testing & test equipment
A u t o m o t i v e RF I m m u n i t y Te s t S e t - u p A n a ly s i s :
W h y Te s t R e s u lt s C a n ’ t C o m par e
Automotive RF Immunity Test Set-up
Analysis: Why Test Results Can’t Compare Mart Coenen
EMCMCC bv
Eindhoven, The Netherlands
Hugo Pues
Melexis NV
Tessenderlo, Belgium
Thierry Bousquet
Continental
Toulouse, France
ABSTRACT
hough the automotive RF emission
and RF immunity requirements are
highly justifiable, the application of
those requirements in an non-intended
manner leads to false conclusions and
unnecessary redesigns for the electronics
involved. When the test results become too
dependent upon the test set-up itself, interlaboratory comparison as well as the search
for design solutions and possible correlation
with other measurement methods loses
ground. In this paper, the ISO bulk-current
injection (BCI) and radiated immunity (RI)
module-level tests are discussed together
with possible relation to the DPI and TEM
cell methods used at the IC level.
Keywords: Bulk Current injection (BCI),
Radiated Immunity (RI), Direct Power Injection (DPI), TEM cell, wire harness, automotive module, Electronic Control Unit (ECU)
and Electronic Sub-Assembly (ESA)
T
I. INTRODUCTION
The increasing use of electronics in vehicles
16 interference technology
requires a very high level of reliability to
assure the safety of the vehicle occupants
as well as all other road users. Aside all
mechanical vibration, thermal and moisture
requirements, the new sensors and active
actuators used have to be robust against
the electromagnetic threats which originate
from causes both within and around the
vehicle. Already in the past, RF emission and
immunity requirements were set by ISO, in
particular by TC22/SC3/WG3 who deals
with electromagnetic interference. Due to
the growing use of these requirements, it is
increasingly important to avoid faulty application and interpretation of them. This
has a two-fold drawback:
•Module compliance doesn’t necessarily
mean in-vehicle compliance after integration and
•Compliance to over-testing over a large
range has an inverse impact on economics
The playing field is wide and involves
car-manufactures as well as the Electronic
Control Unit (ECU) and Electronic SubAssembly (ESA) manufactures, down to
the silicon design to achieve a more integral
economic solution.
New vehicle developments like using
non-conductive composite materials, ‘zero
emission’ exhaust requirements for combustion motors, the introduction of the
hybrid motor or full electric vehicle put an
ever higher burden on economics as well as
safety reliability for the electronics used.
The RF immunity requirements have
therefore been extended beyond the 30 V/m,
©2011, University of Zagreb
emc Test & design guide 2011
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testing & test equipment
A u t o m o t i v e RF I m m u n i t y Te s t S e t - u p A n a ly s i s :
W h y Te s t R e s u lt s C a n ’ t C o m par e
The calibration of the BCI clamp is described in detail in
the latest version of the standard [2, 8, 9].
With the BCI test, there are two options implemented:
‘open loop’ and ‘closed loop’. With the ‘open loop’ test, the
voltage coupled into the calibration test jig to achieve the
required current through a 50  load (where the opposite
side of the test jig is loaded with 50  as well) is recorded
and the forward power level is maintained during the immunity test while the injection probe is positioned at the
three harness locations.
With the ‘closed loop’ test, the RF current is increased
up to a level where the DUT fails or the current limit or the
forward power limit is reached: 4x the nominal RF power
as used during calibration to meet the induced current
requirements.
However, the ‘open loop’ test method was intended to
apply for non-grounded DUTs and the ‘closed loop’ should
apply for grounded DUTs only (as RF currents will flow
intentionally).
Applying a closed loop bulk current of 100 mA into a
insulated sensor with a capacitance to the reference plane
of 20 pF at 3 MHz would require an output power of nearly
1500 Watt from a 50  RF generator when no power limit
is applied. Applying the open loop test would only require
0,5 Watt, a difference of 35 dB in RF power.
The second pitfall comes in three: the length of the harness, the equivalent RF termination at both ends of the
harness and the BCI clamp itself.
The cable harness above the reference plane represents
a transmission line with a characteristic impedance of 150
– 200 , Figure 1. Even in the ideal case when the cable
harness is only terminated by two ANs to ground, being
equal to 25  in common-mode, there is a serious mismatch
between the harness transmission line impedance and the
ANs in parallel.
When a capacitor to ground is used for one of the (signal)
lines in the load box circuit, the harness termination impedance mismatch will even be higher and standing waves over
the harness will result.
Figure 1. The characteristic impedance calculation of a cable harness
over a metal plate (Agilent AppCad (freeware)).
in the 20 – 1000 MHz frequency range, as specified in the
European Automotive Directive 2004/104/EC with its many
amendments [1].
Most car manufacturers use extended immunity requirements downwards from 20 MHz to 150 kHz, typically by
using the bulk current injection (BCI) test method. Where
the highest level according the standards is 100 mA, levels
up to 600 mA are already specified by some car-manufacturers. BCI test set-up drawbacks and pitfalls are described
in chapter II.
100 V/m has been set as typical radiated immunity (RI)
requirement for non-safety related ECU/ESA and 200 –
600 V/m for those ECU/ESAs which are safety related. The
frequency range for the radiated emission and immunity of
applications has been extended upwards from 1 GHz to 2 or
even 6 GHz. This will be elucidated in chapter III.
In chapter IV, the necessary conditions to obtain possible
correlation with IC test methods will be given and conclusions will be given in chapter V.
II. BCI TEST SET-UP
The BCI test set-up, according ISO 11452-4 (2005) [2] is
specified in the frequency range 1 – 400 MHz. The BCI test
defines that the cable harness length = 1 ± 0,1 meter and it
shall be positioned at 50 mm above a metal reference plane
at 0,2 meter from the front edge of the metal plated table,
see figure 1. The metal plated table is defined 1,5 meter wide
and 0,9 meter high positioned above a conductive floor. The
battery shall be connected through an artificial network
(AN, also known as Impedance Stabilizing Network: ISN)
with an impedance of 50  // 5 H but this network is only
defined in the frequency range 0,1 - 100 MHz.
An RF-impedance undefined load simulator box is prescribed in-between the cable harness to the DUT and the
ANs. The BCI probe shall be placed at distances, d, from the
connector of the DUT; 150, 450, 750 ± 10 mm for the openloop method and 0,9 ± 0,1 m for the closed-loop method. If
a current measurement probe is used during the test it shall
be placed at 50 ± 10 mm from the connector of the DUT.
18 interference technology
Figure 2. Simulated BCI clamp turns ratio effect on resonances 1) 1:5,
2) 1:2, 3) 1:1 load box impedance is 1 , DUT is floating, open loop test.
emc Test & design guide 2011
testing & test equipment
C o e n e n, P u e s, B o u s q u e t
On the opposite side of the harness, the DUT will be left
floating or grounded. In either case, another ideal condition
for resonances. However, these harness resonance frequencies are fully determined by the cable harness length which
might include the wiring inside the load box up to the ANs.
The third item in this equation is the BCI clamp itself
as the turn ratio between primary and secondary of this
‘transformer’ determines the resistive loading of the harness loop. Dependent on the frequencies designed for, the
BCI clamp turns ratio also varies between manufactures,
this between 1:1 and 1:5 which alters the equivalent damping resistance between 50 and 2  (when excluding the RF
losses of the clamp itself).
The length of the cable harnesses tested with varies
between 1 - 2 meter determined by the specification of the
end-user i.e. car manufacturer and has typically the same
topology as used with the RI test set-up.
In the simulated results of figure 2, the DUT’s RF voltage
towards the reference plane is given from a ‘floating’ sensor
under the condition when the load box represents low RF
impedance at the end of the harness. 0 dB represent the
nominal voltage. Due to the open-ended transmission line,
the induced voltage appears in full at the lower frequencies.
This DUT to reference plate voltage, divided by the distance
gives the local E-field strength. Excesses over 30 dB both
above and below nominal can be noted which are also mea-
interferencetechnology.com
Figure 3. Measured BCI clamp turns ratio 1:2; load box impedance is
1 , DUT is floating, open loop test, nominal level is 100 dBV.
sured from the test set-up and can also be seen in real RF
immunity test results, figure 3. The resonances occur at all
harmonics of where the harness length equals n/4. When
the cable harness is 2 meter long, the first resonance occurs
at 37,5 MHz, see figure 3.
interference technology 19
testing & test equipment
A u t o m o t i v e RF I m m u n i t y Te s t S e t - u p A n a ly s i s :
W h y Te s t R e s u lt s C a n ’ t C o m par e
the cable harness characteristic impedances as well.
Only for the artificial BCI and RI test set-up, the cable
harness will be used at 50 mm apart from a metal reference
plane i.e. vehicle frame. In real cars, where the harness is
routed against the vehicle’s frame characteristic impedances
of 50 ± 20  can be found. The common-mode termination
to achieve best compliance with the test set-up will divert
from the optimal impedances occurring in real vehicle applications.
III. RI TEST SET-UP
The RI test set-up, according ISO 11452-2 (2004) [3] defines
that the cable harness (length 1,5 ± 0,1 meter) shall be
positioned at 50 mm above a metal reference plane at 0,1
meter from the front edge of the metal plated table. The RI
test is specified in the frequency range 80 MHz – 18 GHz.
The antenna front is at 1 meter from the cable harness (0,9
meter from the metal plated table top and the antenna center
is at the harness center. The metal plated table is defined 2
meter wide and 0,9 meter height above a conductive floor.
The battery is still connected through an artificial network
(AN). Also here the impedance undefined load box is defined
in-between the cable harness to the DUT and the ANs.
The ISO standard reads: “The load simulator box shall be
placed directly on the ground plane. If the load simulator
has a metallic case, this case shall be bonded to the ground
Figure 4. Simulated BCI clamp turns ratio 1:1, 2, 5; load box impedance
is 150 , DUT is floating, open voltage and open loop test condition.
However, when the load box is replaced by a grounded
network which represents, in total, the characteristic impedance of the cable harness, the influence of the current
injection probe reduces as well as that the cable harness
length related resonances and variation diminish: ≤ 3 dB,
see figure 4. To enable these values in real vehicles, also the
equivalent RF common-mode impedances at the ESA/ECU
ports to the sensors connected have to be adapted to meet
20 interference technology
emc Test & design guide 2011
testing & test equipment
C o e n e n, P u e s, B o u s q u e t
plane. Alternatively, the load simulator may be located adjacent to the ground plane (with the case of the load simulator
bonded to the ground plane) or outside of the test chamber,
provided the test harness from the DUT passes through an
RF boundary bonded to the ground plane. When the load
simulator is located on the ground plane, the DC power supply lines of the load simulator shall be connected through
the AN(s)”. This open description allows for a very broad
variety of RF impedances represented by the load box.
As result of different dimensions defined in the BCI and
the RI standards, the widest metal plated table is used with a
long cable harness. The cable harness is fixed at 50 mm above
the metal plane and pretty undefined RF terminated by the
load simulation box, which may or may not be grounded.
On the opposite side of the harness, the DUT shall be
placed on an insulating support; also 50 mm height and the
DUT shall be grounded by a ground strap (when defined by
application).
When performing radiated immunity tests e.g. according
IEC 61000-4-3, the E-field strength in front of the antenna
is measured at 1 meter distance at center level, without any
nearby object to the antenna. In the ISO RI case, the antenna
is placed in front of the metal plated table which is at 0,9
meter distance as the distance to the cable harness has to be
set to 1 meter. The E-field strength is measured 0,15 meter
above the metal plate at 0,1 meter from the edge without
interferencetechnology.com
Figure 5. Worst-case E-field to induced voltage ratio from a 2 meter
cable harness at 50 mm above a metal reference plate while the load
box/AN impedance is varied; red = 2,5 k , blue = 50  ‘sensor to GRP’
impedance.
the cable harness present. The antenna height is adjusted
such that the antenna center is also at the harness cable
height: 0,95 m above the ground reference plane. For each
frequency, the RF generator settings e.g. forward power is
recorded to obtain the field strength at that single E-field
sensor position.
Due to the close proximity of the metal table, the an-
interference technology 21
testing & test equipment
A u t o m o t i v e RF I m m u n i t y Te s t S e t - u p A n a ly s i s :
W h y Te s t R e s u lt s C a n ’ t C o m par e
the maximum induced voltage reduces when the commonmode termination resistance at one end of the harness cable
topology becomes terminated close to its characteristic
impedance; 150 - 200  in this case. Again this test set-up
optimum common-mode termination impedance will be
less in real vehicle applications.
The differences between the red and blue line results
in figure 5 indicate that the worst-case resonances occurring under no-load conditions are substantially worse than
when loaded with 50 , by about 10 dB. In either case, the
induced voltage decreases when the load box impedance is
increased. No valid simulation model has been found yet to
describe these cases.
tenna’s radiation pattern is affected by mutual coupling.
More problematic w.r.t. RI test result comparison is the
antenna used as the formal antenna factor and gain factor
are given for an antenna in free space. When high(er) gain
horn antennas are used, the distance at which a plane EM
field can be expected has to be multiplied by the gain factor.
When the wavelength is 1 meter, the theoretical near-field to
intermediate-field transition occurs at 1/(2) meter distance.
When the antenna gain is 12 dB e.g. with horn antennas, the
distance to achieve this condition is 2 times further away
as with a log-periodic antenna with a gain of 6 - 7 dB. The
E-fieldstrength requirements can be met but the plane-wave
conditions are not. As such, the local E-fieldstrength over
the cable harness length has become antenna dependent
thus unpredictable and non-calculable.
Similar to the BCI test set-up, the voltage i.e. current
induced in the cable harness will depend on the RF termination at both ends of the harness. To verify this, a test set-up
has been built using a horn antenna at 1 meter distance
from the harness while sweeping through the frequency
band from 400 MHz to 1 GHz. The antenna polarization
was changed from horizontal to vertical while measuring
the induced voltages in-between an insulated sensor and
the reference plate. The worst case induced voltage was
recorded and the load box impedance was varied between 1
and 200 , see figure 5. What was already expected is that
22 interference technology
IV. POSSIBLE (COR)RELATION WITH DPI OR
OTHER EMC IC TEST METHODS
Based on the lack of site-to-site correlation and the lack of
sufficient bounds in-between the BCI set-ups, it will be very
hard to find any correlation with DPI or TEM-cell results
according IEC 62132-2, IEC 62132-4 or other test methods
[4 - 7]. What has remained from the measurements in the
80-ies is the relation between the E-fieldstrength applied to
exterior of the vehicle and the levels of the induced currents
obtained on the internal harnesses of the car which appears
to be 1 mA/V/m.
When with BCI a current is applied of 200 mA, which
emc Test & design guide 2011
testing & test equipment
C o e n e n, P u e s, B o u s q u e t
across 50  equals 10 Volt during calibration, this harness voltage, applied
in “open loop control” will increase at
resonance (worst-case) to about 200
– 300 Volt. Unfortunately, the same
holds for “closed loop” BCI where due
to the impedance at the sensor the local
voltage may go to high extremes of >
500 Volt, as described earlier.
With the TEM cell test method as
described in IEC 62132-2, only the IC
itself will be exposed to EM-fields,
none of the external components or
the sensor front-end will be incorporated in the EM-field, unless the whole
application board is applied on the 4 by
4 inch (or 100 x 100 mm) PCB structure as described in IEC 62132-1 [4].
The E-field applied will be RF voltage
applied divided by distance between
septum to outer enclosure, being 45
mm in a FCC TEM cell; a distance
slightly less than the harness height
of the BCI/RI test set-up.
When 5 Watt RF power is applied
to the IC related TEM cell, terminated
by 50 , the inside E-fieldstrength will
become 350 V/m, which is more than
enough to satisfy the 200 V/m requirements but hardly enough when all the
excessive voltages occurring at resonances have to be taken into account.
From figure 5 it can be derived that
the maximum induced voltage from
a 2 meter harness exposed to 200
Volt/m (in the frequency range 400 –
1000 MHz) will be 20 Volt when a low
impedance termination at the load
box is considered. This RF signal level
divided by the sensor height above
the reference plane of 50 mm yields
400 Volt/m, so slightly over 5 Watt
RF power should be enough to satisfy
this excessive condition (under the
assumption that a large broadband
horn antenna will be used rather than
a log-per or any other type of antenna
structure suitable in that frequency
range). When the cable harness exposed is characteristic terminated in
common-mode at the load box side, the
worst case induced voltage reduces by
8 dB (2,5 x) which means that testing
with only 160 V/m is enough; quite
similar to what is occurring at the BCI/
RI sensor position.
The DPI test is typically done by apinterferencetechnology.com
plying up to 30 dBm on the global pins
(those port pins connected to wires
leaving the PCB into a cable harness)
and up to 12 dBm to the local pins (for
those pins connected to local on-board
components only). The coupling occurs from a 50  source in series with
a coupling capacitance of max. 6,8 nF
or a value which can still be handled
by the circuit connected to. For the
CAN-bus interfaces, these RF voltages
requirements have been raised even
further to 36 dBm (4 watt; which equals
28 Volt RMS open voltage to an input
or 40 Volts peak). Dedicated ESD protection structures need to be defined
and special insulation techniques have
to be used.
All RF voltages applied to each pin
with the DPI tests are referenced to the
interference technology 23
testing & test equipment
common Vss/ground reference layer of
the PCB. As such the delta voltages
appearing on the PCB application have
to be known between the various pins.
V. CONCLUSIONS
The present ISO standards carry many
faces by their implementations; ‘open/
closed loop’, cable harness length, load
box impedances, the grounding of the
loading box as well as the DUT, etc.,
which leads to an ambiguous definition
of these test set-ups, yielding severe
differences in test results.
The ‘closed loop’ E-field measurement with the RI measurements
close to the surface of the conductive
table is incorrectly related on incident
and reflective EM-field effects and
therefore, together with the antenna
chosen poorly correlated with EMsimulations. Also as different kind of
antennas are allowed, these do yield
differences in test results.
‘Open loop’ testing should be restricted to electrically ‘floating’ sensors
A u t o m o t i v e RF I m m u n i t y Te s t S e t - u p A n a ly s i s :
W h y Te s t R e s u lt s C a n ’ t C o m par e
and ‘closed loop’ testing shall apply to
electrically grounded applications. The
use of the ‘open loop’ and ‘closed loop’
testing shall be defined in the BCI standard in relation to how the DUT will be
used in its application and not be left
to the interpretation of an individual
EMC test engineer or specification
from a car manufacturer.
As real in-vehicle applications will
deviate from the artificial ISO test
set-up topologies, over-testing will
not guarantee immunity compliance
when the ESA/ECU will be integrated
into a vehicle. The equivalent ESA/
ECU RF common-mode impedance
port definitions have to be aligned
with the BCI/RI test set-ups or better
vice versa, this to achieve comparable
test data. Resonances in the test set-ups
shall be avoided and equal measures
shall be taken at the ESA/ECU ports
also to avoid resonances while being
integrated into a vehicle.
It is necessary to enforce (by standard) a unified AN (including the load
simulation box) which is encapsulated
into one metal box. This box shall be
grounded to the reference plane and
shall yield a defined CM output impedance at the ESA/ECU port of 150 - 200
 over the whole frequency range of
application rather than 25  (two ANs
in parallel) again in parallel to the load
box input filter topology in a limited
frequency band.
Care shall be taken with the real
characteristic common-mode impedance occurring in a vehicle which will
be around 50  and thus less that the
artificial impedances one used with
the test set-ups. Changing the cable
harness height over the reference plane
to achieve 50  could be a better alternative but will require new evidence
building compared to the data gathered
over the last 25 years.
The induced RF voltages occurring
from the BCI can be forecasted by an
analogue circuit simulator for both
‘open’ and ‘closed loop’ measurement
set-ups for the various application
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24 interference technology
emc Test & design guide 2011
testing & test equipment
C o e n e n, P u e s, B o u s q u e t
conditions of the BCI clamp. When the common mode
termination impedances are set to the characteristic impedance of the cable harness under these test conditions, the
turns ratio of the BCI clamps becomes close to irrelevant.
The root causes for the differences in test results inbetween the BCI and RI test set-ups have been described
and based on these findings the requirements for a TEM-cell
or DPI test set-up can be adapted accordingly. The RF voltages induced from both the BCI and RI test set-ups could
compare with the TEM cell and DPI test methods under the
condition that resonances are avoided and common-mode
cable harness impedance requirements are met. Fortunately,
these two measures coincide in one action.
When the relations between the BCI/RI and the DPI/
TEM- cell test methods become justified, earlier compliance
to the requirements can be proven which then shortens
development cycles by months and probably will reduce a
substantial amount of non-predictable redesigns.
ous fields and has published many papers and publications. He has been
actively involved in international EMC standardization since 1988 and
was awarded with the IEC 1906. He is the former project leader of the
standards: IEC 61000-4-6 and IEC 61000-4-2 but has moved his focus
towards EMC in integrated circuits. He was the former convenor of IEC
TC47A/WG9 and until last year, a member of IEC TC47A/WG2. Coenen
is CEO of EMCMCC bv. He can be reached at mart.coenen@emcmcc.nl.
Hugo Pues is senior development engineer of EMC at Melexis NV. He
can be reached at hpu@melexis.com.
Thierry Bousquet is ASICs Development Engineer EMC at Continental.
He can be reached at thierry.bousquet@continental-corporation.com. n
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REFERENCES
• [1]
Commission Directive 2004/104/EC of 14 October 2004 adapting to technical progress Council Directive 72/245/EEC relating to
the radio interference (electromagnetic compatibility) of vehicles
and amending Directive 70/156/EEC on the approximation of the
laws of the Member States relating to the type-approval of motor
vehicles and their trailers (followed by numerous amendments)
• [2]
ISO 11452-4, Road vehicles - Component test methods for
electrical disturbances from narrowband radiated electromagnetic
energy - Part 4: Bulk current injection (BCI)
• [3]
ISO 11452-2, Road vehicles - Component test methods for
electrical disturbances from narrowband radiated electromagnetic
energy - Part 2: Absorber-lined shielded enclosure
• [4]
IEC 62132-1, Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions
and definitions
• [5]
IEC 62132-2, Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity
- TEM cell and wideband TEM cell method
• [6]
IEC 62132-3, Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current
injection (BCI) method
• [7]
IEC 62132-4, Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power
injection method
• [8]
Pignari S.A., Grassi F., Marliani F., Canavero F. G., "Experimental characterization of injection probes for bulk current injection," www.ursi.org/Proceedings/ProcGA05/pdf/EA.4(0494).pdf
• [9]
Crovetti P.S., Fiori F, "A Critical Assessment of the ClosedLoop Bulk Current Injection Immunity Test Performed in Compliance With ISO 11452-4," IEEE Transactions on Instrumentation and
Measurement, April 2011.
Mart Coenen has more than 30 years of experience in EMC in variinterferencetechnology.com
interference technology 25