X Ray Beam
Characterization
Richard M. Bionta
Facility Advisory Committee Meeting
April 30, 2004
LCLS Commissioning
Measuring Gain vs z.
Kick beam at z to stop FEL gain
Measure at end of undulator
Measure Spectra with resolution < r = 5-15x10-4
But with bandwidth of 0.5%
Pulse length
…
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
FEL beam power level calculations
FEL r parameter
 K  p wF1K 
r


8



c

2




Psat  1.6  r  LG1D
Saturated
power
2/3
L
G 3D
Gain length parameterization
L
L
G1 D

G 3D
fa1 d

d

1
1 
Plasma
frequency
f
a2
a4
a6
a8 a9
a11 a12
a14 a15
a17 a18 a19
a3  a5  a7   a10 d

a13 d

a16 d


L
L
G1D
Rayleigh
April 29, 2004
X-Ray Beam Characterization
 4   
 L
  
G1 D

f
FEL
n



4    LG1D  e
 E
w
Photon
Richard M. Bionta
bionta1@llnl.gov
LCLS Spectral Output
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Model FEL beam propagation as a singlemode gaussian
FEL modeled as a Gaussian beam in optics
0  t  233  fs
1 ix 2  y
x 2 y

k





i



t

k

z



z0
w
2
2
E  x, y , z , t   p  2
e
 e w z   e R  z 
w0  k  2  i  ( z  z0)
2
2
0
Phase curvature function
Gaussian width wz  
4
2
1 w0  k  4   z  z0 
Rz   
4
 z  z0   k
4
2
w0  k  4   z  z 0 
w0  k
2
2
z0  z Exit  LRayleigh 
p
Amplitude is given in terms of saturated power level
X-Ray Beam Characterization
w0  2   e
Gaussian waist
Origin is one Rayleigh length in front of undulator exit
April 29, 2004
2
2
 4
P
sat
   w 
2
0
Richard M. Bionta
bionta1@llnl.gov
0
0

Check Gaussian with Ginger: A numerical FEL
simulation
Data in the form of
N  768  3  2
8
radial distributions
of complex numbers
representing the
envelope of the
Electric Field at the
undulator exit.
Each radial distribution has
NR  47
radial points.
t  i  t
i  1..N
0
150
Electric Field Envelope Power Density vs time
at R = 0
Samples are separated in time by
n  16
R, mm
Time between samples is
t 
watts/cm2
wavelengths.
n
c
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
l= 0.15 nm
Time Domain
FEL Photon Spectra
rms BW (%)
rms BW (%) vs wavelength
(nm)
0.40
0.30
0.20
0.10
0.00
0.0
l= 0.15 nm
Frequency Domain
1.0
wavelength (nm)
0.8% E/E
Power Density
watts
x 1017
c m2
3
0
w0 - 50 / fs
April 29, 2004
w0 = 12558 /fs
frequency
X-Ray Beam Characterization
w0 + 50 /fs
Richard M. Bionta
bionta1@llnl.gov
2.0
FEL spatial FWHM downstream of undulator exit, l = 0.15 nm
Transverse beam profile at
undulator exit
FWHM vs. z at l = 0.15 nm
500
Transverse beam profile
15 m downstream of
undulator exit
FWHM, microns
400
300
Ginger
(points)
200
Gaussian Beam
(line)
100
0
0
100
200
distance from undulator exit, meters
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
300
Ultimate output power uncertain
Total FEL Power
35.00
•10 Ginger simulations were run at
different electron energies but with
fixed electron emittance through 100
meter LCLS undulator.
30.00
Giga-Watts
Ginger simulations
25.00
•The Ginger runs at the longer
wavelengths were not optimized,
resulting in significant postsaturation effects. Results at longer
wavelengths carry greater
uncertanty.
20.00
Theoretical FEL
saturation level
15.00
10.00
5.00
0.00
0.00
0.50
1.00
1.50
2.00
wavelength, nm
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Front End Enclosure/
Hutch 1 Layout
NEH Hutch 1
PPS
Access
Shaft
Access
Shaft
4'
Muon
shield
PPS
Spectrometer,
Total Energy
Solid
Attenuator
Direct Imager
Indirect Imager
Slit A
Slit B
Photon
Beam
PPS
Fast
close
valve
Electron
Beam
April 29, 2004
X-Ray Beam Characterization
13'
Muon
shield
Windowless
Ion
Chamber
Gas Attenuator
Front End Enclosure
Electron Dump
Richard M. Bionta
bionta1@llnl.gov
Diagnostics Commissioning
Ion
Chamber
Gas Attenuator
Slits
Solid
Attenuator
Slits
Direct
Imager
Total energy
Indirect
Imager
Start with Low Power Spontaneous
Saturate DI, measure linearity with solid
attenuators
Raise power, Measure linearity of Calorimeter and
Indirect imager. Cross calibrate
Test Gas Attenuator
Raise Power, Look for FEL
in DI, switch to Indirect Imager when attenuator
burns
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Spontaneous radiation is a big background
0 < Ephoton < 1.2
400 keV < Ephoton < 1.2
MeV
MeV
Far-field radiation pattern calculated by R. Tatchyn 400 m from undulator exit.
http://www-ssrl.slac.stanford.edu/lcls/x-rayoptics/documents/
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
FEE Layout
Solid
Attenuator
Slit B
Gas Attenuator
PPS
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Windowless Gas Attenuator – 10 m system
Gas Inlet
Window
Region of highest pressure
Vacuum pumps
Photon
Energy eV
800
8260
April 29, 2004
X-Ray Beam Characterization
Vacuum pumps
Gas
N
Ar
Pressure, torr Transmission
1.65
10
10-4
0.2
Richard M. Bionta
bionta1@llnl.gov
Gas Attenuator – Windows
Photon Energy eV
FEL FWHM mm
800
8260
1.252
0.176
Open, tilted, nozzle
High gas flow
Rotating slots
Synchronization
Plasma Window
Gas flow
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Z = 90 m
Gaussian Model Layout Code
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Gas Attenuator Issues
Beam size
Window
Blocking Spontaneous
Gas delivery and recovery in FEE tunnel
Physics instrumentation ( 1st experiment)
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Solid Attenuator
Be, Li, and B4C attenuators
can tolerate FEL beam at E > 23 keV
Linear/log configurations
Multiple wheels allowing
multiple configurations
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Solid Attenuator - Issues
Contamination of low Z attenuators
Damage and ES&H from damaged Be
Bleaching
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
NEH Hutch 1 Diagnostic systems
Windowless
Ion
Chamber
Imaging
Detector
Tank
April 29, 2004
X-Ray Beam Characterization
Comissioning
Tank
Richard M. Bionta
bionta1@llnl.gov
Imaging Detector Tank
Be
Isolation
valve
Direct Imager
Indirect
Imager
Space
for
calorimeter












Turbo pump
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Prototype Low Power imaging camera
CCD
Camera
Microscope
Objective
X-ray beam
LSO or YAG:Ce crystal prism assembly
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Photon Monte Carlo Simulations for predicting
backgrounds and detector
LSO
performance (at SPEAR)
4,000
3,000
Y, microns
2,000
Monte
Carlo
1,000
0
-1,000
Bend
-2,000
LSO25 Exit Z
-3,000
-4,000
450
-5,000
400
-4,000
-2,000
0
2,000
8,000
4,000
350
6,000
300
X, microns
4,000
250
200
X Ray Photons
150
SPEAR source
simulation
2,000
0
100
-2,000
50
-4,000
0
0
10
20
30
40
-6,000
-8,000
-10,000
-10,000
-5,000
0
8,000
6,000
4,000
2,000
0
Visible photons
-2,000
-4,000
-6,000
-8,000
April 29, 2004
X-Ray Beam Characterization
-10,000
-10,000
-5,000
0
5,000
Richard M. Bionta
bionta1@llnl.gov
5,000
Simulation to predict performance at LCLS
Far-field
Spontanious
Distribution
Undulator
Optics
Predict spectrum and spatial distribution in plane of camera
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
First check CCD by measuring Response Equation Coefficients
d r ,c  G  (Qr ,c  Lr ,c  DC r ,c )  t  Pr ,c
d r ,c
G
Digitized gray level of pixel in row r, column c.
Electronic gain in units grays/photo electron.
Lr ,c   QE ( )   r ,c ( )  d
Qr ,c
Pixel Sensitivity non-uniformity correction.
DC r ,c
Pr ,c
Signal in units photo electrons.
Pixel Dark Current in units photo electrons/msec.
Pixel fixed-pattern in units grays.
t
Integration time in units msec.
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Photon Transfer Curve
2
2
 r ,c (t )  G  dr ,c (t )   Readout  G  Pr ,c 
d r ,c (t ) 

2
r ,c
(t ) 
1
N pixels
  d r ,c (t )
r ,c
1
N pixels  1
April 29, 2004
X-Ray Beam Characterization
Temporal mean gray level of
pixel r,c.
  d r ,c (t )  d r ,c (t )
2
r ,c
Temporal gray level
fluctuations of pixel r,c.
Richard M. Bionta
bionta1@llnl.gov
Calibration Data for one pixel
d r ,c  G  (Qr ,c  Lr ,c  DC r ,c )  t  Pr ,c
Mean gray vs. time
70000
60000
Mean Gray
50000
40000
30000
20000
10000
0
 2 r ,c (t )  G  dr ,c (t )   2 Readout  G  Pr ,c 
0
1000
2000
3000
4000
5000
6000
7000
time, milliseconds
Sigma Squared Vs. Mean
Sigma Squared
12000
10000
8000
6000
4000
2000
0
0
10000 20000 30000 40000 50000 60000 70000
Mean gray
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Calibration Coefficients for All Pixels
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Direct Imager Version 1 efficiency
CCD pixel size, microns
Objective power
Object Pixel Size
Object FOV, mm
Scintillator material
Central Wavelength (nm)
Scintillator Thickness, microns
Visible Photons/8 KeV interaction
Solid angle efficiency %
glue scintillator interface efficiency %
prism glue interface efficiency %
prism transmission efficiency %
mirror reflection efficiency %
Objective transmission efficiency %
CCD Quantum Deficiency %
Photo electrons/interacting x-ray
Photosn/Gray
Scintillator efficiency %
Time to fill well at SSRL bend, minutes
Attenuation needed at LCLS to fill well
April 29, 2004
X-Ray Beam Characterization
24
2.5
9.6
10
LSO
415
100
248
0.05
99.8
98.5
100
94
99.7
62.4
0.068
74
100
3.1
2.E-04
24
2.5
9.6
10
LSO
415
50
248
0.05
99.8
98.5
100
94
99.7
62.4
0.068
74
98.4
3.2
2.E-04
24
2.5
9.6
10
LSO
415
25
248
0.05
99.8
98.5
100
94
99.7
62.4
0.068
74
87.2
3.6
2.E-04
24
2.5
9.6
10
YAG
526
100
66
0.05
99.8
98.5
100
97.8
99.9
71.3
0.021
238
94.6
10
6.E-04
24
20
1.2
1
LSO
415
100
248
0.7
100
98.5
100
94
99.7
62.4
0.955
5
100
14
7.E-04
24
20
1.2
1
LSO
415
50
248
0.7
100
98.5
100
94
99.7
62.4
0.955
5
98.4
14
8.E-04
Richard M. Bionta
bionta1@llnl.gov
24
20
1.2
1
LSO
415
25
248
0.7
100
98.5
100
94
99.7
62.4
0.955
5
87.2
16
9.E-04
24
20
1.2
1
YAG
526
100
66
0.7
100
98.5
100
97.8
99.9
71.3
0.304
16
94.6
47
2.E-03
Camera Sensitivity Measurements at SPEAR 10-2
Ion chamber
attenuator
Imaging camera
Horizontal
Photon Rate at Camera
Vertical
1.40E+12
1.30E+12
1.20E+12
1.10E+12
#Photons/Sec
1.00E+12
Ion Chamber
Photon rate
Sum of gray levels
9.00E+11
8.00E+11
7.00E+11
6.00E+11
5.00E+11
4.00E+11
3.00E+11
2.00E+11
1.00E+11
0.00E+00
<----10 mm----->
April 29, 2004
X-Ray Beam Characterization
0.000E+00
1.000E+10
2.000E+10
3.000E+10
Sum-of-Greys/Second
Richard M. Bionta
bionta1@llnl.gov
Measured and predicted sensitivities in
fair agreement
Photons/gray
Measured and Predicted Sensitivity
180
160
140
120
100
80
60
40
20
0
Pred Ver 1
Meas Ver 1
Meas Ver 2
Pred Ver 2
0
10000
20000
30000
Photon Energy, eV
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Camera Resolution Model
Source
Dobj
Dimg Objective
Crystal
Rdiffract
Rdepth
SPEARBend
SPEARBend
SPEARBend
SPEARBend
SPEARBend
SPEARBend
18.670
18.670
18.670
18.670
18.670
18.670
0.050
0.050
0.050
0.050
0.050
0.050
SPEARBend
SPEARBend
SPEARBend
SPEARBend
SPEARBend
SPEARBend
18.670
18.670
18.670
18.670
18.670
18.670
SPEARBend
SPEARBend
SPEARBend
SPEARBend
SPEARBend
SPEARBend
18.670
18.670
18.670
18.670
18.670
18.670
20x
20x
20x
20x
20x
20x
YAG100
LSO100
LSO50
LSO25
YAG20
YAG5
3.1
2.5
2.5
2.5
3.1
3.1
8.4
8.4
4.2
2.1
1.7
0.4
2.1
2.1
2.1
2.1
2.1
2.1
0.050
0.050
0.050
0.050
0.050
0.050
2.5x Zeiss
2.5x Zeiss
2.5x Zeiss
2.5x Zeiss
2.5x Zeiss
2.5x Zeiss
YAG100
LSO100
LSO50
LSO25
YAG20
YAG5
9.6
7.5
7.5
7.5
9.6
9.6
2.8
2.8
1.4
0.7
0.6
0.1
0.050
0.050
0.050
0.050
0.050
0.050
5x Zeiss
5x Zeiss
5x Zeiss
5x Zeiss
5x Zeiss
5x Zeiss
YAG100
LSO100
LSO50
LSO25
YAG20
YAG5
3.8
3.0
3.0
3.0
3.8
3.8
6.9
6.9
3.5
1.7
1.4
0.3
April 29, 2004
X-Ray Beam Characterization
RSourceX RSourceY
TotalX
TotalY
0.5
0.5
0.5
0.5
0.5
0.5
9.2
9.0
5.3
3.9
4.1
3.8
8.9
8.7
4.9
3.3
3.6
3.2
2.1
2.1
2.1
2.1
2.1
2.1
0.5
0.5
0.5
0.5
0.5
0.5
10.2
8.3
8.0
7.9
9.8
9.8
10.0
8.0
7.7
7.6
9.6
9.6
2.1
2.1
2.1
2.1
2.1
2.1
0.5
0.5
0.5
0.5
0.5
0.5
8.2
7.8
5.0
4.1
4.6
4.4
7.9
7.6
4.6
3.5
4.1
3.8
Richard M. Bionta
bionta1@llnl.gov
Camera Resolution in qualitative agreement with
models
1.1 mm
April 29, 2004
1.5 mm
X-Ray Beam Characterization
Richard M. Bionta
1.5 mm
bionta1@llnl.gov
Issues
Vacuum Operation
Low Photon Energy Performance
Noise levels and Format of 120 Hz Readout
CCDs
Afterglow in LSO
High Energy Spontaneous Background
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Indirect, high power imaging system
Be Mirror
Cuts off high energy spontaneous
Be Reflectivity at 8.267 keV
Be Mirror angle provides "gain" adjustment
over several orders of magnitude.
Reflectivity
1.E+00
1.E-02
1.E-04
1.E-06
0
0.5
1
1.5
2
Angle, deg
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
2.5
Multilayer allows higher angle, higher transmission and
energy selection, but high z layer gets high dose
Be Mirror needs grazing incidence, camera close to beam
Single high Z layer tamped by Be may hold together
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Indirect Imager Mirror sizes
• Q = 1.0 deg
• Z = 105 m
Normal
Photon
FEL FWHM
Mirror
Incidence
Energy eV
mm
Length mm dose to Be,
eV/atom
800
1.222
70.0
0.015
8260
0.170
9.7
0.000
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Indirect imager issues
Calibration
Mirror roughness
Tight camera geometry
Compton background
Vacuum q2qmechanics
Making mirror thin enough for maximum
transmission
Ceramic multilayers?
Use as an Imaging Monochrometer
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Windowless Ion Chamber for monitoring
position and intensity
Measures intensity using x-ray gas interactions
Windowless for operation at low photon energies
Open nozzel
Rotating slots
Plasma window
Crude imaging may be possible
As a drift chamber
As a Quad cell
As a Fluorescent Imager
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Micro Strip version
Cathodes
Windowless
FEL entry
Differential
pump
April 29, 2004
X-Ray Beam Characterization
Segmented
horizontal
and
vertical
anodes
Isolation valve
with
Be window
Differential
pump
Richard M. Bionta
bionta1@llnl.gov
Windowless ion chamber issues
Windowless operation issues (gas
attenuator)
Beam size
Window
Blocking Spontaneous
Gas delivery and recovery in Hutch
Choice of readout
Pulsed operation
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Commissioning Diagnostics Tank
Intrusive measurements behind attenuator
Measurements
Photon energy spectra
Total energy
Spatial coherence
Spatial shape and centroid
Divergence
R&D
Pulse length
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Commissioning diagnostic tank
Aperture
Stage
“Optic”
Stage
Rail
April 29, 2004
X-Ray Beam Characterization
Detector and attenuator
Stage
Rail alignment
Stages
Richard M. Bionta
bionta1@llnl.gov
Total Energy
Temperature
sensor
Poor Thermal
Conductor
absorber
Heat
Sink
Crossed apertures
On positioning stages
Attenuator
Scintillator
Absorber
0.8 KeV
8 KeV
Be
Si
Dose 2 x FWHM 4 x attn lngth
eV/atom microns
microns
0.02
1918
20
0.12
338
310
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Total energy issues
120 Hz operation
Segmentation
Non-standard materials (Be)
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Photon Spectra Measurement
Aperture
Stage
Crystals
or gratings for 3
Photon energies
Detector and attenuator
Stage
X ray enhanced linear array and stage
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Sputtered-sliced multilayer gratings as high bw spectrometers
5-m-thick Mo/Si multilayer (d=200 Å)
on Si wafer substrate. Thinned and
polished to a 10- m-thick slice
SEM image of Mo/Si multilayer
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Spectrometer Issues
How to achieve 10-4 resolution over a 0.5%
bandwidth shot-to-shot?
Dynamic range
Designs for low divergence beam
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Pulse length measurement - 233 fsec!
Rad sensor is an InGaAs optical wave
guide with a band gap near the 1550
nm.
X-Rays strike the rad sensor disturbing
the waveguide’s electronic structure.
This causes a phase change in the
interferometer. The process is believed
to occur with timescales < 100 fs.
1550 nm optical
carrier
X-Ray measurements of the time structure of the
SPEAR beam in January and March 2003 confirmed
the devices x-ray sensitivity for LCLS applications.
Rad sensor is inserted into
one leg of a fiber-optic
interferometer.
beam
splitter
1550 nm optical carrier
SPEAR
Single electron
bunch mode
Reference
leg
Detector
Point of
interference
Fiber Optic Interferometer
time
X-Ray induced phase change observed as
an intensity modulation at point of
interference
Mark Lowry,
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
NIF Rad-Sensor Experimental Layout at SLAC
Imaging camera RadSensor
April 29, 2004
X-Ray Beam Characterization
slit
Ion chamber
Diamond
PCD attenuator
Richard M. Bionta
bionta1@llnl.gov
RadSensor Response to single-bucket fill pattern
Xray pulse history (conventional)
•Fast rise
•Long fall-time will be improved
781 ns
April 29, 2004
X-Ray Beam Characterization
•Complementary outputs =>
•index modulation
Lowry
Richard M.Mark
Bionta
bionta1@llnl.gov
Significant Improvements in sensitivity are realized near the band edge
= exciton abs peak width
Absorption width = 0.01 nm
From Gibbs, pg 137
•Adding in x4 for QC
enhancement we should
detect a single xray photon at
least 8x10-4 fringe fractions.
Absorption width = 1 nm
Data to date
Absorption edge at 1214 nm
•If we allow for a cavity with
finesse 10-100, this allow the
development of a useful
instrument
Systematic spectral measurements of both index and absorption under xray
illumination must be made to get a clear understanding of the sensitivity available
April 29, 2004
X-Ray Beam Characterization
Lowry
Richard M.Mark
Bionta
bionta1@llnl.gov
Pulse length sensor issues
Significant R&D needed in
"magic material" that converts between x-ray
and optical laser light
Acquisition and recording systems with fs
resolution
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
XRTOD Diagnostics Timeline
FY04 – PED year 4
Complete simulations of camera response to FEL and Spontanous
R&D on Ion Chamber, gas attenuator, and spectrometer
FY05 – PED year 3
FEE Detailed design
FY06 - Start of Construction
FEE Build and test
NEH Design
FY07
FEE Install
NEH Build and Test
FEH Design
FY08
NEH Install
FEH Build and Test
FY09 - Start of Operation
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov
Diagnostics Issues
Large number of independent deliverables
Source for testing damage issues does not
exist
Funding Profile means considerable design
work still ahead
But, the resources are available for success.
April 29, 2004
X-Ray Beam Characterization
Richard M. Bionta
bionta1@llnl.gov