Handout #1
Prof. Papalias
Page 1 of 2
Department of Electrical Engineering
San Jose State University
EE183 – Test Development Engineering II
Instructor: Prof. Tamara A. Papalias (Dr. T)
Semester: Fall 2006
Office: E365
Office Hours: M 11:00am-1:30pm, T 11:00am – 12noon, W 10:00am-12:30pm and by appt.
Office Phone: (408) 924-3989 (only in emergency)
Email: drpapalias@yahoo.com (preferred method of communication)
Lectures & LAB
M/W 2:00pm – 4:30pm
Course Objectives
• Exposure to Industry Practices and Environment
• Best practices in Test Methods and Techniques
• Hands on exposure to ATE(Test Hardware/Software)
• Advanced Data Collection, Techniques and Analysis
• In-depth printed circuit board design (impedance matching, loading effect, cross talk…)
• Laboratory work includes ATE test development and execution for op amps, voltage references, clocks,
ADCs and digital-to-analog converters (DACs)
Prerequisite
EE124, EE189T (EE182)
Text Book
Burns and Roberts, “An Introduction to Mixed-Signal IC Test and Measurement” Oxford University Press.
ISBN 0-19-514016-8
Course Grade
The course grade is determined from the following percentages:
ATE Work/Write-ups
Quizzes
Final Exam/Project
50%
15%
35%
Exams
There will be quizzes plus the Final Exam. The Final Exam is comprehensive.
No make-up quizzes or exams will be allowed.
Handout #1
Prof. Papalias
Page 2 of 2
Course Outline
Lecture
Topics
1
Introduction & Review of ATE Intern Work
Test Plan
2
Economics II (repeatability/correlation/debugging/time to market)
Lab Work – Digital Part
3
Program Development & Test Flow
4
Advanced Test Board Design Concepts
5
Interfacing to Testers for High Volume (handlers, probers, multi-site)
6
Introduction to ATE Hardware
Lab Work – Free-Running Oscillator
7
Introduction to ATE Test Environment
8
Data Analysis I
9
Data Analysis II
10
Op Amp Measurements on ATE
Lab Work – Op Amp Measurements
11
Data Analysis – Industry Example (Berkeley Consulting Services)
12
System Debugging Skills
13
Clean-up/Review
14
Midterm Exam
15
DAC Testing on ATE
Lab Work – DAC Testing
16
Generating Data Sets on ATE
17
DSP Testing on ATE
18
Sourcing AC waveforms on ATE
19
ADC Testing on ATE
Lab Work – ADC Testing
20
Digitizing AC waveforms on ATE
21
ATE Hardware, High-Speed Transmission and Capture
22
ATE Hardware for Analog Waveform Generation and Capture
23
Mixed-Signal Tester Architecture
Lab Work – Final Project
Thanksgiving Break
24
Introduction to RF Layout and Measurement
25
ATE Ranges and Limitation
26
Benchtop Tester by National Instruments
27
Completion and Sign-off of Test Programs and Transfer to Production
FINAL EXAM