle of 2 from 35 to 55 for N55(HT-AG) N57(HT-AG) 201014M 7.69 Ni56:6 Mn18:5 Ga24:9 12914M Ni55:2 Mn20:6 Ga24:2 Ni55 Mn18 Ga27 12714M Ni54 Mn20 Ga26 N57(HT) 12914M N55(HT) N57(HT-AG) N55(HT-AG) N54(HT-AG) N51(HT-AG) 35 40 N54(HT-AG) 45 2θ / ° 12510M 7.66 200bct, 20214M 7.73 Ni54:4 Mn21:3 Ga24:3 bct 7 layer modulated structure (14M) 5 layer modulated structure (10M) 001414M Ni51:4 Mn28:3 Ga20:3 Ni52:5 Mn22 Ga25:5 12514M Ni49:5 Mn28 Ga22:5 N54(HT) 12310M 001010M 200bct N51(HT) 12510M Valence electron concentration (e=a) 12514M Composition of film (b) 112bct 20210M Composition of target Intensity, I (arb. unit) Sample (a) 12714M Table 1 Composition and valence electron concentration (e=a) of the heattreated films. 200bct, 20214M 112bct, 12714M M. Ohtsuka, Y. Konno, M. Matsumoto, T. Takagi and K. Itagaki 12310M 626 N51(HT-AG) 50 35 40 45 2θ / ° 50 55 Fig. 1 X-ray diffraction patterns for the constraint-aged films with various compositions. (b) enlarged intensity of the diffraction patterns in (a). the constraint-aged films with various compositions, respectively. The diffraction patterns in Fig. 1(b) are shown with an enlarged scale of the ordinate in the Fig. 1(a). All constraintaged films show a martensitic structure at room temperature. The XRD pattern obtained for the martensitic phase is indexed as body centered tetragonal (bct), 5 layers modulated structure (10M) and 7 layers modulated structure (14M), which are reported by Wedel et al.3) and Pons et al.4) The XRD peaks for the N51(HT-AG) film present the 5 layers modulated martensitic structure and those of the other constraint-aged films present the 7 layers modulated one. The ð1 1 2Þbct peak shifts to higher angle with increasing nickel content, whereas ð2 0 0Þbct peak does not shift. It is found that the lattice constant of c-axis of bct structure decreases with increasing nickel content. 3.2 Two-way SME by thermal change The photos in Fig. 2 show the spontaneous shape change of the N55(HT-AG) film by the thermal change during heating (a)–(d) and cooling (d)–(f). They were taken by a camera which was slightly tilted from the parallel direction of the film surface because of the difficulty checking the shape change of the film. In the heating step, the radius of curvature for the film increased. However, the shape does not recover to the original straight one. In the next cooling step, the film automatically starts bending. It is clear that the constraintaged film shows a two-way SME by thermal change. It is commonly accepted that the occurrence of the two-way SME has been ascribed to the relaxation of inhomogeneous stress field in the parent phase by the formation of the preferentially oriented twin variants in martensitic phase. It was reported that both the stress-induced martensitic phase and Ni3 (Mn, Ga) precipitates existed as the inhomogeneous stress field in the parent phase for the constraint-aged films.16) The strain–temperature curves for the constraint-aged films with various compositions are shown in Fig. 3. The strain " (¼ ðdS =2Þ=r, dS : thickness of film, r: radius of curvature) was estimated from the shape change recorded on Magnetic-Field Induced Two-Way Shape Memory Effect of Ferromagnetic Ni2 MnGa Sputtered Films (a) 310.2 K (d) 348.3 K (b) 324.7 K (e) 326.7 K (c) 332.1 K (f) 319.8 K 627 5 mm Two-way shape memory effect of N55(HT-AG) film by heating [(a)–(d)] and cooling [(d)–(f)]. the video tape. The symbols of (a)–(f) for N55(NT-AG) film in Fig. 3 correspond to the photographs of (a)–(f) in Fig. 2. The reversible two-way SME can be confirmed for all the constraint-aged films. The schematic strain–temperature curve of the constraintaged film is shown in Fig. 4. is the gradient of the strain– temperature curve. It was defined as a ratio of the strain to the difference in transformation temperatures. The gradient of heating and cooling curves in the strain–temperature curve was nearly the same for each film. The gradient of N51(HTAG) and N54(HT-AG) films are about 5 times of the others. The amount of strain accompanied by the two-way SME ("TWME ), which was determined by the difference in the strain between at low and high temperatures, was different from each film. The value of "TWME was large for N51(HT-AG), N54(HT-AG) and N57(HT-AG) compared to N55(HT-AG). The width of thermal hysteresis for the N54(HT-AG) film is about half of the others. The gradient, two-way SME strain 0.10 0.08 Strain, ε (%) Fig. 2 N51(HT-AG) 0.06 0.04 N57(HT-AG) (a) 0.02 N54(HT-AG) 0 (f) (b) (c) (e) (d) N55(HT-AG) 300 320 340 Temperature, T / K 360 Fig. 3 Strain–temperature curves for the constraint-aged films with various compositions. 628 M. Ohtsuka, Y. Konno, M. Matsumoto, T. Takagi and K. Itagaki tion temperature changed by the magnetic field for a Ni2 MnGa single crystal19) and their strain change by the applied magnetic field up to 5 T corresponded to that observed by cooling down to 4–5 K.20) This result shows the good agreement with the present one. Therefore, it is considered that the strain accompanied by the shape change under a magnetic field will be large between the start and finish temperatures (Ms and Mf ) of shape change on cooling. If the width of thermal hysteresis becomes small, the twoway SME will be appeared by a small magnetic field change. On the other hand, if the gradient in the strain–temperature curve increases, the total strain change by the magnetic field will be large. Strain, ε heating cooling ∆T α ε TWME Temperature, T Fig. 4 Definition of gradient (), effective recovery strain accompanied by two-way shape memory effect ("TWSE ) and thermal hysteresis (T) in strain–temperature curve. Table 3 Gradient of the strain–temperature curve (), strain accompanied by two-way SME ("TWME ) and width of thermal hysteresis (T) for the constraint-aged films with various compositions. Sample /K1 "TWME (%) T/K N51(HT-AG) 8:8 105 4:6 102 7 N54(HT-AG) 6:8 105 4:2 102 4 N55(HT-AG) 1:2 105 2:9 102 8 N57(HT-AG) 1:4 105 4:4 102 8 and thermal hysteresis for the constraint-aged films with various compositions are listed in Table 3. The strain–temperature curves in the thermal cycling under the magnetic field of 0 and 5 T for the N51(HT-AG) and N54(HT-AG) films are shown in Figs. 5(a) and (b), respectively. The transformation temperatures increased by the applied magnetic field of 5 T. It is considered that the strain–temperature curve shifts to a high temperature region and the martensitic phase is stabilized by the applied magnetic field. Vasil’ev et al. reported that the transforma- 0.10 Conclusions The results obtained in the present study are summarized as follows: (1) The XRD peaks of the N51(HT-AG) film presented 5 layers modulated martensitic structure and those of the other constraint-aged films present 7 layers modulated one at R.T. 0.06 0T 5T 0.07 0.06 0.05 N51(HT-AG) 0.03 310 320 330 340 350 360 Temperature, T / K (b) N54(HT-AG) 0.05 heating cooling 0.08 0.04 4. Strain, ε (%) Strain, ε (%) 0.09 (a) 3.3 Two-way SME by magnetic field change N54(HT-AG) film may be expected to have a magneticfield induced SME due to the large gradient and small thermal hysteresis in the strain–temperature curve. The SME of the constraint-aged films induced by the magnetic field was investigated at constant temperature. The shape memory behavior by a magnetic field for the constraint-aged films was observed around the martensitic transformation temperature on cooling. The shape change under the magnetic field from 0 to 5 T for the N54(HT-AG) film is shown in Fig. 6. The radius of curvature of the bended film was changed by the magnetic field. It is clear that the constraint-aged film shows the two-way SME induced by the magnetic-field. The strain of the N54(HT-AG) film against magnetic field is shown in Fig. 7. The strain increased with increasing magnetic field and decreased with decreasing magnetic field. This behavior will be expected from the martensitic transformation induced by the applied magnetic field. 0.04 0.03 0.02 0.01 0 0T 5T heating cooling -0.01 290 300 310 320 330 340 Temperature, T / K Fig. 5 Effect of magnetic field (0 and 5 T) in strain–temperature curves of (a) N51(HT-AG) and (b) N54(HT-AG) films. Magnetic-Field Induced Two-Way Shape Memory Effect of Ferromagnetic Ni2 MnGa Sputtered Films (a) 0 T (c) 5 T (b) 3 T (d) 0 T 629 5 mm Fig. 6 Shape memory effect by the magnetic field change of N54(HT-AG) film at the temperature between Ms and Mf on cooling. The magnetic field was applied perpendicular to the photos. Strain, ε (%) 0.04 N54(HT-AG) (c) 0.03 0.02 Acknowledgement (d) (b) The authors grateful to Mr. K. Koike, Faculty of Engineering, Yamagata University, for the measurement by the vibrating sample magnetometer (VSM). This research was partly supported by the Grants-in-Aid for Scientific Research by Japan Society for the Promotion of Science (JSPS). 0.01 0 (a) 0 the applied magnetic field. (5) The two-way SME by the magnetic field was observed for the N54(HT-AG) film around the martensitic transformation temperature on cooling. * * M f < T = 315 K <M s 1 2 3 4 Magnetic Field, B / T 5 Fig. 7 Strain-magnetic field curve of N54(HT-AG) film at the temperature between Ms and Mf on cooling. (2) The reversible two-way SME for the constraint-aged films with various compositions was confirmed by the temperature change. (3) The N54(HT-AG) film showed a good shape memory properties in which the gradient was large and the width of thermal hysteresis was small in the strain–temperature curve. (4) The strain–temperature curve shifted to a high temperature region and the martensitic phase is stabilized by REFERENCES 1) A. N. Vasil’ev, V. D. Buchel’nikov, T. Takagi, V. V. Khovailo and É. I. Éstrin: Physics-Uspekhi 46 (2003) 559–588. 2) P. J. Webster, K. R. A. Ziebeck, S. L. Town and M. S. Peak: Philos. Mag. B 49 (1984) 295–310. 3) B. Wedel, M. Suzuki, Y. Murakami, C. Wedel, T. Suzuki, D. Shindo and K. Itagaki: J. Alloys Copmpd. 290 (1999) 137–143. 4) J. Pons, V. A. Chernenko, R. Santamarta and E. Cesari: Acta Mater. 48 (2000) 3027–3038. 5) P. J. Brown, J. Crangle, T. Kanomata, M. Matsumoto, K.-U. Neumann, B. Ouladdiaf and K. R. A. Ziebeck: J. Phys.: Condens. Matter 14 (2002) 10159–10171. 6) K. Ullako: J. Mater. Eng. Perform. 5 (1996) 405–409. 7) S. J. Murray, M. Marioni, S. M. Allen, R. C. O’Handley and T. A. Lograsso: Appl. Phys. Lett. 77 (2000) 886–888. 8) A. Sozinov, A. A. Likhachev, N. Lanska and K. Ullakko: Appl. Phys. Lett. 80 (2002) 1746–1749. 630 M. Ohtsuka, Y. Konno, M. Matsumoto, T. Takagi and K. Itagaki 9) A. A. Cherchukin, I. E. Dikshtein, D. I. Ermakov, A. V. Glebov, V. V. Koledov, D. A. Kosolapov, V. G. Shavrov, A. A. Tulaikova, E. P. Krasnoperov and T. Takagi: Phys. Lett. A 291 (2001) 175–183. 10) T. Takagi, V. Khovailo, T. Nagatomo, M. Matsumoto, M. Ohtsuka, T. Abe and H. Miki: Inter. J. Appl. Electromagn. Mech. 16 (2002) 173– 176. 11) M. Suzuki, M. Ohtsuka, T. Suzuki, M. Matsumoto and H. Miki: Mater. Trans., JIM 40 (1999) 1174–1177. 12) M. Ohtsuka and K. Itagaki: Inter. J. Appl. Electromagn. Mech. 12 (2000) 49–59. 13) M. Kohl, D. Brugger, M. Ohtsuka and T. Takagi: Sens. Actuators, A 114 (2004) 445–450. 14) K. Kohl, Y. Liu, B. Kervet, S. Dürr and M. Ohtsuka: J. Phys. IV France 115 (2004) 333–342. 15) S. Isokawa, M. Suzuki, M. Ohtsuka, M. Matsumoto and K. Itagaki: Mater. Trans. 42 (2001) 1886–1889. 16) M. Suzuki, M. Ohtsuka, M. Matsumoto, Y. Murakami, D. Shindo and K. Itagaki: Mater. Trans. 43 (2002) 861–866. 17) M. Ohtsuka, M. Sanada, M. Matsumoto, T. Takagi and K. Itagaki: Mater. Trans. 44 (2003) 2513–2519. 18) M. Ohtsuka, M. Sanada, M. Matsumoto and K. Itagaki: Mater. Sci. Eng. A 378 (2004) 377–383. 19) A. N. Vasil’ev, A. D. Bozhko, V. V. Khovailo, I. E. Dikstein, V. G. Shavrov, V. D. Buchelnikov, M. Matsumoto, S. Suzuki, T. Takagi and J. Tani: Phys. Rev. B 59 (1999) 1113–1120. 20) A. N. Vasil’ev, E. I. Estrin, V. V. Khovailo, A. D. Bozhko, R. A. Ischuk, M. Matsumoto, T. Takagi and J. Tani: Inter. J. Appl. Electromagn. Mech. 12 (2000) 35–40.