Investigations on Laser-Generated Plasma Sources T. Wilhein Georg-August-Universität Göttingen, Forschungseinrichtung Röntgenphysik, Geiststraße 11, D-37073 Göttingen, Germany Abstract. In order to measure the spectral brilliance of laser plasma X-ray sources, a spectrograph has been developed which allows simultaneous recording of the wavelength depending source diameter and the source spectrum. The optical system is a new single element X-ray optic [7], which produces a series of lateral displaced enlarged images of the X-ray source at different wavelength on the detector, a cooled slow scan CCD camera with a thinned, back illuminated CCD. First brilliance measurements of different laser plasma sources in the wavelength range λ=1.5...5nm have been performed, showing that laser plasma sources can serve as bright laboratory X-ray sources for applications in the soft X-ray region. 1 Introduction During the last years, the fields of research using soft X-rays have experienced a remarkable growth. Applications like, e.g., X-ray microscopy, X-ray photoelectron spectroscopy or X-ray lithography have prooved to be powerful scientific tools [1]. Experiments utilizing these technics are mostly performed at synchrotron radiation facilities, which provide quasi-continuous highly collimated X-radiation over a wide spectral range [2]. To extend the applications of these methods, intense laboratory Xray sources have to be developed. Laser generated plasmas promise to become bright X-ray sources, supplying pulsed radiation at wavelength down to around 1nm using commercially available laser systems and even much shorter, if terrawatt laser pulses are employed [3, 4]. In order to decide wether a laser plasma is well suited to serve as an X-ray source for a particular application, its emission properties have to be quantified. The main figure of merit used to characterize X-ray sources is the spectral brilliance, which is defined as the number of photons emitted per unit time, source area, solid angle and relative bandwidth [2]. However, for pulsed sources it is more suitable to define the pulse brilliance bpulse as b pulse = number of photons pulse, source area, solid angle, rel. bandwidth Units for the pulse brilliance are photons/(pulse×µm2×sr×0.1% BW). The exposure time required to carry out a certain experiment can be estimated by integrating the pulse brilliance over the corresponding experimental properties, e.g. the angle of acceptance, and taking into account the repition rate of the source. To be able to measure the pulse brilliance of laser generated plasma sources in the soft X-ray range, a spectrograph has been developed which allows simultaneous measurement of the spectral distribution and the source size by means of an off-axis reflection zone plate (ORZ) [7] in combination with CCD image detection. V - 26 T. Wilhein 2 Off-Axis Reflection Zone Plates for Spectral Imaging A universal idea of point-to-point image formation is shown in Fig. 1 (cp.[5]). A spherical wave emitted by a point source S will converge into image point I if the surface of equal phase describing the wave deflection is given by an ellipsoid with focal points at S and I. Because phase differences being integer multiples of 2⋅π will result in constructive interference, a set of ellipsoidal shells corresponding to optical path differences 2⋅π⋅λ for every two adjacent shells characterize the imaging process. Any single element non-refractive optic can be described using this scheme. For thin, plane diffractive optical elements the pattern providing the appropriate wave deflection is given by the figure which results from cutting the system of ellipsoidal shells with the substrate plane. The general shape of this figures are non-concentric ellipses, which may in special cases lead to, e.g., concentric circles, describing onaxis zone substrate substrate plane s ϕ wave front S d optical axis I ellipsoidal shells cn Fig. 1. Origin of the off-axis reflection zone plate pattern (see text) plates. If the straight line between S and I cuts the substrate plane, the optic is operating in transmission, whereas the opposite case leads to a reflective element. For the off-axis reflection zone plate, the pattern is given (see Fig. 1 for descriptions) by 2 p + w ⋅ 1 + m2 v =1 + 2 2 2 2 2 2 an − s + w v 1+ m v ⋅ an − s + w2 v q2 ( ) ( ) p, q = coords in substr. plane, m = tan ( ϕ ), c n = n ⋅ λ 2 + const, n = 0,1, 2... = zone number a 2 1 d ⋅ = normalized excentricity a n 2 = c n 2 − d 2 , v: = m 2 + n 2 , w: = m ⋅ s, ε = c cn 1 + m2 n Investigations on Laser-Generated Plasma Sources V - 27 Off-axis reflection zone plates (ORZs) [7] are manufactured by e-beam writing of the desired part of this pattern into PMMA and subsequent microstructuring steps. The ORZs used in the below described experiments consists of about 7000 line pairs, written with a LION LV1 e-beam writer (LEICA, Jena, Germany) and structured in ≈20 nm Ge on a glass substrate, in some cases coated with a thin Ni layer for enhanced reflectivity. Table 1. Design parameters of the first ORZ size: 2 stripes, each 1×8mm2, 1mm spacing, ≈7000 line pairs, grating constant along optic axis g =1131-1138nm, +1. diffr. order λ0 wavelength 2.4nm a0 object distance 1500mm b0 3000mm image distance f0 Focal length 1000mm M0 Magnification 2 α0 Input angle (gr.inc.) 1.5° Output angle (gr.inc.) β0 4.0° dβ/dλ 13mrad/nm Angular disp. at λ0 Linear disp. at λ0 dx/dλ 38mm/nm Ω0 Collected solid angle 2×10-7sr δy Spatial diffr. limit 3µm λ/∆λ Spectral diffr. limit > 1000 (dep. on source size) Fig. 2. Scheme of the first ORZ spectrum on CCD focal spot at λ0 CCD reflecting plane X-ray source optical axis β substrate α zone plate figure Fig. 3. Image formation with an off-axis reflection zone plate [7] V - 28 T. Wilhein Detailed reports on the e-beam lithography and microfabrication processes are presented in ref. [6–8]. A scheme of the first built ORZ is given in Fig. 2, its paramters listed beside it. In a first order approximation, the optic can be treated as a diffraction grating with slightly variing grating constant g on the zone plate axis and curved lines. Figure 3 explains the appearance of spectrally displacedimages: for its design paramters, that is geometry and wavelength, the ORZ forms a diffaction limited image of a point source at the location of the image point. Because the focal length of zone plates vary as f∝λ-1, longer / shorter wavelength will have their focus in front of / behind the detector plane, leading to defocused and, due to the off-axis character of the ORZ, laterally displaced images on the detector. Thus, the image consists of a spectral and a spatial direction, the latter allowing to measure the source size at the focused wavelength. The diffraction limits given in the table beside Fig. 2 for both spatial resolution and spectral resolving power takes into account the effective aperture, the spectral resolving power in addition being influenced by the average angular dispersion of the optic. The off-axis nature of the ORZ in combination with the grazing incidence properties give rise to remarkable aberrations when used in geometries different from the design geometry. A ray-tracing program has been developed to calculate the spectral and spatial behaviour of ORZs under arbitrary conditions, e.g., extended or displaced sources, changes in the input angle etc. For example, it has been found that the aberrations arising from setting the focus of the ORZ to a wavelength λ different from the design wavelength λ0 can be minimized by keeping input angle and source distant constant, and placing the detector in image distance corresponding to the focal length fλ=f0⋅λ0/λ, where f0, λ0 are design parame-ters, and with respect to the change in the diffraction angle. 3 The ORZ-Based Imaging Spectrograph The spectrograph consists of three vacuum chambers, connected with vacuum tubes (Fig. 4). The first chamber contains the target system, the second the ORZ and a metal filter (Al or Ti) to block visible, IR and UV light, the third chamber carries the detector, a cooled clow scan CCD camera (Photometrics AT 200L), equipped with a thinned, back illuminated CCD (TK1024AB). The camera provides cooling down to –40°C, 16 bit/40 kHz readout and a readout noise of ≈10e-. The high dynamic range allows to make precise measurements of line/background intensities in the spectral images. In the present setup the achievable spatial resolution is limited by the pixel size (24×24 µm2) of the CCD and approx. 2× magnification to ≈20µm and the spectral resolution to ≈0.002 nm. To record a wider spectral range than that fitting to the CCD size, the input angle α can be choosen by turning the ORZ, keeping the total deflection angle γ constant. The spectra shown below have been obtained by taking images at 3...6 different input angles. In order to adjust the optical axis of the ORZ in a way that it hits the source, which is necessary to minimize aberrations, the ORZ can be rotated precisely perpendicular to the substrate plane using a stepper motor with 80000 steps/360°. Investigations on Laser-Generated Plasma Sources V - 29 laser target focusing optic ORZ filter X-rays vacuum chambers motor thinned, back illuminated CCD Fig. 4. Scheme of the imaging spectrograph [15] Measuring absolute brilliances means determination of absolute photon numbers. To be able to do so, all components of the spectrograph have to be absolutely calibrated. The filter transmittance and the diffraction efficiency of the ORZ have been measured using the X-ray test chamber of the FE Röntgenphysik at BESSY for wavelength λ=1...5nm. The quantum efficiency of the thinned, back illuminated CCD was determined at the radiometry beamline of the Physikalisch Technische Bundesanstalt (PTB) at BESSY [9] in the wavelength region λ=1.5...20nm. ORZ diffraction efficiencies up to 6% have been obtained (at λ=2.2nm) [10], and the quantum efficiency of the CCD was found to be ≥ 0.6. 4 First Experiments with the Imaging Spectrograph Three experiments with the new imaging spectrograph are presented below, carried out in collaboration with three different groups using different laser and target systems. In each case the spectrograph was adapted to the respectively existing target chambers. For applications like X-ray microscopy or X-ray photoelectron spectroscopy strong emission in well separated lines is preferable, thus target elements are choosen to have lines from H-like and He-like ions in the desired spectral range. In the water window, λ≈2.3...4.3nm, which is of particular interest for investigations on biological samples, nitrogen and carbon fullfill this condition and therefore targets containing these elements were choosen for the experiments. Due to the calibration procedure of the ORZ and the CCD the error in the given photon numbers can be expected to be less then 50%. V - 30 T. Wilhein 4.1 Experiment with a Droplet-Target Laser Plasma Source at the Lund Institute of Technology The first experiment with the ORZ spectrograph has been performed in collaboration with H. Hertz, L. Rymell, M. Berglund at the Dep. of Physics, Lund Institute of Technology, applying the droplet-target laser-plasma X-ray source [10]. This source uses ≈10 µm droplets as target, resulting in a practically debris-free plasma source. The frequency doubled Nd:YAG laser supplies 70 mJ laser pulses with 100–120 ps pulse width at λ=532 nm and 10Hz repition rate, giving an intensity of ≈5⋅1014 W/cm2 in a 12 µm focal spot. A detailed description of the source can be found in ref. [11, 12]. In this experiment, 30% NH3 dissolved in H2O has been used as target liquid, and a 3 mJ UV prepulse has been employed for enhanced X-ray emission [13]. Fig. 5. Spectral image of the Lund laser plasma source taken with the imaging spectrograph. Focus set to 2.88 nm. Target: droplets, 30% NH3 dissolved in H2O, laser pulse energy 70 mJ, pulse width ≈120 ps, intensity on target ≈5⋅1014W/cm2 [12], no prepulse Figure 5 shows a spectral image of the Lund laser plasma source. The focus of the spectrograph was set to the nitrogen He-α line (N VI 1s2-1s2p) at λ=2.879 nm, because this line is of particular interest for X-ray microscopy. Due to the target composition (only oxygen and nitrogen contribute to the X-ray emission) the spectrum below 5 nm ends with the focused line, thus the spectral image shows only defocused lines in the short wavelength direction. The picture is composed of three different exposures with variing input angle α. A part of the spectrum taken with the imaging spectrograph is represented in Fig. 6. The expected nitrogen and oxygen lines can easily be identified. The pulse brilliances under the given experimental conditions was found to be ≈9×107photons/ (pulse×µm2 ×sr×0.1%BW) in the N Ly-α line (λ=2.478nm), and ≈5×107photons/ (pulse×µm2 ×sr×0.1%BW) in the N He-α line (λ=2.879nm), the relative linewidth were measured to λ/∆λ≥350 and 450 (FWHM), respectively. 1.0 V - 31 N Ly-α O He-α 0.8 0.6 N He-α 0.4 0.2 N He-β N Ly-β N Ly-γ satellites N He-γ 8 10 Photons / (pulse × µm2 × sr × 0.1% BW) Investigations on Laser-Generated Plasma Sources 0.0 2.0 2.2 2.4 2.6 2.8 3.0 λ [nm] Fig. 6. Part of the spectrum of the Lund laser plasma source, 30% NH3 dissolved in H2O, laser pulse: E=70mJ, τ≈120ps, λ=532nm, 3mJ UV prepulse [10] The measured linewidth is probablylimited by the effect of the extended source on the spectrograph performance. The source size of ≈30µm is in good agreement with other measurements and mainly influenced by the expansion of the plasma during the time delay between pre- and main pulse [13]. Integrating over the entire linewidth and the source size gives for the Ly-α line 4.4×1011photons/(pulse×sr) and 3.2×1011photons/(pulse×sr) for the He-α line [10]. 4.2 Experiment with 8 ns IR Laser Pulses at the Fraunhofer Institut für Lasertechnik in Aachen An experiment using ≈8ns IR laser pulses from a Nd:YAG laser has been carried out in collaboration with G. Schriever, S. Mager, K. Gäbel and R. Lebert at the Fraunhofer Institut für Lasertechnik in Aachen [16]. The ≈1000 mJ laser pulses at λ=1064 nm supplied a target intensity of ≈1013W/cm2. Spectra have been taken from cryogenic (frozen nitrogen) and solid (boron nitride) targets, the target refresh limiting the repition rate to 0.03–1 Hz in the given experiment [17]. Figures 7 and 8 represent the measured pulse brilliances. The relatively large measured source size of ≈80µm corresponds to the comparatively long laser pulses and may influence the appearance of the spectral line width, as discussed above. With the frozen nitrogen target, relative linewidth in the Ly-α line at λ=2.478 nm and the He-α line at λ=2.879 nm have been found to be λ/∆λ≥330 and 200, integration over line width and source size give 1.0×1012 photons/(pulse×sr) and 2.4×1012 photons/(pulse×sr), respectively. 1.6 N He-β 0.8 0.4 N He-α N Ly-α 1.2 8 10 Photons / (pulse × µm2 × sr × 0.1% BW) T. Wilhein N N Ly-β Ly-γ N He-δ N He-γ satellites 0.0 2.0 2.2 2.4 2.6 2.8 3.0 λ [nm] Fig. 7. Spectral brilliance of the Aachen laser plasma source, target: cryogenic, frozen nitrogen laser pulse: E≈1000mJ, τ≈8ns, λ=1064nm [16] 1.6 N Ly-α B Ly-α N He-α 1.2 O He-α N He-β 0.8 0.4 N N Ly-β He-γ N Ly-γ 8 10 Photons / (pulse × µm2 × sr × 0.1% BW) V - 32 B Ly-β B C Ly-α Ly-δ B Ly-γ 0.0 2.0 2.5 3.0 3.5 4.0 4.5 5.0 λ [nm] Fig. 8. Spectrum of the Aachen laser plasma source, target: solid, boron nitride laser pulse: E≈1000mJ, τ≈8ns, λ=1064nm [16] Investigations on Laser-Generated Plasma Sources V - 33 4.3 Experiment with High Intensity UV-Laser Pulses at the University of Jena In collaboration with the U. Teubner, D. Altenbernd, and E. Förster, Max-PlanckArbeitsgruppe "Röntgenoptik", W. Theobald, R. Haeßner, and R. Sauerbrey, Institut für Optik und Quantenelektronik, University of Jena, investigations on a laser plasma created with a KrF∗ -Laser [14] have been performed [15]. The ≈20mJ UV laser pulses, λ=248nm, pulse width ≈700fs, produced an intensity of ≈1016W/cm2 onto the solid target (used targets: boron nitride and carbon) with a repition rate of 0.5-1Hz. Employing a carbon rod as target, strong emission in the C Ly-α (λ=3.373nm) and the C He-α (λ=4.027nm) line could be observed, the photon numbers found in these lines being 1.3×1011photons/(pulse×sr) and 9×1010photons/ (pulse×sr) [15], the relative line width λ/∆λ≥100 and 320, respectively. The relatively broad appearance of the Ly-α line may indicate that the high laser intensity lead to line broadening due to the Stark effect. The source size was found to be ≈25µm, thus, close to the limit given by spectrograph (s. above). 4.4 Discussion of the Experimental Results The data from the described experiments show that it is possible to achieve pulse brilliances in the range of 108photons/(pulse×µm2×sr×0.1%BW) in the water window with the laser plasma sources under investigation, the Lund droplet-target laser plasma source due to the small source size being the most effective in converting laser pulse energy into X-ray pulse brilliance. The absolute photon numbers calculated by integrating over line width and source size divided by the laser pulse energy gives approximately the same values for the Aachen frozen nitrogen and the Lund NH3/H2O droplet target, where in addition to the nitrogen emission strong oxygen lines are observed. The Lund laser plasma source already operating very stable at a repition rate of 10Hz seems to be well suited to act as a bright laboratory X-ray source for applications like, e.g., X-ray microscopy, because it provides high average photon numbers in narrow bandwidth lines. Also the Aachen laser plasma source promise to become an intense X-ray source, if the repition rate can be increased. Laser pulses with very high intensities create comparatively broad line emission in the soft X-ray region, thus a monochromator may be needed if the plasma should work as a monochromatic X-ray source. 5 Summary A spectrograph using off-axis reflection zone plates has been developed and tested with laser produced plasma sources in the spectral range λ=1.5...5nm. The spatial resolution has been found to be better than 25µm, the spectral resolving power λ∆λ≥450 at 2.88nm. A ray tracing program allows to control the design of ORZs for a particular application. With the calibrated spectrograph absolute measurements of the pulse brilliance of laser generated plasma sources have been performed, the results prooving that pulse brilliances bpulse >108photons/(pulse×µm2×sr×0.1%BW) and V - 34 T. Wilhein integrated photon numbers N >1012 photons/(pulse×sr) in a single are achievable in narrow bandwidth line emission. Acknowledgements The author gratefully acknowledges the excellent collaborations with all the researchers in the labs in Lund, Jena and Aachen. Thanks to B. Niemann, T. Schliebe, G. Schneider, P. Guttmann, J. Herbst, P. Nieschalk from the FE Röntgenphysik, Göttingen, R. Plontke and his team from LEICA, Jena, and G. Schmahl and D. Rudolph for their continous support of this work. This project has been funded by the German Federal Minister for Education and Research (BMBF) under contract number 13N6491. References 1 2 3 4 5 6 7 8 9 10 11 12 13 See, e.g., G. Schmahl, D. Rudolph, B. Niemann, P. Guttmann, J. Thieme, G. Schneider, Naturwissenschaften 83 (1996), 61. F. J. Wuilleumier, Y. Petroff, and I. Nenner, eds., Vacuum Ultraviolet Radiation Physics, Proc. of the 10th VUV conference (World Scientifc, Singapore, 1993). E.-E. Koch, D. E. Eastman, and Y. Farge, Handbook on Synchrotron Radiation (North Holland, Amsterdam, 1983). M. C. Richardson, G. A. Kyrala, eds. Applications of Laser Plasma Radiation II, Proc. SPIE Vol. 2523 (1995). C. Tillmann, A. Persson, C.-G. Wahlström, S. Svanberg, K. Herrlin, Appl. Phys. B 61, 333 (1995). A. G. Michette and C. J. Buckley, eds. X-Ray Science and Technology, (Institute of Physics, Bristol, 1993). T. Schliebe, Diffraktive Kondensoroptiken für die Röntgenmikroskopie, Elektronenstrahllithographie und Nanostrukturierung, PhD-thesis, (Göttingen, in preparation). B. Niemann, T.Wilhein, T. Schliebe, R. Plontke, O. Fortagne, I. Stolberg, M. Zierbock, Microelectr. Eng. 30, 49 (1996). B. Niemann, New X-ray optical elements generated by the electron beam lithography system LION LV1, this volume. T. Wilhein, D. Rothweiler, A. Tusche, F. Scholze, and W. Meyer-Ilse, in X-ray Microscopy IV, V.V. Aristov and A.I. Erko, eds. (Bogorodskii Pechatnik Publishers, Chernogolovka, Moscow region, 1994) p. 470. T. Wilhein, D. Hambach, B. Niemann, M. Berglund, L. Rymell, H. M. Hertz, Appl. Phys. Lett. 71 (28), (1997). L. Rymell and H. M. Hertz, Opt. Commun. 103, 105 (1993). L. Rymell, M. Berglund and H. M. Hertz, Appl. Phys. Lett. 66, 2625 (1995). M. Berglund, L. Rymell, and H. M. Hertz, Appl. Phys. Lett. 69, 1683 (1996). Investigations on Laser-Generated Plasma Sources 14 15 16 17 V - 35 U. Teubner, C. Wülker, W. Theobald, E. Förster, Phys. Plasmas 2, 972 (1995); U. Teubner, W. Theobald, C. Wülker, J. Phys. B 29 (1996) 4333. S. Szatmari, F. P. Schäfer, Opt. Comm. 68, 196 (1988). T. Wilhein, R. Häßner, D. Altenbernd, U. Teubner, W. Theobald, E. Förster, R. Sauerbrey, X-ray brilliance measurements of a subpicosecond laser-plasma using an elliptical off-axis reflection zone plate, subm. to Opt. Lett. T. Wilhein, G. Schriever, S. Mager, K. Gäbel, R. Lebert, to be published. R. Lebert, G. Schriever, S. Mager, A. Naweed, O. Treichel, K. Bergmann, W. Neff, Laser Produced and Pinch Plasmas: Narrowband X-Ray sources for Applications. X-Tech 96 Workshop, Berlin, Sept. 29–Oct. 2, 1996.