LUSI
X-ray Correlation Spectroscopy
Instrument
Advanced Procurement Review :
Diffractometer
Large Angle Detector Mover
Large Offset Monochromator
Aymeric ROBERT – XCS Instrument Scientist
Eric BONG – XCS Lead Engineer
April, 2009
1
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
Outline
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Purpose of the Review
XCS Instrument Overview
Long-lead Items for XCS
– Diffractometer System
– Large Angle Detector Mover
– Large Offset Monochromator
•Experimental Requirements
•Engineering Specifications
•Safety
•Acquisition Plan
•Discussions Status with vendors
•Timeline
•Vendor Selection Criteria
2
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
Purpose of the Review
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•
•
•
•
•
This review is NOT a Design Review
This review seeks approval of the specifications, the
procurement process and the potential vendors for the 3 longlead items of the X-ray Correlation Spectroscopy Instrument
We require advanced procurement approval since the LUSI
project has not reached CD-3 yet
DOE wishes to review all our procurement specifications
– Make sure we effectively use funding
This review must occur before we can submit the paperwork to
go out for bids
We are planning a design-build contract with an outside vendor
for the 3 items
– We are NOT doing the design ourselves
3
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Instrument Overview
Coherent X-rays
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Coherent
Scattering
(Speckles)
Speckles : scattering patterns produced by
the coherent illumination of the sample
XPCS : observation of the time-fluctuation
of speckle patterns
Characterization of the underlying dynamics
of the system
XPCS is independent of the scattering
geometry (SAXS, Diff., GI-SAXS, Refl.,…)
XPCS probes dynamical phenomena
First Hard X-ray Speckles
4
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XPCS / Coherent Scattering at XFEL’s
Intensity autocorrelation function
Dt
Dt
Dt
Dt
4
3
2
1
1
2
3
4
Dt
Dt
Time-average Brilliance
•1/(Rep. Rate) < tC< mach stab
•Large Q’s accessible
5
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
Ultrafast XPCS with a Split and Delay Unit
6
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
Ultrafast XCS : Split & Delay
No Dynamics
(zero delay)
Δt
Change in Contrast !
Dynamics
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Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
Ultrafast XCS : Split & Delay
Peak Brilliance & Pulse Duration
t
•Pulse duration < C< several ns
•Large Q’s accessible
Development of Split and Delay technology is crucial to success in Ultrafast
dynamics with XFEL’s
8
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XPCS capabilities on XFEL’s
LCLS
Ultra Fast Mode
Sequential Mode
LCLS Beam Parameters
Full Transverse Coherence
8 and 24 keV
High Time–average Brilliance
Rep. Rate 120 Hz
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High Peak Brilliance
Short pulse duration 200fs
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
X-ray Correlation Spectroscopy Science
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Ultra dilute systems ( gazes , aerosol, fogs, fumes)
Ionic liquids and Transport theories
Nano-systems (nanoscale = sub ns dynamics)
Biological samples dynamics (in their native state)
Dynamics of hard materials ( phonons, low-E excitations,… )
Hard condensed matter phase transitions
1600
-10 °C / 1 bar
Q=
1.6
t=5±3
H 2O
2nm-1
t-1
F(Q,t) (a.u.)
S(Q,E) (a.u.)
2400
ps
800
0
-10
-5
0
E (meV)
5
0.8
0.0
-0.8
1
10
10
100
t (ps)
10
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Instrument Location
Near Experimental Hall
X-ray Transport Tunnel
(200m long)
XCS
Source to Sample distance : ~ 420 m
Far Experimental Hall
11
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
Far Experimental Hall
Coherent
X-ray
Imaging
X-ray
Correlation
Spectroscopy
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Material
Extreme
Conditions
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Instrument Goals/Requirements
Photon Shutter
Primary Slits
Diagnostics
Monochromators
• Goals
– Time-resolved observation of coherent diffraction patterns
using LCLS coherent hard x-rays (6-25keV)
Transport Tunnel
• Tailor and characterize X-ray beam parameters
Secondary Slits
Diagnostics
Split and Delay
Secondary Slits
Diagnostics
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Spatial Profile
Intensity
Repetition rate
Spectral Bandwidth
• X-ray Photon Correlation Spectroscopy Requirements
Photon Shutter
Attenuators
Pulse Picker
FEH Hutch 4
Defining Slits
Diagnostics
Diffractometer
Large Angle
Detector Stage
– Versatility of the instrumentation (SAXS,WAXS, GI)
– Coherence Preservation of X-ray optics
– Detector with small pixel size / Large sample-detector
distance
• Key Performance Parameters
– 4-20 keV energy range
• Using the fundamental and third harmonic
– 0.1-0.01% energy resolution
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Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Instrument Overview
Photon Shutter
Primary Slits
Requirement
Device
Transport Tunnel
Diagnostics
Tailor X-ray spatial profile
X-ray Slits
Monochromators
Select X-ray energy and tailor spectrum width
Control longitudinal coherence length
MonochromatorS
Secondary Slits
Split X-ray pulse and control the delay
Split and Delay (MoU DESY)
Tailor X-ray spatial profile ( < 50 microns )
X-ray Focusing Lenses
Tailor X-ray intensity and spectrum
Attenuators
Diagnostics
Tailor X-ray repetition rate
Pulse Picker
Focusing Lenses
Tailor X-ray spectrum
Harmonic Rejection Mirrors
Characterize X-ray pulse intensity
Intensity Monitor
Pulse Picker
Characterize X-ray spatial profile
Profile Monitor
Harm. Rej. Mirrors
Characterize incident X-ray intensity before
optical component of before sample
Non-destructive Intensity
Monitor
Sample orientation and alignment
Diffractometer
Position X-ray area detector and minimize air
absorption and air scattering
Large Angle Detector Stage
Measure X-ray speckle patterns
2D Detector (BNL)
Diagnostics
Split and Delay
Secondary Slits
Photon Shutter
Attenuators
FEH Hutch 4
Defining Slits
Diagnostics
Diffractometer
Large Angle
Detector Stage
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Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Instrument Overview
Hutch 4
Optics, Diffractometer
Large Angle detector Mover
Split and Delay Area
Post-Monochromator
Large Offset Monochromator
15
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Inst. Overview : Detector
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2D Pixel Array Detector
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Developed at BNL (MoU)
1024 x 1024 pixels
35 x 35 mm2 pixel size
High DQE
10 2 dynamic range
Noise << 1 photon
120 Hz Readout Rate
D/=1.410-4
20mm, Flat
Pink : D/=1.5%
20mm, Focussed
We are in the process of
revisiting the pixel size
Pink : D/=1.5%
12mm, Focussed
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D/=1.410-4
20mm, Focussed
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Instrument Overview
600 mm
2x 2 mm
3 mm
30 mm
1400 mm
( Floor )
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Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
The sample position and angular orientation must be manipulated in a precise and reproducible fashion.
For some XPCS-experiments the sample will be confined in a particular environment (vacuum, cryostat
system, pressure cell, liquid jet, etc…). The local detector aids to the alignment of the sample/sample
environment in the x-ray beam. In all cases the diffractometer has to guarantee a stable and
reproducible position and angular orientation of both the sample and local detector.
The XCS diffractometer is a 4-circle horizontal scattering geometry diffractometer
FEH Hutch 4
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Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer Acquisition
Produce Physics Requirement
Document
P3 SLAC Design using
commercial vendor parts,
assemble at SLAC
Meet with vendor
Can vendor
design and build?
no
Continue with assemble at SLAC
yes
Write ESD & Purchase docs for
design/build
• Multiple vendors expressed interest in design/build
19
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer Safety
• Safety
– Preliminary concept
• Sense the X-ray PPS state of the hutch and use that to permit diffractometer
power (speed)
• Set motors to run at low velocities and acceleration (software)
• Set low current trip threshold of motors (software)
• Brakes on all axis
– Installation
• Need to coordinate with vendor regarding the hazards associated with
diffractometer installation, initial turn on and rigging
• Also coordinate with vendor on installation of granite floor insert
regarding rigging and construction safety
– Seismic
• The entire system will be reviewed and approved by SLAC for seismic
safety
– Electrical
• NRTL, SLAC Inspection and approval
20
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Diffractometer Location in the XCS Experimental Hutch
Transport Tunnel
FEH Hutch 4
21
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Conceptual Design of the XCS Diffractometer System
Transport Tunnel
FEH Hutch 4
22
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
• Movable Diffractometer Base
FEH Hutch 4
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Possibility to completely remove diffractometer from IP’s
Solid Granite Base, airpad motion, floor insert
Access 3 positions (IP1, IP2, Park)
Guiding rail on the side
back at orig. position with repeatability ± 0.5mm
23
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
• Alignment of the axis of rotations with beam [XX]
FEH Hutch 4
– Fine correction provided by Horiz. Trans [XX]
• ±40mm ; Repeatability 1 μm
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Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
• Local Detector : Aid sample alignment [2θ,γ,R, Yd]
FEH Hutch 4
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[2θ]
±160° Resolution < 1 arcsec
[γ]
±5° Resolution < 1 arcsec
[R] manual radius change 200mm range
[Yd] vertical adj. range>200mm with repeatability 1μm
Local detector maximum weight : 10kg (e.g. diode + slits)
25
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
• Sample Precise Rotation : [2θ]
FEH Hutch 4
– 360° range of motion
– Repeatability < 1 arcsec
– Stability :6 arcsec/hr
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Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
• Central Elevator [YY]
FEH Hutch 4
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To position vertically the CoR of the diffractometer in the beam
Range +50/-100mm
Repeatability < ±2 μm
“super compact” : included in the rotations
27
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
• Sample Tilts [χ,φ]
FEH Hutch 4
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Crystallographic tilts for the sample
Range ±5°
Repeatability better than 3 arcsec
Stability : 6 arcsec/hr
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Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
• Sample Translation [X,Z,Y]
FEH Hutch 4
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Precise position of the sample in the center of rotation
Range > ± 10mm
Repeatability better than 1μm
Stability better than 1μm/hr
>250 x250mm top surface
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Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
• Additional Requirements
FEH Hutch 4
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Maximum load : 50kg
Sphere of confusion : 70μm
Distance top platform to Tilts CoR >200mm
Operation in both the CXI and XCS beamline
30
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Transport Tunnel
FEH Hutch 4
31
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Engineering Specifications
32
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
Acquisition Strategy
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The complete XCS Diffractometer System will be procured as
a design/build contract.
Identical procedure to the XPP Sample Goniometer
To sole or not to sole source…
• Current plan is to go out for bid
• However, similar purchases at the lab have been sole
sourced
33
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
Status of Discussions with Vendors
• Vendor Discussions
• Huber (via Blake Industries)
– Sent the PRD & design study to Huber for a preliminary quote for budget
planning
– Received quotation - $ 517k
– Very positive discussions
• Kohzu
– Discussed the system in person with Chief R & D Engineer
– Will not bid on the system
• Aerotech
– Discussed the system in person with applications engineer
– Interested in bidding on system
• No discussions with other possible vendors
• ADC – do not expect to compete since they purchase most goniometer
components from Huber
34
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
Procurement Specification
35
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer Schedule
award K$ design
duration
mnths days
Diffractometer
hours
Diffractometer RFQ document / package prep
pre-bid BIS prep
1.25
25
RFQ to vendors
0
0
vendor quote prep and response
1.5
30
vendor selection
0
0
post-bid BIS document prep
1.25
25
AWARD Diffractometer
0
0
474
Diffractometer vendor design-fab (phase 1)
3.3
66
preliminary status review (30%)
0
0
Diffractometer vendor fab (phase 2)
4.4
88
final status review (70%)
0
0
Diffractoometer vendor fab-tst-ship (phase 3)
3.3
66
SLAC review approved vendor site tests
0.25
5
vendor ship Diffractometer
0.75
15
RFI diffractometer system
0
0
Floor final design
1
160
Floor FDR
0
Floor documentation
0.75
80
Floor fabrication
5
80
alignment fixtures preliminary design
2
10
alignment fixtures final design
1
20
alignment fixtures documentation
0.5
20
alignment fixtures fabrication
5
10
cable management final design
1
40
cable management documentation
0.5
20
cable management fabrication
3.5
5
component lifting, storage fixtures preliminary - final design documentation
0.75
40
component lifting, storage fixtures fabrication
1.5
5
950
eng / design
BIS / purchasing
vendor / fab
engineer
hours
20
Apr-09
May-09
May-09
Jun-09
Jul-09
Aug-09
Sep-09
Oct-09
Nov-09
Dec-09
Jan-10
Feb-10
Mar-10
Apr-10
May-10
Jun-10
Jul-10
Aug-10
Sep-10
20
80
20
540
• Possible advanced schedule
• Must re-baseline P3 schedule to validate advanced schedule
36
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS
XCS Diffractometer System
• Vendor Selection Criteria : identical to XPP procurements
Criteria
Max
Excellent
Good
Fair
Poor
Unacceptable
Compliance with technical requirements
& specifications
45
40-45
30-39
20-29
11-19
0-10
Personnel, experience, facilities
25
22-25
16-21
11-15
5-10
0-4
Delivery and milestone schedule
10
9-10
7-8
4-6
2-3
0-1
Quality Plan
10
9-10
7-8
4-6
2-3
0-1
Cost
10
9-10
7-8
4-6
2-3
0-1
Excellent -
Good Fair Poor Unacceptable -
Comprehensive and completer; meets or exceeds all requirements; exemplifies
complete understanding of the requirements; and demonstrates in detail how to
accomplish task
Generally meets or exceeds requirements; omissions are of minor consequence or
small; would be likely to produce an acceptable end item
Omissions are of significance, but are correctable; substantiation of points is weak or
lacking; probability of successful effort is marginal
Gross omissions; failure to understand problem areas; failure to respond to
requirements; little or no chance of success in completing the end item
Does not meet the specifications
37
Aymeric ROBERT
aymeric@slac.stanford.edu
XCS