12-Bit Parallel Digital-to-Analog Converters With

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TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

D

12-Bit Voltage Output DAC

D

Single Supply 2.7-V to 5.5-V Operation

D

Separate Analog and Digital Supplies

D ±

0.4 LSB Differential Nonlinearity (DNL),

±

1.5 LSB Integral Nonlinearity (INL)

D

Programmable Settling Time vs Power

Consumption:

1

µ s/4.2 mW in Fast Mode,

3.5

µ s/1.2 mW in Slow Mode

D

8-Bit

µ

Controller Compatible Interface (8+4

Bit)

D

Power-Down Mode (50 nW)

D

Rail-to-Rail Output Buffer

D

Synchronous or Asynchronous Update

D

Monotonic Over Temperature

description

The TLV5613 is a 12-bit voltage output digital-to-analog converter (DAC) with a 8-bit microcontroller compatible parallel interface. The

8 LSBs, the 4 MSBs and 3 control bits are written using three different addresses. Developed for a wide range of supply voltages, the TLV5613 can be operated from 2.7 V to 5.5 V.

applications

D

Digital Servo Control Loops

D

Battery Powered Test Instruments

D

Digital Offset and Gain Adjustment

D

Industrial Process Control

D

Speech Synthesis

D

Machine and Motion Control Devices

D

Mass Storage Devices

A1

A0

SPD

DV

DD

D2

D3

D4

D5

D6

D7

DW OR PW PACKAGE

(TOP VIEW)

7

8

9

10

4

5

6

1

2

3

14

13

12

11

17

16

15

20

19

18

D1

D0

CS

WE

LDAC

PWD

GND

OUT

REF

AV

DD

The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer. The buffer features a Class A

(slow mode: AB) output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed versus power dissipation. The settling time can be chosen by the control bits within the 16-bit data word.

Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in 20 pin SOIC in standard commercial and industrial temperature ranges.

TA

0

°

C to 70

°

C

– 40

°

C to 85

°

C

AVAILABLE OPTIONS

PACKAGE

SMALL OUTLINE

(DW)

TLV5613CDW

TLV5613IDW

TSSOP

(PW)

TLV5613CPW

TLV5613IPW

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

Copyright

2000, Texas Instruments Incorporated

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.

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TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

functional block diagram

REF

SPD

PWD

A(0–1)

CS

WE

2

Power-On

Reset

Interface

Control

3

3-Bit

Control

Latch

4

4-Bit

DAC MSW

Holding

Latch

4

8

8-Bit

DAC LSW

Holding

Latch

8

Powerdown and Speed

Control

2

12

12-Bit

DAC

Latch

12 x2

8

D(0–7)

LDAC

Terminal Functions

PWD

REF

SPD

GND

WE

NAME

TERMINAL

AVDD

A0

A1

CS

DVDD

D0 (LSB) – D7 (MSB)

LDAC

OUT

NO.

11

8

7

18

10

1–6, 19, 20

16

13

15

12

9

14

17 I

I

I

I

I

I

I

Analog positive power supply

Address input

Address input

Chip select. Digital input active low, used to enable/disable inputs

I

I

Digital positive power supply

Data input

Load DAC. Digital input active low, used to load DAC output

O DAC analog voltage output

Power down. Digital input active low

Analog reference voltage input

Speed select. Digital input

Ground

Write enable. Digital input active low, used to latch data

OUT

2

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TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

absolute maximum ratings over operating free-air temperature range (unless otherwise noted)

Supply voltage (DV

DD

, AV

DD

to GND)

Reference input voltage range

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Supply voltage difference, AV

DD

to DV

DD

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

– 2.8 V to 2.8 V

– 0.3 V to AV

DD

7 V

+ 0.3 V

Digital input voltage range to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Operating free-air temperature range, T

A

TLV5613I

– 0.3 V to DV

DD

+ 0.3 V

: TLV5613C 0

°

C to 70

°

C

– 40

°

C to 85

°

C

Storage temperature range, T stg

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65

°

C to 150

°

C

Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260

°

C

† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

recommended operating conditions

MIN NOM MAX

High-level digital input voltage, VIH

Low-level digital input voltage, VIL

Load resistance, RL

Load capacitance, CL

5-V Supply

3-V Supply

Supply voltage difference,

∆ VDD = AVDD – DVDD

Power on reset, POR

DVDD = 2.7 V to 5.5 V

DVDD = 2.7 V to 5.5 V

5-V Supply (see Note 1)

3-V Supply (see Note 1)

4.5

2.7

–2.8

5

3

0

5.5

3.3

2.8

0.55

2

0

2

0.8

GND 2.048

AVDD – 1.5

GND 1.024

AVDD – 1.5

2

100

70 TLV5613C

TLV5613I – 40

NOTE 1: Due to the x2 output buffer, a reference input voltage

(VDD – 0.4)/2 causes clipping of the transfer function.

85

UNIT k

Ω pF

°

C

°

C

V

V

V

V

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TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

electrical characteristics over recommended operating free-air temperature range, supply voltages, and reference voltages (unless otherwise noted)

power supply

PARAMETER TEST CONDITIONS

Fast

MIN TYP MAX UNIT

1.6

3 mA

No load,

Slow

Fast

0.5

1.4

1.3

2.7

mA mA

DAC latch = 0x800

Power down supply current See Figure 14

Slow 0.4

0.01

1.1

10 mA

µ

A

Zero scale, See Note 2

PSRR Power supply rejection ratio

Full scale, See Note 3

NOTES: 2. Power supply rejection ratio at zero scale is measured by varying AVDD and is given by:

PSRR = 20 log [(EZS(AVDDmax) – EZS(AVDDmin))/AVDDmax]

3. Power supply rejection ratio at full scale is measured by varying AVDD and is given by:

PSRR = 20 log [(EG(AVDDmax) – EG(AVDDmin))/AVDDmax] static DAC specifications

–65

–65

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

Resolution

Integral nonlinearity (INL), end point adjusted

Differential nonlinearity (DNL)

EZS Zero-scale error (offset error at zero scale)

Zero-scale-error temperature coefficient

Vref(REFIN) = 2.048 V, 1.024 V

Vref(REFIN) = 2.048 V, 1.024 V,

Vref(REFIN) = 2.048 V, 1.024 V,

See Note 4

See Note 5

12

±

1.5

±

0.4

±

3

±

4

±

1

±

20 bits

LSB

LSB

Vref(REFIN) = 2.048 V, 1.024 V, See Note 6

Vref(REFIN) = 2.048 V, 1.024 V, See Note 7 3 mV ppm/

°

C

EG Gain error Vref(REFIN) = 2.048 V, 1.024 V, See Note 8

±

0.25

±

0.5

% of FS voltage ppm/

°

C Gain error temperature coefficient Vref(REFIN) = 2.048 V, 1.024 V, See Note 9 1

NOTES: 4. The relative accuracy or integral nonlinearity (INL) sometimes referred to as linearity error, is the maximum deviation of the output from the line between zero and full scale excluding the effects of zero code and full-scale errors.

5. The differential nonlinearity (DNL) sometimes referred to as differential error, is the difference between the measured and ideal 1

LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant) as a change in the digital input code.

6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.

7. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (Tmax) – EZS (Tmin)]/Vref

×

8. Gain error is the deviation from the ideal output (Vref – 1 LSB) with an output load of 10 k

9. Gain temperature coefficient is given by: EG TC = [EG(Tmax) – EG (Tmin)]/Vref

×

106/(Tmax – Tmin).

Ω excluding the effects of the zero-error.

106/(Tmax – Tmin).

output specifications

VO

PARAMETER

Output voltage

Output load regulation accuracy

RL = 10 k

TEST CONDITIONS

VO(OUT) = 4.096 V, RL = 2 k Ω

,

MIN TYP

0

0.1

MAX UNIT

AVDD–0.4

V

0.29

% of FS voltage

IOSC(source) Output short circuit source current VO(OUT) = 0 V input all 1s

Ω input all 1s

AVDD = 5 V

AVDD = 3 V

AVDD = 5 V

AVDD = 3 V

–100

–25

–10

–10

4

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TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

electrical characteristics over recommended operating free-air temperature range, supply voltages, and reference voltages (unless otherwise noted)

reference input (REFIN)

PARAMETER

Vref Input voltage reference

Ri Input resistance

Ci Input capacitance

See Note 10

TEST CONDITIONS

Fast mode

Slow mode

Reference feed through

REF = 1 Vpp at 1 kHz + 1.024 V dc,

See Note 10

NOTES: 10. Reference feedthrough is measured at the DAC output with an input code = 0x000.

digital inputs

IIH

IIL

Ci

PARAMETER

High-level digital input current

Low-level digital input current

Input capacitance

VI = DVDD

VI = 0 V

TEST CONDITIONS

MIN TYP

0

10

5

1.6

1

MAX

AVDD– 1.5

–60

UNIT

V

M

Ω pF

MHz

MHz dB

MIN TYP MAX UNIT

–1

1

µ

A

µ

A

8 pF

operating characteristics over recommended operating free-air temperature range, supply voltages, and reference voltages (unless otherwise noted)

analog output dynamic performance

S/N

PARAMETER

Glitch energy

Signal-to-noise

TEST CONDITIONS

L

, ,

CL = 100 pF,

See Note 11

RL = 10 k Ω

,

CL = 100 pF,

RL = 10 k Ω

,

CL = 100 pF,

See Note 12

See Note 13

Code-to-code transition

Fast

Slow

Fast

Slow

Fast

Slow

MIN TYP MAX UNIT

1 3

µ s

65

3.5

0.5

1

8

1.5

1

78

7

1.5

2

µ

V/ s

µ s nV–s

S/(N+D) Signal-to-noise + distortion

THD Total harmonic distortion

RL = 10 k, CL = 100 pF

58 69

–68 –60

Spurious free dynamic range 60 72

NOTES: 11. Settling time is the time for the output signal to remain within

±

0.5 LSB of the final measured value for a digital input code change of 0x020 to 0x3FF or 0x3FF to 0x020.

12. Settling time is the time for the output signal to remain within

±

0.5 LSB of the final measured value for a digital input code change of one count. The max time applies to code changes near zero scale or full scale.

13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage.

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2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

timing requirements

digital inputs tsu(D) tsu(CS-WE) tsu(A) th(D) tsu(WE-LD) tw(WE) tw(LD)

Setup time, data ready before positive WE edge

Setup time, CS low before positive WE edge

Setup time, address bits A0, A1

Hold time, data held after positive WE edge

Setup time, positive WE edge before LDAC low

Pulse duration, WE high

Pulse duration, LDAC low

MIN NOM MAX UNIT

9 ns

13 ns

17

0 ns ns

0

25

25 ns ns

µ s

D(0–7) X

PARAMETER MEASUREMENT INFORMATION

Data X

A(0–1)

CS

X tsu(CS-WE)

Address tsu(D) tsu(A) th(D) tw(WE)

X

WE tsu(WE-LD) tw(LD)

LDAC

Figure 1. Timing Diagram

6

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D(0–7) X

A(0–1) X

CS

TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

PARAMETER MEASUREMENT INFORMATION

MSW X LSW X

0 X 1 X

WE

LDAC

D(0–7) X

Figure 2. Example of a Complete Write Cycle Using LDAC to Update the DAC

MSW X LSW X Control

A(0–1) X 0 X 1 X 3

CS

WE

LDAC

Figure 3. Example of a Complete Write Cycle Using the Control Word to Update the DAC

X

X

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TYPICAL CHARACTERISTICS

MAXIMUM OUTPUT VOLTAGE vs

LOAD

4.5

AVDD = 5 V, Vref = 2 V,

Input Code = 4095

4

MAXIMUM OUTPUT VOLTAGE vs

LOAD

3

AVDD = 3 V, Vref = 1.2 V,

Input Code = 4095

2.5

3.5

2

3

1.5

2.5

1

2

1.5

100 K 10 K 1 K

RL – Output Load –

100

Figure 4

TOTAL HARMONIC DISTORTION vs

LOAD

0

AVDD = 5 V, Vref = 2 V,

Tone @ 1 kHz

–20

10

0.5

100 K 10 K 1 K

RL – Output Load –

100

Figure 5

TOTAL HARMONIC DISTORTION vs

LOAD

0

AVDD = 3 V, Vref = 1.2 V,

Tone @ 1 kHz

–20

10

–40 –40

–60

–80

–100

100 K 10 K 1 K

RL – Output Load – Ω

100

Figure 6

10

–60

–80

–100

100 K 10 K 1 K

RL – Output Load –

100

Figure 7

10

8

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2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

TYPICAL CHARACTERISTICS

–20

–30

–40

–50

TOTAL HARMONIC DISTORTION vs

FREQUENCY

0

AVDD = 5 V

–10

–60

–70

–80

0 5 30 35 10 15 20 f – Frequency – kHz

25

Figure 8

30

20

10

0

0

80

70

60

50

40

SIGNAL-TO-NOISE + DISTORTION vs

FREQUENCY

AVDD = 5 V

5 30 35 10 15 20 f – Frequency – kHz

25

Figure 10

TOTAL HARMONIC DISTORTION vs

FREQUENCY

0

AVDD = 3 V

–10

–20

–30

–40

–50

–60

–70

0

70

60

50

40

30

20

10

0

0

5 10 15 20 f – Frequency – kHz

25

Figure 9

30 35

SIGNAL-TO-NOISE + DISTORTION vs

FREQUENCY

AVDD = 3 V

5 10 15 20 f – Frequency – kHz

25

Figure 11

30 35

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2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

TYPICAL CHARACTERISTICS

0

–0.2

–0.4

–0.6

–0.8

–1

0

1

0.8

0.6

0.4

0.2

500 1000 1500 2000

Code

2500

Figure 12. Differential Nonlinearity

3000

4

2

1.5

1

0.5

0

–0.5

–1

–1.5

–2

–4

0 500

3500

1000 1500 2000

Code

2500

Figure 13. Integral Nonlinearity

3000 3500

4000

4000

10

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TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

TYPICAL CHARACTERISTICS

POWER DOWN SUPPLY CURRENT vs

TIME

1

0.1

0.01

0.001

0.0001

0.00001

0.000001

0 100 200 300 t – Time – ms

400

Figure 14

500 600

APPLICATION INFORMATION general function

The TLV5613 is a 12-bit, single supply DAC, based on a resistor string architecture. It consists of a parallel interface, speed and power down control logic, a resistor string and a rail-to-rail output buffer. The output voltage

(full scale determined by reference) is given by:

2 REF

CODE

0x1000

[V]

Where REF is the reference voltage and CODE is the digital input value, range 0x000 to 0xFFF. A power on reset initially puts the internal latches to a defined state (all bits zero).

parallel interface

The device latches data on the positive edge of WE. It must be enabled with CS low. Whether the data is written to one of the DAC holding latches (MSW, LSW) or the control register, depends on the address bits A1 and A0.

LDAC low updates the DAC with the value in the holding latch. LDAC is an asynchronous input and can be held low, if a separate update is not necessary. Two more asynchronous inputs, SPD and PWD control the settling times and the power down mode:

SPD:

PWD:

Speed control

Power control

1

fast mode 0

slow mode

1

normal operation 0

power down

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APPLICATION INFORMATION

It is also possible to program the different modes (fast, slow, power down) and the DAC update latch using the control register. The following tables list the possible combination of the control signals and control bits.

PIN

SPD

0

0

1

1

BIT

SPD

0

1

0

1

Slow

Fast

Fast

Fast

PIN

PWD

0

0

1

1

BIT

PWD

0

1

0

1

Down

Down

Normal

Down

PIN

LDAC

0

0

1

1

BIT

RLDAC

0

1

0

1

Transparent

Transparent

Hold

Transparent

data format

The TLV5613 writes data either to one of the DAC holding latches or to the control register depending on the address bits A1 and A0.

A1

0

0

1

1

A0

0

1

0

1

ADDRESS BITS

REGISTER

DAC LSW holding

DAC MSW holding

Reserved

Control

D7 D6

X

X: Don’t care

SPD: Speed control bit

PWD: Power control bit

RLDAC: Load DAC latch

X

D5

X

1

fast mode

1

power down

1

latch transparent

D4

X

D3

X

0

slow mode

0

normal operation

0

DAC latch controlled by LDAC pin

D2

RLDAC

D1

PWD

D0

SPD

12

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APPLICATION INFORMATION layout considerations

To achieve the best performance, it is recommended to have separate power planes for GND, AV

DD

, and DV

DD

.

Figure 15 shows how to lay out the power planes for the TLV5613. As a general rule, digital and analog signals should be separated as wide as possible. To avoid crosstalk, analog and digital traces must not be routed in parallel. The two positive power planes ( AV

DD

and DV

DD

) should be connected together at one point with a ferrite bead.

A 100-nF ceramic low series inductance capacitor between DV

DD

and GND and a 1-

µ

F tantalum capacitor between AV

DD

and GND as close as possible to the supply pins are recommended for optimal performance.

DVDD AVDD

Figure 15. TLV5613 Board Layout linearity, offset, and gain error using single end supplies

When an amplifier is operated from a single supply, the voltage offset can still be either positive or negative. With a positive offset, the output voltage changes on the first code change. With a negative offset the output voltage may not change with the first code depending on the magnitude of the offset voltage.

The output amplifier attempts to drive the output to a negative voltage. However, because the most negative supply rail is ground, the output cannot drive below ground and clamps the output at 0 V.

The output voltage remains at zero until the input code value produces a sufficient positive output voltage to overcome the negative offset voltage, resulting in the transfer function shown in Figure 16.

Output

Voltage

Negative

Offset

0 V

DAC Code

Figure 16. Effect of Negative Offset (Single Supply)

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SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

APPLICATION INFORMATION

This offset error, not the linearity error, produces this breakpoint. The transfer function would have followed the dotted line if the output buffer could drive below the ground rail.

For a DAC, linearity is measured between zero input code (all inputs 0) and full scale code (all inputs 1) after offset and full scale are adjusted out or accounted for in some way. However, single supply operation does not allow for adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity is measured between full scale code and the lowest code that produces a positive output voltage.

TLV5613 interfaced to an Intel MCS

251 controller

The circuit in Figure 17 shows how to interface the TLV5613 to an Intel MCS

251 microcontroller. The address bus and the data bus of the controller are multiplexed on port 0 (non page mode) to save port pins. To separate the address bits and the data bits, the controller provides a dedicated signal, address latch enable (ALE), which is connected to a latch at port 0.

An address decoder is required to generate the chip select signal for the TLV5613. In this example, a simple

3-to-8 decoder (74AC138) is used for the interface as shown in Figure 17. The DAC is memory mapped at addresses 0x8000/1/2/3 within the data memory address space and mirrored every 32 address locations

(0x8020/1/2/3, 0x8040/1/2/3, etc.). In a typical microcontroller system, programmable logic should be used to generate the chip select signals for the entire system.

The data pins and the WE pin of the TLV5613 can be connected directly to the multiplexed address and data bus and the WR signal of the controller.

LDAC is held high so that the output voltage is updated using the RLDAC bit in the control register. Hardware power down mode is deactivated permanently by pulling PWD to DV

DD

.

8xC251

8 16

P2 A(15–8)

8 8

A(15–0)

AD(7–0)

P0 AD(7–0)

ALE

8

74AC373

D(7–0) Q(7–0)

LE OE

A2

A3

A4

DVDD

A

B

C

74AC138

Y(7–0)

A15

G1

G2A

G2B

8

CS(7–0)

2

TLV5613

D(7–0)

SPD

PWD

DVDD

CS OUT

WR WE

REF191

REF

Figure 17. TLV5613 Interfaced to an Intel MCS

251 Controller

LDAC

DVDD

RL

MCS is a registered trademark of Intel Corporation.

14

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TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

APPLICATION INFORMATION software

In the following example, the code generates a waveform at 500 KSPS with 500 samples stored in a table within the program memory space of the microcontroller. The period of the waveform is 1 ms.

The waveform data is located in the program memory space from address 01000h to address 013E8h

(2

×

500 = 1000 = 03E8h) beginning with the MSW of the first 16-bit word (the 4 MSBs are ignored), followed by the LSW. Two bytes are required for each DAC word (the table is not shown in the code example).

The program consists of two parts:

D

A main routine, which is executed after reset and which initializes the timer and the interrupt system of the microcontroller.

D

An interrupt service routine, which reads a new value from the waveform table and writes it to the DAC.

This example uses timer 0 in mode 3 (8-bit timer with auto reload). The clock of the timer is derived from the system clock and has a frequency of f osc

/12. The timer overrun frequency f tim

is given by the following equation: f tim

+ f

OSC

12(256–Reload) and the reload value is given by Reload

+

256– f

OSC

12 f tim

To get a timer overrun frequency of 500 kHz at a system clock of 24 MHz, the reload value is:

Reload + 256 –

24

12 0.5

+ 256–4 + 252 + 0FCh

With this value, the timer generates an interrupt every 2

µ s. The corresponding service routine T0_isr reads a sample from program memory and writes it to the DAC. First, it disables the update of the DAC output by clearing the RLDAC bit in the control register. Then it reads the MSW and the LSW from the waveform table and stores it in the MSW and LSW register of the TLV5613. The write cycle is completed by setting the RLDAC bit, which updates the DAC output. At the end of the interrupt service routine, the pointer to the waveform samples is increased and is checked to determine if it has reached the end of the table. If the pointer has reached the end of the table, the pointer is set to the start address of the table.

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15

TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

APPLICATION INFORMATION

;************************************************************************

;* Title : Waveform generation with TLV5613 *

;* Version: 1.0 *

;* MCU : Intel MCS

251, MCS

51 *

;*

1998 Texas Instruments Inc. *

;************************************************************************

TABLE_START EQU 01000h

TABLE_END_H EQU 013h

TABLE_END_L EQU 0E8h

RELOAD EQU 0FCh

ORG 00000h

JMP main

ORG 0000bh

JMP T0_isr

;start address of waveform data

;high byte – end address of waveform data

;low byte – end address of waveform data

;timer reload value

;entry point

;jump to main program

;timer0 (T0) interrupt vector

;jump to T0 interrupt service routine

;––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––

;main: setup timer and interrupt, loop forever

;–––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––– main: CLR A

MOV A, IE0

CLR TCON.4

MOV A, #002h

;disable all interrupts

;stop T0

MOV TMOD, A

MOV A, #RELOAD

MOV TH0, A

MOV TL0, A

MOV P2, #080h

;set T0 to auto reload mode

;set T0 reload value

;set T0 start value

;set A15 of address bus to select DAC

MOV DPTR, #TABLE_START ;set data pointer to start of wave form data

SETB IE0.1

SETB IE0.7

SETB TCON.4

idle_loop: SJMP idle_loop

;enable T0 interrupt

;enable interrupts

;start T0

;loop forever

16

POST OFFICE BOX 655303

DALLAS, TEXAS 75265

TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

APPLICATION INFORMATION

;––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––

;T0_isr: will be called on every timer interrupt.

;fetches a new 16–bit value from program memory space and writes it

;to the DAC. If end of table is reached, sets DPTR to table start addr.

;––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––

T0_isr: MOV R0, #003h

MOV A, #001h

;select DAC control register

;RLDAC=0, PWD=0, SPD=1

MOVX @R0, A

;no DAC update, normal operation, fast mode

;write Accu to DAC control register

MOV R0, #001h

CLR A

MOVC A, @A+DPTR

MOVX @R0, A

;select DAC MSW register

;get MSW from code memory

;write Accu to DAC MSW register

INC DPTR

MOV R0, #000h

CLR A

MOVC A, @A+DPTR

MOVX @R0, A

;set DPTR to LSW data

;select DAC LSW register

MOV R0, #003h

MOV A, #005h

MOVX @R0, A

;get LSW from code memory

;write Accu to DAC LSW register

;select DAC control register (to update DAC)

;DAC update, normal operation, fast mode

;write Accu to DAC control register

INC DPTR

MOV A, DPL

CJNE A, #TABLE_END_L, T0_isr_end

MOV A, DPH

;set DPTR to next MSW

;test end of table

CJNE A, #TABLE_END_H, T0_isr_end

MOV DPTR, #TABLE_START ;end of table reached –> start again

T0_isr_end: RETI

END

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17

TLV5613

2.7 V TO 5.5 V 12-BIT PARALLEL DIGITAL-TO-ANALOG CONVERTER

WITH POWER DOWN

SLAS174B – DECEMBER 1997 – REVISED NOVEMBER 2000

APPLICATION INFORMATION definitions of specifications and terminology

integral nonlinearity (INL)

The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output from the line between zero and full scale excluding the effects of zero code and full-scale errors.

differential nonlinearity (DNL)

The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant) as a change in the digital input code.

zero-scale error (E

ZS

)

Zero-scale error is defined as the deviation of the output from 0 V at a digital input value of 0.

gain error (E

G

)

Gain error is the error in slope of the DAC transfer function.

signal-to-noise ratio + distortion (SINAD)

Signal-to-noise ratio + distortion is the ratio of the rms value of the output signal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for SINAD is expressed in decibels.

spurious free dynamic range (SFDR)

Spurious free dynamic range is the difference between the rms value of the output signal and the rms value of the spurious signal within a specified bandwidth. The value for SFDR is expressed in decibels.

total harmonic distortion (THD)

Total harmonic distortion is the ratio of the rms sum of the first six harmonic components to the rms value of the fundamental signal and is expressed in decibels.

18

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PACKAGE OPTION ADDENDUM

www.ti.com

30-Jan-2016

PACKAGING INFORMATION

Orderable Device

TLV5613CDW

TLV5613CDWG4

TLV5613CPW

TLV5613IDW

TLV5613IPW

TLV5613IPWG4

Status

(1)

ACTIVE

ACTIVE

ACTIVE

ACTIVE

ACTIVE

ACTIVE

Package Type Package

Drawing

Pins Package

Qty

SOIC

SOIC

DW

DW

20

20

25

25

Eco Plan

(2)

Green (RoHS

& no Sb/Br)

Green (RoHS

& no Sb/Br)

TSSOP

SOIC

TSSOP

TSSOP

PW

DW

PW

PW

20

20

20

20

70

25

70

70

Green (RoHS

& no Sb/Br)

Green (RoHS

& no Sb/Br)

Green (RoHS

& no Sb/Br)

Green (RoHS

& no Sb/Br)

Lead/Ball Finish

(6)

CU NIPDAU

CU NIPDAU

CU NIPDAU

CU NIPDAU

CU NIPDAU

CU NIPDAU

MSL Peak Temp

(3)

Level-1-260C-UNLIM

Level-1-260C-UNLIM

Level-1-260C-UNLIM

Level-1-260C-UNLIM

Level-1-260C-UNLIM

Level-1-260C-UNLIM

Op Temp (°C)

0 to 70

0 to 70

0 to 70

-40 to 85

-40 to 85

-40 to 85

Device Marking

(4/5)

TLV5613C

TLV5613C

TV5613

TLV5613I

TY5613

TY5613

TLV5613IPWR ACTIVE TSSOP PW 20 2000 Green (RoHS

& no Sb/Br)

CU NIPDAU Level-1-260C-UNLIM

(1)

The marketing status values are defined as follows:

ACTIVE: Product device recommended for new designs.

LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.

NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.

PREVIEW: Device has been announced but is not in production. Samples may or may not be available.

OBSOLETE: TI has discontinued the production of the device.

-40 to 85 TY5613

(2)

Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details.

TBD: The Pb-Free/Green conversion plan has not been defined.

Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.

Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.

Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)

(3)

MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.

(4)

There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.

Addendum-Page 1

Samples

PACKAGE OPTION ADDENDUM

www.ti.com

30-Jan-2016

(5)

Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device.

(6)

Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width.

Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.

TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.

In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.

Addendum-Page 2

www.ti.com

TAPE AND REEL INFORMATION

PACKAGE MATERIALS INFORMATION

2-Sep-2015

*All dimensions are nominal

Device

TLV5613IPWR

Package

Type

Package

Drawing

TSSOP PW

Pins

20

SPQ

2000

Reel

Diameter

(mm)

Reel

Width

W1 (mm)

330.0

16.4

A0

(mm)

6.95

B0

(mm)

7.1

K0

(mm)

P1

(mm)

W

(mm)

Pin1

Quadrant

1.6

8.0

16.0

Q1

Pack Materials-Page 1

www.ti.com

PACKAGE MATERIALS INFORMATION

2-Sep-2015

*All dimensions are nominal

Device

TLV5613IPWR

Package Type Package Drawing Pins

TSSOP PW 20

SPQ

2000

Length (mm) Width (mm) Height (mm)

367.0

367.0

38.0

Pack Materials-Page 2

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