Problem Solution # 4 ECEN 3320 Fall 2013 Semiconductor Devices September 18, 2013 – Due September 25, 2013 1. Consider n-type silicon with Nd = 1015 cm−3 at T = 300◦ K. A light source is turned on at t = 0. The source illuminates the semiconductor uniformly, generating carriers at the rate of Gn = Gp = 1019 cm−3 s−1 . There is no applied field. (a) Write down the continuity equation and solve it to find the expression for the excess minoritiy carrier concentration, δp(t), as a function of time for t ≥ 0. Solution: When there is no applied electric field the carrier distribution is diffusion driven. The continuity equation for the minority carrier ∂p(x, t) 1 ∂Jp (x, t) =− + Gp (x, t) − Rp (x, t) ∂t q ∂x then reduces to δp ∂δp = Gp − ∂t τp with the general solution t δp(t) = A exp − τp ! + Gp τp . Using the initial condition (before the light was turned on) that δp(0) = 0, then we find that A = −Gp τ . The full solution then is ( δp(t) = Gp τp t 1 − exp − τp !) . (b) As t → ∞, the system will approach steady state. When the steady state excess carrier concentration is 5 × 1013 cm−3 , find the minority carrier lifetime, τp . Solution: The system will approach steady state as t → ∞. Evidently, the steady state carrier density is given δp(t)|t→∞ = Gp τp . The τp must then take on the value τp = 5×1013 /Gp . With Gp = 1019 cm−3 s−1 , then the minority (hole) carried lifetme must be τp = 5 × 10−6 s. (c) Determine the time at which the excess carrier concentration becomes half of the steady state value, δp(t → ∞) that you calculated in (b). Solution: The value at which exp − τt = 1 1 2 is t = ln(2)τp = 0.69 × 5 × 10−6 s. Figure 1: An illuminated semiconductor. 2. Consider an n-type semconductor as shown above. Illumination produces a constant excess carrier generation rate of Gp is the region −L ≤ x ≤ L. Assume the minority current density is zero at x = −3L and x = 3L. Find the steady state minority carrier concentration as a funciton of x, δp(x). There is no applied electric field. Solution: When there is no applied electric field the carrier distribution is diffusion driven. The continuity equation for the minority carrier ∂p(x, t) 1 ∂Jp (x, t) =− + Gp (x, t) − Rp (x, t) ∂t q ∂x then reduces to 0 = Dp ∂ 2 δp(x, t) δp + Gp − 2 ∂ x τp in −L ≤ x ≤ L and 0 = Dp ∂ 2 δp(x, t) δp − ∂2x τp in −3L ≤ x ≤ −L and L ≤ x ≤ 3L with boundary conditions that dδp dδp (−3L) = (3L) = 0 dx dx and δp(−L) and δp(L) are continuous. From symmetry, we need only solve the for x ≥ 0 with new boundary condition that dδp dx (0) = 0. The solution is Gp τp + A exp − x + B exp x 0≤x<L Lp Lp δp(x) = x x C exp − Lp + D exp Lp L ≤ x ≤ 3L where L2p = Dp τp . 2 The end conditions at 0 and L then lead to A = B and C = D exp 6L Lp . This results in Gp τp + E cosh x 0≤x<L Lp δp(x) = L ≤ x ≤ 3L F cosh x−3L Lp where E = 2A and F = 2D exp 3L Lp are the new constants to find and where 2 cosh(x) = exp(x) + exp(−x) is the hyperbolic cosine function. We will later also use the derivative of this function. 2 sinh(x) = exp(x) − exp(−x) the hyperbolic sine function. At x = L, we find L Gp τp + E cosh Lp ! 2L = F cosh Lp ! x E sinh Lp ! 2L = −F sinh Lp ! where we have used the evenness of cosh and oddness of sinh. Solving, we find F sinh L Lp sinh 2L Lp = − E Gp τp sinh E = − cosh L Lp sinh 2L Lp 2L Lp + cosh 2L Lp sinh L Lp =− Gp τp sinh sinh where the identity 3L sinh Lp ! L = cosh Lp ! 2L sinh Lp ! ! 2L L + cosh sinh Lp Lp has been used. Substituting back, we find F = Gp τp sinh sinh 3L Lp L Lp and 2L cosh Lx sinh L p p Gp τp 1 − 3L sinh L p δp(x) = x−3L L G cosh p τp sinh L Lp p 3L sinh Lp 3 0≤x<L . L ≤ x ≤ 3L ! 3L Lp 2L Lp 3. Consider n=type gallium arsenide (GaAs) at T = 300◦ K with uniform doping ND = 1 × 1015 cm−3 . (a) Determine the position of the Fermi level with respect to the intrinsic Fermi level, Ef −Ei . Solution: Assuming that semiconductor is non-degenerate, we can write Ef − Ei n0 = Nd = ni exp kT to find Nd Ef − Ei = kT ln ni = 0.519 eV (b) Suppose the excess carriers are generated such that the excess carrier concentrations are 10% of the equilibrum majority carrier concentrations. Caluclate the quasi-Fermi levels relative the intrinsic Fermi levels, that is, Fn − Ei and Ei − Fp . Solution: Here we can use that Fn − Ei n0 + δn = ni exp kT to find 1.1 × Nd Fn − Ei = kT ln ni = 0.521 eV. The minority carriers than are give by po = n2i = 4.0 × 10−3 cm−3 n0 and Ei − Fp p = p + δp ≈ δp = ni exp kT that yields 0.1Nd Ei − Fp = kT ln ni 4 = 0.459 eV