High Aspect Ratio and Complex
Shaped Blind Micro Holes by Micro
EDM
姓名:盧世宗
學號:m97r0101
98.05.19
大綱
• 前言
• 實驗步驟
• 結果與討論
前言
• 在微細放電加工很難做出高深寬比的微小
加工孔因為加工時會有殘存材料的碎片因
為孔徑太小加工液無法帶走加工屑導致放
電異常與電極過度磨損降低加工精度。
• 本論文提出一個新的辦法可以有效的把加
工屑去除提高加工精度。
實驗步驟
Hole exit
Hole entrance.
電極消耗比較
較複雜的加工孔
Triangular blind hole
Square blind hole.
P ntago al blind hole.
結果與討論
In micro EDM, the discharge gap is very small, and the
size of the electrode is too small to use internal and/or
external flushing to remove debris. In this paper, a new
approach using planetary movement of the electrode is
proposed to reduce the debris concentration and improve
precision. The planetary movement of electrode provides
extra space for debris removal. Therefore, the material
removal rate increases and the electrode wear reduces.
This method has been verified by machining of micro
holes with high aspect ratio and blind noncircular micro
holes.
參考文獻
Z . Y . Yu, k . P . Rajurkar ,H . Shen , High
Aspect Ratio and Complex Shaped Blind Micro
Holes by Micro EDM
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