PolyZen Devices

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PolyZen Devices
PolyZen Devices
Polymer Protected Zener Diode
PolyZen devices are polymer enhanced precision Zener
diode micro-assemblies that help protect sensitive
electronics from damage caused by inductive voltage
spikes, voltage transients, use of incorrect power supplies
and reverse bias.
The PolyZen micro-assembly incorporates a stable
Zener diode for precise voltage clamping and a
resistively non-linear, polymeric positive temperature
coefficient (PPTC) layer that responds to either diode
heating or overcurrent events by transitioning from a
low to high resistance state.
4
PolyZen devices help provide resettable protection
against damage caused by multi-watt fault events and
require only 0.7W power dissipation. In the event of
sustained high power conditions, the PPTC element of
the device “trips” to limit current and generate voltage
drop. This functionality helps protect both the Zener
and the follow-on electronics, effectively increasing the
diode’s power handling capacity.
Benefits
Features
• Helps shield downstream electronics from overvoltage
and reverse bias
• RoHS compliant
• Trip events shut out overvoltage and reverse bias
sources
• Hold currents up to 2.3A
• Analog nature of trip events minimize upstream
inductive spikes
• Time delayed, reverse bias trip
• Helps reduce design costs with single component
placement and minimal heat sinking requirements
• Integrated device construction
• Overvoltage transient suppression
• Time delayed, overvoltage trip
• Power handling on the order of 30 watts
Applications
• Portable media players
• Cellphone charger port and USB power
• Global positioning systems
• Automotive peripheral input power
• Hard disk drives 5V & 12V bus
• DC power port protection
• Solid State Drives (SSD) 5V bus
• Industrial handheld POS
27
Figure PZ1 Typical Application Block Diagram for PolyZen Devices
Power Supply
Protected Electronics
(External or internal)
2
VIN
1
+
PolyZen
Device
3
GND
VOUT
RLOAD
Regulated
Output
Protected downstream
electronics
Table PZ1 Electrical Characteristics for PolyZen Devices
4
(Performance ratings @ 25°C unless otherwise specified)
VZ(V)
NEW
VINT MAX
IHOLD
@ 20°C
(A)
RTyp
(Ω)
R1MAX
(Ω)
IFLT MAX
Test
Current
(A)
IFLT MAX
(A)
Test
Voltage
(V)
Part Number
Min.
Typ.
Max.
IZt
(A)
ZEN056V130A24LS
5.45
5.6
5.75
0.1
1.3
0.12
0.16
24V
3A
+10/-40
+24/-16V
ZEN065V130A24LS
6.35
6.5
6.65
0.1
1.3
0.12
0.16
24V
3A
+6/-40
+24/-16V
+24/-16V
VINT MAX
(V)
ZEN098V130A24LS
9.60
9.8
10.00
0.1
1.3
0.12
0.16
24V
3A
+3.5/-40
ZEN132V130A24LS
13.20
13.4
13.60
0.1
1.3
0.12
0.16
24V
3A
+2/-40
+24/-16V
ZEN164V130A24LS
16.10
16.4
16.60
0.1
1.3
0.12
0.16
24V
3A
+1.25/-40
+24/-16V
ZEN056V230A16LS
5.45
5.6
5.75
0.1
2.3
0.04
0.06
16V
5A
+5/-40
+16/-12V
ZEN065V230A16LS
6.35
6.5
6.65
0.1
2.3
0.04
0.06
16V
5A
+3.5/-40
+16/-12V
ZEN132V230A16LS
13.20
13.4
13.60
0.1
2.3
0.04
0.06
16V
5A
+2/-40
+20/-12V
ZEN056V075A48LS
5.45
5.6
5.75
0.1
0.75
0.28
0.45
48V
3A
+10/-40
+48/-16V
ZEN132V075A48LM
13.20
13.4
13.60
0.1
0.75
0.28
0.45
48V
3A
+2/-40
+48/-16V
NEW
ZEN056V115A24LS
5.45
5.6
5.75
0.1
1.15
0.15
0.18
24V
3A
+10/-40
+24/-16V
NEW
ZEN056V130A24GS
5.45
5.6
5.75
0.1
1.30
0.12
0.18
24V
3A
+6/-40
+24/-16V
Coming*
Soon
ZEN059V130A24LS†
5.80
5.9
6.00
0.1
1.30
0.12
0.16
24V
3A
+6/-40
+24/-16V
* Data is preliminary
† Maximum Reverse Leakage Current = 650µA@5.0V meets USB suspend mode specification
Table PZ2 Definitions of Terms for PolyZen Devices
VZ
Zener clamping voltage measured at current IZt and 20°C.
IZt
Test current at which VZ is measured.
IHOLD
Maximum steady state current IPTC that will not generate a trip event at the specified temperature.
Ratings assume IFLT = 0A.
RTyp
Typical resistance between VIN and VOUT pins when the device is at room temperature.
R1MAX
The maximum resistance between VIN and VOUT pins, at room temperature, one hour after first trip
or after reflow soldering.
IFLT
Current flowing through the Zener diode.
IFLT MAX
Maximum RMS fault current the Zener diode component of the device can withstand and remain
resettable; testing is conducted at rated voltage with no load connected to VOUT.
VINT MAX
The voltage (VIN - VOUT “post trip”) at which typical qualification devices (98% devices, 95%
confidence) survived at least 100 trip cycles and 24 hours trip endurance when “tripped” at the
specified voltage and current (IPTC).
Trip Event
28
A condition where the PPTC transitions to a high resistance state, thereby limiting IPTC, and
significantly increasing the voltage drop between VIN and VOUT.
RoHS Compliant, ELV Compliant
Polymer PTC
VIN
VOUT
Zener
Diode
GND
IPTC
IOUT
VIN
VOUT
IFLT
GND
PolyZen Devices
Figure PZ2-PZ9 Typical Performance Curves for PolyZen Devices
Figure PZ2
Figure PZ3
VOUT Peak vs IFLT RMS (IOUT = 0)
Time-to-Trip vs IFLT RMS (IOUT = 0)
22.0
10
20.0
E
18.0
A = ZEN056V1yyA24LS/GS
B = ZEN065V130A24LS
B = ZEN065V130A24LS
C = ZEN098V130A24LS
D
C = ZEN098V130A24LS
Time-to-Trip (Sec)
16.0
VOUT Peak (V)
A = ZEN056V1yyA24LS/GS
D = ZEN132V130A24LS
14.0
E = ZEN164V130A24LS
12.0
C
10.0
8.0
B
A
6.0
D = ZEN132V130A24LS
1
E = ZEN164V130A24LS
E
0.1
D
B
C
A
4.0
2.0
0
0.01
0
1
2
3
4
5
6
7
8
9
10
0
1
2
3
4
IFLT RMS (A)
Figure PZ4
6
7
8
9
10
Figure PZ5
VOUT Peak vs IFLT RMS (IOUT = 0)
4
Time-to-Trip vs IFLT RMS (IOUT = 0)
22.0
100
A = ZEN056V230A16LS
20.0
A = ZEN056V230A16LS
B = ZEN065V230A16LS
18.0
B = ZEN065V230A16LS
C = ZEN132V230A16LS
Time-to-Trip (Sec)
C
16.0
VOUT Peak (V)
5
IFLT RMS (A)
14.0
12.0
10.0
8.0
B
A
6.0
C = ZEN132V230A16LS
10
1
0.1
B
C
A
4.0
2.0
0.01
0
0
1
2
3
4
5
6
7
8
9
10
0
1
2
3
4
IFLT RMS (A)
Figure PZ6
6
8
9
10
Time-to-Trip vs IFLT RMS (IOUT = 0)
0.0
100
A = ZENxxxV1yyA24LS/GS
A = ZENxxxV1yyA24LS/GS
B = ZENxxxV230A16LS
-0.2
B = ZENxxxV230A16LS
10
Time-to-Trip (Sec)
C = ZENxxxV075A48LS/M
-0.4
-0.6
-0.8
C = ZENxxxV075A48LS/M
1
0.1
B
0.01
-1.0
A
B
-1.2
-50
C
-40
-30
A
C
0.001
-20
-10
0
-50
-40
-30
IFLT RMS (A)
-20
-10
0
IFLT RMS (A)
Figure PZ8
Figure PZ9
Temperature Effect on IHOLD (IFLT = 0)
Time-to-Trip vs IPTC RMS (IFLT = 0)
10
3.5
A = ZENxxxV130A24LS/GS
3.0
A = ZENxxxV1yyA24LS/GS
B = ZENxxxV230A16LS
B
B = ZENxxxV230A16LS
2.5
Time-to-Trip (Sec)
C = ZENxxxV075A48LS/M
IHOLD (A)
7
Figure PZ7
VOUT Peak vs IFLT RMS (IOUT = 0)
VOUT Peak (V)
5
IFLT RMS (A)
D = ZENxxxV115A24LS
2.0
A
1.5
D
1.0
C
C = ZENxxxV075A48LS/M
1
0.1
0.01
B
0.5
C
A
0.001
0.0
-40
-20
0
20
40
Ambient Temperature (˚C)
RoHS Compliant
60
80
100
0
5
10
15
20
25
30
35
40
45
IPTC RMS (A)
29
Table PZ3 General Characteristics for PolyZen Devices
Operating temperature range
Storage temperature
ESD withstand
Diode capacitance
Construction
-40° to +85°C
-40° to +85°C
15kV
4200pF
RoHS compliant
Human body model
Typical @ 1MHz, 1V RMS
Figure PZ10-PZ22 Basic Operation Examples for PolyZen Devices
Figure PZ10
Hot-Plug Response
ZEN056V130A24LS vs a 22V/120W Universal Power Supply
350
35
C
Capacitive
Current Spike
Voltage (V) and Current (A)
Current Pulled to
GND via diode
25
B = VOUT
Supply Voltage
returns to normal
Supply Voltage
dropped by current
300
C = CURRENT (IFLT)
D = POWER
250
A
Power (Watts)
30
4
A = VIN
200
20
D
15
PPTC switches to
high resistance
10
150
Output Voltage
remains clamped
100
A
B
B
5
50
D
VOUT Peak
C
0
0
0.01
0.02
0
0.03
0.04
0.05
0.06
0.07
0.08
Time (Sec)
Figure PZ11
Figure PZ12
Typical Fault Response: ZEN056V115A24LS
20V, 3.5A Current Limited Source (IOUT=0)
20
18
B = VOUT (V)
16
Voltage (V) or Current (A)
Voltage (V) or Current (A)
20
A
A = VIN (V)
18
Typical Fault Response: ZEN056V130A24LS
24V, 3.5A Current Limited Source (IOUT=0)
C = IFLT (A)
14
12
10
8
B
6
4
2
16
A
A = VIN (V)
B = VOUT (V)
C = IFLT (A)
14
12
10
8
B
6
4
2
C
0
-0.02
0.02
0.06
0.10
0.14
C
0
-0.02
0.18
0.02
0.06
Time (s)
0.18
Figure PZ14
Typical Fault Response: ZEN065V130A24LS
24V, 5.0A Current Limited Source (IOUT=0)
Typical Fault Response: ZEN098V130A24LS
24V, 3.5A Current Limited Source (IOUT=0)
26
24
24
A = VIN (V)
22
B = VOUT (V)
20
C = IFLT (A)
A
Voltage (V) or Current (A)
Voltage (V) or Current (A)
0.14
Time (s)
Figure PZ13
18
16
14
12
10
B
8
6
22
A = VIN (V)
20
B = VOUT (V)
18
C = IFLT (A)
A
16
14
B
12
10
8
6
4
4
2
2
C
0
0
0.01
0.02
0.03
0.04
0.05
Time (s)
30
0.10
RoHS Compliant, ELV Compliant
0.06
0.07
0.08
0.09
0.10
0
0.00
C
0.05
0.10
Time (s)
0.15
Figure PZ15
Typical Fault Response: ZEN164V130A24LS
24V, 1.0A Current Limited Source (IOUT=0)
30
30
A = VIN (V)
B = VOUT (V)
25
Voltage (V) or Current (A)
A = VIN (V)
Voltage (V) or Current (A)
Cont’d
Figure PZ16
Typical Fault Response: ZEN132V130A24LS
24V, 2.0A Current Limited Source (IOUT=0)
A
C = IFLT (A)
20
B
15
10
5
B = VOUT (V)
25
A
C = IFLT (A)
20
B
15
10
5
C
C
0
0.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
0.40
0.45
0
0.00
0.50
0.10
0.20
Time (s)
0.40
0.50
Figure PZ18
Typical Fault Response: ZEN056V230A16LS
16V, 5.0A Current Limited Source (IOUT=0)
4
Typical Fault Response: ZEN065V230A16LS
16V, 3.5A Current Limited Source (IOUT=0)
20
20
A = VIN (V)
A = VIN (V)
Voltage (V) or Current (A)
Voltage (V) or Current (A)
0.30
Time (s)
Figure PZ17
A
B = VOUT (V)
C = IFLT (A)
15
10
B
5
B = VOUT (V)
A
C = IFLT (A)
15
10
B
5
C
0
0.00
0.10
0.20
C
0
0.00
0.30
0.10
0.20
Time (s)
0.30
Time (s)
Figure PZ19
Figure PZ20
Typical Fault Response: ZEN056V075A48LS
48V, 10.0A Current Limited Source (IOUT=0)
Typical Fault Response: ZEN132V230A16LS
20V, 2.0A Current Limited Source (IOUT=0)
50
22
A
A = VIN (V)
20
A = VIN (V)
B = VOUT (V)
18
Voltage (V) or Current (A)
Voltage (V) or Current (A)
PolyZen Devices
Figure PZ16-PZ22 Basic Operation Examples for PolyZen Devices
C = IFLT (A)
16
B
14
12
10
8
6
4
A
B = VOUT (V)
40
C = IFLT (A)
30
20
10
B
2
C
0
0
0.05
0.10
0.15
0.20
0.25
C
0
0.00
0.30
0.01
0.02
Figure PZ21
Figure PZ22
Typical Fault Response: ZEN132V075A48LM
48V, 2.0A Current Limited Source (IOUT=0)
Typical Fault Response: ZEN056V130A24GS
24V, 1.0A Current Limited Source (IOUT=0)
24
50
Voltage (V) or Current (A)
Voltage (V) or Current (A)
A
A = VIN (V)
45
B = VOUT (V)
40
0.04
Time (s)
Time (s)
C = IFLT (A)
35
30
25
20
B
15
10
A
22
A = VIN (V)
20
B = VOUT (V)
18
C = IFLT (A)
16
14
12
10
8
B
6
4
5
0
0.03
2
C
0
0.02
0.04
0.06
0.08
0.10
Time (s)
RoHS Compliant
0.12
0.14
0.16
C
0
0.18
0.20
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
Time (s)
31
Table PZ4 Packaging and Marking Information for PolyZen Devices
Part Number
Bag Quantity
Tape & Reel Quantity
Standard Package
ZENxxxVyyyAzzLS/M
-
3,000
15,000
ZENxxxVyyyAzzGS
-
4,000
20,000
Table PZ5 Dimensions for PolyZen Devices
ZENxxxVyyyAzzLS/M Devices
A
mm
inch
B
C
Min.
Max.
Min.
Max.
Min.
3.85
4.15
3.85
4.15
1.4
2.0
(0.055)
(0.081)
(0.152) (0.163)
(0.152) (0.163)
Max.
C
A
4
B
ZENxxxVyyyAzzGS Devices
L
mm
inch
W
Min.
Max.
3.85
4.15
(0.152) (0.163)
H
Min.
Max.
3.85
4.15
(0.152) (0.163)
Min.
W
Max.
1.16
1.25
(0.046)
(0.049)
L
H
Table PZ6 Pad Layout and Configuration Information for PolyZen Devices
Pin Number
Pin Name
1
VIN
Pin Function
2
GND
GND = Ground
3
VOUT
VOUT = Zener regulated voltage output
VIN
= Protected input to Zener diode
Pin Configuration
(Top View)
Pad Dimensions
0.94mm
(0.037”)
2 GND
0.33mm
(0.013”)
2.21mm
(0.087”)
VIN 1
0.94mm
(0.037”)
3 VOUT
0.56mm
(0.022”)
32
RoHS Compliant, ELV Compliant
2.88mm
(0.1135”)
0.56mm
(0.022”)
PolyZen Devices
Solder Reflow and Rework Recommendation for PolyZen Devices
Classification Reflow Profiles
Profile Feature
Average ramp up rate (TsMAX to Tp)
Preheat
• Temperature min. (TsMIN)
• Temperature max. (TsMAX)
• Time (tsMIN to tsMAX)
Time maintained above:
• Temperature (TL)
• Time (tL)
Peak/Classification temperature (Tp)
Time within 5°C of actual peak temperature
Time (tp)
Ramp down rate
Time 25°C to peak temperature
Pb-Free Assembly
3°C/second max.
150°C
200°C
60-180 seconds
217°C
60-150 seconds
260°C
20-40 seconds
6°C/second max.
8 minutes max.
4
Note: All temperatures refer to topside of the package, measured on the package body surface.
Figure PZ23
tp
Critical Zone
TL to Tp
Tp
Ramp up
Temperature
TL
tL
TsMAX
TsMIN
ts
Preheat
25
Ramp down
t 25˚C to Peak
Time
Reflow Profile
Tape and Reel Specifications for PolyZen Devices (in Millimeters)
Figure PZ24 EIA Referenced Taped Component Dimensions for PolyZen Devices (in Millimeters)
Description
ZENxxxVyyyAzzLS/M Devices
ZENxxxVyyyAzzGS Devices
A0
4.35
4.35
B0
4.35
4.35
K0
2.30
1.80
8.00
ø1.5 + 0.1 / -0.0
4.00Note 1
ø1.50 Min
0.35 ± 0.05
0.25 R
2.00 ± 0.05Note 3
A
1.75 ± 0.10
R 0.3 Max
5.50 ± 0.05Note 3
B0
12.0 ± 0.3
K0
A0
0.25
A
Notes:
1. 10 sprocket hole pitch cumulative tolerance ±0.2
2. Camber in compliance with EIA 481
3. Pocket position relative to sprocket hole measured as true position of pocket, not pocket hole
RoHS Compliant
33
Figure PZ25 Reel Dimensions for PolyZen Devices (in Millimeters)
Matte Fi nish These Area
Description
Dimension (mm)
AMax
330
NMin
102
W1
8.4
W2
11.1
Lock Feature (6 places)
NMin
ø20.0 Min
AMax
+0.25
330.0 –4.00
+0.5
ø13.0 –0.2
102.0 Ref
2.0 +/– 0.5
Detail A
See “Detail A”
W1 (measured at hub)
W2 (measured at hub)
Part Numbering System for PolyZen Devices
4
ZEN 056V 130A
24
LS/M & GS
Special Labeling
LS or M = Module Height of 2.0mm
GS = Module Height of 1.25mm
VINT Max Rating (24 = 24V)
PPTC Hold Current Group (130 = 1.3A)
Zener Voltage Group (056 = 5.6V)
PolyZen Series
Part Marking System for PolyZen Devices
ZENxxxVyyyAzzLS/M Devices
t056
12345
Zener Diode Voltage Rating
056 = 5.6V
059 = 5.9V
065 = 6.5V
098 = 9.8V
132 = 13.4V
164 = 16.4V
ZENxxxVyyyAzzGS Devices
Zener Diode Voltage Rating
056 = 5.6V
t056
1234567
Batch Number
Batch Number
Warning :
All information, including illustrations, is believed to be accurate and reliable. Users, however, should independently evaluate the suitability of and
test each product selected for their application. Tyco Electronics Corporation makes no warranties as to the accuracy or completeness of the
information, and disclaims any liability regarding its use. Tyco Electronics’ only obligations are those in the Tyco Electronics’ Standard Terms and
Conditions of Sale for this product, and in no case will Tyco Electronics be liable for any incidental, indirect, or consequential damages arising from
the sale, resale, use, or misuse of the product. Specifications are subject to change without notice. In addition, Tyco Electronics reserves the right
to make changes to materials or processing that do not affect compliance with any applicable specification without notification to Buyer.
34
RoHS Compliant, ELV Compliant
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