Chap. 4 Excess carriers in semiconductors Objectives 1. Understand how photons interact with direct and indirect band gap semiconductors 2. Understand generation-recombination of excess carriers, possibly through trap sites 3. Introduce quasi-Fermi levels in non-equilibrium 4. Calculate diffusion currents from carrier concentration gradients and diffusivity 5. Use the continuity equation to study time dependence of carrier concentration 4.1 Optical absorption dI ( x) I ( x ) dx I ( x) I 0 e x I t I 0 e l 4.2 Luminescence 4.2.1 Photoluminescence 4.2.2 Electroluminescence 4.3 Carrier lifetime and photoconductivity 4.3.1 Direct recombination of electrons and holes dn (t ) r ni2 r n(t )p(t ) dt dn(t ) r ni2 r [n 0 n(t )][p0 p(t )] dt r [(n 0 p0 )n(t ) n 2(t )] If p-type dn(t ) r p0n(t ) dt n(t ) ne r p t ne t / n 0 4.3.2 Indirect recombination; Trapping Photoconductive decay 4.3.3 Steady state carrier generation; Quasi-Fermi levels g (T ) r ni2 r n0 p0 g (T ) g op r np r (n0 n)( p0 p ) for steady state recombinat ion and no trapping, n p g (T ) g op r n0 p0 r [(n0 p0 )n n 2 ] g op r (n0 p0 )n n p g op n n n quasi - Fermi levels n0 ni e ( E F Ei ) / kT p0 ni e ( Ei EF ) / kT n ni e ( Fn Ei ) / kT p ni e ( Ei F p ) / kT Quasi-Fermi levels are steady state analogues of the equilibrium Fermi level. Fn=Fp=EF at equilibrium. 4.3.4 Photoconductive devices Light detector Exposure meter Optical sensitivity by examining steady state excess carrier concentrations by g op n n g op and p p g op qg op ( n n p p ) n of InSb 105 cm 2 / V s Time response of photoconductive cell: recombination time, carrier trapping, carrier drift Proper choice of material and geometry Response time vs. sensitivity 4.4 Diffusion of carriers 4.4.1 Diffusion processes Natural result of random motion of individual molecules Net diffusion continues as long as gradients exist. 1 1 n1l A n2l A 2 2 l n ( x0 ) n1 n2 2t n( x) n( x x) n1 n2 l x l2 n( x) n( x x) l 2 dn( x) n ( x) lim 2t x0 x 2t dx l2 : electron diffusion coefficien t, D n 2t dn( x) n ( x) Dn dx dp ( x) p ( x) D p dx dn( x) dn( x) J n (diff .) (q ) Dn qDn dx dx dp ( x) dp ( x) J p (diff .) ( q ) D p qD p dx dx 4.4.2 Diffusion and drift of carriers; Built-in fields dn( x) dx dp( x) J p ( x) q p p( x) ( x) qD p dx J ( x) J n ( x) J p ( x) J n ( x) q n n( x) ( x) qDn Minority carriers can contribute to current. V ( x) E ( x) q ( x) dV ( x) d E 1 dEi i dx dx q q dx at equilibriu m, ( x) Dp ( x) D p 1 dEi dEF p kT dx dx D D p 1 dp ( x) p ( x) dx kT : Einstein relation q 0.026eV See table 4-1 4.4.3 Diffusion and recombination; The continuity equation p t x x x 1 J p ( x) J p ( x x) p q x p p ( x, t ) p 1 J p p , as x approaches zero. t t q x p Continuity equation for holes n 1 J n n t q x n Diffusion equation for electrons, n 2n n Dn t x 2 n p 2p p Dp t x 2 p 4.4.4 Steady state carrier injection; Diffusion length d 2n n n dx 2 Dn n L2n Lp: average distance a hole diffuses before recombination d p p p dx 2 D p p L2p 2 p( x) C1e x / Lp p( x) pe C2 e x / Lp x / Lp 4.4.5 The Haynes-Shockley experiment Drift and diffusion of minority carriers L vd td p vd time dependent diffusion eq. p ( x, t ) 2p Dp t x 2 P x 2 / 4 D t p e p ( x, t ) 2 D p t P x 2 / 4 D t p e p( x, t ) 2 D p t x tvd t L td 4.4.6 Gradients in the Quasi-Fermi levels dn( x) dx n( x) dFn dEi kT dx dx J n ( x) q n n( x) ( x) qDn dn( x) d ni e ( Fn Ei ) / kT dx dx dF dE J n ( x) q n n( x) ( x) n n( x) n i dx dx dF J n ( x ) n n( x ) n dx a modified Ohm' s law, d ( Fn / q ) d ( Fn / q ) n ( x) dx dx d ( Fp / q ) d ( Fp / q ) J p ( x) q p p ( x) p ( x) dx dx J n ( x) q n n( x) A lack of current implies constant quasi-Fermi levels. Same as electrochemical potential