SEMI CAST Working Group
RITdb – Rich Interactive Test Database
July 2015
Purpose
• Provide standards driven data environment for
Semiconductor Test including:
• Simple standards-based data capture, transport and
relationship model for:
– E-test, probe, and final test data
– Equipment configuration and performance data
– Event logs
• Model intended to support:
– Near real time Monitoring of status and performance
– Data analysis that requires accurate, consistent data from
multiple related sources
– The requirements of the ITRS Adaptive Test Roadmap
Focus
• Common transport format
– SQLITE noSQL binary file
– Legacy STDF support
• Provenance
– Metadata attached to each data file
• Security Model
– Encryption
• Real time query and analytics support
RITdb Advantages
• Addresses the weaknesses of STDF4
–
–
–
–
Better field definitions
Enhanced extensibility
Support for adaptive test
Smaller size/faster access
• Single simple extensible data model that can
capture
– Etest, probe and final test datalogs
– Equipment configuration information
– Equipment events, adaptive controls and results, etc.
RITdb Advantages
• Real-time streaming model that will:
– Combine and synchronize data from multiple sources
– Enable monitoring and other real-time applications
• Plug-and-Play of components from multiple suppliers
– consumers and producers linked through SEMI standard
messages and data format
• Addresses ITRS Adaptive Test Roadmap requirements
including
– Multilevel data stores with feed-forward and feedback
– Both real-time and non real-time adaptive test
RITdb in ITRS Model – E-test Feed-forward to Probe
ETest Cell
Tools
FAB
Cell
Data
Probe Cell
Broker
Tools
Datalog
“RT A/O” stands for
“Real-Time Analysis &
Optimization”
Cell
Data
Broker
“PTAD” is “Post-Test
Analysis &
Dispositioning”
PTAD
Cell AT
Etest
Results
PTAD
Etest
FFwd
Assembly
Operations
(This includes build operations at
any level of assembly.)
Probe
Results
Fab data
Design data
Business data
Customer specs
Burn-in
PTAD
RITd
Meta b
Factory DB
RITdb
Meta
Factory DB
Etest
FFwd
•
•
•
•
RT A/O
Meta
Final Test Cell Cell
Tools
Data
Broker
RITdb
Meta
Factory DB
Global
Global
(RITdb)
(RITdb)
Cell AT
RT A/O
PTAD
Card/System Test
PTAD
World-wide cross-company databases
RITdb structure addresses part, not
necessarily all of database requirements
GURU app used to store and access RITdb
datalogs
Field Operation
RT A/O
Final Test
Status:RITdb datalog
• Available Utilities:
– STDF to RITdb translator
• Specification
– Specification will be in RITdb format and will
enable spec format and content validation.
– Initial draft of spec planned for 4Q15
STDF to RITdb:PTR
PTR => test_info
PIR/PRR = test_event
RITdb - testerlog
• TI has implemented RITdb testerlog inventory
data collection for several roadmap testers. This
along with other ATE information will be centrally
collected into a centralized information portal.
• In the coming month, TI and ST will begin
working jointly on refining the testerlog
specification.
– Current spec is targeted toward the collection of the
hw information. i.e. The boards, modules, and
instrumentation in the tester.
– Next stage will be define the tester software and
configuration in more detail.
RITdb testerlog – Inventory
Pin to tester resource relationships
RITdb-based messaging:
Architecture Objectives
Long-term architecture that:
1. Enables Plug and Play for tools and test support
applications – meaning:
A tool or application that produces RITdb standard data can be plugged
together with one that consumes RITdb standard data with no need to
develop a special purpose interface.
2. Supports generation and access to real-time streaming
data as well as files
3. Allows for data from different producers to be merged
and synchronized, and then delivered to consumers
4. Allows for adding new types of data without impacting
existing model
5. Integrates cleanly with ITRS Adaptive Test Model
RITdb-based messaging:
Architecture Objectives
Near-term architecture that:
1. Allows for integration of legacy tools that don’t meet
the RITdb standards
2. Works with test cells of varying capabilities (e.g., from
cells that contain only a tester and handler/prober, to
cells that include full function cell controllers, support
real-time adaptive test, etc.)
3. Uses a modern high-performance open software
message-based communications model that reduces
dependence on proprietary software
Logical Model for a Test Cell in RITdb Environment
•
•
•
Red lines depict links that carry RITdb
standard messages
Dark blue boxes are examples of cell and
factory functionality
Components are linked through standard
open systems messaging
Factory Apps
Web
Dash
Other
OtherCells
Cells
Web Server
Outlier Det
Engr Analysis
Adaptive Test
Tester
Control
Events
Datalog
Test Cell
Monitor
Equip Status
Cell Control
RITdb Appliance
Adaptive
Broker
Broker
Eq Config
GURU
Data
Logger
Prober
Handler
Control
Events
Adaptive
Test
MES
Files
Map to
STDF
Map to
OTDF
Current Prototype for Testing Messaging & Streaming
STDF
Application
Gen/Control
(Display)
STDF ->
RITdb
RITdb
Dlog
Map
Event
Gen
Persistent
Store
Cell-1
Control
Dlog Col
Cell
Broker
Bridge
Cell-1
Factory
Control
Dlog Col
Convert, &
Index
Factory
Broker
Event
Mgr
Equip State
Display
Rule App
Alarm
Display
Bridge
Tester
Creating
RITdb
Dlog
Map
Event
Gen
Cell-N
Factory
Cell-N
Control
Cell
Broker
Stream
Builder
System Monitor
(Message Flow
Display & Log)
Current testing reads RITdb files;
later testing will take Datalog and events directly from tester
Provided by Appliance
Apps that map to RITdb
Data Processing Apps
Analysis Result Displays
Control Apps with GUI
RITdb Working Group
• Participating companies
Roos Instruments
Optimal+
TestCIM Consulting
Texas Instruments
Maxim
STMicroelectronics
Xcerra
O’Neill Tech Consulting ….
• Weekly working group calls
• LinkedIn Group
– Semiconductor Big Data - RITdb the next gen STDF
– Discussions, documents, meeting minutes available in
group
Contacts
• Mark Roos
• Paul Trio
mroos@roos.com
ptrio@semi.org