Introduction Electronic Instrumentation Electronic Instrumentation Chapter 1 Introduction Pablo Acedo / Jose A. García Souto 1 Introduction Electronic Instrumentation Chapter 1. Introduction • Basic Architecture for an Electronic/Optoelectronic Instrumentation Measurement System. Definitions. • Sensors and Categories of Sensor by Input Mechanisms • Characterization of Sensors and Measurement Systems • Calibration Curve/Transfer Function • Static Characteristics • Dynamic Characteristics • Errors in Measurements • Summary Pablo Acedo / Jose A. García Souto 2 Introduction Electronic Instrumentation Basic Architecture for an Electronic Instrumentation Measurement System q: Sensor/transducer output (electrical magnitude) Vo: Output voltage of the Signal conditioning circuit q Vo m p1 p2 Sensor/ Transducer Analog Signal Conditioning ADC p3 Storage m: Magnitude to be measured Transmission p1, p2,… : Influence magnitudes/variables Display Pablo Acedo / Jose A. García Souto Digital Signal Conditioning: FPGA, µC, µP, DSP 3 Introduction Electronic Instrumentation Basic Architecture for an Opto-Electronic Instrumentation Measurement System Light Input Light Output m p1 p2 q Detection Analog Signal Conditioning Vo p3 • • • • Light Input from a Semiconductor laser diode or LED (sometimes not necessary). “Optical Signal conditioning” sometimes present (eg. Interferometer). Output from detector can be either a current (photodiode) an impedance change (photoconductor) or a voltage (photovoltaic sensor). The information from the interest magnitude can be either in the amplitude, phase, polarization or wavelength of the light. Pablo Acedo / Jose A. García Souto 4 Introduction Electronic Instrumentation Sensors A sensor is a device that receives a stimulus and responds with an electrical signal • There is always a form of energy conversion associated to the transduction process. • A sensor can be a simple sensor or can be a complex system. • Sensors can be classified in many ways depending on the criteria chosen: • Field of applications • Conversion Phenomena • Specification • Other Pablo Acedo / Jose A. García Souto 5 Introduction Electronic Instrumentation Categories of Sensor Input Mechanisms • Resistive Sensors • Variable Inductance/Magnetic Coupling Sensors • Capacitive Sensors • Voltage Generating Sensors • Current Generating Sensors/optical Sensors Passive Sensors Active Sensors • Other Sensors Pablo Acedo / Jose A. García Souto 6 Introduction Electronic Instrumentation Characterization of Sensors and Measurement Systems • Transfer Function: • Calibration Curve (static): Pablo Acedo / Jose A. García Souto 7 Introduction Electronic Instrumentation Output (q) Calibration Curve 9 8 7 • Input Range Output Range 6 • Output Range 5 • Span 4 • Full Scale Input 3 2 • Full-Scale Output 1 0 0 2 4 6 Input Range 8 10 Magnitude (m) Pablo Acedo / Jose A. García Souto 8 Introduction Electronic Instrumentation Calibration Curve: Example RT/R0 4 3,5 Pt100 Cu100 3 Ni120 2,5 2 1,5 1 0,5 -200 -100 0 100 200 Pablo Acedo / Jose A. García Souto 300 400 T, ºC 9 Introduction Electronic Instrumentation Output (q) Sensitivity 9 • Definition: 8 7 6 5 4 • Local Value 3 • UNITS!! • Slope of the transfer function (local) 2 1 0 0 2 4 6 8 10 Magnitude (m) Pablo Acedo / Jose A. García Souto 10 Introduction Electronic Instrumentation Output (q) Non-Linearity •Associated to a linear approximation of the transfer function. 9 8 Least-Squares aproximation 7 •IMPORTANT: Different linear aproximations may be used, leading to different non-linearity error values 6 5 4 3 Terminal points aproximation 2 1 0 0 2 4 6 8 •Maximum deviation from the nonlinear transfer function (usually in percent of FS value) 10 Magnitude (m) Pablo Acedo / Jose A. García Souto 11 Introduction Electronic Instrumentation Output (q) Hysteresis 9 •Deviation of the sensor’s output at specified point when it is approached from the opposite directions (usually in percent of FS value) 8 7 6 5 4 • Typical causes of Hysteresis are friction and structural changes in the materials 3 2 1 0 0 2 4 6 8 10 Magnitude (m) Pablo Acedo / Jose A. García Souto 12 Introduction Electronic Instrumentation Resolution • Resolution: The smallest increment of the input that can be sensed. 0.8 0.8 0.6 0.6 0.4 0.4 0.2 0.2 Amplitude (mV) Amplitude (mV) • Important: For sensors with a continuous response some texts talk about infinitesimal resolution. That does not mean “infinite Resolution”. 0 -0.2 0 -0.2 -0.4 -0.4 -0.6 -0.6 -0.8 -0.8 0 200 400 600 800 1000 0 200 400 600 800 1000 time (ms) time (ms) Limited by the Signal-to-Noise ratio (S/N=0dB) Pablo Acedo / Jose A. García Souto 13 Introduction Electronic Instrumentation Output (q) Resolution • In sensors with discrete response (after ADC conversion for exampled), the minimum resolution achievable is usually limited by A/D quantization error (step size). 1000 0110 0100 10 00 0 2 4 6 8 Input (m) Pablo Acedo / Jose A. García Souto • NOTE: that only will be true if the resolution asociated to the SN ratio at the ADC input is lower than the ADC’s resolution. 14 Introduction Electronic Instrumentation Output (q) Precision/Accuracy 9 8 • Precision: consistency of the measurement. It is associated to the capacity of the sensor to give the same output (measurement) under the same input (Stimulus). 7 6 5 4 • In modern sensors uncertainty is preferred asociated to the Limiting error of the measurement (to be discussed later) 3 2 1 0 0 2 4 6 8 10 Magnitude (m) Pablo Acedo / Jose A. García Souto 15 Introduction Electronic Instrumentation Sample Count Precision 80 70 • Precision of the nth measurement 60 50 • Where: 40 30 20 10 0 0.25 0.5 0.75 1 1.25 1.5 1.75 Measured Value (q) Pablo Acedo / Jose A. García Souto 16 Introduction Electronic Instrumentation NOTE • Precision: Quality of the system to give always the same output under the same stimulus (input) • Accuracy: Error between the measurement and the true value (Y): i.e. conformance between the measurement and the standard. Accurate Measurements require the use of a precision measurement system which is calibrated against a certified, accurate standard Pablo Acedo / Jose A. García Souto 17 Introduction Electronic Instrumentation Other Parameters • Stability: Quality of the system to maintain its characteristics under changes of the measurement conditions (e.g. Temperature) or aging. Usually characterized through drifts in the calibration curve (offset & sensitivity drifts). • Dead Band: Insensitivity of a sensor in a specific range of input signals. • Those related to the physical/electronic characteristics of the sensor/transducer: • Output Impedance • Excitation (Power supply) • Weigh • …… Pablo Acedo / Jose A. García Souto Example of Datasheet 18 Introduction Electronic Instrumentation Dynamic Characteristics • Dynamic Transfer Function: V (t ) = f [m(t ),...] • Transient Response: • • Previous characteristics assume a steady state. The time response shows the behavior of the sensor or the instrumentation system to the changes in the magnitude of interest by observing the signal output with time. The step response is used as a basic test and for characterizing the system. Basic parameters are: overshoot in the under-damped response, peak time, settling time that is the time to reach and thereafter remain within a prescribed percentage of the steady-state value (5%), rise time and delay. • Frequency Response: • • • Range of work frequencies, bandwidth and types of pass-band. Some cases don´t respond to a constant. Even more, narrow-band ones. Dynamic sensitivity for the amplitude. Don´t forget the phase. Pablo Acedo / Jose A. García Souto 19 Introduction Electronic Instrumentation Parameters of the time response Step response Output response Error band (±ε) tp 100% Os Value 2 • • • tr 50% • • 0% Value 1 td ts Os: overshoot ts: settling time tr: rise time t10-90 td: delay tp: peak time Magnitude of interest: analog step or discrete change Pablo Acedo / Jose A. García Souto 20 Introduction Electronic Instrumentation Frequency response F [ jω ] Dynamic sensitivity: sensitivity for each frequency input Pablo Acedo / Jose A. García Souto 21 Introduction Electronic Instrumentation Dynamic Characteristics • Step Response: • Frequency Response: F [ jω ] Pablo Acedo / Jose A. García Souto 22 Introduction Electronic Instrumentation Errors in Measurements All measuring instruments should be regarded as guilty until proven innocent (P.K. Stein) Sources/Classification of Errors • Systematic Errors • Random Errors (Noise/Interference) • Gross Errors (Northrop)/Human Errors (Stein) Pablo Acedo / Jose A. García Souto 23 Introduction Electronic Instrumentation Limiting Error (LE) Limiting Error (guarantee error) describes the outer bounds of the expected worst case error • It includes all source of errors (gross/human errors apart) • Value given by designer/manufacturers to specify the precision (accuracy) of the instrument/sensor • Related to uncertainty Pablo Acedo / Jose A. García Souto 24 Introduction Electronic Instrumentation Systematic Errors (I) • The output of a sensor or a complete measurement system (Vo) will be function of the mesurand (q) and other, indirect factors, along with the characteristics of signal conditioning. • The influence of this factors in the final output is deterministic. Sources: • Signal conditioning and its imperfections. • Influence Variables. Pablo Acedo / Jose A. García Souto 25 Introduction Electronic Instrumentation Propagation of Systematic Errors • As the influence of the different parameters is deterministic, the combined effect of errors (∆xi) using the linear error-propagation law using Taylor series and removing all second and higher-order terms. • Usually is expressed in relative error. Pablo Acedo / Jose A. García Souto 26 Introduction Electronic Instrumentation Example • Let’s calculate the LE in the calculation of the DC power in a resistor from the measurement of the current and its value: • If we use a 2% precision multimeter and the value of the resistor is known to the 1%, the LE in the DC power calculation is 5% Pablo Acedo / Jose A. García Souto 27 Introduction Electronic Instrumentation Influence Variables • The output of the sensor is related not only to the measurand value and the signal conditioning (former example), but to other environmental variables: • Temperature • Pressure • Vibration • …. • The influence is also studied using the deterministic linear error propagation law that allows also for cancelation of effects (next chapter). Pablo Acedo / Jose A. García Souto 28 Introduction Electronic Instrumentation Random Errors (I) • Associated to any measurement or electronic signal we find random, non-deterministic variations as the result of different sources: • Electronic noise (Johnson, shot,..) • Interference • It is important to note that whilst some sources may well be truly random (noise), some can be rendered as systematic (interference) if enough effort is devoted to discover and model the sources. However, usually is easier to model them directly as noise. Pablo Acedo / Jose A. García Souto 29 Introduction Electronic Instrumentation Propagation of Random Errors • In this case all the sources are independent and their influence are added to the variance of the final result. • This quantity is usually expressed in terms of signalto-noise ratio as will be discussed further . Pablo Acedo / Jose A. García Souto 30 Introduction Electronic Instrumentation Gross/Human Errors • Humans are always part of an instrument chain as designers, manufacturers or observers. • History is full of examples of errors due to wrong use of measurment units (SI vs Standard/Imperial) • Instrumentation misuse, calculation errors and other human mistakes are the main source of wrong measurements!!!! Pablo Acedo / Jose A. García Souto 31 Introduction Electronic Instrumentation Summary • The typical Architecture for an Electronic/Optoelectronic Instrumentation Measurement System has been presented, along with different sensor input mechanisms • The Characterization of Sensors and Measurement Systems has been presented through the description of the Static and Dynamic Characteristics from the Calibration Curve/Transfer Function • Errors in Measurements have been also described and classified as something inherent to every measurement. Pablo Acedo / Jose A. García Souto 32