Journal Citation Reports, Science Edition 2011: Electrical & Electronics Engineering Category, Ranked by Impact Factor
IF
Rank
2011
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
Abbreviated Journal Title
PROG QUANT ELECTRON
P IEEE
PROG ELECTROMAGN RES
IEEE T IND ELECTRON
IEEE IND ELECTRON M
IEEE T PATTERN ANAL
IEEE T POWER ELECTR
IEEE T FUZZY SYST
IEEE SIGNAL PROC MAG
IEEE COMMUN MAG
IEEE J SEL TOP QUANT
IEEE T MED IMAGING
IEEE T INTELL TRANSP
IEEE J SEL AREA COMM
IEEE J SOLID‐ST CIRC
IEEE T IMAGE PROCESS
IEEE T INFORM THEORY
J ELECTROMAGNET WAVE
IEEE T NEURAL NETWOR
IEEE T GEOSCI REMOTE
IEEE J‐STSP
IEEE‐ASME T MECH
IEEE ELECTR DEVICE L
AUTOMATICA
J LIGHTWAVE TECHNOL
J FRANKLIN I
IEEE T POWER SYST
IEEE T SIGNAL PROCES
IEEE T WIREL COMMUN
IEEE WIREL COMMUN
IEEE POWER ENERGY M
SEMICONDUCT SEMIMET
IEEE PHOTONICS J
IEEE T ELECTRON DEV
Publisher
Pergamon‐Elsevier
IEEE
Pergamon‐Elsevier
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
VSP
IEEE
IEEE
IEEE
IEEE
IEEE
Pergamon‐Elsevier
IEEE
Pergamon‐Elsevier
IEEE
IEEE
IEEE
IEEE
IEEE
Academic Press Elsevier
IEEE
IEEE
ISSN
2011
Total
Cites
Impact
Factor
(IF)
5-Year
Impact
Factor
0079‐6727
0018‐9219
1559‐8985
0278‐0046
1932‐4529
0162‐8828
0885‐8993
1063‐6706
1053‐5888
0163‐6804
1077‐260X
0278‐0062
1524‐9050
0733‐8716
0018‐9200
1057‐7149
0018‐9448
0920‐5071
1045‐9227
0196‐2892
1932‐4553
1083‐4435
0741‐3106
0005‐1098
0733‐8724
0016‐0032
0885‐8950
1053‐587X
1536‐1276
1536‐1284
1540‐7977
0080‐8784
1943‐0655
0018‐9383
699
16,872
4,675
15,474
292
22,409
11,728
5,441
4,089
6,016
6,768
10,353
2,004
9,949
12,403
12,063
27,909
2,256
8,821
16,126
1,276
2,283
8,764
12,276
14,055
1,768
11,718
16,727
9,657
1,738
635
446
409
14,095
7.000
6.810
5.298
5.160
5.000
4.908
4.650
4.260
4.066
3.785
3.780
3.643
3.452
3.413
3.226
3.042
3.009
2.965
2.952
2.895
2.880
2.865
2.849
2.829
2.784
2.724
2.678
2.628
2.586
2.575
2.408
2.333
2.320
2.318
6.818
6.460
3.156
5.337
4.224
6.085
4.664
4.196
6.522
3.267
3.510
4.105
4.090
4.840
3.549
3.770
4.117
1.594
3.370
3.298
2.852
2.705
3.128
2.680
2.384
3.258
2.829
2.627
3.128
1.474
2.320
2.476
Immediacy
Index
0.600
0.881
0.848
0.757
0.533
0.629
0.389
0.323
0.697
0.437
0.807
0.543
0.503
0.716
0.428
0.378
0.473
0.345
0.445
0.490
0.333
0.569
0.520
0.235
0.613
0.387
0.216
0.421
0.260
0.224
0.216
0.133
0.567
0.393
2011
Articles
5
118
315
531
15
194
370
93
66
213
187
175
143
169
264
296
564
229
209
420
126
123
537
357
463
181
282
527
458
58
51
15
120
591
Article
Cited
Eigenfactor Influence
Half-Life
Score*
Score**
9
>10.0
3
4
3
10
5
8
6
6
6
9
5
7
7
7
9
3
9
8
3
6
5
8
6
5
9
7
4
6
4
>10.0
2
8
0.00186
0.04081
0.01473
0.04019
0.00155
0.04882
0.02524
0.01089
0.01844
0.02626
0.02314
0.01893
0.00535
0.04164
0.04262
0.03719
0.07729
0.00776
0.01657
0.02884
0.01333
0.00495
0.04116
0.04061
0.04086
0.00279
0.01877
0.05716
0.05531
0.00950
0.00403
0.00035
0.00224
0.04011
3.068
3.371
0.625
1.131
1.256
2.917
0.983
1.165
3.335
1.624
1.300
1.307
0.899
2.711
1.644
1.608
1.897
0.380
1.095
0.861
0.664
1.210
1.436
0.891
0.402
0.915
1.247
1.112
1.658
1.017
0.829
0.997
IF
Rank
2011
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
Abbreviated Journal Title
IEEE T NANOTECHNOL
PATTERN RECOGN
J DISP TECHNOL
IEEE T ENERGY CONVER
INT J ELEC POWER
IEEE NETWORK
EXPERT SYST APPL
IEEE PHOTONIC TECH L
IEEE INTELL SYST
IEEE T ANTENN PROPAG
IEEE MICROW MAG
IEEE T AUTOMAT CONTR
J MICROMECH MICROENG
J MICROELECTROMECH S
IEEE ACM T NETWORK
IEEE T BIOMED CIRC S
IEEE T SOFTWARE ENG
IEEE T CIRCUITS‐I
IEEE T VEH TECHNOL
IEEE J QUANTUM ELECT
IEEE T MICROW THEORY
SENSOR ACTUAT A‐PHYS
IEEE T CONTR SYST T
IET RENEW POWER GEN
IMAGE VISION COMPUT
SEMICOND SCI TECH
IEEE MICROW WIREL CO
IEEE T BROADCAST
IEEE T ULTRASON FERR
IEEE T COMMUN
ENG APPL ARTIF INTEL
IEEE T IND APPL
IEEE T KNOWL DATA EN
IEEE T CIRC SYST VID
INT J CIRC THEOR APP
Publisher
IEEE
Elsevier
IEEE
IEEE
Elsevier
IEEE
Pergamon‐Elsevier
IEEE
IEEE
IEEE
IEEE
IEEE
IOP Publishing
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
Elsevier
IEEE
IET
Elsevier
IOP Publishing
IEEE
IEEE
IEEE
IEEE
Pergamon‐Elsevier
IEEE
IEEE
IEEE
Wiley‐Blackwell
ISSN
2011
Total
Cites
Impact
Factor
(IF)
5-Year
Impact
Factor
1536‐125X
0031‐3203
1551‐319X
0885‐8969
0142‐0615
0890‐8044
0957‐4174
1041‐1135
1541‐1672
0018‐926X
1527‐3342
0018‐9286
0960‐1317
1057‐7157
1063‐6692
1932‐4545
0098‐5589
1549‐8328
0018‐9545
0018‐9197
0018‐9480
0924‐4247
1063‐6536
1752‐1416
0262‐8856
0268‐1242
1531‐1309
0018‐9316
0885‐3010
0090‐6778
0952‐1976
0093‐9994
1041‐4347
1051‐8215
0098‐9886
1,851
11,092
953
4,586
1,991
1,236
9,947
13,572
1,461
15,952
733
19,589
8,103
5,029
4,532
406
3,692
6,414
6,506
9,531
13,445
10,389
3,459
287
3,203
5,459
3,489
1,316
6,174
11,415
1,745
8,448
3,146
4,834
916
2.292
2.292
2.280
2.272
2.247
2.239
2.203
2.191
2.154
2.151
2.111
2.110
2.105
2.098
2.033
2.032
1.980
1.970
1.921
1.879
1.853
1.802
1.766
1.742
1.723
1.723
1.717
1.703
1.694
1.677
1.665
1.657
1.657
1.649
1.625
2.139
3.172
2.258
3.434
2.277
2.588
2.455
1.860
2.316
2.324
1.750
2.773
2.313
2.512
2.805
2.523
3.038
2.044
1.910
1.913
2.056
2.009
2.309
2.007
1.743
1.388
1.694
1.894
1.670
1.794
1.844
2.050
2.084
2.489
2.163
Immediacy
Index
2011
Articles
0.304
0.363
0.369
0.286
0.320
0.579
0.229
0.414
0.488
0.307
0.473
0.295
0.344
0.289
0.255
0.617
0.167
0.227
0.291
0.533
0.298
0.249
0.292
207
240
103
126
206
38
1,709
611
41
609
55
342
407
166
141
47
48
256
440
195
342
438
154
0.377
0.467
0.242
0.303
0.264
0.249
0.241
0.266
0.160
0.177
0.180
69
274
223
89
299
370
137
256
131
164
89
Article
Cited
Eigenfactor Influence
Half-Life
Score*
Score**
5
7
4
7
5
7
3
6
7
8
4
>10.0
5
7
7
3
>10.0
7
5
>10.0
9
7
7
3
7
7
5
5
7
10
5
>10.0
7
7
4
0.00839
0.03507
0.00513
0.01315
0.00441
0.00541
0.02829
0.03807
0.00505
0.03722
0.00453
0.03845
0.02773
0.01388
0.01729
0.00354
0.00554
0.02636
0.02724
0.01181
0.04536
0.02582
0.01102
0.00239
0.01057
0.01497
0.02454
0.00446
0.01598
0.02686
0.00544
0.01280
0.01282
0.01681
0.00203
0.870
1.275
0.828
1.236
0.516
1.573
0.467
0.613
1.100
0.822
1.011
1.324
0.747
0.933
1.459
1.292
1.160
1.063
0.798
0.699
1.194
0.638
0.942
0.929
0.783
0.569
1.027
0.615
0.598
0.884
0.535
0.670
1.110
1.067
0.452
IF
Rank
2011
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
Abbreviated Journal Title
IET POWER ELECTRON
IEEE GEOSCI REMOTE S
MICROELECTRON ENG
IEEE PERVAS COMPUT
INT J ROBUST NONLIN
OPT FIBER TECHNOL
IEEE T DEVICE MAT RE
NETWORK‐COMP NEURAL
IEEE SENS J
SIGNAL PROCESS
IEEE T AUDIO SPEECH
CONTROL ENG PRACT
ELECTR POW SYST RES
J ELECTRON MATER
IEEE T NUCL SCI
IEEE CIRC SYST MAG
DIGIT SIGNAL PROCESS
SIGNAL PROCESS‐IMAGE
IEEE T CIRCUITS‐II
IEEE T PARALL DISTR
SOLID STATE ELECTRON
IEEE SIGNAL PROC LET
IEEE DES TEST COMPUT
IEEE ANTENN WIREL PR
IEEE T MAGN
IEEE T POWER DELIVER
J VAC SCI TECHNOL B
COMPUT VIS IMAGE UND
IEEE T INF FOREN SEC
IEEE ELECTR INSUL M
IEEE T RELIAB
IEEE T COMPUT AID D
MECHATRONICS
J CRYPTOL
IEEE VEH TECHNOL MAG
Publisher
IET
IEEE
Elsevier
IEEE
Wiley‐Blackwell
Elsevier
IEEE
Informa Healthcare
IEEE
Elsevier
IEEE
Elsevier
Elsevier
Springer
IEEE
IEEE
Academic Press Elsevier
Elsevier
IEEE
IEEE
Pergamon‐Elsevier
IEEE
IEEE
IEEE
IEEE
IEEE
AVS AIP
Academic Press Elsevier
IEEE
IEEE
IEEE
IEEE
Pergamon‐Elsevier
Springer
IEEE
ISSN
2011
Total
Cites
Impact
Factor
(IF)
5-Year
Impact
Factor
Immediacy
Index
1755‐4535
1545‐598X
0167‐9317
1536‐1268
1049‐8923
1068‐5200
1530‐4388
0954‐898X
1530‐437X
0165‐1684
1558‐7916
0967‐0661
0378‐7796
0361‐5235
0018‐9499
1531‐636X
1051‐2004
0923‐5965
1549‐7747
1045‐9219
0038‐1101
1070‐9908
0740‐7475
1536‐1225
0018‐9464
0885‐8977
1071‐1023
1077‐3142
1556‐6013
0883‐7554
0018‐9529
0278‐0070
0957‐4158
0933‐2790
1556‐6072
345
1,840
6,746
960
1,613
650
1,046
868
3,172
4,618
1,779
2,900
3,023
5,098
9,222
311
1,449
847
3,706
2,595
6,208
3,302
934
2,359
15,454
7,771
10,637
2,672
759
557
2,270
3,682
1,330
684
282
1.621
1.560
1.557
1.554
1.554
1.554
1.543
1.533
1.520
1.503
1.498
1.481
1.478
1.466
1.447
1.439
1.435
1.415
1.410
1.402
1.397
1.388
1.386
1.374
1.363
1.353
1.341
1.340
1.340
1.333
1.285
1.271
1.255
1.250
1.226
1.703
1.845
1.495
2.150
1.739
1.232
1.673
1.698
1.728
1.567
1.962
1.844
1.726
1.475
1.390
2.515
1.633
1.308
1.540
1.780
1.466
1.430
1.657
1.469
1.236
1.707
1.355
2.485
2.155
1.278
1.530
1.490
1.496
1.553
2.096
0.009
0.374
0.268
0.156
0.374
0.217
0.328
0.000
0.332
0.414
0.305
0.164
0.183
0.196
0.219
0.062
0.408
0.020
0.049
0.359
0.317
0.240
0.186
0.106
0.119
0.143
0.321
0.085
0.134
0.241
0.134
0.172
0.148
0.120
0.233
2011
Articles
117
235
762
32
115
92
67
14
371
266
203
134
241
368
416
16
76
50
184
184
262
171
43
404
1,005
329
442
130
119
29
82
163
122
25
30
Article
Cited
Eigenfactor Influence
Half-Life
Score*
Score**
3
4
5
6
6
5
5
>10.0
4
6
4
7
6
6
8
6
6
7
6
7
9
6
7
4
8
8
9
7
4
9
>10.0
7
7
>10.0
4
0.00155
0.00877
0.02416
0.00331
0.00692
0.00199
0.00475
0.00083
0.01206
0.01609
0.01048
0.00687
0.00933
0.01415
0.01917
0.00180
0.00508
0.00383
0.01893
0.00987
0.01424
0.01493
0.00276
0.01490
0.03381
0.01612
0.02381
0.01058
0.00532
0.00099
0.00473
0.00858
0.00368
0.00189
0.00230
0.418
0.611
0.490
0.933
0.848
0.393
0.735
0.720
0.521
0.631
0.657
0.594
0.569
0.467
0.401
1.439
0.619
0.691
0.897
0.833
0.585
0.709
0.726
0.682
0.386
0.565
0.483
1.295
0.844
0.467
0.762
0.482
0.508
1.097
1.090
IF
Rank
2011
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
Abbreviated Journal Title
IEEE T VLSI SYST
IEEE T INSTRUM MEAS
J COMPUT ELECTRON
COMPUT NETW
IET GENER TRANSM DIS
IEEE T ELECTROMAGN C
IET ELECTR POWER APP
MICROELECTRON RELIAB
IEEE SPECTRUM
IEEE T COMPUT
IEEE T AERO ELEC SYS
IEEE T DIELECT EL IN
J ELECTROSTAT
J MATER SCI‐MATER EL
COMPUT COMMUN
IEEE T APPL SUPERCON
IET OPTOELECTRON
IEEE T EDUC
J REAL‐TIME IMAGE PR
J SOC INF DISPLAY
MACH VISION APPL
J MICRO‐NANOLITH MEM
IET CONTROL THEORY A
IEEE T COMP PACK MAN
IEEE ANTENN PROPAG M
OPTO‐ELECTRON REV
ELECTRON LETT
MULTIDIM SYST SIGN P
IEEE J OCEANIC ENG
IEEE T CONSUM ELECTR
MICROSYST TECHNOL
IEEE SYST J
MICROELECTRON J
ELEKTRON ELEKTROTECH
INT J ADAPT CONTROL
Publisher
IEEE
IEEE
Springer
Elsevier
IET
IEEE
IET
Pergamon‐Elsevier
IEEE
IEEE
IEEE
IEEE
Elsevier
Springer
Elsevier
IEEE
IET
IEEE
Springer Heidelberg
Soc Information Display
Springer
SPIE
IET
IEEE
IEEE
Versita
IET
Springer
IEEE
IEEE
Springer
IEEE
Elsevier
Kaunas Univ Technology
Wiley‐Blackwell
ISSN
2011
Total
Cites
Impact
Factor
(IF)
5-Year
Impact
Factor
1063‐8210
0018‐9456
1569‐8025
1389‐1286
1751‐8687
0018‐9375
1751‐8660
0026‐2714
0018‐9235
0018‐9340
0018‐9251
1070‐9878
0304‐3886
0957‐4522
0140‐3664
1051‐8223
1751‐8768
0018‐9359
1861‐8200
1071‐0922
0932‐8092
1932‐5150
1751‐8644
2156‐3950
1045‐9243
1230‐3402
0013‐5194
0923‐6082
0364‐9059
0098‐3063
0946‐7076
1932‐8184
0026‐2692
1392‐1215
0890‐6327
2,249
5,329
319
3,501
595
2,023
442
3,263
805
5,449
4,952
3,090
1,911
2,118
2,350
5,338
117
1,001
116
926
711
393
969
2,942
1,292
566
14,413
227
1,927
2,699
1,738
162
1,925
704
670
1.219
1.214
1.211
1.200
1.197
1.178
1.173
1.167
1.139
1.103
1.095
1.094
1.080
1.076
1.044
1.041
1.029
1.021
1.020
1.017
1.009
0.995
0.990
0.977
0.968
0.966
0.965
0.953
0.950
0.941
0.931
0.923
0.919
0.913
0.913
1.347
1.175
1.589
1.395
1.200
1.625
1.212
0.877
1.627
1.680
1.266
1.290
1.023
1.067
0.911
0.720
1.205
0.844
0.879
1.324
1.009
1.321
1.053
1.184
1.054
0.950
0.784
1.381
0.960
1.014
0.916
0.904
1.132
Immediacy
Index
0.206
0.221
0.075
0.245
0.094
0.125
0.149
0.150
0.288
0.217
0.151
0.205
0.141
0.179
0.264
0.102
0.093
0.136
0.167
0.161
0.132
0.376
0.062
0.132
0.209
0.303
0.147
0.150
0.180
0.084
0.110
0.127
0.161
0.236
0.182
2011
Articles
238
439
40
274
139
136
74
374
59
138
218
259
92
291
193
814
43
81
24
124
76
85
211
219
91
66
817
20
61
262
209
55
174
259
66
Article
Cited
Eigenfactor Influence
Half-Life
Score*
Score**
6
7
4
6
3
8
4
5
8
>10.0
>10.0
7
9
5
5
5
3
7
3
4
8
3
3
7
8
6
>10.0
9
9
5
5
3
5
2
7
0.00978
0.01267
0.00176
0.01409
0.00444
0.00454
0.00280
0.01083
0.00289
0.01064
0.00752
0.00603
0.00434
0.00630
0.01067
0.01272
0.00064
0.00125
0.00087
0.00391
0.00252
0.00130
0.00603
0.00802
0.00440
0.00133
0.03536
0.00075
0.00343
0.00638
0.00644
0.00103
0.00671
0.00025
0.00203
0.662
0.361
0.687
0.582
0.437
0.578
0.401
0.495
0.843
0.640
0.325
0.457
0.291
0.399
0.219
0.223
0.222
0.371
0.288
0.664
0.202
0.454
0.364
0.557
0.281
0.414
0.402
0.534
0.232
0.322
0.337
0.291
0.442
IF
Rank
2011
Abbreviated Journal Title
140
ETRI J
141
142
143
144
145
146
147
148
149
150
151
152
153
WIREL COMMUN MOB COM
BELL LABS TECH J
EURASIP J WIREL COMM
DISPLAYS
J POWER ELECTRON
COMPUT ELECTR ENG
QUANTUM ELECTRON+
IET COMMUN
OPT QUANT ELECTRON
CIRC SYST SIGNAL PR
EURASIP J ADV SIG PR
ELECTROMAGNETICS
INT J IMAG SYST TECH
154
APPL COMPUT ELECTROM
155
156
157
MAT SCI SEMICON PROC
RADIOENGINEERING
J INFRARED MILLIM TE
158
IETE TECH REV
159
160
161
162
163
164
165
166
167
168
169
170
IEEE T SEMICONDUCT M
RADIOPHYS QUANT EL+
EURASIP J AUDIO SPEE
J ELECTRON PACKAGING
ELECTR POW COMPO SYS
IET MICROW ANTENNA P
J SIGNAL PROCESS SYS
J ELECTRON IMAGING
INTEGRATION
IEEE IND APPL MAG
IET IMAGE PROCESS
IET COMPUT VIS
Publisher
Electronics Telecommunications
Research Inst
ISSN
2011
Total
Cites
Impact
Factor
(IF)
5-Year
Impact
Factor
0.897
0.776
1225‐6463
638
Wiley‐Blackwell
1530‐8669
Wiley
1089‐7089
Springer
1687‐1499
Elsevier
0141‐9382
Korean Inst Power Electronics
1598‐2092
Pergamon‐Elsevier
0045‐7906
Turpion
1063‐7818
IET
1751‐8628
Springer
0306‐8919
Birkhauser Boston
0278‐081X
Springer
1687‐6180
Taylor & Francis
0272‐6343
Wiley‐Blackwell
0899‐9457
Applied Computational
1054‐4887
Electromagnetics Soc
Elsevier
1369‐8001
Spolecnost Pro Radioelektronicke In1210‐2512
Springer
1866‐6892
Inst Electronics
0256‐4602
Telecommunication Engineers
IEEE
0894‐6507
Springer
0033‐8443
Springer
1687‐4722
ASME
1043‐7398
Taylor & Francis
1532‐5008
IET
1751‐8725
Springer
1939‐8018
IS&T & SPIE
1017‐9909
Elsevier
0167‐9260
IEEE
1077‐2618
IET
1751‐9659
IET
1751‐9632
1,744
460
936
638
275
404
2,541
642
1,246
473
2,113
387
376
0.884
0.880
0.873
0.846
0.842
0.837
0.832
0.829
0.822
0.817
0.811
0.789
0.779
364
Immediacy
Index
2011
Articles
Article
Cited
Eigenfactor Influence
Half-Life
Score*
Score**
0.135
133
4
0.733
0.761
0.855
0.701
0.905
1.015
0.844
0.630
0.192
0.074
0.079
0.111
0.096
0.047
0.188
0.088
0.140
0.033
0.098
0.098
0.053
125
54
280
45
115
106
213
296
57
91
235
41
38
7
8
3
7
3
5
>10.0
3
>10.0
5
5
6
8
0.00458
0.00205
0.00686
0.00138
0.00146
0.00114
0.00372
0.00353
0.00210
0.00182
0.01200
0.00113
0.00092
0.210
0.209
0.269
0.241
0.351
0.481
0.291
0.266
0.759
0.654
0.107
122
4
0.00082
0.133
742
302
264
0.753
0.739
0.738
0.944
0.647
0.745
0.182
0.085
0.385
55
142
122
6
3
2
0.00252
0.00137
0.00121
0.318
0.188
0.227
99
0.724
0.358
0.068
44
0.00037
0.089
1,076
686
67
667
414
596
228
989
259
412
91
54
0.722
0.715
0.709
0.694
0.681
0.681
0.672
0.647
0.646
0.640
0.639
0.636
1.100
0.136
0.145
0.000
0.034
0.018
0.073
0.067
0.125
0.000
0.174
0.028
0.025
59
69
13
58
113
248
134
72
27
46
71
40
0.00181
0.00188
0.00051
0.00179
0.00145
0.00554
0.00135
0.00176
0.00112
0.00106
0.00062
0.00029
0.307
1.070
0.636
0.894
1.390
0.590
0.839
0.650
0.789
0.684
0.694
0.611
0.595
0.645
0.697
9
8
8
5
3
3
8
7
9
0.00312
0.286
0.496
0.366
0.442
0.385
0.262
0.342
0.179
0.412
0.250
0.220
0.321
0.262
0.246
0.211
IF
Rank
2011
Abbreviated Journal Title
Publisher
ISSN
2011
Total
Cites
Impact
Factor
(IF)
5-Year
Impact
Factor
0.538
0.702
0.604
0.388
0.520
0.547
0.526
0.693
171
172
173
174
175
176
177
178
179
180
181
182
183
184
185
186
187
188
189
190
191
192
193
194
195
196
197
198
199
200
201
202
MICROW OPT TECHN LET
MULTIMED TOOLS APPL
IET SCI MEAS TECHNOL
INT J NUMER MODEL EL
MICROELECTRON INT
ANALOG INTEGR CIRC S
INT J RF MICROW C E
AEU‐INT J ELECTRON C
J ELECTR ENG TECHNOL
J SUPERCOMPUT
EUR T ELECTR POWER
MICROPROCESS MICROSY
IET SIGNAL PROCESS
SIGNAL IMAGE VIDEO P
INT J OPTOMECHATRONI
J NANOELECTRON OPTOE
ADV ELECTR COMPUT EN
IET CIRC DEVICE SYST
J SEMICOND TECH SCI
WIREL NETW
EURASIP J IMAGE VIDE
MATH CONTROL SIGNAL
INT J ANTENN PROPAG
J ELECTRON TEST
IEICE ELECTRON EXPR
CIRCUIT WORLD
INT J ELECTRON
ACM J EMERG TECH COM
IEEE INSTRU MEAS MAG
INT J COMMUN SYST
IEICE T ELECTRON
ELECTR ENG
Wiley‐Blackwell
Springer
IET
Wiley‐Blackwell
Emerald
Springer
Wiley‐Blackwell
Elsevier, Urban & Fischer
Korean Inst Electr Eng
Springer
Wiley‐Blackwell
Elsevier
IET
Springer London
Taylor & Francis
Amer Scientific Publishers
Univ Suceava
IET
IEEK Publication Center
Springer
Springer
Springer London
Hindawi
Springer
IEICE
Emerald
Taylor & Francis
ACM
IEEE
Wiley‐Blackwell
IEICE
Springer
0895‐2477
1380‐7501
1751‐8822
0894‐3370
1356‐5362
0925‐1030
1096‐4290
1434‐8411
1975‐0102
0920‐8542
1430‐144X
0141‐9331
1751‐9675
1863‐1703
1559‐9612
1555‐130X
1582‐7445
1751‐858X
1598‐1657
1022‐0038
1687‐5281
0932‐4194
1687‐5869
0923‐8174
1349‐2543
0305‐6120
0020‐7217
1550‐4832
1094‐6969
1074‐5351
0916‐8524
0948‐7921
4,021
411
113
180
125
762
332
656
187
335
368
291
146
74
62
210
100
181
119
1,215
150
461
53
237
491
133
942
65
233
231
1,116
192
0.618
0.617
0.603
0.600
0.600
0.592
0.591
0.588
0.579
0.578
0.577
0.575
0.561
0.560
0.556
0.556
0.555
0.547
0.520
0.520
0.500
0.500
0.468
0.468
0.461
0.444
0.440
0.414
0.406
0.406
0.400
0.397
203
J COMMUN TECHNOL EL+
Maik
Nauka/Interperiodica/Springer
1064‐2269
819
0.383
Immediacy
Index
2011
Articles
0.728
0.373
0.393
0.427
0.078
0.110
0.065
0.021
0.185
0.050
0.119
0.102
0.150
0.155
0.128
0.078
0.036
0.044
0.167
0.533
0.104
0.373
0.071
0.068
0.140
0.000
0.000
0.034
0.078
0.105
0.063
0.118
0.086
0.058
0.051
0.000
811
164
31
48
27
160
84
157
120
103
149
64
83
45
24
75
77
59
42
117
43
15
37
59
319
19
126
17
35
103
294
24
0.325
0.099
191
0.523
0.625
0.570
0.802
0.624
0.794
0.719
0.912
0.807
0.918
0.450
0.485
0.426
0.416
0.477
Article
Cited
Eigenfactor Influence
Half-Life
Score*
Score**
5
4
3
9
5
7
5
5
3
5
5
7
3
5
5
6
5
0.01479
0.00251
0.00087
0.00047
0.00041
0.00188
0.00125
0.00229
0.00082
0.00145
0.00116
0.00086
0.00106
0.00051
0.00033
0.00101
0.00019
0.00129
0.00128
0.00341
0.00130
0.00091
0.00038
0.00076
0.00238
0.00032
0.00114
0.00049
0.00089
0.00112
0.00385
0.00075
10
0.00140
3
2
3
4
8
3
>10.0
7
3
8
>10.0
0.189
0.318
0.261
0.168
0.181
0.172
0.194
0.211
0.238
0.201
0.226
0.324
0.193
0.258
0.317
0.467
0.402
0.811
0.184
0.201
0.136
0.141
0.134
0.279
0.163
0.147
0.161
0.086
IF
Rank
2011
Abbreviated Journal Title
Publisher
ISSN
2011
Total
Cites
Impact
Factor
(IF)
204
205
206
207
208
209
210
211
212
213
J ELECTR ENG‐SLOVAK
IEEJ T ELECTR ELECTR
IEEE LAT AM T
EPE J
APPL ARTIF INTELL
SOLDER SURF MT TECH
IEEE TECHNOL SOC MAG
COMPEL
INTEGR FERROELECTR
IEEE AERO EL SYS MAG
Slovak Univ Technology
Wiley‐Blackwell
IEEE
EPE Assoc
Taylor & Francis
Emerald
IEEE
Emerald
Taylor & Francis
IEEE
1335‐3632
1931‐4973
1548‐0992
0939‐8368
0883‐9514
0954‐0911
0278‐0097
0332‐1649
1058‐4587
0885‐8985
159
185
154
88
355
123
111
367
660
359
0.370
0.363
0.346
0.339
0.333
0.314
0.308
0.301
0.300
0.297
214
INFORM MIDEM
Soc Microelectronics, Electron
Components Materials ‐ MIDEM
0352‐9045
76
0.296
215
TURK J ELECTR ENG CO
1300‐0632
91
0.283
216
217
218
219
220
221
222
223
224
225
J CIRCUIT SYST COMP
J SYST ENG ELECTRON
SOLID STATE TECHNOL
IEICE T COMMUN
PRZ ELEKTROTECHNICZN
CAN J ELECT COMPUT E
IEICE T FUND ELECTR
AUTOMATIKA
IETE J RES
EDN
0218‐1266
1004‐4132
0038‐111X
0916‐8516
0033‐2097
0840‐8688
0916‐8508
0005‐1144
0377‐2063
0012‐7515
270
280
263
1,354
793
66
1,335
41
62
134
0.281
0.276
0.271
0.254
0.244
0.241
0.226
0.208
0.200
0.183
226
CHINESE J ELECTRON
1022‐4653
148
0.147
227
228
229
230
231
232
233
234
J APPL RES TECHNOL
MICROWAVE J
SMPTE MOTION IMAG J
REV ROUM SCI TECH‐EL
INT J SOFTW ENG KNOW
INT ARAB J INF TECHN
FREQUENZ
INT J APPL ELECTROM
1665‐6423
0192‐6225
0036‐1682
0035‐4066
0218‐1940
1683‐3198
0016‐1136
1383‐5416
20
271
36
43
135
35
154
255
0.145
0.145
0.143
0.136
0.129
0.127
0.124
0.122
Tubitak Scientific & Research
Council
World Scientific
Systems Engineering & Electronics
Pennwell Publ
IEICE
Wydawnictwo Sigma
IEEE
IEICE
Korema
Medknow Publications
Canon Communications
Technology Exchange Limited
Hong Kong
Univ Nacional Autonoma Mexico
Horizon House
Soc Motion Picture TV Eng
Editura Acad Romane
World Scientific
Zarka Private Univ
Walter de Gruyter
IOS Press
5-Year
Impact
Factor
Immediacy
Index
2011
Articles
0.303
0.467
0.440
0.372
0.311
0.305
0.337
0.067
0.078
0.098
0.000
0.122
0.000
0.043
0.140
0.072
0.015
60
103
163
10
41
23
23
136
208
67
0.263
0.000
Article
Cited
Eigenfactor Influence
Half-Life
Score*
Score**
0.00063
0.00114
0.00032
0.00017
0.00064
0.00025
0.00040
0.00114
0.00152
0.00115
0.074
0.174
0.124
0.195
0.109
0.104
0.172
49
0.00019
0.054
0.027
74
0.00031
0.041
0.021
0.024
0.059
0.052
98
142
41
526
887
7
4
>10.0
5
3
379
23
57
73
6
0.158
0.127
0.034
0.043
0.053
0.301
0.112
0.071
154
0.000
0.048
0.000
0.023
0.000
0.017
0.041
0.076
32
105
47
43
42
59
49
79
0.350
0.263
0.254
0.268
0.385
0.288
0.211
0.167
0.253
0.265
0.179
5
3
3
9
8
7
5
7
7
0.122
4
0.00071
0.00116
0.00048
0.00378
0.00072
0.00030
0.00461
0.00009
0.00015
0.00006
0.033
0.005
4
0.00031
0.021
9
7
7
7
0.00006
0.00095
0.00030
0.00001
0.00050
0.00011
0.00045
0.00072
0.094
0.080
0.077
0.152
0.115
0.105
0.098
0.119
0.093
0.066
IF
Rank
2011
Abbreviated Journal Title
235
236
INT J ELEC ENG EDUC
FUJITSU SCI TECH J
237
J I TELECOMMUN PROF
238
239
240
241
242
243
244
NEC TECH J
MICROWAVES RF
ELECTR ENG JPN
LIGHT ENG
ELECTR COMMUN JPN
TRAIT SIGNAL
ELECTRON WORLD
Publisher
Manchester Univ Press
Fujitsu
ITP ‐ Inst Telecommunications
Professionals
NEC
Penton Media
Wiley‐Blackwell
Znack Publishing
Wiley‐Blackwell
Presses Univ Grenoble
St John Patrick Publ
ISSN
2011
Total
Cites
Impact
Factor
(IF)
5-Year
Impact
Factor
Immediacy
Index
2011
Articles
Article
Cited
Eigenfactor Influence
Half-Life
Score*
Score**
0020‐7209
0016‐2523
92
71
0.119
0.114
0.178
0.114
0.000
27
0.00013
0.00046
0.044
0.085
1755‐9278
8
0.109
0.065
0.000
26
0.00008
0.039
1880‐5884
0745‐2993
0424‐7760
0236‐2945
1942‐9533
0765‐0019
1365‐4675
23
66
287
14
287
74
27
0.095
0.087
0.085
0.082
0.078
0.061
0.013
0.067
0.061
0.143
0.028
0.016
0.000
0.011
0.273
0.000
0
142
124
38
89
11
73
0.00018
0.00021
0.00067
0.00005
0.00056
0.00010
0.00004
0.039
0.019
0.053
0.272
0.012
9
>10.0
*Eigenfactor Scores are recent additions to the Journal Citations Report. Carl Bergstrom, who devised the Eigenfactor Score, describes it as a variable based on data from ISI, the source
of the Science Citation Index (SCI) and the Thomson Reuters Journal Citation Reports (JCR). It is "a measure of the journal's total importance to the scientific community, using an iterative
algorithm to weight citations (similar to the PageRank algorithm used for Google.)"
**Article Influence Score (AIS), also developed by Bergstrom, is meant to represent the relative importance of the journal on a per‐article basis. Bergstrom describes the journal’s Article
Influence Score as "a measure of the average influence of each of its articles over the first five years after publication." To find out more about both the Eigenfactor score and the AIS
score visit the web site http://www.eigenfactor.org.
0.127
0.005