VNS3NV04D - STMicroelectronics

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VNS3NV04D
®
“OMNIFET II”:
FULLY AUTOPROTECTED POWER MOSFET
TYPE
VNS3NV04D
RDS(on)
120 mΩ (*)
Ilim
3.5 A (*)
Vclamp
40 V (*)
(*)Per each device
)
s
(
ct
n LINEAR CURRENT LIMITATION
n THERMAL SHUT DOWN
n SHORT CIRCUIT PROTECTION
n INTEGRATED CLAMP
n LOW CURRENT DRAWN FROM INPUT PIN
n DIAGNOSTIC FEEDBACK THROUGH INPUT
u
d
o
r
P
e
PIN
n ESD PROTECTION
t
e
l
o
n DIRECT ACCESS TO THE GATE OF THE
POWER MOSFET (ANALOG DRIVING)
n COMPATIBLE WITH STANDARD POWER
MOSFET
DESCRIPTION
The VNS3NV04D is a device formed by two
monolithic OMNIFET II chips housed in a
standard SO-8 package. The OMNIFET II are
designed in STMicroelectronics VIPower M0-3
Technology: they are intended for replacement of
standard Power MOSFETS from DC up to 50KHz
)
(s
s
b
O
t
c
u
BLOCK DIAGRAM
SO-8
applications. Built in thermal shutdown, linear
current limitation and overvoltage clamp protects
the chip in harsh environments.
Fault feedback can be detected by monitoring the
voltage at the input pin.
d
o
r
P
e
t
e
l
o
O
bs
INPUT1
DRAIN1
OVERVOLTAGE
CLAMP
OVERVOLTAGE
CLAMP
GATE
CONTROL
GATE
CONTROL
OVER
TEMPERATURE
LINEAR
CURRENT
LIMITER
LINEAR
CURRENT
LIMITER
SOURCE1
September 2013
DRAIN2
INPUT2
OVER
TEMPERATURE
SOURCE2
DocID7396 Rev 4
1/14
1
VNS3NV04D
ABSOLUTE MAXIMUM RATING
Symbol
VDSn
VINn
IINn
RIN MINn
IDn
IRn
VESD1
VESD2
Ptot
Tj
Tc
Tstg
Parameter
Drain-source Voltage (VINn=0V)
Input Voltage
Input Current
Minimum Input Series Impedance
Drain Current
Reverse DC Output Current
Electrostatic Discharge (R=1.5KΩ, C=100pF)
Electrostatic Discharge on output pins only (R=330Ω, C=150pF)
Total Dissipation at Tc=25°C
Operating Junction Temperature
Case Operating Temperature
Storage Temperature
Value
Internally Clamped
Internally Clamped
+/-20
220
Internally Limited
-5.5
4000
16500
4
Internally limited
Internally limited
-55 to 150
Unit
V
V
mA
Ω
A
A
V
V
W
°C
°C
°C
u
d
o
)
s
(
ct
r
P
e
CONNECTION DIAGRAM (TOP VIEW)
bs
DRAIN 1
5
DRAIN 2
1
SOURCE 1
INPUT 1
8
O
)
SOURCE 2
INPUT 2
4
t
e
l
o
DRAIN 1
DRAIN 2
s
(
t
c
u
d
o
r
P
e
CURRENT AND VOLTAGE CONVENTIONS
t
e
l
o
s
b
O
VIN1
RIN1
IIN1
INPUT 1
IIN2
1
DRAIN 1
RIN2
ID2
INPUT 2
VIN2
2/14
ID1
SOURCE 1
VDS1
DRAIN 2
SOURCE 2
VDS1
VNS3NV04D
THERMAL DATA
Symbol
Rthj-lead
Rthj-amb
Parameter
Thermal Resistance Junction-lead (per channel)
Thermal Resistance Junction-ambient
Value
30
80(*)
MAX
MAX
Unit
°C/W
°C/W
(*) When mounted on a standard single-sided FR4 board with 50mm2 of Cu (at least 35 µm thick) connected to all DRAIN pins of the relative
channel.
ELECTRICAL CHARACTERISTICS (-40°C < Tj < 150°C, unless otherwise specified)
(Per each device)
OFF
Symbol
VCLAMP
VCLTH
VINTH
IISS
VINCL
Parameter
Drain-source Clamp
Voltage
Drain-source Clamp
Threshold Voltage
Input Threshold Voltage
Supply Current from Input
Pin
Input-Source Clamp
Test Conditions
IDSS
Zero Input Voltage Drain
Current (VIN=0V)
Symbol
Parameter
Typ
Max
Unit
VIN=0V; ID=1.5A
40
45
55
V
VIN=0V; ID=2mA
36
VDS=VIN; ID=1mA
0.5
VDS=0V; VIN=5V
IIN=-1mA
VDS=13V; VIN=0V; Tj=25°C
VDS=25V; VIN=0V
RDS(on)
Test Conditions
VIN=5V; ID=1.5A; Tj=25°C
u
d
o
s
(
t
c
VIN=5V; ID=1.5A
Pr
u
d
o
6
100
6.8
-1.0
V
2.5
V
150
µA
8
-0.3
30
bs
O
)
ON
Static Drain-source On
Resistance
e
t
e
ol
IIN=1mA
Voltage
)
s
(
ct
Min
75
Min
Typ
Max
120
240
V
µA
Unit
mΩ
r
P
e
t
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s
b
O
3/14
1
VNS3NV04D
ELECTRICAL CHARACTERISTICS (continued) (Tj=25°C, unless otherwise specified)
DYNAMIC
Symbol
gfs (*)
COSS
Parameter
Forward
Test Conditions
Transconductance
Output Capacitance
Min
Typ
Max
Unit
VDD=13V; ID=1.5A
5.0
S
VDS=13V; f=1MHz; VIN=0V
150
pF
SWITCHING
Symbol
td(on)
tr
td(off)
tf
td(on)
tr
td(off)
tf
Parameter
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
(dI/dt)on
Turn-on Current Slope
Qi
Test Conditions
VDD=15V; ID=1.5A
Vgen=5V; Rgen=RIN MINn=220Ω
(see figure 1)
IRRM
r
P
e
(see figure 1)
let
VDD=15V; ID=1.5A
Vgen=5V; Rgen=RIN MINn=220Ω
VDD=12V; ID=1.5A; VIN=5V
so
Total Input Charge
Igen =2.13mA (see figure 5)
Parameter
Forward On Voltage
Reverse Recovery Time
Reverse Recovery Charge
)-
b
O
Test Conditions
ISD=1.5A; VIN=0V
ISD=1.5A; dI/dt=12A/µs
Min
s
(
t
c
u
d
o
VDD=30V; L=200µH
Reverse Recovery Current (see test circuit, figure 2)
r
P
e
Typ
90
250
450
250
0.45
2.5
3.3
2.0
Max
300
750
1350
750
1.35
7.5
10.0
6.0
Unit
ns
ns
ns
ns
µs
µs
µs
µs
)
s
(
ct
u
d
o
VDD=15V; ID=1.5A
Vgen=5V; Rgen=2.2KΩ
SOURCE DRAIN DIODE
Symbol
VSD (*)
trr
Qrr
Min
4.7
A/µs
8.5
nC
Typ
0.8
107
37
Max
0.7
Unit
V
ns
µC
A
PROTECTIONS (-40°C < Tj < 150°C, unless otherwise specified)
Symbol
Ilim
Parameter
Drain Current Limit
t
e
l
o
tdlim
bs
Tjsh
O
Tjrs
Igf
Eas
Step Response Current
Limit
Test Conditions
VIN=5V; VDS=13V
VIN=5V; VDS=13V
Overtemperature
Shutdown
Overtemperature Reset
Fault Sink Current
Single Pulse
Avalanche Energy
VIN=5V; VDS=13V; Tj=Tjsh
starting Tj=25°C; VDD=24V
VIN=5V; Rgen=RIN MINn=220Ω; L=24mH
(see figures 3 & 4)
(*) Pulsed: Pulse duration = 300µs, duty cycle 1.5%
4/14
2
Min
3.5
Typ
5
Max
7
Unit
A
µs
10
150
175
200
°C
135
10
15
20
°C
mA
100
mJ
VNS3NV04D
PROTECTION FEATURES
During normal operation, the INPUT pin is
electrically connected to the gate of the internal
power MOSFET through a low impedance path.
The device then behaves like a standard power
MOSFET and can be used as a switch from DC to
50KHz. The only difference from the user’s
standpoint is that a small DC current IISS (typ.
100µA) flows into the INPUT pin in order to supply
the internal circuitry.
The device integrates:
- OVERVOLTAGE CLAMP PROTECTION:
internally set at 45V, along with the rugged
avalanche characteristics of the Power MOSFET
stage give this device unrivalled ruggedness and
energy handling capability. This feature is mainly
important when driving inductive loads.
- LINEAR CURRENT LIMITER CIRCUIT: limits
the drain current ID to Ilim whatever the INPUT pin
voltage. When the current limiter is active, the
device operates in the linear region, so power
dissipation may exceed the capability of the
heatsink. Both case and junction temperatures
increase, and if this phase lasts long enough,
junction
temperature
may
reach
the
overtemperature threshold Tjsh.
)
(s
- OVERTEMPERATURE AND SHORT CIRCUIT
PROTECTION: these are based on sensing the
chip temperature and are not dependent on the
input voltage. The location of the sensing element
on the chip in the power stage area ensures fast,
accurate detection of the junction temperature.
Overtemperature cutout occurs in the range 150 to
190 °C, a typical value being 170 °C. The device is
automatically restarted when the chip temperature
falls of about 15°C below shut-down temperature.
- STATUS FEEDBACK: in the case of an
overtemperature fault condition (Tj > Tjsh), the
device tries to sink a diagnostic current Igf through
the INPUT pin in order to indicate fault condition. If
driven from a low impedance source, this current
may be used in order to warn the control circuit of
a device shutdown. If the drive impedance is high
enough so that the INPUT pin driver is not able to
supply the current Igf, the INPUT pin will fall to 0V.
This will not however affect the device
operation: no requirement is put on the current
capability of the INPUT pin driver except to be
able to supply the normal operation drive
current IISS.
Additional features of this device are ESD
protection according to the Human Body model
and the ability to be driven from a TTL Logic
circuit.
)
s
(
ct
u
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o
r
P
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t
e
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s
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O
t
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u
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r
P
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s
b
O
5/14
1
VNS3NV04D
Fig.1: Switching Time Test Circuit for Resistive Load
VD
Rgen
Vgen
)
s
(
ct
ID
u
d
o
90%
tr
Vgen
s
b
O
td(off)
)
(s
t
e
l
o
tf
10%
td(on)
r
P
e
t
c
u
t
t
d
o
r
Fig.2: Test Circuit for Diode Recovery Times
P
e
t
e
l
o
s
b
O
A
A
D
I
FAST
DIODE
OMNIFET
S
L=100uH
B
B
220Ω
D
Rgen
Vgen
VDD
I
OMNIFET
S
8.5 Ω
6/14
1
VNS3NV04D
Fig. 3: Unclamped Inductive Load Test Circuits
Fig. 4: Unclamped Inductive Waveforms
)
s
(
ct
RGEN
VIN
PW
u
d
o
r
P
e
Fig. 5: Input Charge Test Circuit
t
e
l
o
)
(s
VIN
s
b
O
t
c
u
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o
r
P
e
t
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s
b
O
7/14
1
1
VNS3NV04D
Source-Drain Diode Forward Characteristics
Static Drain Source On Resistance
Vsd (mV)
Rds(on) (mohms)
1100
1000
1050
Tj=-40ºC
900
Vin=0V
Vin=2.5V
1000
800
950
700
900
600
850
500
800
400
750
300
700
200
650
100
Tj=25ºC
)
s
(
ct
Tj=150ºC
600
u
d
o
0
0
1
2
3
4
5
6
7
8
9
10
11
12
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
0.45
0.5
0.55
r
P
e
Id (A)
Id(A)
Static Drain-Source On resistance Vs. Input
Voltage
Derating Curve
t
e
l
o
Rds(on) (mohms)
300
bs
275
(s)
ct
du
ro
P
e
-O
250
Tj=150ºC
225
200
175
Id=3.5A
Id=1A
150
Tj=25ºC
125
100
Tj=-40ºC
75
Id=3.5A
Id=1A
50
Id=3.5A
Id=1A
25
0
t
e
l
o
3
3.5
4
4.5
5
5.5
6
6.5
Vin(V)
Static Drain-Source On resistance Vs. Input
Voltage
s
b
O
Transconductance
Gfs (S)
Rds(on) (mohms)
11
250
10
225
Vds=13V
9
Id=1.5A
200
Tj=-40ºC
Tj=25ºC
8
175
Tj=150ºC
7
Tj=150ºC
150
6
125
5
100
4
3
75
Tj=25ºC
2
50
Tj=-40ºC
1
25
0
0
0
3
3.5
4
4.5
Vin(V)
5
5.5
6
6.5
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
5.5
Id (A)
8/14
1
1
VNS3NV04D
Static Drain-Source On Resistance Vs. Id
Transfer Characteristics
Rds(on) (mohms)
Idon (A)
250
6
225
5.5
Vin=5V
Vds=13.5V
5
200
Tj=150ºC
4.5
175
4
Tj=150ºC
150
3.5
125
3
Tj=25ºC
100
Tj=-40ºC
2.5
)
s
(
ct
2
75
1.5
50
Tj= - 40ºC
Tj=25ºC
1
25
u
d
o
0.5
0
0
0
0.5
1
1.5
2
2.5
3
3.5
4
1.5
2
2.5
bs
4.5
3.5
O
)
3
s
(
t
c
2.5
2
1.5
250
500
1
0.75
0.25
Pr
0
0
250
500
750 1000 1250 1500 1750 2000 2250 2500
Rg(ohm)
Rg(ohm)
Turn off drain source voltage slope
Input Voltage Vs. Input Charge
s
b
O
6
Vin=3.5V
Vdd=15V
Id=1.5A
1.25
750 1000 1250 1500 1750 2000 2250 2500
e
t
e
ol
5.5
0.5
u
d
o
1
5
1.5
Vin=5V
Vdd=15V
Id=1.5A
4
4.5
t
e
l
o
di/dt(A/usec)
1.75
5
0
4
Turn On Current Slope
di/dt(A/us)
0
3.5
Vin (V)
Turn On Current Slope
0.5
3
r
P
e
Id (A)
Vin (V)
dv/dt(V/usec)
9
300
275
8
Vds=1V
Id=1.5A
7
Vin=5V
Vdd=15V
Id=1.5A
250
225
200
6
175
5
150
125
4
100
3
75
2
50
1
25
0
0
0
0
1
2
3
4
5
6
Qg (nC)
7
8
9
10
11
500
250
1000
750
1500
1250
2000
1750
2500
2250
Rg(ohm)
9/14
1
1
VNS3NV04D
Turn Off Drain-Source Voltage Slope
Capacitance Variations
dv/dt(V/usec)
C(pF)
300
350
275
Vin=3.5V
Vdd=15V
Id=1.5A
250
225
300
f=1MHz
Vin=0V
200
250
175
150
200
125
100
)
s
(
ct
150
75
50
100
25
u
d
o
0
0
500
1000
250
750
1500
1250
2000
1750
50
2500
2250
0
5
10
900
3.5
800
bs
td(off)
Vdd=15V
Id=1.5A
Vin=5V
700
tr
2.5
)
s
(
t
2
tf
1.5
c
u
d
td(on)
0
0
500
250
o
r
P
1000
750
e
t
e
ol
1500
1250
2000
1750
30
35
2500
tr
Vdd=15V
Id=1.5A
Rg=220ohm
600
500
400
td(off)
300
tf
200
td(on)
0
2250
3.25
3.5
3.75
4
Rg(ohm)
4.25
4.5
4.75
5
5.25
Vin(V)
Normalized On Resistance Vs. Temperature
Id (A)
O
-O
100
Output Characteristics
bs
t
e
l
o
t(nsec)
4
0.5
25
Switching Time Resistive Load
t(usec)
1
20
Vds(V)
Switching Time Resistive Load
3
15
r
P
e
Rg(ohm)
Rds(on) (mOhm)
5
4
Vin=5V
4.5
3.5
Vin=4V
Vin=5V
Id=1.5A
4
3
3.5
Vin=3V
3
2.5
2.5
2
2
1.5
1.5
1
1
0.5
0
0.5
0
1
2
3
4
5
Vds (V)
6
7
8
9
10
-50
-25
0
25
50
75
100
125
150
175
Tc )ºC)
10/14
1
1
VNS3NV04D
Normalized Input
Temperature
Threshold
Voltage
Vs.
Vinth (V)
Normalized
Current
Temperature
Limit
Vs.
Junction
Ilim (A)
10
2
1.8
9
Vds=Vin
Id=1mA
1.6
1.4
7
1.2
6
1
5
0.8
4
0.6
3
0.4
2
0.2
1
0
0
-50
-25
0
Vin=5V
Vds=13V
8
25
50
75
100
125
150
175
)
s
(
ct
-50
-25
Tc (ºC)
25
50
75
100
125
150
175
Tc (ºC)
Step Response Current Limit
t
e
l
o
Tdlim(usec)
13
12.5
Vin=5V
Rg=220ohm
12
u
d
o
r
P
e
0
11.5
)
(s
11
10.5
s
b
O
t
c
u
10
9.5
d
o
r
9
8.5
P
e
8
7.5
t
e
l
o
5
7.5
10
12.5
15
17.5
20
22.5
25
27.5
30
32.5
Vdd(V)
s
b
O
11/14
1
1
VNS3NV04D
SO-8 MECHANICAL DATA
mm.
inch
DIM.
MIN.
TYP
A
MAX.
MIN.
TYP.
a1
1.75
MAX.
0.1
0.068
0.25
a2
0.003
0.009
1.65
0.064
a3
0.65
0.85
0.025
b
0.35
0.48
0.013
b1
0.19
0.25
0.007
C
0.25
0.5
0.010
c1
45 (typ.)
D
4.8
5.0
E
5.8
6.2
e
1.27
e3
3.81
F
3.8
L
0.4
M
u
d
o
F
o
s
b
u
d
o
Pr
0.228
O
)
s
(
t
c
e
t
e
l
0.188
)
s
(
ct
0.033
0.018
0.010
0.019
0.196
0.244
0.050
0.150
4.0
0.14
0.157
1.27
0.015
0.050
0.6
0.023
8 (max.)
r
P
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t
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s
b
O
12/14
1
VNS3NV04D
SO-8 TUBE SHIPMENT (no suffix)
B
Base Q.ty
Bulk Q.ty
Tube length (± 0.5)
A
B
C (± 0.1)
C
A
100
2000
532
3.2
6
0.6
All dimensions are in mm.
)
s
(
ct
TAPE AND REEL SHIPMENT (suffix “13TR”)
u
d
o
REEL DIMENSIONS
r
P
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Base Q.ty
Bulk Q.ty
A (max)
B (min)
C (± 0.2)
F
G (+ 2 / -0)
N (min)
T (max)
t
e
l
o
)
(s
s
b
O
All dimensions are in mm.
t
c
u
d
o
r
TAPE DIMENSIONS
2500
2500
330
1.5
13
20.2
12.4
60
18.4
According to Electronic Industries Association
(EIA) Standard 481 rev. A, Feb 1986
P
e
Tape width
Tape Hole Spacing
Component Spacing
Hole Diameter
Hole Diameter
Hole Position
Compartment Depth
Hole Spacing
t
e
l
o
s
b
O
W
P0 (± 0.1)
P
D (± 0.1/-0)
D1 (min)
F (± 0.05)
K (max)
P1 (± 0.1)
All dimensions are in mm.
12
4
8
1.5
1.5
5.5
4.5
2
End
Start
Top
No components
Components
No components
cover
tape
500mm min
Empty components pockets
saled with cover tape.
500mm min
User direction of feed
13/14
1
VNS3NV04D
Please Read Carefully:
)
s
(
ct
Information in this document is provided solely in connection with ST products. STMicroelectronics NV and its subsidiaries (“ST”) reserve the
right to make changes, corrections, modifications or improvements, to this document, and the products and services described herein at any
time, without notice.
u
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All ST products are sold pursuant to ST’s terms and conditions of sale.
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Purchasers are solely responsible for the choice, selection and use of the ST products and services described herein, and ST assumes no
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UNLESS OTHERWISE SET FORTH IN ST’S TERMS AND CONDITIONS OF SALE ST DISCLAIMS ANY EXPRESS OR IMPLIED
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WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE (AND THEIR EQUIVALENTS UNDER THE LAWS
OF ANY JURISDICTION), OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT.
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ST PRODUCTS ARE NOT DESIGNED OR AUTHORIZED FOR USE IN: (A) SAFETY CRITICAL APPLICATIONS SUCH AS LIFE
SUPPORTING, ACTIVE IMPLANTED DEVICES OR SYSTEMS WITH PRODUCT FUNCTIONAL SAFETY REQUIREMENTS; (B)
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OR ENVIRONMENTS. WHERE ST PRODUCTS ARE NOT DESIGNED FOR SUCH USE, THE PURCHASER SHALL USE PRODUCTS AT
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Resale of ST products with provisions different from the statements and/or technical features set forth in this document shall immediately void
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