Materials Transactions, Vol. 51, No. 12 (2010) pp. 2329 to 2331 #2010 The Japan Institute of Metals RAPID PUBLICATION Characteristics of Isotropically Conductive Adhesive (ICA) Filled with Carbon Nanotubes (CNTs) and Low-Melting-Point Alloy Fillers Byung-Seung Yim and Jong-Min Kim* School of Mechanical Engineering, Chung-Ang University, Seoul 156-756, Korea A new class of isotropic conductive adhesive (ICA) using a carbon nanotubes (CNTs) and a low-melting-point alloy (LMPA) fillers has been developed. We investigated the fundamental materials characteristics including curing behavior and temperature-dependant viscous property of ICA. In addition, the morphology of conduction paths in each ICA was investigated using X-ray inspection systems and an optical microscope. Mechanical and electrical characteristics of formulated ICAs were determined and compared with those of three kinds of conventional ICAs filled with Ag flakes. The CNT-filled solderable ICA formed good metallurgical interconnection between upper and corresponding lower electrode. In addition, the results indicated that the CNT-filled ICA exhibit lower electrical resistance and higher mechanical strength, as compared with those of conventional ICAs. [doi:10.2320/matertrans.M2010301] (Received September 6, 2010; Accepted October 6, 2010; Published November 17, 2010) Keywords: carbon nanotuubes (CNTs), isotropically conductive adhesive (ICA), low-melting-poing alloy, polymeric composites 1. Introduction In recent years, conductive filler-filled polymeric composites have been used for a wide range of applications due to their versatile properties including thermal stability, mechanical strength, electrical resistance, and adhesive characteristics.1,2) Among these composites, isotropically conductive adhesives (ICAs) filled with organic or inorganic fillers have been investigated as a lead-free alternative in microelectronic packaging.3,4) In addition to the environmental issue, they have attracted attention due to advantages including lower temperature processing, more flexible and simpler processing, and compatibility with nonsolderable materials.5,6) An ICA is mainly composed of a polymer matrix and electrically conductive fillers. ICAs offer alldirectional conductivity by incorporating a higher filler concentration (typically 25 to 30%).4) Silver (Ag) flake is the most common conductive filler for ICAs due to its high conductivity and easy processing. However, a conventional ICAs has several critical limitations such as lower conductivity, unstable contact resistance with non-noble metal finished components, Ag migration, and poor mechanical performance compared to traditional solder materials.7–9) To improve the mechanical and electrical properties of ICA assembly, a new class of ICAs using carbon nanotubes (CNTs) and low melting point alloys (LMPAs) has been developed. As shown in Fig. 1, an electrical conduction path is mainly established by the rheology-coalescence-wetting behaviors of molten LMPA fillers in an ICA during the curing process, and the shear strength of the assembly is reinforced by the CNTs. In this study, a reinforced ICA using CNTs and a LMPA is considered. The influence of CNTs on the mechanical and electrical properties of the assembly was investigated and compared to the mechanical and electrical properties of commercial ICAs. *Corresponding author, E-mail: 0326kjm@cau.ac.kr (a) (b) (c) (d) Fig. 1 2. Schematic of CNT-filled solderable ICA bonding. Experimental The proposed ICA consists of CNTs, a LMPA, a thermoset polymer resin, and other minor organic additives. Multiwalled CNTs (MWCNTs) with diameters ranging from 15 to 40 nm and lengths ranging from 30 to 50 mm (Hanwha Nanotech Co. Ltd., Korea) were used. Sn-58Bi LMPA filler with a diameter of 45 mm (Senju Metal Co., Japan) was used. The polymer matrix was formulated with diglycidyl ether of bisphenol-A (DGEBA) for the binder, diaminodiphenyl sulfone (DDS) for the curing agent, and an amine-type catalyst. Carboxylic acid was used to remove the oxide layer from the surface of the LMPA fillers and the electrodes. The CNTs were functionalized using carboxylic acid.10) Functionalized MWCNTs and LMPA particles were added into the polymer matrix and sonicated to produce a homogeneous CNT-filled solderable ICA. To compare mechanical and electrical properties, two kinds of ICAs were formulated: ICA 1 (without CNT and reductant), and ICA 2 (with CNT and reductant). Also, three types of conventional ICAs with Ag flakes were used to compare the mechanical and electrical 2330 B.-S. Yim and J.-M. Kim Table 1 Components of ICA formulations. ECA Polymer Filler ICA 1 Epoxy-type (W/O reduction Capa.) Sn-58Bi ICA 2 Epoxy-type (With reduction Capa.) Sn-58Bi (40 vol%) + MWCNTs (0.05 wt%) ICA 3 Epoxy-type ICA 4 ICA 5 Ag flake Polyester-type properties of assemblies. The ICA formulations are shown in Table 1. To test adhesive bonding, a Quad Flat Package (QFP) with 44-pin I/O terminals plated with Sn (14 14 2:7 mm3 in size, and 1.0 mm in lead pitch) and an 18 mm-thick Cu-plated printed circuit board (PCB, 32 32 1:0 mm3 ) were used. The curing behavior of the polymer and the melting behavior of the LMPA filler were monitored using differential scanning calorimetry (DSC). The temperature-dependant viscosity of the formulated polymer matrix was investigated using a torsional parallel rheometer. The substrate was cleaned with acetone for 1 min, rinsed with deionized (DI) water, and dried with an air jet. ICAs were selectively applied on the QFP leads. The QFP was then aligned on the PCB, and adhesive bonding was performed using a chip bonder (Lambda, Finetech Co., German). After the adhesive bonding, the electrical properties were investigated through a daisy chain-connected probe terminal using a multimeter (34410A, Agilent Tech., USA). The bonding characteristics of the LMPA fillers in each ICA assembly were observed using an X-ray inspection system (SMX-160, Shimadzu Co., Japan). In addition, the morphology of the conduction path was observed using an optical microscope (VHX-100, Keyence Co., Japan). To observe the mechanical strength of each ICA joint, a 45 degree pull test (JIS Z 3198-6) on the QFP lead was performed. The QFP lead was pulled upward at 6 mm/min, and a total of 22 leads were pull-tested for each ICA assembly. 3. Fig. 2 Curing behavior of polymer matrix and melting behavior of LMPA. Results and Discussion Figure 2 shows the DSC results of the curing behavior of the polymer matrix and the melting behavior of the LMPA. The peak curing peak temperature of the polymer matrix was about 427 K, and the endothermic peak at around 414 K indicates the melting point of the LMPA. The viscosity of the polymer matrix was about 100 cPs around the melting point of the LMPA. From our previous work, we knew that the ICA should not cure too much around the melting point of the LMPA in order to achieve a good metallurgical interconnection between the upper and corresponding electrode. Otherwise, the flow-coalescence-wetting behavior of LMPA fillers in the ICA during the adhesive bonding process is hindered by excessive curing of the ICA.11,12) As shown in the results, the polymer matrix does not excessively. In addition, the polymer matrix was maintained at a sufficiently low viscosity for the molten LMPA fillers to flow, coalesce with each other, and wet the upper and lower electrodes. Fig. 3 Morphology of the conduction path formed between metallizations of QFP and PCB substrate by (a) ICA 1 and (b) ICA 2. Figure 3 shows the morphology of the conduction path of each formulated ICA. The interconnected parts were divided into two distinct regions. One is a conductive path made by melted fillers, and the other is a polymer wrapped around the outside of the conduction path. The white dotted line in Fig. 3 shows the cured polymer region. Characteristics of Isotropically Conductive Adhesive (ICA) Filled with Carbon Nanotubes (CNTs) and Low-Melting-Point Alloy Fillers 25 Solderable ECA without reductant & CNT (ICA 1) Solderable ECA with reductant & CNT (ICA 2) Conventional ICAs (ICA 3, ICA 4, ICA 5) 1000 100 42.45 40.00 43.63 10 0.99 1 0.1 ICA 1 ICA 2 ICA 3 ICA 4 ICA 5 Pull Strength, S / N Contact Resistance, R / mΩ 10000 Solderable ECA without reductant & CNT (ICA 1) Solderable ECA with reductant & CNT (ICA 2) Conventional ICAs (ICA 3, ICA 4, ICA 5) 20 Pull Speed: 6mm/min 14.93 15 10 6.91 5.35 5 Electrical resistances of QFP assemblies. As for non-reductive ICA 1, the wetting of the LMPA fillers on the surface of the metallization of the substrate was not remarkable, and a large quantity of LMPA fillers remained. As for CNT-incorporated ICA 2 with reduction capability, the LMPA fillers were mostly wet and metallurgically interconnected between the metallizations of the QFP lead and substrate, as shown in Fig. 3(b). The spherical LMPA fillers remained outside the interconnection region. Since the remaining LMPA fillers were covered with the polymer matrix, the QFP assembly maintained its insulation properties between adjacent leads. Figure 4 shows the electrical resistance per joint of the QFP assemblies in which three commercial Ag-filled ICAs were incorporated. Although ICA 1 without reduction capability did not form any electrical connection, the CNTincorporated ICA 2 with reduction capability showed much lower electrical resistance (0.99 m) than those of other ICAs (42.45 m for ICA 3, 40.00 m for ICA 4, and 43.63 m for ICA 5). This was due to a stable electrical conduction path caused by sufficient wetting, and the coalescence behavior of the LMPA fillers in ICA 2 during the curing process. Figure 5 shows the results of the pull test of the QFP assemblies with each ICA. The QFP assembled with CNTincorporated ICA 2 exhibited excellent pull strength properties. Its pull strength was 14.93 N, which was more than three times greater than the QFP assemblies with conventional Ag-filled ICAs (ICA 3, ICA 4, and ICA 5). This was due to the robust interconnection achieved through metallurgical bonding between the metallizations of the chip and substrate. Conclusion A novel ICA filled with CNT and LMPA fillers was developed. The morphology of the achieved conduction path, which was formed by the flow-coalescence-wetting behavior of LMPA fillers in the ICA, was investigated experimentally. 4.04 4.59 ICA 4 ICA 5 0 ICA 1 Fig. 4 4. 2331 ICA 2 ICA 3 Fig. 5 Pull strengths of QFP assemblies. When the reduction capability was introduced into the ICA, a stable metallurgical interconnection was formed between metallizations of the chip and substrate by totally wetted and coalesced LMPA fillers in the ICA. Due to the stable and robust metallurgical interconnection in the ICA, the CNT-incorporated ICA 2 with reduction capability showed much lower electrical resistance and higher pull strength than conventional ICAs. Acknowledgement This research was supported through Chung-Ang University Research Grants in 2009. REFERENCES 1) M. J. Yim, Y. Li, K. S. Moon, K. W. Paik and C. P. Wong: J. Adhesion Sci. Technol. 22 (2008) 1593–1630. 2) L. J. Matienzo, R. N. Das and F. D. Egitto: J. Adhesion Sci. Technol. 22 (2008) 853–869. 3) I. Mir and D. Kumar: Int. J. Adhesion Adhesive 28 (2008) 362–371. 4) D. D. Lu and C. P. Wong: J. Adhesion Sci. Technol. 22 (2008) 835– 851. 5) H. K. Kim and F. G. Shi: Microelectron. J. 32 (2001) 315–321. 6) M. J. Yim and K. W. Paik: Int. J. Adhesion Adhesive 26 (2006) 304– 313. 7) Q. K. Tong, D. L. Markley, G. Frederickson, R. Kuder and D. Lu: Proc. 49th Electronic Components and Technology Conference 49 (1999) pp. 347–352. 8) Y. S. Eom, J. W. Baek, J. T. Moon, J. D. Nam and J. M. Kim: Microelec. Eng. 85 (2008) 327–331. 9) M. Zwolinski, J. Hickman, H. Rubin, Y. Zaks, S. McCarthy, T. Hanlon, P. Arrowsmith, A. Chaudhuri, R. Harmansen, S. Lau and D. Napp: IEEE Trans. Comp. Packag. Manufac. Technol. Part C 19 (1996) 241–250. 10) J. Kim, W. J. Koros and D. R. Paul: Polymer 47 (2006) 3104–3111. 11) J. M. Kim, K. Yasuda, M. Yasuda and K. Fujimoto: Mater. Trans. 45 (2004) 793–798. 12) B. S. Yim, J. M. Kim, S. H. Jeon, S. H. Lee, J. H. Kim, J. G. Han and M. H. Cho: Mater. Trans. 50 (2009) 2649–2655.