INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
IEC TC 113 Nanotechnology Standardization for
Electrical and Electronic Products and Systems
12 February 2008 SMB Update
Dr. J. Thomas Chapin,
Chair
Dr. Norbert Fabricius,
Secretary
© IEC:2007
Scope and SPS of IEC TC113
Standardization of the technologies relevant to electrical and
electronic products and systems in the field of nanotechnology in
close cooperation with other IEC committees and ISO TC 229.
1. Components / intermediate assemblies created from nano-scaled materials
2.
3.
4.
and processes.
Properties and functionalities of these components / intermediate
assemblies are electrical or electro-optical.
Final products using these components / intermediate assemblies are
typically within the scope of other IEC TC's
Fields of activities are for example:
a)
b)
c)
d)
e)
f)
5.
electronics,
optical aspects addressed by IEC TC’s,
magnetics and electromagnetics,
electroacoustics,
multimedia and telecommunication,
energy production (direct conversion into electrical power like in fuel cells,
photovoltaic devices, storage of electrical energy).
Specific topics: Terminology, measurement, characterization, performance,
reliability and safety and environment related to the nanoscale.
2
IEC TC 113 Membership
14 Participating Members – 14 Observing Members
ARGENTINA
AUSTRALIA
AUSTRIA
BELARUS
BELGIUM
BOSNIAHERZEGOVINA
BRAZIL
BULGARIA
CANADA
CHINA
COLOMBIA (AM)
CROATIA
CYPRUS (AM)
CZECH REP
DENMARK
EGYPT
ESTONIA
FINLAND
FRANCE
GERMANY
GREECE
HUNGARY
ICELAND (AM)
INDIA
INDONESIA
IRAN
IRELAND
ISRAEL
ITALY
JAPAN
KAZAKHSTAN (AM)
KENYA (AM)
KOREA, DPR OF (AM)
KOREA, REP OF
LATVIA (AM)
LITHUANIA (AM)
LUXEMBURG
MACEDONIA
(AM)
MALAYSIA
MALTA (AM)
MEXICO
NETHERLANDS
NEW ZEALAND
NIGERIA (AM)
NORWAY
PAKISTAN
POLAND
PORTUGAL
ROMANIA
RUSSIAN FED
SAUDI ARABIA
SERBIA &
MONTENEGRO
SINGAPORE
SLOVAKIA
SLOVENIA
SOUTH AFRICA
SPAIN
SRI LANKA (AM)
SWEDEN
SWITZERLAND
THAILAND
TUNISIA (AM)
TURKEY
UKRAINE
UK
USA
VIETNAM (AM)
3
International Standardisation in
Nanotechnology
TC47
IEC TC's
SEMI
TC86
D-liaison
TC111
IEEE
A-liaison
D-liaison
IEC TC 113
WG3: Performance
assessment
ISO TC 229
Appointed Observer
JWG1: Terminology,
nomenclature
D-Liaisons: SEMI and IEEE (under SMB ballot)
WG3: Health, safety
environment
JWG2: Measurement,
characterization
4
Working Group Structure of IEC TC113
1: "Terminology and Nomenclature"
 JWG
Scope: Define and develop unambiguous and uniform terminology

and nomenclature in the field of nanotechnologies to facilitate
communication and to promote common understanding.
2: "Measurement and Characterization"
 JWG
Scope: Standardization of metrology and test methods and

consideration of reference materials used to characterize
properties of mainly materials and structures in the field of
nanotechnologies.
3: "Performance assessment"
 WGScope:
To develop standards for the assessment of performance,

reliability, and durability related to the nanotechnology-enabled
aspects of components and systems in support of continuous
improvement at all stages of the value adding chain.
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Liaison between IEC TC113 and ISO TC229






Every two years there will be a co-allocated plenary
meeting to improve networking between the TC’s.
Chairman and Secretary attend the plenary
meetings of the other committee.
Two Joint Working Groups with Convener and CoConvener from both TC’s.
Regular consultancy of the officers of both TC’s.
Common IEC/ISO standards with coordinated
voting are under consideration.
Common workshops will take place (e.g. 26.2.2008
- 28.2.2008, Gaithersburg, NIST USA).
6
IEC TC 113 WG3 Programme of Work
 Standards to characterize nano-specific
product performance
 Fast "Screening Methods" to assess reliability and durability
 Modelling of nano-related failure mechanisms
 Fast standardized test methods for nano
fabrication
 Identification of "Nano Key Control Characteristics" for Material and
Process SPC
 Electronic-grade nano materials specifications
 Generic nano material specification
 Electronic grade CNT specification
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Area of Nanotechnology Standardization
IEC
Product TC's
Nano-enabled Product
System Integration
IEC TC 113
Nano
Subassembly
Subassembly
#1
Subassembly
#N
Nano
Materials &
Processes
Nano
Science
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Area of Nanotechnology Standardization
KCC – key control characteristics
IEC
Product TC's
Nano-enabled Product
KCC‘s
System Integration
IEC
TC 113
Nano
Subassembly
Nanoscale
Driven
Failure
Modes
Subassembly
#1
Subassembly
#N
Nano
Materials &
Processes
Nano
Science
9
Area of Nanotechnology Standardization
Nano-enabled Product
System Integration
Nano
Subassembly
Subassembly
#1
Subassembly
#N
Carbon nanotube
Nano
Materials &
Processes
Prof. Young Hee Lee,
Sungkyunkwan
University, KO
Samsung
Nano
Science
KCC – key control characteristics 10
Area of Nanotechnology Standardization
Nano-enabled Product
System Integration
Nano
Subassembly
Subassembly
#1
Subassembly
#N
Nano
Materials &
Processes
Nano
Science
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IEC TC 113 Working Activities
New Work Items:

IEC/TC 113/WG3 - Specification for Carbon Nanotube
Characteristics for Electrotechnical Applications
Meeting History:

IEC TC 113: 26-27 March 2007 in Frankfurt


IEC TC 113/WG3 20-21 July 2007 in San Francisco


IEC TC 113/WG3: 08 April 2008 in Tokyo
(1st TC 113 Plenary)
IEC TC 113: 04-07 December 2007 in Singapore
(2nd TC 113 meeting, co-located with ISO/TC 229)
IEC TC 113: 11-13 November 2008 in US
(3rd TC 113 Plenary)
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Summary

IEC TC 113 is now active and has held 2 plenary
meetings.

IEC TC 113 has established a strategic liaison with
ISO TC 229.

Pursuing liaisons with other organizations involved
in nanotechnology (SEMI, IEEE).

IEC TC 113 and ISO TC 229 have two Joint Working
Groups with parallel activities.

IEC TC 113 WG3 has been established and now
working on specific work items.
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Summary, cont’d.

IEC TC 113 is actively recruiting technical experts
for working group activities.

IEC TC 113 developing an international survey on
nanotechnology to help guide focus and priority.

IEC TC 113 created and staffed a Chairman’s
Advisory Group (CAG) to help facilitate strategic
and tactical planning for the TC. CAG composed
of IEC TC 113 leadership plus 1 nominated
representative from each NC.
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