Journal Citation Reports, Science Edition 2010: Electrical & Electronics Engineering Category, Ranked by Impact Factor
IF
Rank
2010
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
Abbreviated Journal Title
IEEE SIGNAL PROC MAG
PROG QUANT ELECTRON
P IEEE
IEEE T PATTERN ANAL
IEEE J SEL AREA COMM
PROG ELECTROMAGN RES
IEEE T MED IMAGING
IEEE J SEL TOP QUANT
IEEE T IND ELECTRON
IEEE T POWER ELECTR
IEEE J SOLID-ST CIRC
IEEE COMMUN MAG
IEEE T INFORM THEORY
IEEE ELECTR DEVICE L
IEEE T FUZZY SYST
J CRYPTOL
IEEE T SIGNAL PROCES
IEEE T NEURAL NETWOR
PATTERN RECOGN
IEEE T IMAGE PROCESS
IEEE-ASME T MECH
IEEE J-STSP
IEEE INTELL SYST
IEEE J QUANTUM ELECT
IEEE T GEOSCI REMOTE
COMPUT VIS IMAGE UND
IEEE POWER ENERGY M
IEEE PHOTONICS J
IEEE ACM T NETWORK
J MICROMECH MICROENG
IEEE T ENERGY CONVER
IEEE T ELECTRON DEV
Publisher
ISSN
IEEE
1053-5888
Pergamon-Elsevier
0079-6727
IEEE
0018-9219
IEEE
0162-8828
IEEE
0733-8716
EMW Publishing
1559-8985
IEEE
0278-0062
IEEE
1077-260X
IEEE
0278-0046
IEEE
0885-8993
IEEE
0018-9200
IEEE
0163-6804
IEEE
0018-9448
IEEE
0741-3106
IEEE
1063-6706
Springer
0933-2790
IEEE
1053-587X
IEEE
1045-9227
Elsevier
0031-3203
IEEE
1057-7149
IEEE
1083-4435
IEEE
1932-4553
IEEE
1541-1672
IEEE
0018-9197
IEEE
0196-2892
Academic Press Elsevier1077-3142
IEEE
1540-7977
IEEE
1943-0655
IEEE
1063-6692
IOP Publishing
0960-1317
IEEE
0885-8969
IEEE
0018-9383
2010
Total
Cites
Impact
Factor
(IF)
3,599
677
16,971
24,279
11,803
3,202
10,907
6,804
10,294
8,612
12,966
6,142
28,764
7,921
4,863
1,191
16,576
9,078
11,498
12,062
2,033
790
1,658
10,533
14,006
2,771
516
110
5,378
7,858
4,219
13,464
5.860
5.250
5.096
5.027
4.232
3.745
3.545
3.458
3.439
3.176
3.127
2.837
2.725
2.714
2.683
2.675
2.631
2.624
2.607
2.606
2.577
2.571
2.570
2.477
2.470
2.404
2.384
2.344
2.284
2.276
2.260
2.255
1
5-Year
Impact
Factor
6.889
4.893
6.155
7.228
5.445
2.512
4.349
3.626
3.824
3.397
3.730
3.043
4.292
2.607
3.752
2.582
2.947
3.417
3.402
3.908
2.596
2.632
2.269
2.995
2.730
2.344
3.200
2.536
3.223
2.380
Immediacy
Index
2010
Articles
0.478
1.889
0.597
0.591
0.194
0.665
0.975
0.648
0.240
0.180
0.390
0.277
0.419
0.511
0.387
1.000
0.338
0.355
0.450
0.291
0.354
0.523
0.600
0.531
0.720
0.144
0.250
0.312
0.147
0.367
0.104
0.463
67
9
139
176
129
275
162
199
434
300
246
173
477
456
93
20
571
172
349
261
99
86
45
254
375
111
40
112
150
472
134
454
Cited
Half-Life
5.7
8.3
>10.0
9.6
7.3
2.4
8.3
5.8
4.1
5.9
6.9
6.5
8.9
4.9
7.9
>10.0
7.2
9
7.2
7.5
5.9
2.7
7
>10.0
7.5
7.4
3.7
1.3
7.6
4.9
6.8
8
Article
Eigenfactor Influence
Score*
Score**
0.01729
0.00127
0.03596
0.05002
0.03920
0.01109
0.01888
0.02309
0.02541
0.01802
0.04238
0.02056
0.07028
0.03612
0.00895
0.00113
0.05025
0.01533
0.02871
0.03596
0.00421
0.00751
0.00418
0.01249
0.02908
0.00952
0.00319
0.00065
0.01479
0.02841
0.01205
0.04024
3.181
2.325
2.772
2.810
2.227
0.516
1.261
1.284
0.775
0.734
1.489
1.190
1.694
1.115
0.950
0.636
1.114
0.982
1.067
1.565
0.556
0.832
0.754
0.859
1.201
1.042
1.263
0.764
1.113
0.969
IF
Rank
2010
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
Abbreviated Journal Title
J LIGHTWAVE TECHNOL
IEEE T INTELL TRANSP
IEEE T SOFTWARE ENG
IEEE PERVAS COMPUT
AUTOMATICA
J MICROELECTROMECH S
IEEE T WIREL COMMUN
IET RENEW POWER GEN
INT J ELEC POWER
IEEE T MICROW THEORY
IEEE PHOTONIC TECH L
IEEE T POWER SYST
IEEE T AUTOMAT CONTR
IEEE NETWORK
SENSOR ACTUAT A-PHYS
EXPERT SYST APPL
IEEE ELECTR INSUL M
IEEE T NANOTECHNOL
IEEE T CIRC SYST VID
IEEE T KNOWL DATA EN
IEEE IND ELECTRON M
IEEE WIREL COMMUN
IEEE MICROW WIREL CO
INT J CIRC THEOR APP
IEEE MICROW MAG
IEEE T ANTENN PROPAG
IEEE T INF FOREN SEC
IEEE T BIOMED CIRC S
J DISP TECHNOL
IEEE T AUDIO SPEECH
IEEE T COMPUT
IEEE T CIRCUITS-I
IEEE T PARALL DISTR
Publisher
IEEE
IEEE
IEEE
IEEE
Pergamon-Elsevier
IEEE
IEEE
IET
Elsevier
IEEE
IEEE
IEEE
IEEE
IEEE
Elsevier
Pergamon-Elsevier
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
Wiley-Blackwell
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
IEEE
ISSN
2010
Total
Cites
Impact
Factor
(IF)
0733-8724
1524-9050
0098-5589
1536-1268
0005-1098
1057-7157
1536-1276
1752-1416
0142-0615
0018-9480
1041-1135
0885-8950
0018-9286
0890-8044
0924-4247
0957-4174
0883-7554
1536-125X
1051-8215
1041-4347
1932-4529
1536-1284
1531-1309
0098-9886
1527-3342
0018-926X
1556-6013
1932-4545
1551-319X
1558-7916
0018-9340
1549-8328
1045-9219
13,565
1,182
4,382
1,155
11,068
5,060
9,049
203
1,378
14,395
13,537
11,091
18,892
1,399
10,492
6,609
634
1,556
5,342
3,645
87
1,712
3,705
704
664
13,627
682
208
703
1,569
6,460
6,691
2,729
2.255
2.234
2.216
2.189
2.171
2.157
2.152
2.082
2.073
2.015
1.987
1.964
1.950
1.934
1.933
1.924
1.911
1.864
1.847
1.847
1.844
1.798
1.759
1.759
1.752
1.728
1.725
1.689
1.674
1.668
1.604
1.573
1.571
2
5-Year
Impact
Factor
Immediacy
Index
2.563
2.748
3.468
3.351
2.768
2.722
2.678
2.314
1.828
2.388
1.850
3.045
3.075
3.011
2.008
2.193
1.902
1.959
2.837
2.893
1.673
3.368
1.938
1.516
1.644
2.032
2.542
1.990
2.299
2.215
2.031
2.167
1.990
0.570
0.385
0.224
0.293
0.276
0.294
0.245
0.074
0.144
0.300
0.441
0.119
0.214
0.243
0.245
0.227
0.200
0.531
0.184
0.219
0.278
0.154
0.291
0.279
0.357
0.239
0.099
0.184
0.438
0.206
0.216
0.221
0.222
2010
Articles
388
91
49
41
272
160
413
54
139
444
583
210
364
37
335
1010
30
98
185
128
18
65
227
61
56
528
81
49
89
180
139
272
135
Cited
Half-Life
6
4.7
>10.0
5.7
7.8
6.7
3.9
2.5
5.3
8.5
5.8
8.7
>10.0
6.8
6.5
2.6
8.1
4.7
6.7
5.9
5.4
4.3
6.2
5.3
8.3
3.3
2.6
3.3
3.5
>10.0
6.7
6.7
Article
Eigenfactor Influence
Score*
Score**
0.04644
0.00375
0.00616
0.00462
0.03318
0.01390
0.04538
0.00135
0.00327
0.04624
0.04814
0.01748
0.03871
0.00424
0.02840
0.02059
0.00094
0.00881
0.01454
0.01440
0.00052
0.00740
0.02558
0.00151
0.00338
0.03455
0.00432
0.00119
0.00504
0.00797
0.01125
0.02500
0.00982
0.932
0.702
1.137
1.242
1.143
0.897
0.891
0.803
0.419
1.141
0.668
0.783
1.347
1.184
0.624
0.431
0.430
0.847
0.904
1.166
0.549
1.249
0.954
0.358
0.835
0.721
0.846
0.610
0.899
0.595
0.842
0.962
0.831
IF
Rank
2010
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
Abbreviated Journal Title
MICROELECTRON ENG
IEEE CIRC SYST MAG
IMAGE VISION COMPUT
IEEE T NUCL SCI
INT J ROBUST NONLIN
J FRANKLIN I
IEEE T VEH TECHNOL
IEEE T DEVICE MAT RE
MACH VISION APPL
IEEE SENS J
IEEE T DIELECT EL IN
IEEE T ULTRASON FERR
IEEE T BROADCAST
SOLID STATE ELECTRON
IEEE GEOSCI REMOTE S
IEEE T CONTR SYST T
CONTROL ENG PRACT
IEEE J OCEANIC ENG
ELECTR POW SYST RES
J ELECTRON MATER
J ELECTROMAGNET WAVE
IEEE T COMMUN
INT REV ELECTR ENG-I
SIGNAL PROCESS
ENG APPL ARTIF INTEL
IEEE T CIRCUITS-II
SEMICOND SCI TECH
IEEE T RELIAB
IET CONTROL THEORY A
IEEE T ADV PACKAGING
SEMICONDUCT SEMIMET
J VAC SCI TECHNOL B
IEEE T COMPUT AID D
Publisher
ISSN
Elsevier
0167-9317
IEEE
1531-636X
Elsevier
0262-8856
IEEE
0018-9499
Wiley-Blackwell
1049-8923
Pergamon-Elsevier
0016-0032
IEEE
0018-9545
IEEE
1530-4388
Springer
0932-8092
IEEE
1530-437X
IEEE
1070-9878
IEEE
0885-3010
IEEE
0018-9316
Pergamon-Elsevier
0038-1101
IEEE
1545-598X
IEEE
1063-6536
Pergamon-Elsevier
0967-0661
IEEE
0364-9059
Elsevier
0378-7796
Springer
0361-5235
VSP
0920-5071
IEEE
0090-6778
Praise Worthy Prize SRL1827-6660
Elsevier
0165-1684
Pergamon-Elsevier
0952-1976
IEEE
1549-7747
IOP Publishing
0268-1242
IEEE
0018-9529
IET
1751-8644
IEEE
1521-3323
Academic Press Elsevier0080-8784
AVS AIP
1071-1023
IEEE
0278-0070
2010
Total
Cites
Impact
Factor
(IF)
6,432
282
3,159
9,717
1,381
1,070
5,942
834
688
2,585
3,315
5,873
1,270
5,583
1,344
2,967
2,603
2,386
2,361
4,936
1,432
13,820
718
4,255
1,423
3,781
5,331
2,324
728
1,206
482
10,442
3,551
1.569
1.568
1.525
1.519
1.495
1.492
1.485
1.483
1.479
1.471
1.470
1.460
1.444
1.438
1.420
1.419
1.406
1.402
1.396
1.390
1.376
1.364
1.364
1.351
1.344
1.334
1.323
1.288
1.283
1.276
1.273
1.268
1.252
3
5-Year
Impact
Factor
1.537
3.063
1.840
1.499
1.798
1.219
1.819
1.610
1.655
1.587
1.721
1.749
1.801
1.391
1.684
1.969
1.704
1.641
1.522
1.483
0.991
2.105
1.450
1.598
1.637
1.578
1.698
1.549
1.454
1.000
1.339
1.494
Immediacy
Index
2010
Articles
0.389
0.100
0.307
0.174
0.222
0.260
0.224
0.119
0.143
0.265
0.177
0.318
0.131
0.281
0.215
0.239
0.152
0.557
0.138
0.173
0.262
0.229
0.372
0.199
0.100
0.133
0.589
0.040
0.068
0.217
0.000
0.262
0.159
552
20
150
536
135
123
446
59
70
264
232
314
61
288
177
142
132
79
181
427
237
398
352
316
130
195
209
75
266
115
3
526
182
Cited
Half-Life
4.6
5.7
7
7.4
6.2
9.3
5.9
5.1
7.6
4
6.2
7.3
5.3
8.3
3.5
7.1
7.1
8.5
5.3
6.7
2.9
9.8
2
7.3
5.3
6.1
6.4
>10.0
3
5.3
>10.0
8.1
7.3
Article
Eigenfactor Influence
Score*
Score**
0.02553
0.00119
0.00857
0.01866
0.00595
0.00229
0.01974
0.00494
0.00211
0.01183
0.00612
0.01473
0.00423
0.01429
0.00938
0.00854
0.00675
0.00321
0.00778
0.01287
0.00509
0.02411
0.00057
0.01334
0.00392
0.01922
0.01802
0.00457
0.00435
0.00586
0.00045
0.02424
0.00896
0.510
1.277
0.636
0.372
0.856
0.373
0.634
0.678
0.657
0.514
0.348
0.549
0.541
0.548
0.688
0.719
0.558
0.484
0.475
0.451
0.257
0.811
0.555
0.403
0.876
0.618
0.703
0.489
0.648
1.458
0.456
0.478
IF
Rank
2010
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
Abbreviated Journal Title
DIGIT SIGNAL PROCESS
DISPLAYS
IEEE T POWER DELIVER
IEEE T IND APPL
J MICRO-NANOLITH MEM
SIGNAL PROCESS-IMAGE
IEEE VEH TECHNOL MAG
COMPUT NETW
IEEE T EDUC
IEEE SIGNAL PROC LET
IET ELECTR POWER APP
IET OPTOELECTRON
IEEE T INSTRUM MEAS
J ELECTROSTAT
MICROSYST TECHNOL
MICROELECTRON RELIAB
IEEE T MAGN
IEEE T CONSUM ELECTR
IEEE ANTENN WIREL PR
OPTO-ELECTRON REV
IET POWER ELECTRON
IEEE T APPL SUPERCON
EURASIP J ADV SIG PR
ELECTRON LETT
IET COMMUN
IEEE T COMPON PACK T
J REAL-TIME IMAGE PR
WIREL NETW
IEEE DES TEST COMPUT
NETWORK-COMP NEURAL
IET GENER TRANSM DIS
MECHATRONICS
J MATER SCI-MATER EL
Publisher
ISSN
Academic Press Elsevier1051-2004
Elsevier
0141-9382
IEEE
0885-8977
IEEE
0093-9994
SPIE
1932-5150
Elsevier
0923-5965
IEEE
1556-6072
Elsevier
1389-1286
IEEE
0018-9359
IEEE
1070-9908
IET
1751-8660
IET
1751-8768
IEEE
0018-9456
Elsevier
0304-3886
Springer
0946-7076
Pergamon-Elsevier
0026-2714
IEEE
0018-9464
IEEE
0098-3063
IEEE
1536-1225
Versita
1230-3402
IET
1755-4535
IEEE
1051-8223
Hindawi
1687-6172
IET
0013-5194
IET
1751-8628
IEEE
1521-3331
Springer Heidelberg 1861-8200
Springer
1022-0038
IEEE
0740-7475
Informa Healthcare 0954-898X
IET
1751-8687
Pergamon-Elsevier
0957-4158
Springer
0957-4522
2010
Total
Cites
Impact
Factor
(IF)
1,360
600
7,380
7,393
334
809
253
3,536
940
3,253
294
136
5,114
1,904
1,711
2,839
13,945
2,712
1,713
469
120
5,686
2,026
15,365
527
1,703
105
1,376
926
740
347
1,173
1,992
1.220
1.210
1.208
1.204
1.194
1.186
1.184
1.176
1.157
1.146
1.110
1.105
1.098
1.078
1.069
1.066
1.052
1.038
1.031
1.027
1.018
1.013
1.012
1.001
0.963
0.962
0.962
0.958
0.957
0.957
0.951
0.944
0.927
4
5-Year
Impact
Factor
1.607
1.426
1.678
1.911
1.211
1.105
2.114
1.690
1.310
1.526
1.438
1.055
1.148
1.230
1.110
1.024
1.024
1.085
1.270
1.075
1.027
0.967
1.136
1.009
0.988
1.373
1.669
2.000
1.667
1.138
1.343
1.097
Immediacy
Index
2010
Articles
0.329
0.206
0.084
0.144
0.176
0.113
0.185
0.117
0.150
0.247
0.143
0.067
0.173
0.115
0.143
0.109
0.172
0.077
0.118
0.344
0.045
0.080
0.097
0.147
0.136
0.141
0.000
0.041
0.382
0.250
0.051
0.059
0.185
155
34
346
271
91
62
27
223
80
223
70
30
364
78
258
341
836
391
297
64
89
540
331
994
214
92
21
148
34
4
117
85
211
Cited
Half-Life
7.9
6.4
8.6
>10.0
1.9
6.4
4.3
6
6.5
5.7
3.2
2.6
7.2
8.5
4.3
5.7
8.5
5.6
3.9
4.8
2.2
5.3
4.5
>10.0
2.5
7
3
7.2
6.2
9.4
2.9
6.6
4.5
Article
Eigenfactor Influence
Score*
Score**
0.00332
0.00166
0.01339
0.01285
0.00125
0.00227
0.00115
0.01217
0.00123
0.01578
0.00210
0.00073
0.01148
0.00472
0.00692
0.00835
0.03392
0.00605
0.01155
0.00154
0.00063
0.01536
0.01142
0.03628
0.00285
0.00404
0.00069
0.00373
0.00354
0.00121
0.00210
0.00304
0.00734
0.519
0.454
0.445
0.695
0.247
0.394
0.670
0.604
0.199
0.721
0.556
0.294
0.308
0.429
0.343
0.304
0.349
0.239
0.590
0.329
0.285
0.222
0.455
0.408
0.292
0.388
0.629
0.829
0.797
0.362
0.412
0.348
IF
Rank
2010
Abbreviated Journal Title
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
148
149
150
151
152
153
154
155
156
157
158
159
160
161
162
163
164
IEEE T AERO ELEC SYS
ETRI J
IEEE T VLSI SYST
J NANOELECTRON OPTOE
MULTIMED TOOLS APPL
IET IMAGE PROCESS
IEEE SPECTRUM
J SOC INF DISPLAY
IEEE ANTENN PROPAG M
ELECTROMAGNETICS
OPT FIBER TECHNOL
ACM J EMERG TECH COM
J INFRARED MILLIM TE
MULTIDIM SYST SIGN P
COMPUT COMMUN
EURASIP J WIREL COMM
WIREL COMMUN MOB COM
IEEE T ELECTROMAGN C
QUANTUM ELECTRON+
BT TECHNOL J
MICROELECTRON J
J POWER ELECTRON
CIRC SYST SIGNAL PR
IEEE T SEMICONDUCT M
IET SIGNAL PROCESS
INT J ADAPT CONTROL
ADV ELECTR COMPUT EN
INT J IMAG SYST TECH
IET MICROW ANTENNA P
INT J OPTOMECHATRONI
INT J INFRARED MILLI
INTEGRATION
ELEKTRON ELEKTROTECH
Publisher
ISSN
IEEE
0018-9251
ETRI
1225-6463
IEEE
1063-8210
Amer Scientific Publishers
1555-130X
Springer
1380-7501
IET
1751-9659
IEEE
0018-9235
IET
1071-0922
IEEE
1045-9243
Taylor & Francis
0272-6343
Elsevier
1068-5200
ACM
1550-4832
Springer
1866-6892
Springer
0923-6082
Elsevier
0140-3664
Hindawi
1687-1499
Wiley-Blackwell
1530-8669
IEEE
0018-9375
Turpion
1063-7818
Springer
1358-3948
Elsevier
0026-2692
Korean Inst Power Electronics
1598-2092
Birkhauser Boston
0278-081X
IEEE
0894-6507
IET
1751-9675
Wiley-Blackwell
0890-6327
Univ Suceava
1582-7445
Wiley-Blackwell
0899-9457
IET
1751-8725
Taylor & Francis
1559-9612
Springer/Plenum
0195-9271
Elsevier
0167-9260
Kaunas Univ Technology1392-1215
2010
Total
Cites
Impact
Factor
(IF)
4,545
672
2,097
133
435
83
829
810
1,240
343
546
93
136
197
2,133
734
1,858
1,726
2,530
272
1,889
226
383
1,107
107
576
82
408
414
51
847
255
524
0.917
0.912
0.904
0.900
0.885
0.862
0.858
0.857
0.855
0.844
0.841
0.838
0.824
0.822
0.815
0.815
0.810
0.803
0.802
0.800
0.787
0.779
0.752
0.748
0.741
0.729
0.688
0.684
0.682
0.682
0.672
0.663
0.659
5
5-Year
Impact
Factor
1.599
0.885
1.336
0.895
0.880
0.853
0.959
0.823
1.165
0.733
0.890
0.824
0.729
0.958
1.846
1.115
0.796
0.384
0.884
0.819
1.115
0.915
1.101
0.709
0.855
0.721
0.583
0.661
Immediacy
Index
2010
Articles
0.140
0.107
0.207
0.070
0.163
0.047
0.339
0.079
0.143
0.114
0.333
0.000
0.156
0.136
0.102
0.084
0.164
0.076
0.210
136
131
188
71
123
43
56
152
98
44
63
12
154
22
226
273
116
118
205
0.073
0.196
0.095
0.070
0.141
0.085
0.095
0.111
0.053
0.080
110
102
74
57
71
71
95
45
263
25
0
31
264
0.065
0.473
Cited
Half-Life
>10.0
4
6
2.7
3.7
7.8
3.9
7.7
7.2
7.1
1.4
9.2
4.4
3.4
6.6
8
9.6
6.5
4.6
2.5
5.5
7.9
2.5
6.8
8.4
3
9.7
6.2
1.9
Article
Eigenfactor Influence
Score*
Score**
0.00687
0.00322
0.00820
0.00092
0.00205
0.00064
0.00312
0.00422
0.00436
0.00111
0.00133
0.00061
0.00062
0.00110
0.00774
0.00503
0.00607
0.00451
0.00393
0.00053
0.00799
0.00085
0.00134
0.00245
0.00077
0.00192
0.00017
0.00095
0.00427
0.00024
0.00203
0.00075
0.00021
0.574
0.292
0.558
0.332
0.294
0.348
0.500
0.297
0.560
0.276
0.280
0.234
0.588
0.281
0.686
0.436
0.204
0.116
0.299
0.270
0.361
0.373
0.453
0.285
0.469
0.184
0.206
0.214
IF
Rank
2010
165
166
167
168
169
170
171
172
173
174
175
176
177
178
179
180
181
182
183
184
185
186
187
188
189
190
191
192
193
194
195
196
197
Abbreviated Journal Title
MICROW OPT TECHN LET
MAT SCI SEMICON PROC
BELL LABS TECH J
SOLDER SURF MT TECH
EURASIP J IMAGE VIDE
IEEE SYST J
SIGNAL IMAGE VIDEO P
J SIGNAL PROCESS SYS
J ELECTRON PACKAGING
APPL ARTIF INTELL
J SUPERCOMPUT
MICROPROCESS MICROSY
AEU-INT J ELECTRON C
OPT QUANT ELECTRON
J ELECTRON IMAGING
RADIOENGINEERING
INT J ANTENN PROPAG
J ELECTRON TEST
IET CIRC DEVICE SYST
RADIOPHYS QUANT EL+
IEEE IND APPL MAG
COMPUT ELECTR ENG
INT J RF MICROW C E
ELECTR POW COMPO SYS
IEICE T ELECTRON
MICROELECTRON INT
ANALOG INTEGR CIRC S
IET COMPUT VIS
IEEE INSTRU MEAS MAG
IEICE ELECTRON EXPR
IET SCI MEAS TECHNOL
CIRCUIT WORLD
COMPEL
Publisher
ISSN
Wiley-Blackwell
0895-2477
Elsevier
1369-8001
Wiley Periodicals
1089-7089
Emerald
0954-0911
Hindawi
1687-5176
IEEE
1932-8184
Springer
1863-1703
Springer
1939-8018
ASME
1043-7398
Taylor & Francis
0883-9514
Springer
0920-8542
Elsevier
0141-9331
Elsevier, Urban & Fischer
1434-8411
Springer
0306-8919
IS&T & SPIE
1017-9909
Spolecnost Pro Radioelektronicke
1210-2512
Hindawi
1687-5869
Springer
0923-8174
IET
1751-858X
Springer
0033-8443
IEEE
1077-2618
Pergamon-Elsevier
0045-7906
Wiley-Blackwell
1096-4290
Taylor & Francis
1532-5008
IEICE
0916-8524
Emerald
1356-5362
Springer
0925-1030
IET
1751-9632
IEEE
1094-6969
IEICE
1349-2543
IET
1751-8822
Emerald
0305-6120
Emerald
0332-1649
2010
Total
Cites
Impact
Factor
(IF)
4,012
700
518
148
80
96
56
139
734
429
343
265
516
1,282
892
178
40
271
117
683
430
232
257
302
1,263
103
748
37
189
401
82
115
356
0.656
0.650
0.639
0.636
0.619
0.619
0.617
0.607
0.564
0.563
0.545
0.545
0.519
0.513
0.506
0.503
0.500
0.500
0.495
0.490
0.489
0.484
0.475
0.474
0.469
0.468
0.452
0.447
0.444
0.425
0.414
0.404
0.386
6
5-Year
Impact
Factor
0.574
0.778
0.613
0.644
0.550
0.838
0.650
0.955
0.616
0.530
0.553
0.571
0.733
0.682
0.455
0.596
0.697
0.534
0.526
0.423
0.431
0.465
0.492
0.583
0.740
0.625
0.444
0.530
0.407
0.373
Immediacy
Index
2010
Articles
0.114
0.222
0.220
0.038
0.000
0.054
0.116
0.072
0.042
0.103
0.130
0.148
0.058
0.312
0.046
0.135
0.000
0.061
0.036
0.071
0.047
0.039
0.074
0.053
0.062
0.080
0.087
0.000
0.135
0.074
0.065
0.227
0.023
781
9
59
26
34
56
43
111
48
39
77
27
155
16
108
104
22
49
56
42
43
103
81
95
258
25
173
26
37
282
31
22
131
Cited
Half-Life
4.6
5.3
>10.0
6.9
2.3
6.9
9
5.5
6.4
5.1
9.4
6.8
2.6
7
3.1
>10.0
8.5
5.7
5.2
4.8
5.4
5.3
7.2
5.4
2.9
6.2
5.3
Article
Eigenfactor Influence
Score*
Score**
0.01551
0.00304
0.00112
0.00037
0.00057
0.00053
0.00033
0.00084
0.00178
0.00089
0.00137
0.00087
0.00180
0.00249
0.00181
0.00066
0.00038
0.00145
0.00084
0.00172
0.00069
0.00076
0.00102
0.00132
0.00493
0.00030
0.00211
0.00037
0.00065
0.00223
0.00071
0.00025
0.00174
0.190
0.320
0.191
0.181
0.211
0.246
0.235
0.296
0.225
0.221
0.205
0.182
0.228
0.226
0.221
0.367
0.262
0.159
0.170
0.159
0.155
0.168
0.130
0.204
0.384
0.199
0.150
0.241
0.105
0.163
IF
Rank
2010
198
199
200
201
202
203
204
205
206
207
208
209
210
211
212
213
214
215
216
217
218
219
220
221
222
223
224
225
226
227
228
229
230
Abbreviated Journal Title
IEEE TECHNOL SOC MAG
MATH CONTROL SIGNAL
MICROLITHOGR WORLD
EUR T ELECTR POWER
IETE TECH REV
INT J NUMER MODEL EL
SOLID STATE TECHNOL
EURASIP J AUDIO SPEE
J COMMUN TECHNOL EL+
INT J APPL ELECTROM
ELECTR ENG
IEEJ T ELECTR ELECTR
IEICE T COMMUN
TURK J ELECTR ENG CO
IEICE T FUND ELECTR
J ELECTR ENG-SLOVAK
MICROWAVE J
INTEGR FERROELECTR
APPL COMPUT ELECTROM
INT J ELECTRON
INFORM MIDEM
INT J SOFTW ENG KNOW
PRZ ELEKTROTECHNICZN
FREQUENZ
INT J COMMUN SYST
EDN
J APPL RES TECHNOL
J CIRCUIT SYST COMP
J SYST ENG ELECTRON
FUJITSU SCI TECH J
EPE J
CAN J ELECT COMPUT E
IEEE AERO EL SYS MAG
Publisher
ISSN
2010
Total
Cites
Impact
Factor
(IF)
IEEE
0278-0097
92
Springer London
0932-4194
463
Pennwell Publ
1074-407X
25
Wiley-Blackwell
1430-144X
238
IETE
0256-4602
61
Wiley-Blackwell
0894-3370
192
Pennwell Publ
0038-111X
314
Hindawi
1687-4714
44
Maik Nauka/Interperiodica/Springer
1064-2269
686
IOS Press
1383-5416
266
Springer
0948-7921
146
Wiley-Blackwell
1931-4973
135
IEICE
0916-8516
1,467
Tubitak Scientific
1300-0632
79
IEICE
0916-8508
1,487
Slovak Univ Technology1335-3632
132
Horizon House Publications
0192-6225
364
Taylor & Francis
1058-4587
644
Applied Computational 1054-4887
Electromagnetics136
Soc
Taylor & Francis
0020-7217
910
Soc Microelectronics 0352-9045
42
World Scientific
0218-1940
183
Wydawnictwo Sigma 0033-2097
616
Fachverlag Schiele Schon
0016-1136
156
Wiley-Blackwell
1074-5351
213
Reed Business Information
0012-7515
170
Univ Nacionale Autonoma
1665-6423
Mexico
14
World Scientific
0218-1266
224
Systems Engineering & 1004-4132
Electronics
224
Fujitsu
0016-2523
81
EPE Assoc
0939-8368
96
IEEE
0840-8688
82
IEEE
0885-8985
359
0.375
0.375
0.375
0.371
0.370
0.354
0.342
0.341
0.339
0.328
0.309
0.301
0.301
0.286
0.281
0.270
0.268
0.264
0.258
0.252
0.250
0.248
0.242
0.231
0.229
0.228
0.220
0.215
0.211
0.193
0.188
0.184
0.179
7
5-Year
Impact
Factor
0.423
1.106
0.206
0.421
0.174
0.353
0.274
0.583
0.290
0.285
0.371
0.322
0.339
0.320
0.231
0.269
0.209
0.417
0.179
0.313
0.268
0.320
0.152
0.237
0.178
0.333
0.357
0.446
Immediacy
Index
2010
Articles
0.040
0.111
25
9
0
89
44
34
48
30
188
249
42
110
539
74
361
59
93
147
98
104
0.011
0.114
0.441
0.083
0.067
0.069
0.000
0.024
0.064
0.033
0.041
0.055
0.017
0.075
0.000
0.051
0.019
0.000
0.043
0.043
0.080
0.495
0.000
0.060
0.037
0.034
0.036
0.014
37
1058
46
88
91
30
116
163
58
28
0
70
Cited
Half-Life
>10.0
7
8.7
>10.0
8.4
6.8
4.4
2.7
4.9
6
4.6
>10.0
7.3
7.3
>10.0
7
2.7
6.8
5.6
2.7
8.1
3.4
6.2
Article
Eigenfactor Influence
Score*
Score**
0.00042
0.00127
0.00004
0.00076
0.00015
0.00039
0.00079
0.00030
0.00096
0.00081
0.00061
0.00085
0.00487
0.00019
0.00445
0.00054
0.00109
0.00180
0.00033
0.00090
0.00016
0.00053
0.00050
0.00057
0.00073
0.00018
0.00003
0.00044
0.00087
0.00027
0.00038
0.00024
0.00158
0.195
0.987
0.033
0.146
0.034
0.131
0.111
0.212
0.056
0.111
0.123
0.111
0.091
0.101
0.108
0.108
0.071
0.110
0.048
0.106
0.111
0.111
0.015
0.060
0.049
0.161
0.096
0.220
IF
Rank
2010
231
232
233
234
235
236
237
238
239
240
241
242
243
244
245
246
247
Abbreviated Journal Title
INT J ELEC ENG EDUC
CHINESE J ELECTRON
ELECTR ENG JPN
AUTOMATIKA
SMPTE MOTION IMAG J
TRAIT SIGNAL
IETE J RES
MICROWAVES RF
NEC TECH J
INT ARAB J INF TECHN
REV ROUM SCI TECH-EL
ELECTR COMMUN JPN
ELECTRON WORLD
LIGHT ENG
CONTROL ENG
J I TELECOMMUN PROF
CONNECTOR SPECIFIER
Publisher
ISSN
2010
Total
Cites
Impact
Factor
(IF)
Manchester Univ Press0020-7209
92
Technology Exchange Limited
1022-4653
Hong Kong187
Wiley-Blackwell
0424-7760
242
Korema
0005-1144
20
Soc Motion Picture TV Eng
0036-1682
25
Presses Univ Grenoble 0765-0019
48
Medknow Publications 0377-2063
49
Penton Media
0745-2993
75
NEC
1880-5884
47
Zarka Private Univ
1683-3198
25
Editura Acad Romane 0035-4066
36
Wiley-Blackwell
1942-9533
237
Nexus Media Communications
1365-4675
29
Znack Publishing
0236-2945
19
Reed Business Information
0010-8049
77
ITP
1755-9278
1
Pennwell Publ
1078-1528
3
0.140
0.135
0.131
0.108
0.094
0.078
0.076
0.073
0.071
0.065
0.057
0.050
0.047
0.036
0.026
0.016
0.000
5-Year
Impact
Factor
0.258
0.147
0.134
0.117
0.068
0.047
0.150
0.497
0.028
0.033
0.013
0.013
Immediacy
Index
2010
Articles
0.034
0.026
0.028
0.000
0.023
0.000
0.045
0.013
29
156
106
25
44
12
44
154
0
59
46
80
77
54
63
8
0.034
0.022
0.038
0.000
0.000
0.016
0.000
Cited
Half-Life
4.8
7
8.2
Article
Eigenfactor Influence
Score*
Score**
0.00025
0.00054
0.00056
0.00009
0.00015
0.00010
0.00007
0.00025
0.00027
0.00011
0.00001
0.00058
0.00009
0.00001
0.00009
0.00000
0.00002
0.080
0.033
0.040
0.050
0.013
0.024
0.054
0.187
0.011
0.008
0.002
0.006
*Eigenfactor Scores are recent additions to the Journal Citations Report. The scientist who devised the Eigenfactor Score is Carl Bergstrom, who states at his web site "using data primarily
from ISI, the source of the Science Citation Index (SCI) and the Thomson Reuters Journal Citation Reports (JCR), Eigenfactor.org calculates an importance variable (called an Eigenfactor) for
each journal. The Eigenfactor Score is a measure of the journal's total importance to the scientific community, using an iterative algorithm to weight citations (similar to the PageRank
algorithm used for Google.)"
**Article Influence Score (AIS) is also a relatively recent addition to the IEEE JCR report. It too was developed by Bergstrom, also with data primarily from SCI and JCR. The AIS is meant to
represent the relative importance of the journal on a per-article basis. Bergstrom describes the journal’s Article Influence Score as "a measure of the average influence of each of its articles
over the first five years after publication." To find out more about the both the Eigenfactor score and the AIS score visit the web site http://www.eigenfactor.org, with FAQs at
http://www.eigenfactor.org./faq.htm. You can visit Bergstrom's academic web page at http://octavia.zoology.washington.edu/.
8