FYS3410 Condensed matter physics Lecture 18: Intrinsic semiconductors Randi Haakenaasen randi.haakenaasen@ffi.no, 63 80 73 09 UniK/UiO Forsvarets forskningsinstitutt 12.03.2014 Outline • Repetition: energy band structure and filling of bands • Intrinsic semiconductors • The Fermi level • Carrier concentrations at equilibrium • Semiconductor growth and characterization: HgCdTe at FFI – FTIR – measurements of band gap – Quantum well photoluminescence Remember this… • Pauli exclusion principle: no two electrons in an interacting system can be in the same state • For a crystal with N atoms, each overlapping electron level will split into N levels which can accomodate 2N electrons • Material with odd number of valence electrons per unit cell -> metal • Even number of valence electrons per unit cell – semiconductor or insulator if filled shell, metal or semi-metal if overlapping bands • In a crystal we can decribe the motion of electrons as if they were free electrons but with an effective mass m* which includes the effect of the crystal on the electron π ∗= π2 πΈ(π) 2 β ππ 2 −1 Filling of bands • The periodicity of the crystal potential introduces band gaps in the free electron bands at the BZ boundaries • DOS x FD distribution gives density of occupied states • Highest occupied band is – – – partially filled at 0 K –> metal completely filled at 0K –> semiconductor or insulator Can only get current if there are empty states to go to SC or insulator metal or semimetal metal Semiconductors vs insulators • Semiconductors: band gap Eg small enough to get thermally excited carriers at reasonable temperatures • Approximate: semiconductor Eg < 3eV < insulator Eg • Semiconductors extremely important: transistors, switches, diodes, solar cells, detectors, LEDs… • Electrical conductivity varies by > 16 orders of magnitude by changes in temperature, optical excitation or impurity content • Trick : vary electrical conductivity by doping extra electrons or holes • • • Group IV elemental SC: Si, Ge (diamond lattice, ie fcc lattice with a basis) Group III-V compound SC: GaAs, InSb (zincblence, fcc w basis) Group II-VI SC: HgCdTe (zincblende, fcc w basis) Intrinsic semiconductors An intrinsic semiconductor has no impurities or defects -> no carriers at 0 K Inctrinsic σ and carr. conc. largely controlled by Eg/kT At finite T, carriers are thermally excited from valence band VB to conduction band CB and create electron-hole pairs EHP. The intrinsic carrier concentrations are therefore equal: π = π = ππ In steady state EHP recombine at same rate as they are generated FD distribution of e- over of allowed energy levels at thermal equilibrium = prob that available state E is occupied at T π(πΈ) = 1 1+π (πΈ−πΈπΉ )⁄ππ π(πΈπΉ + βπΈ) = 1 − π(πΈπΉ − βπΈ) symmetric about EF at all T The Fermi level EF • At EF the prob of being occupied is ½: f ( EF ) = 1 1 + e( EF − EF ) / kT = 1 1 = 1+1 2 • From symmetry about EF and intrinsic π = π – > EF close to middle of Eg – (in middle if DOS in VB and CB are equal) • At room temp f(EC) and (1-f(EV)) are quite small: 10 −3 – In Si at 300K n = p = 1.5 ×10 cm i i 19 −3 while DOS g ( EC ), g ( EV ) ≈ 10 cm – As g ( EC ), g ( EV ) are large, small changes in f(E) can result in significant changes in n and p • At finite T, both CB and VB are partially filled and contibute to electrical conduction • In VB, electrons can hop and fill in the empty states – This can be treated as a pos.charged hole moving in the opposite direction EF in extrinsic semiconductors • In n-type material: – – n in CB > (>>) p in VB > f(E) must be above intrinsic position so that f ( EC ) > f ( EV ) – • Thus EC − EF gives a measure of n In p-type material: – p in VB > (>>) n in CB – FD must be below middle of gap so [1 − f ( E )] below EV is larger than f ( EC ) above EC – • Thus EF − EV gives a measure of p For given T, n and p can be calculated from the position of EF if DOS of CB and VB are known Holes • Electrons at the CBM are accelerated in E-field as a=(-e)E/me* , ie in the normal direction for e- in E-field • Valence band almost filled except some holes around VBM. Here a=(-e)E/(-βmh*β)=eE/βmh*β and can be interpreted as motion of positive carriers with positive mass –> holes. Assume mh* is positive and carriers in VB are holes. Carrier densities at equilibrium - qualitative • Concentration of e- in conduction band 1 ∞ π0 = οΏ½ π(πΈ)π(πΈ, π)ππ π πΈπΆ • f(E) decreases fast with energy -> Very few e- far above EC • The probability of finding a hole also decreases rapidly below EV 1 πΈπ π0 = οΏ½ π(πΈ) 1 − π(πΈ, π) ππ π −∞ • We get carrier densities as indicated in the figure • For holes, the energy increases downwards since E scale refers to electron energy Electron and hole concentrations at equilibrium Assumptions: 1 1. πΈπΆ − πΈπΉ β« ππ then π(πΈ, π) = 1+π (πΈ−πΈπΉ)⁄ππ ≅ π −(πΈ−πΈπΉ )⁄ππ in CB kT = 0.026 eV This means that most n in CB close to CBM and most p in VB close to VBM 1 − π(πΈ, π) = 1 − 1 ≅ π (πΈ−πΈπΉ )⁄ππ 2. For holes in VB 3. Near CBM and VBM bands are nearly parabolic, so we approximate bands by parabolas with (constant) effective masses ππ ∗ and πβ ∗ given by the curvature of the band π0 = = 1+π (πΈ−πΈπΉ )⁄ππ 1 ∞ π 2ππ ∗ 3⁄2 1⁄2 −(πΈ−πΈ )⁄ππ πΉ πΈ π ππ ∫ β2 π 0 2π2 2ππ ∗ 3⁄2 πΈ ⁄ππ ∞ 1⁄2 −πΈ ⁄ππ π πΉ ππ ∫0 πΈ π 2π2 β3 =2 =2 2πππ ∗ ππ 3⁄2 πΈ ⁄ππ π πΉ β2 2πππ ∗ ππ 3⁄2 −(πΈ −πΈ )⁄ππ π πΆ πΉ β2 = ππππ πΆ π −(πΈπΆ −πΈπΉ )⁄ππ ∞ ∫0 π₯ 1⁄2 π −ππ ππ = 2π refer to bottom of CB as Ec instead of 0 πΆ where ππππ = 2 2πππ ∗ ππ 3⁄2 β2 π π Valid for material in thermal equilibrium, both intrinsic or doped: π0 = ππππ πΆ π −(πΈπΆ −πΈπΉ )⁄ππ where ππππ πΆ = 2 π0 = ππππ π π −(πΈπΉ −πΈπ )⁄ππ where 3⁄2 2πππ ∗ ππ β2 ππππ π = 2 2ππβ ∗ ππ 3⁄2 β2 So integration over distributed electron states in CB can be represented by an effective DOS NeffC at EC The concentration of holes in the VB can in a similar manner be represented by an effective hole DOS at EV The product of π0 and π0 is constant at a given temperature, independent of EF (and thereby independent of doping) – law of mass action π0 π0 = (ππππ πΆ π −(πΈπΆ −πΈπΉ )⁄ππ )(ππππ π π −(πΈπΉ −πΈπ )⁄ππ )= ππππ πΆ ππππ π π −(πΈπΆ −πΈπ )⁄ππ = ππππ πΆ ππππ π π −πΈπ ⁄ππ = π0 π0 For intrinsic material we get: ππ = ππ = ππππ πΆ ππππ π π −πΈπ⁄2ππ While for doped materials π0 π0 = ππ 2 π0 = ππ π −(πΈπΉ −πΈπ )⁄ππ π0 = ππ π −(πΈπ −πΈπΉ )⁄ππ • For intrinsic material we also get • If effective masses for electrons and holes are πΈπ 3 πβ ∗ πΈπΉ = + ππ ln 2 4 ππ ∗ equal, EF is in the middle of the gap – If not, then it changes with temperature • For example: light electrons, heavy holes - • many more holes than electrons generated as temperature increases, unless EF moves up with temperature Heavy holes: bands formed from wavefunctions with little overlap (inner or core e-) such as 4f e- in rare earth metals – Slow tunneling from one ion to the next is reflected in heavy mass Simplified view of band edge structure of a direct band gap SC Temperature dependence of ni • • • • • ππ π = 2 2πππ β2 3⁄2 ππ ∗ πβ ∗ Temperature dependence in exponential, but also in T3/2 from DOS and in EF (or Eg) Usually ni is known for given material Plot (neglect T dependence of ni and Eg) ni strongly temp dep and much smaller than those of metals Eg • • • • 3⁄4 π −πΈπ ⁄2ππ GaAs Si Ge HgCdTe 1.43 eV 1.11eV 0.67 eV 0 – 1.6 eV Measurements of Eg, ππ ∗ and πβ ∗ • • • Need Eg, ππ ∗ and πβ ∗ to calculate carrier concentrations Get Eg from absorption experiments Get effective masses from cyclotron resonance experiments • • In a magnetic field B, electrons move in spirals around the field with Wc=Be/me* Strong absorption of radio frequency radiation when wr=wc FTIR cut-on and detector cut-off λ 8 7 Apparent Q.E. 6 5 4 3 2 1 0 3 4 5 Wavelength [µm] • • Fourier Transform Infrared spectroscopy or optical absorption experiments – Send spectrum of IR radiation onto sample, measure transmission spectrum – Photons with energy hν = hc /λ > Eg can create an EHP and are then absorbed – Photons with energy hν = hc /λ > Eg can not create an EHP and are transmitted – Band gap where transmission increases steeply – Oscillations on transmitted spectrum are interference fringes due to film thickness Detector cut-off λ : below cut-off spectral response QE positive verdier – Industri standard: der QE er 50% av maksimum Some semiconductor properties Summary • Semiconductors: 0 < Eg < 3 eV, get thermally excited carriers at resonable T • Fermi level ∼ chemical potential: f(EF)=1/2, FD symmetric about EF at all T – • Position of EF -> n and p Intrinsic semiconductors: π = π = ππ – Fermi level close to middle of gap – ππ = ππ = ππππ πΆ ππππ π π −πΈπ ⁄2ππ • For SC in thermal equilibrium and not too heavily doped: n and p can be represented by effective DOS at Ec and Ev • For doped material π0 π0 = ππ 2 • law of mass action At high enough temperature semiconductors become intrinsic