Coherent X-ray Imaging Instrument Sébastien Boutet CXI Instrument Scientist June 3, 2009
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Coherent X-ray Imaging Instrument Sébastien Boutet CXI Instrument Scientist June 3, 2009 Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 1 1 Sébastien Boutet sboutet@slac.stanford.edu Outline CXI Science CXI Goals and Physics Requirements CXI Instrument Overview X-ray Optics and Diagnostics KB Mirror Systems Sample Environments Detector Operating Modes Work Breakdown Structure Early Science Instrument Scope Preliminary Instrument Design Review Summary Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 2 2 Sébastien Boutet sboutet@slac.stanford.edu Science Team Specifications and instrument concept developed with the science team. The CXI team leaders Janos Hajdu, Uppsala University (leader) Henry Chapman, DESY, University of Hamburg John Miao, UCLA Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 3 3 Sébastien Boutet sboutet@slac.stanford.edu Coherent Diffractive Imaging of Biomolecules One pulse, one measurement Particle injection LCLS pulse Noisy diffraction pattern Wavefront sensor or second detector Combine many measurements into 3D dataset Data Frames Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 Combined Data Set 4 4 Reconstruction Sébastien Boutet sboutet@slac.stanford.edu Coherent X-ray Imaging Science 3D bio imaging beyond the damage limit Single injected reproducible biomolecules that can’t be crystallized Protein molecule injection Proteins Membrane Proteins Viruses Molecular complexes Molecular machines Biomolecular structure determination from nanocrystals No need for large high quality crystals LCLS detector 2D bio imaging beyond the damage limit detector Live hydrated cells with particle injector Nanoparticles Quantum dots Amorphous nanoparticles To mass spectrometer High fluence X-ray-matter interactions Damage studies during the pulse Effect of tamper layers on damage X-ray diffraction pattern Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 5 5 Sébastien Boutet sboutet@slac.stanford.edu CXI Instrument Goals/Requirements Goals Perform imaging of single particles at highest spatial resolution achievable using single LCLS pulses Image biological nanoparticles beyond the classical damage limit using single LCLS pulses Global Requirements (SP-391-000-19) Tailor and characterize X-ray beam parameters Spatial Profile Intensity Repetition rate Deliver the sample to the beam and control its environment Key Performance Parameters 4-20 keV energy range Using the fundamental and third harmonic Set by LCLS beam Particle Injector 50-500 nm size range Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 6 6 Sébastien Boutet sboutet@slac.stanford.edu CXI Instrument Location Near Experimental Hall AMO SXR X-ray Transport Tunnel XPP XCS CXI Endstation Source to Sample distance : ~ 440 m Far Experimental Hall Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 7 7 Sébastien Boutet sboutet@slac.stanford.edu Far Experimental Hall CXI Control Room XCS Control Room Lab Area Hutch #6 X-ray Correlation Spectroscopy Instrument Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 Coherent X-ray Imaging Instrument 8 8 Sébastien Boutet sboutet@slac.stanford.edu CXI Instrument Overview Guard Slits Requirement Diagnostics Device XRT Photon Shutter Remove X-ray beam halo X-ray Guard Slits Attenuators Tailor X-ray intensity Attenuators Pulse Picker Tailor X-ray repetition rate Pulse Picker Reference Laser Characterize X-ray pulse intensity Intensity Monitor Guard Slits Characterize X-ray spatial profile Profile Monitor Diagnostics Characterize X-ray focus Wavefront Monitor Align experiment without X-ray beam Reference Laser Maximize X-ray flux on sample Tailor focal spot size to the sample 1 micron Kirkpatrick-Baez Mirrors 0.1 micron Kirkpatrick-Baez Mirrors Minimize air scatter and background Position sample and final apertures Sample environment Position sample environment Instrument Stand Deliver particles to the X-ray beam in Particle Injector Measure X-ray scattering pattern 2D X-ray Detector (Utilizing the LCLS Detector) Position X-ray area detector Detector Stage Analysis of sample fragments after Coulomb explosion Ion Time-of-Flight Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 9 9 Sébastien Boutet sboutet@slac.stanford.edu CXI Instrument Overview Particle injector Detector Stage (upstream position) Sample Chamber Detector Stage (back position) Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 Precision Instrument Stand 10 10 Sébastien Boutet sboutet@slac.stanford.edu X-ray Optics and Diagnostics Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 Requirement Device Remove X-ray beam halo X-ray Guard Slits Tailor X-ray intensity Attenuators Tailor X-ray repetition rate Pulse Picker Characterize X-ray pulse intensity Intensity Monitor Characterize X-ray spatial profile Profile Monitor Characterize X-ray focus Wavefront Monitor 11 11 Sébastien Boutet sboutet@slac.stanford.edu X-ray Optics and Diagnostics Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage LUSI Attenuator\Pulse Picker System Excellent Optical Quality > 3 steps per decade of attenuation above 6 keV > 1012 attenuation < 17 keV Isolate 3rd harmonic from fundamental Tailor rep rate up to 10 Hz Wavefront Monitor Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 12 12 Sébastien Boutet sboutet@slac.stanford.edu Reference Laser Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Purpose Rough alignment of the experiment without the X-ray beam Requirements On/Off states Beam size Smallest possible at the end of the hutch Stability 5% of FWHM (short term) 15% of FWHM (long term) Useable with any part of the instrument vented to air Window valves Wavefront Monitor Aligned to the unfocused FEL beam to within 100 microns Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 13 13 Sébastien Boutet sboutet@slac.stanford.edu CXI 1 µm KB Mirrors Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Purpose Produce a 1 µm focus Focal lengths 8.2 m for M1 7.8 m for M2 Requirements 350 mm clear aperture 3.4 mrad maximum incidence angle SiC coating <1 nm rms height error over entire mirror 2-11 keV energy range Space for 2 coating strips Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 14 14 Sébastien Boutet sboutet@slac.stanford.edu CXI 1 µm Sample Environment Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Purpose Position samples on grids and apertures Maintain high vacuum Requirements Accommodate multiple experiments configurations Fixed targets Injected particles Interface with Detector Stage downstream and upstream Ports for Particle Injector Ion TOF Lasers Vacuum better than 10-7 torr Rapid access Large volume for flexibility Compatible only with 1 micron KB System Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 15 15 Sébastien Boutet sboutet@slac.stanford.edu CXI 0.1 µm KB Mirrors/Sample Environment Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Purpose Produce a ~100 nm focus Focal lengths 0.9 m for M1 0.5 m for M2 Requirements Identical to 1 micron KB System in every way except for the mirror curvature Integrated system with 0.1 micron Sample Chamber due to close proximity Extend vacuum enclosure by ~600 mm for sample area Separate both parts of the vacuum enclosure with valve and window Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 16 16 Sébastien Boutet sboutet@slac.stanford.edu CXI Particle Injector Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 Purpose Deliver support-free single particles to the LCLS beam Requirements < 250 microns Particle beam focus > 50 % Transmission 10 mm XZ Translation 10 – 1000 nm Particle size range Aerodynamic lens Stack of concentric orifices with decreasing openings. Particle beam diagnostics Charge detectors Particle beam viewer 17 17 Sébastien Boutet sboutet@slac.stanford.edu CXI Ion TOF Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Purpose Detect ions produced by exploding sample Provide a veto trigger signal when a particle was hit by the beam Identify unwanted particles Requirements 1 Atomic Mass Unit resolution Up to 100 AMU detection 1 GHz digitization Does not interfere with imaging detector Design based on AMO Ion Spectrometer Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 18 18 Sébastien Boutet sboutet@slac.stanford.edu CXI Detector Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Collaboration with the Gruner Group at Cornell University Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 2D Pixel Array Detector High resistivity Silicon (500 µm) for direct x-ray conversion. Reverse biased for full depletion. Bump-bonding connection to CMOS ASIC. <1 photon readout noise 110x110 µm2 pixels 1520x1520 pixels 103 dynamic range 120 Hz readout Tiled detector, permits variable ‘hole’ size Detector not in CXI LUSI scope Part of LCLS Project scope 19 19 Sébastien Boutet sboutet@slac.stanford.edu CXI Detector Stage Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits FEH Hutch 5 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 Purpose Center the detector hole on the direct beam Position the detector at the appropriate distance from the interaction region Requirements Range along the beam : 50-2400 mm Non-continuous Vacuum better than 10-7 torr Diagnostics behind the detector for alignment Valve to isolate the detector vacuum Short term stability 1 micron 10 µrad (pitch/yaw) 20 20 Sébastien Boutet sboutet@slac.stanford.edu Operating Modes Photon operating modes described in LCLS Document 1.6.009 CXI operation requires SH1, SH2 and S5 open CXI has three modes: “1 micron” Mode Use 1 micron KB mirrors and 1 micron Sample Environment “0.1 micron” Mode Use 0.1 micron KB mirrors and 0.1 micron Sample Environment “Unfocused” Mode No focusing optic and 1 micron Sample Environment Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 21 21 Sébastien Boutet sboutet@slac.stanford.edu CXI with 1 micron and Unfocused Beam Diagnostics/ Common Optics Diagnostics & Wavefront Monitor 1 micron Sample Environment 1 micron KB Reference Laser Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 22 22 Sébastien Boutet sboutet@slac.stanford.edu CXI with 0.1 micron Beam Diagnostics/ Common Optics Wavefront Monitor 0.1 micron KB & Sample Environment 1 micron KB Reference Laser Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 23 23 Sébastien Boutet sboutet@slac.stanford.edu Work Breakdown Structure WBS Scope/Cost Includes: 1.3.1 CXI System Integration & Design 1.3.2 CXI X-ray Optics - 2 KB mirror systems 1.3.3 CXI Lasers - Reference Laser 1.3.4 CXI Coherent Imaging Injector 1.3.5 CXI Sample Environment – 2 Sample Chambers, 2 Stands, Detector Stage & Sample diagnostics 1.3.6 CXI Hutch Facilities 1.3.7 CXI Vacuum system 1.3.8 CXI Installation Other Related WBS 1.5 Diagnostics & Common Optics 1.6 Controls and Data Acquisition LCLS Cornell 2D Pixel Array Detector Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 24 24 Sébastien Boutet sboutet@slac.stanford.edu Scope Early Science Scope (available 2011) CD 4 (available in 2012 or before) 1 micron KB System 0.1 micron KB System 1 micron Sample Chamber 0.1 micron Sample Chamber 1 micron Instrument Stand 0.1 micron Instrument Stand Detector Stage Particle Injector Reference Laser Ion TOF X-ray Slits X-ray Attenuator/Pulse Picker X-ray Diagnostics X-ray Optics and Diagnostics Support Stands Vacuum System Controls & Data Systems Hutch Facilities X-ray Detector System Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 25 25 Sébastien Boutet sboutet@slac.stanford.edu Preliminary Instrument Design Review Design review held on December 4, 2007 PIDR Committee Members John Arthur (LCLS) Chris Jacobsen (Stony Brook) Stefano Marchesini (LLNL) Michael Soltis (SLAC, SSRL) Quotes from Report “The committee found the preliminary design well thought out, and the proposed design viable. The design appears to be appropriately flexible and applicable to a wide range of diffraction-imaging science.” “The committee recommends that the experimental team move forward with the design leading to a Final Design Review, taking into account the comments and recommendations enumerated below.” Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 26 26 Sébastien Boutet sboutet@slac.stanford.edu Preliminary Instrument Design Review (2) PIDR Recommendation Post Review Resolutions 1. The instrument utility depends on the performance of the focusing system, which plans to utilize KB mirrors. At this point it is not certain whether the required focus efficiency and wavefront preservation can be achieved. It is recommended that LUSI actively collaborate with one of the leading KB mirror development programs, so as to better understand the state of the art and minimize risk in this area. The CXI team has been in communication with the Osaka group and the JTEC company for months about the KB mirrors. The contact person for these groups has come to SLAC for 2 days of discussions. The CXI team has also contacted 9 potential vendors to discuss the specifications for the mirrors and how they relate to their capabilities and the state of the art.. A mirror vendor with proven capabilities has been selected. 2. In addition to KB mirrors, this instrument plans to use Be lenses for focusing. At this time it appears that lenses with the desired focal length are not readily available. The CXI team needs to pursue this issue with the lens vendor, to be certain that the desired lenses can be procured The Be lenses have been removed from the scope of the instrument since the review. The removal from the scope has no impact on any of the other components in the CXI system. Contingency became available and Be lenses were put back into the CXI scope. Lenses with the required focal length do exist and this was confirmed during discussions with the vendor. 3. The range of applicability of the Cornell detector is still being decided. This has the consequence that some detector specifications, such as the diameter of the central hole, are not yet determined. The CXI team needs to finalize the application-driven specifications for the detector soon. The CXI team should investigate the possibility of a detector scaffold that would allow for a variable central hole. The specifications of the Cornell detector were somewhat fixed many years ago by the LCLS construction project when they signed the MOU with Cornell. Therefore, there is limited freedom to modify these specifications at this point in the project. However, the Physics Requirements Document for the detector (LCLS PRD # 1.6-002) was updated and the CXI team believes the specifications are sufficient to allow interesting science to be accomplished. The main issue with the detector is the small number of pixels and the CXI team was successful in convincing Cornell and LCLS to build a mechanical framework that easily allows for future expansion of the tiled system to increase the number of pixels. This framework also allows the detector hole size to be varied from 1 to 10 mm. The mechanical design of the variable detector hole is almost complete and fabrication will start soon. It is expected that the yield on the Cornell chips will be high enough that the full detector can be populated, producing a detector with 1500x1500 pixels instead of 750x750. Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 27 27 Updated Resolutions Sébastien Boutet sboutet@slac.stanford.edu Preliminary Instrument Design Review (3) PIDR Recommendation Post Review Resolutions Updated Resolutions 4. Analysis of the experimental data will be affected by the quality of the X-ray focal spot, so a reliable technique for determining X-ray wave shape at the focus needs to be developed. Two concepts were presented during the review, but it is not yet clear if either concept will work for CXI. Since this is an issue common to other LCLS experiments and experiments at other XFELs, it is recommended that LUSI collaborate with other XFEL groups in R&D in this area. LUSI will first of all build a wavefront monitor that will constitute a prototype diffractive imaging wavefront sensor. Since LUSI is not allowed to perform R&D, no formal collaboration exists to test the wavefront sensor concepts. However, informally, the CXI scientist and the DCO scientists are involved in writing proposal to use the beam in the AMO hutch to test wavefront sensor techniques in collaboration with other groups from LLNL, SPRING8 and DESY who have previous experience with such devices at longer wavelengths. The hope is to perform experiments at LCLS with the soft X-ray beam in the second half of 2009, if the proposal is approved of course Beamtime for testing wavefront sensing techniques is planned during the early commissioning of AMO. 5. The current concept for an experimental chamber stresses flexibility, with lots of access ports and valves. The committee approves of this flexible approach, since it is not yet clear exactly which types of imaging experiments will prove most suited to LCLS. After some experience is obtained, a more specialized second-generation chamber may be desired. Since this review, the LUSI project has made the decision to build 2 CXI chambers, with the first to be delivered earlier. It is hoped that some lessons can be learned from experiments with the first chamber to improve the second chamber. Also, very similar experiments are being proposed to use the soft x-ray beam focused by the AMO KB mirrors into a rollup chamber located in hutch 2. Information from these experiments, in which the CXI scientist is involved, will be used to improve the design of the second CXI chamber as well. Again, this is dependent on the approval of the proposal for beamtime by the LCLS proposal review panel. No change. Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 28 28 Sébastien Boutet sboutet@slac.stanford.edu Preliminary Instrument Design Review (4) PIDR Recommendation 6. The committee feels that in the near term, a scientifically-productive use of the CXI station could be for performing crystallography using sub-micrometer-sized crystals. The CXI team should examine the needs of such experiments, in particular detector and sample holder needs, and make sure that a proof-of-principal experiment could be accommodated by the near-term instrument design Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 Post Review Resolutions Updated Resolutions The CXI team believes that some nanocrystals can be mounted on grids into vacuum. Some nanocrystals can tolerate the vacuum environment without damage and these would be ideal candidates for proof-of-principle experiments. Also, the particle injector could be used to deliver these nanocrystals although this is not the preferred method for a demonstration of the technique. The main limitation to such experiments with nanocrystals is the number of pixels on the detector. If we assume that we want on the order of 10 pixels between each Bragg peak, then only 38 diffraction orders can be resolved with the 760x760 pixel detector. The detector allows a resolution of 0.2 nm which means the largest unit cell that can be resolved is 7.6 nm. This is sufficient for small proteins. The expandability of the detector will allow us to increase the number of pixels to 1500x1500 pixels which will increase the maximum unit cell that one can image. As a comparison, typical protein crystallography beamlines use detectors with 4000x4000 pixels which means the CXI instrument will at the beginning have the capability to solve the structure of proteins that are 20% of the size of what can be done with large crystals. With the detector upgrade, this will be pushed to 40%. The larger detector will likely become a reality. Also, the CXI team is involved with an approved experiment looking at nanocrystals on the AMO beamline at the end of 2009. 29 29 Sébastien Boutet sboutet@slac.stanford.edu Preliminary Instrument Design Review (5) PIDR Recommendation Post Review Resolutions Updated Resolutions 7. It is likely that X-ray beam time for the CXI instrument will be very limited. Therefore, it is important for this instrument to support as much off-line setup, testing, and diagnostic work as possible. Off-line analysis of the sample delivery system and sample quality, for example, should be used to avoid unproductive beam time. Moreover, automation should be employed where possible (i.e. for changing micro-crystal samples). The CXI team should decide which offline diagnostics would be most effective for this instrument, and include them. In addition, the team should study the user interactions and data flow at synchrotron crystallography facilities, to better enhance the user-friendliness of the CXI instrument. No off-line diagnostics are currently in the scope of LUSI for the CXI instrument. The instrument does however include the capabilities for offline alignment of the beamline. As far as off-line diagnostics are concerned, some scope additions are already being considered should contingency money become available. One such addition is a desorption-ionization laser which allows the particle injector to be optimized without the LCLS beam. The LUSI team will be looking for every opportunity to add equipment that will allow for more efficient use of the LCLS beam and will be working closely with the LCLS operations organization for these possible additions. The CXI team is planning to visit protein crystallography beamlines at SSRL to study the user-friendliness of these beamlines and learn from them. The CXI team has been interacting with users on software and userinterface issues. Also, LCLS is planning to hire a scientific data coordinator to oversee all data analysis issues. Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 30 30 Sébastien Boutet sboutet@slac.stanford.edu Summary Instrument accommodates a wide variety of cutting edge research capabilities and fulfills the CD-0 mission The CXI instrument is versatile: X-ray optics can tailor FEL parameters for users Sample environment can accommodate multiple experimental configurations User operation start planned for 2011 First call for proposals Spring 2010 CXI 2nd Scientist Position Opened CXI Website: http://lcls.slac.stanford.edu/cxi/ Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 31 31 Sébastien Boutet sboutet@slac.stanford.edu Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 32 32 Sébastien Boutet sboutet@slac.stanford.edu Assembly with Positioning Plate Removed Modular design Cross-roller rails support positioning plate and provides low-friction, repeatable motion Allows for addition of tiles in the future Torque ring rotates to translate Quadrant Rafts and change aperture size Initial detector 8 modules Variable hole size Martin Nordby & Matthew Swift Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 33 33 Sébastien Boutet sboutet@slac.stanford.edu Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 34 34 Sébastien Boutet sboutet@slac.stanford.edu Front View—1 mm Aperture Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 35 35 Sébastien Boutet sboutet@slac.stanford.edu Front View—6 mm Aperture Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 36 36 Sébastien Boutet sboutet@slac.stanford.edu Front View—10 mm Aperture Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 37 37 Sébastien Boutet sboutet@slac.stanford.edu Back View with Base Plate Removed—1 mm Aperture Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 38 38 Sébastien Boutet sboutet@slac.stanford.edu Back View with Base Plate Removed—6 mm Aperture Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 39 39 Sébastien Boutet sboutet@slac.stanford.edu Back View with Base Plate Removed—10 mm Aperture Coherent X-ray Imaging Instrument Final Instrument Design Review, June 3 2009 40 40 Sébastien Boutet sboutet@slac.stanford.edu