MIL-STD-883H
METHOD 3004.1
TRANSITION TIME MEASUREMENTS
1. PURPOSE. This method establishes the means for measuring the output transition times of digital microelectronic
devices, such as TTL, DTL, RTL, ECL, and MOS.
1.1 Definitions. The following definitions shall apply for the purpose of this method.
1.1.1 Rise time (ti LH ). The transition time of the output from 10 percent to 90 percent or voltage levels of output voltage
with the specified output changing from the defined LOW level to the defined HIGH level.
1.1.2 Fall time (t THL ). The transition time of the output from 90 percent to 10 percent or voltage levels of output voltage
with the specified output changing from the defined HIGH level to the defined LOW level.
2 APPARATUS. Equipment capable of measuring the elapsed time between specified percentage points (normally 10
percent to 90 percent on the positive transition and 90 percent to 10 percent on the negative transition) or voltage levels.
The test chamber shall be capable of maintaining the device under test at any specified temperature.
3. PROCEDURE. The device shall be stabilized at the specified test temperature. The device under test shall be loaded
as specified in the applicable acquisition document. The load shall meet the requirements specified in method 3002 of this
document. The driving signal shall be applied as specified in method 3001 or the applicable acquisition document.
3.1 Measurement of t TLH and t THL . Unless otherwise stated, the rise transition time (t TLH ) shall be measured between the
10 percent and 90 percent points on the positive transition of the output pulse and the fall transition time (t THL ) shall be
measured between the 90 percent and 10 percent points on the negative transition of the output pulse. The device under
test shall be conditioned according to the applicable acquisition document with nominal bias voltages applied. Figure
3004-1 shows typical transition time measurement.
4. SUMMARY. The following details shall be specified in the applicable acquisition document:
a.
tTLH l i m i t s .
b.
t THL limits.
c.
Transition time measurement points if other than 10 percent or 90 percent.
d.
Parameters of the driving signal.
e.
Conditioning voltages (static or dynamic).
f.
Load condition.
g.
Power supply voltages.
h.
Test temperature.
METHOD 3001.1
15 November 1974
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C h e c k t h e s o u r c e to v e r i f y t h a t t h i s is t h e c u r r e n t v e r s i o n b e f o r e u s e .