7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
Summary Report: MIL-STD-883H Mechanical Shock and Random Vibration
Testing of Dexter Silicon Based Thermopiles
1.0
PURPOSE
In response to internal and military application inquires regarding mechanical durability of Dexter
silicon based thermopiles; Dexter Research Center, Inc. has undertaken specific MIL-STD-883H
mechanical testing of it’s single element ST and S60 series TO5 package thermopiles. The
present military fire sensor application using the thin film Sb/Bi 1M model has been in use for over
30 years and proven to survive environments of 1,000G mechanical shock, and 30G random
vibration. In order to build on that success, the 1M model underwent additional testing as a
control for performance comparison to the Silicon based thermopiles.
(Data & excerpts are inserted as applicable from documents published between Dexter Research & Trialon Corporation.)
1.1
Scope
1M and Silicon based thermopile configurations were built according to table 3.0-1 (below) and
then subjected to MIL-STD-883H mechanical shock (3 axis), and random vibration (3 axis). Each
MIL test was performed at two intensity levels, and all units were electrically tested for integrity
between each mechanical test and intensity. The test sequence followed is defined in table 3.1-1
below. As indicated in MIL-STD-883H, the physical fixturing and holding of the units under test
may compromise the hermetic package seal. As a result, only the integrity of the internal
detector, on-chip resistor, or chip thermistor circuits (resistance or continuity) is reported.
2.0
APPLICABLE DOCUMENTS
The following documents formed an integral part of this test procedure.
MIL-STD-883H
Doc. # 5327 Rev J
Doc. # 153116 Rev E
Procedure (note that
purposes.)
3.0
Military Standard Mechanical Test Methods
Dexter Final Test, Process Flowchart
Customer X Thermopile Detector Sensitivity and Resistance Test
Customer name and part numbers have been removed for privacy
TEST ARTICLES
Test articles for this program were finished thermopiles in the following configurations and
quantities, (table 3.0-1):
Table 3.0-1
Qty.
Detector P/N
under
(or base p/n)
Description of units tested
test
Notes:
DX-0017
1M/CF:X GE/.180/GOLD/N2
10
1M on pins
DX-0018
1M/CF:X /.180/GOLD/N2
10
1M on pins
DX-0830
ST60R/SAPPHIRE U1/XE
15
TO5 w/on-chip resistor wired
DX-0783
ST120/T4/SAPPHIRE U1/XE
15
TO5 w/30kohm chip thermistor
DX-0425
ST150/SAPPHIRE/XE
15
TO5 w/no resistor-thermistor
DX-0875
ST60R/TO18/5.0LWPSI1/XE
20
TO18 w/on-chip resistor wired
DX-0409
S60M/HS/.020FAP/8-14 SI 1%/XE
20
TO5 w/.020" internal aperture
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc
7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
3.1
Test Sequence
Table 3.1-1 defines the test sequence followed.
Table 3.1-1
4.0
Test
Sequence
Test Description
Location
1
2
Circuit Integrity
Mechanical Shock
DRC
Trialon
3
4
Circuit Integrity
Random Vibration
DRC
Trialon
5
6
Circuit Integrity
Mechanical Shock
DRC
Trialon
7
8
Circuit Integrity
Random Vibration
DRC
Trialon
9
Circuit Integrity
DRC
Test Method and Detail
Resistance Test of DX-0409-0830 units (Ref doc. 5327
Rev J), Sensitivity of DX-0017/DX-0018 (Customer X
doc.153116 Rev E)
MIL-STD-883, Method 2002.5, Condition A (500G).
Resistance Test of DX-0409-0830 units (Ref doc. 5327
Rev J), Sensitivity of DX-0017/DX-0018 (Customer X
doc.153116 Rev E)
MIL-STD-883, 2026, Cond. II – A (6G Random Vibration)
Resistance Test of DX-0409-0830 units (Ref doc. 5327
Rev J), Sensitivity of DX-0017/DX-0018 (Customer X
doc.153116 Rev E)
MIL-STD-883, Method 2002.5, Condition B (1000G).
Resistance Test of DX-0409-0830 units (Ref doc. 5327
Rev J), Sensitivity of DX-0017/DX-0018 (Customer X
doc.153116 Rev E)
MIL-STD-883, 2026, Cond. II - J (30G Random Vibration)
Resistance Test of DX-0409-0830 units (Ref doc. 5327
Rev J), Sensitivity of DX-0017/DX-0018 (Customer X
doc.153116 Rev E)
GENERAL TEST INFORMATION
4.1
Test Location
Testing was performed at Dexter Research Center, or Trialon Corporation as noted in Table 3.11.
4.2
Test Conditions
All tests were performed at prevailing site altitude, at a room temperature of 205C (689F),
and relative humidity not exceeding 90% unless otherwise specified. All units were tested at the
same time from the same batch.
4.3
Test Reporting
Trialon shock/vibration set-up and profiles are reported in section 5.0, report. Dexter circuit
integrity data is tabulated in section 6.0. ..
4.4
Quality Assurance
All tests at Dexter were performed by Quality Assurance personnel. All testing at Trialon was
supported by a signed Test Report outlining the equipment name, model number, calibration due
date, tolerance, setup, and method of test.
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc
7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
4.5
General Failure Criteria
For ‘DX-0409-0830’ products, a detector circuit, on-chip resistor, or chip thermistor is classified as
failing if the resistance value changed by >10% from its baseline (pre-MIL) tested value under
Dexter Final Test Procedure (Doc.5327). For parts number DX-0017 and DX-0018 only the
sensitivity (uV output) was measured via Customer X doc 153116 Rev E; failure was considered
as any drop in output >10% from its baseline (pre-MIL) tested value. In hindsight, the DX-0017 &
DX-0018 could have been tested for resistance on the test equipment as well. The presence of
output within +/-10% from baseline will satisfy continuity and integrity of the detector pattern for
this test.
5.0
MIL-STD-883H Test Setup, and Profiles
5.1
Test # 2 Setup & Profile, 500G Shock
MIL-STD-883, Method 2002.5, Condition A. Thermopiles were fastened into 3 tooling plates, and
attached to the Avco Drop Shock Machine as shown in the photos below. –Plates are rotated as
needed to achieve all pulse orientations, and subjected to a total of 30 Half-sine/500G/1.0ms
shock pulses, 5 in each of the three axes, in positive and negative direction. An accelerometer is
mounted near the samples to measure the pulse profile (10 mV/G)
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc
7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
5.2
Test # 4 Setup & Profile, 6G Random Vibration
MIL-STD-883, 2026, Cond. II – A. Thermopiles were fastened into 3 tooling plates, attached to
the LDS Vibration Table as shown in the photos below, and subjected to the following vibration
profile for 15 minutes in each of 3 axes. An accelerometer is mounted near the samples to
measure and control the vibration input listed below.
Frequency (Hz)
5
100
2000
2
Power Spectral Density -PSD (G /Hz)
0.000051
0.02
0.02
Overall Grms Level = 6.21
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc
7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
5.3
Test # 6 Profile, 1,000G Shock
MIL-STD-883, Method 2002.5, Condition B (modified from 1,500G down to 1,000G).
Thermopiles plates were mounted to the Drop Shock Machine as shown 5.1 above, and
subjected to a total of 30 Half-sine/1,000G/0.5ms shock pulses, 5 in each of the three
axes, in positive and negative directions. An accelerometer is mounted near the samples
to measure the pulse profile. (10 mV/G)
5.4
Test # 8 Setup & Profile, 30G Random Vibration
MIL-STD-883H, 2026, Cond. II – J. Thermopiles were fastened into 3 tooling plates,
attached to the LDS Vibration Table as shown in the photos below, and subjected to the
following vibration profile for 3 hours in each of 3 axes. An accelerometer is mounted
near the samples to measure and control the vibration input below.
Frequency (Hz)
5
100
2000
2
Power Spectral Density -PSD (G /Hz)
.00118673
0.465386
0.465386
Overall Grms Level = 30.0
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc
7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
6.0
Detector Test Data
All circuit integrity test data defined in the table below. The resistance of DX-0409-0830 units
(kohm), and the sensitivity (uV) of the DX-0017 & DX-0018 units are reflected. Delta from
Baseline columns illustrate the percent of change from the baseline reading.
Detector test data: kohm for 'DX', uV for '4211XX'
D = detector, R = On-Chip Resistor, T = Chip Thermistor
Δ from Baseline columns formatted to show any change > +/- 10% as
Tested after:
Detector
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
DX-0830
#
1D
1R
2D
2R
3D
3R
4D
4R
5D
5R
6D
6R
7D
7R
8D
8R
9D
9R
10 D
10 R
11 D
11 R
12 D
12 R
13 D
13 R
14 D
14 R
15 D
Pre-MIL
Baseline
(5/6/11)
54.2
28.6
54.8
30.39
54.83
29.23
55.54
30.36
55.35
29.84
55.17
29.29
53.95
28.46
54.95
30.99
55.4
30.28
53.81
29.87
55.66
30.01
55.87
30.26
55.74
29.95
55.31
31.38
55.23
500G
Shock
(5/12/11)
54.31
28.65
54.9
30.43
54.94
29.28
55.69
30.42
55.51
29.91
55.34
29.36
54.09
28.54
55.08
31.07
55.55
30.34
53.95
29.93
55.78
30.1
56.01
30.33
55.88
30.02
55.41
31.46
55.34
Δ from
Baseline
0.2%
0.2%
0.2%
0.1%
0.2%
0.2%
0.3%
0.2%
0.3%
0.2%
0.3%
0.2%
0.3%
0.3%
0.2%
0.3%
0.3%
0.2%
0.3%
0.2%
0.2%
0.3%
0.3%
0.2%
0.3%
0.2%
0.2%
0.3%
0.2%
6G Vibe (5/20/11)
54.46
28.68
55.06
30.46
55.04
29.3
55.75
30.45
55.63
29.94
55.42
29.38
54.15
28.53
55.18
31.08
55.66
30.36
54.02
29.93
55.89
30.11
56.14
30.33
56.01
30.02
55.55
31.47
55.51
Δ from
Baseline
0.5%
0.3%
0.5%
0.2%
0.4%
0.2%
0.4%
0.3%
0.5%
0.3%
0.5%
0.3%
0.4%
0.2%
0.4%
0.3%
0.5%
0.3%
0.4%
0.2%
0.4%
0.3%
0.5%
0.2%
0.5%
0.2%
0.4%
0.3%
0.5%
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc
1000G
Shock
(6/13/11)
54.26
28.63
54.84
30.41
54.9
29.25
55.61
30.4
55.44
29.89
55.26
29.33
53.96
28.48
54.99
31.02
55.44
30.31
53.86
29.88
55.65
30.04
55.93
30.28
55.79
29.97
55.34
31.41
55.27
Δ from
Baseline
1.8%
3.5%
1.8%
3.3%
1.8%
3.4%
1.8%
3.3%
1.8%
3.4%
1.8%
3.4%
1.9%
3.5%
1.8%
3.2%
1.8%
3.3%
1.9%
3.3%
1.8%
3.3%
1.8%
3.3%
1.8%
3.3%
1.8%
3.2%
1.8%
30G Vibe
(8/1/11)
54.34
28.66
54.95
30.43
54.9
29.26
55.68
30.41
55.48
29.92
55.28
29.33
54.03
28.48
55.05
31.04
55.49
30.31
53.9
29.91
55.74
30.05
55.96
30.3
55.84
29.98
55.4
31.44
55.36
Δ from
Baseline
0.3%
0.2%
0.3%
0.1%
0.1%
0.1%
0.3%
0.2%
0.2%
0.3%
0.2%
0.1%
0.1%
0.1%
0.2%
0.2%
0.2%
0.1%
0.2%
0.1%
0.1%
0.1%
0.2%
0.1%
0.2%
0.1%
0.2%
0.2%
0.2%
7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
DX-0830
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0783
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0425
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
15 R
1D
1T
2D
2T
3D
3T
4D
4T
5D
5T
6D
6T
7D
7T
8D
8T
9D
9T
10 D
10 T
11 D
11 T
12 D
12 T
13 D
13 T
14 D
14 T
15 D
15 T
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
1D
1R
2D
2R
3D
3R
4D
4R
5D
5R
6D
6R
7D
7R
8D
8R
9D
9R
10 D
10 R
11 D
11 R
12 D
12 R
13 D
29.56
92.32
32.44
92.64
32.02
92.63
31.47
92.71
31.93
92.29
31.12
92.61
31.71
92.4
30.94
92.44
31.94
92.58
31.04
92.37
31.8
92.64
31.1
92.33
31.98
92.48
31.65
92.22
31.42
92.4
31.87
81.51
80.98
81.56
81.12
81.57
81.66
81.96
82.09
82.14
82.11
81.5
81.4
81.25
81.29
81.96
58.82
28.62
59.72
29.78
57.7
26.71
58.06
28.11
58.6
28
59.06
28.14
58.65
28.93
59.62
29.34
59.69
29.36
57.98
28.43
59.54
30.28
58.42
28.23
58.64
29.63
92.75
32.2
93.01
29.65
92.98
31.03
93.13
31.37
92.66
30.49
93.03
31.1
92.94
29.92
92.78
31.01
92.95
30.19
92.73
31
92.9
30.1
92.765
31.42
92.93
30.59
92.61
29.64
92.74
30.93
81.89
81.37
81.82
81.53
82.09
82.33
82.43
82.59
82.66
82.61
82.06
81.74
81.58
81.76
82.33
58.59
28.74
59.62
29.83
57.55
26.75
57.8
28.21
58.39
28.05
58.9
28.25
58.41
29.03
59.53
29.46
59.63
29.55
57.74
28.55
59.38
30.37
58.13
28.27
58.32
0.2%
0.5%
-0.7%
0.4%
-7.4%
0.4%
-1.4%
0.5%
-1.8%
0.4%
-2.0%
0.5%
-1.9%
0.6%
-3.3%
0.4%
-2.9%
0.4%
-2.7%
0.4%
-2.5%
0.3%
-3.2%
0.5%
-1.8%
0.5%
-3.3%
0.4%
-5.7%
0.4%
-2.9%
0.5%
0.5%
0.3%
0.5%
0.6%
0.8%
0.6%
0.6%
0.6%
0.6%
0.7%
0.4%
0.4%
0.6%
0.5%
-0.4%
0.4%
-0.2%
0.2%
-0.3%
0.1%
-0.4%
0.4%
-0.4%
0.2%
-0.3%
0.4%
-0.4%
0.3%
-0.2%
0.4%
-0.1%
0.6%
-0.4%
0.4%
-0.3%
0.3%
-0.5%
0.1%
-0.5%
29.66
92.97
32.12
93.12
31.85
93.18
31.37
93.13
31.97
92.75
30.96
93.14
31.44
93.03
30.49
92.91
31.58
93.05
30.54
92.76
31.35
92.98
30.55
92.76
31.97
93
31.36
92.7
31.21
92.95
31.36
81.94
81.51
82.01
81.57
82.06
82.41
82.44
82.59
82.7
82.65
82.12
81.8
82.46
81.81
81.62
58.7
28.66
59.7
29.77
57.66
26.71
57.89
28.13
58.46
27.97
59.02
28.19
58.51
28.97
59.59
29.36
59.68
29.43
57.83
28.48
59.47
30.29
58.19
28.23
58.49
0.3%
0.7%
-1.0%
0.5%
-0.5%
0.6%
-0.3%
0.5%
0.1%
0.5%
-0.5%
0.6%
-0.9%
0.7%
-1.5%
0.5%
-1.1%
0.5%
-1.6%
0.4%
-1.4%
0.4%
-1.8%
0.5%
0.0%
0.6%
-0.9%
0.5%
-0.7%
0.6%
-1.6%
0.5%
0.7%
0.6%
0.6%
0.6%
0.9%
0.6%
0.6%
0.7%
0.7%
0.8%
0.5%
1.5%
0.6%
-0.4%
-0.2%
0.1%
0.0%
0.0%
-0.1%
0.0%
-0.3%
0.1%
-0.2%
-0.1%
-0.1%
0.2%
-0.2%
0.1%
-0.1%
0.1%
0.0%
0.2%
-0.3%
0.2%
-0.1%
0.0%
-0.4%
0.0%
-0.3%
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc
29.6
92.7
33.45
92.78
33.02
92.75
32.66
92.98
33.13
92.57
32.24
92.77
32.85
92.77
32.07
92.67
33.05
92.78
32.16
92.59
32.99
92.77
32.19
92.59
33.31
92.74
32.9
92.58
32.62
92.57
33.22
81.72
81.15
81.81
81.27
81.71
82.24
82.17
82.4
82.38
82.34
81.95
81.55
82.12
81.64
81.51
58.54
28.62
59.52
29.72
57.45
26.7
57.81
28.1
58.29
27.97
58.83
28.13
58.33
28.93
59.43
29.34
56.56
29.41
57.71
28.42
59.35
30.23
58.09
28.21
58.37
3.4%
1.1%
3.2%
1.1%
3.2%
1.1%
3.3%
1.1%
3.2%
1.1%
3.3%
1.1%
3.3%
1.1%
3.4%
1.1%
3.2%
1.1%
3.3%
1.1%
3.3%
1.1%
3.3%
1.1%
3.3%
1.1%
3.3%
1.1%
3.3%
1.1%
3.3%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.2%
1.7%
3.5%
1.7%
3.4%
1.7%
3.7%
1.7%
3.6%
1.7%
3.6%
1.7%
3.6%
1.7%
3.5%
1.7%
3.4%
1.6%
3.4%
1.7%
3.5%
1.7%
3.3%
1.7%
3.5%
1.7%
29.61
93.02
34.97
93.2
34.8
93.26
34.26
93.46
34.79
93.05
33.67
93.26
34.23
93.11
33.67
93.08
34.71
93.23
33.54
93.13
34.41
93.24
33.73
93.07
34.79
93.36
34.36
92.98
34.13
93.14
34.58
82.01
81.5
82.12
81.59
81.94
82.41
82.57
82.59
82.74
82.72
82.15
81.84
79.1
81.97
81.74
58.67
28.69
59.65
29.97
57.67
26.77
57.95
28.17
58.47
28.03
58.95
28.19
58.48
29.01
59.58
29.37
59.59
29.45
57.85
28.46
59.46
30.31
58.19
28.25
58.47
0.2%
0.8%
7.8%
0.6%
8.7%
0.7%
8.9%
0.8%
9.0%
0.8%
8.2%
0.7%
7.9%
0.8%
8.8%
0.7%
8.7%
0.7%
8.1%
0.8%
8.2%
0.6%
8.5%
0.8%
8.8%
1.0%
8.6%
0.8%
8.6%
0.8%
8.5%
0.6%
0.6%
0.7%
0.6%
0.5%
0.9%
0.7%
0.6%
0.7%
0.7%
0.8%
0.5%
-2.6%
0.8%
-0.3%
-0.3%
0.2%
-0.1%
0.6%
-0.1%
0.2%
-0.2%
0.2%
-0.2%
0.1%
-0.2%
0.2%
-0.3%
0.3%
-0.1%
0.1%
-0.2%
0.3%
-0.2%
0.1%
-0.1%
0.1%
-0.4%
0.1%
-0.3%
7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0875
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0409
DX-0017
DX-0017
DX-0017
DX-0017
DX-0017
DX-0017
DX-0017
DX-0017
DX-0017
DX-0017
DX-0018
DX-0018
DX-0018
DX-0018
DX-0018
DX-0018
DX-0018
DX-0018
DX-0018
DX-0018
7.0
13 R
14 D
14 R
15 D
15 R
16 D
16 R
17 D
17 R
18 D
18 R
19 D
19 R
20 D
20 R
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
1
2
3
4
5
6
7
8
9
10
1
2
3
4
5
6
7
8
9
10
28.33
58.14
27.37
58.04
28.03
58.91
29.09
57.55
27.7
58.44
28.07
59.05
28.6
59.08
28.64
84.57
85.75
97.99
98.49
86.92
73.29
84.01
85.19
89.86
47.3
70.04
96.44
94.98
85.83
85.48
85.3
89.76
84.13
83.41
94.77
380.6
399.2
376.1
381.9
388.5
348.1
375.3
392.2
391
394.6
234.1
236.5
228.1
245.9
252.2
251.8
232.4
227.1
238.3
233.1
28.4
57.82
27.4
57.79
28.05
58.76
29.18
58.21
28.13
57.45
27.75
58.9
28.67
59.01
28.82
84.75
85.83
98.05
98.57
87.08
73.36
84.06
85.32
89.88
47.29
70.01
96.43
94.89
83.52
85.47
85.35
89.87
84.05
83.38
94.87
379.1
395.8
375
382.2
392.5
358.1
365.9
389.5
383.2
367.6
224.7
228.7
223.2
244.6
235.1
245.3
210.4
227.1
230.6
226.8
0.2%
-0.6%
0.1%
-0.4%
0.1%
-0.3%
0.3%
1.1%
1.6%
-1.7%
-1.1%
-0.3%
0.2%
-0.1%
0.6%
0.2%
0.1%
0.1%
0.1%
0.2%
0.1%
0.1%
0.2%
0.0%
0.0%
0.0%
0.0%
-0.1%
-2.7%
0.0%
0.1%
0.1%
-0.1%
0.0%
0.1%
-0.4%
-0.9%
-0.3%
0.1%
1.0%
2.9%
-2.5%
-0.7%
-2.0%
-6.8%
-4.0%
-3.3%
-2.1%
-0.5%
-6.8%
-2.6%
-9.5%
0.0%
-3.2%
-2.7%
28.31
57.95
27.39
57.87
27.99
58.83
29.12
9999
9999
57.49
27.7
58.97
28.64
59.04
28.66
84.81
85.78
98.16
98.71
87.14
73.36
84.13
85.41
90.05
47.32
70.05
96.6
94.98
83.62
85.56
85.44
90.04
84.28
83.48
95.03
379.6
404.9
376.1
383.3
392.7
357.9
369
387.2
380.6
390.9
225.3
228.6
220.9
249.7
235
243.3
233
226.7
229.3
226.6
-0.1%
-0.3%
0.1%
-0.3%
-0.1%
-0.1%
0.1%
17274.5%
35997.5%
-1.6%
-1.3%
-0.1%
0.1%
-0.1%
0.1%
0.3%
0.0%
0.2%
0.2%
0.3%
0.1%
0.1%
0.3%
0.2%
0.0%
0.0%
0.2%
0.0%
-2.6%
0.1%
0.2%
0.3%
0.2%
0.1%
0.3%
-0.3%
1.4%
0.0%
0.4%
1.1%
2.8%
-1.7%
-1.3%
-2.7%
-0.9%
-3.8%
-3.3%
-3.2%
1.5%
-6.8%
-3.4%
0.3%
-0.2%
-3.8%
-2.8%
28.28
57.83
27.37
57.78
27.99
58.72
29.09
57.37
27.68
58.83
28.57
58.89
28.62
84.45
85.45
97.91
98.31
86.62
73.06
83.76
85.13
89.71
47.17
69.85
96.21
94.62
83.26
85.4
85.1
89.65
83.87
83.2
94.76
390.3
411
383.3
388.2
398.2
366.6
375.5
393.4
389
394.7
231.8
235
227.6
251.7
243.1
249.7
238.6
239.9
235.4
229.5
3.5%
1.7%
3.7%
1.7%
3.6%
1.7%
3.4%
n/a
n/a
1.7%
3.5%
1.7%
3.5%
1.7%
3.5%
1.2%
1.2%
1.0%
1.0%
1.1%
1.4%
1.2%
1.2%
1.1%
2.1%
1.4%
1.0%
1.0%
1.1%
1.2%
1.2%
1.1%
1.2%
1.2%
1.1%
0.3%
0.3%
0.3%
0.3%
0.3%
0.3%
0.3%
0.3%
0.3%
0.3%
0.4%
0.4%
0.4%
0.4%
0.4%
0.4%
0.4%
0.5%
0.4%
0.4%
28.32
57.89
27.45
57.88
28.06
58.84
29.13
57.51
27.73
58.97
28.65
59
28.61
84.83
85.89
98.46
98.84
87.12
73.35
84.11
85.41
90.03
47.26
70
96.62
95.13
83.62
85.66
85.51
89.98
84.28
83.53
85.26
388.1
396.4
379.3
9999
395.2
371.3
375.8
388.9
388.1
387.1
231.2
233.7
226.1
249.7
241.6
247.5
233.9
244.7
233.1
227.5
0.0%
-0.4%
0.3%
-0.3%
0.1%
-0.1%
0.1%
n/a
n/a
-1.6%
-1.2%
-0.1%
0.2%
-0.1%
-0.1%
0.3%
0.2%
0.5%
0.4%
0.2%
0.1%
0.1%
0.3%
0.2%
-0.1%
-0.1%
0.2%
0.2%
-2.6%
0.2%
0.2%
0.2%
0.2%
0.1%
-10.0%
2.0%
-0.7%
0.9%
2518.2%
1.7%
6.7%
0.1%
-0.8%
-0.7%
-1.9%
-1.2%
-1.2%
-0.9%
1.5%
-4.2%
-1.7%
0.6%
7.7%
-2.2%
-2.4%
INTERPRETATION OF DATA
7.1
The DX-0875 indicated failure after being subjected to the 6G Random Vibration (15
minutes in each of 3 axes):
With the cap cut open on this unit, the photo below shows that the ST60 die membrane
fracture/crack.
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc
7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
Dexter Research Centers’ two highest volume ST60 configurations (TO18 & TO5 Quad)
had thirty two broken membranes from over 317,975 dies shipped in 2009 and 2010, this
represents 0.01% field loss for this failure mode. These two models were summarized
because of the high volume and customer’s willingness to return failed units for
evaluation
7.2
The DX-0017 unit that indicated failure after the 30G Random Vibration (3hrs each axis)
With the cap cut open on this unit, the photo below shows that the 1M substrate had
cracked, flexing the thin-film pattern creating an open circuit. As an observation;
inspection before the substrate piece was broken out during handling for the photo,
revealed that the substrate was unsecured from the support post (seen here with gray
epoxy on it). It is unclear whether the crack allowed it to become unsecure, or whether it
became unsecured allowing the stresses to crack the substrate.
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc
7300 Huron River Drive ▪ Dexter, MI 48130 U.S.A.
Tel: 734-426-3921 ▪ Fax: 734-426-5090 ▪ www.DexterResearch.com
8.0
CONCLUSION
Test results support that our present silicon based volume thermopile detector dies, and
the assembly techniques used in these configurations, are capable of withstanding MILSTD-883H Physical Shock of 1,000G/0.5 ms pulses, 10x each axis, and Random Vibration
of 30Grms/3hrs each axis as determined by the series of tests performed, and
understanding of the known field failure mode and rate of the ST60 membrane fracture
Further, with respect to the military application inquiry regarding comparison to the 1M model;
these same silicon based thermopiles and their assembly techniques are comparable in durability
under these test conditions to the present 1M model
C:\Users\Owner\Documents\Gessert Inc\Client Folders\Dexter research\2010 Project\SALES DATA\SummaryofMIL-STD883HShockandVibrationTestingofSiliconBasedThermopiles.doc