Mol. Crysr. Liq. Cryst. 1990, Vol. 192, pp. 75-78 Reprints available directly from the publisher Photocopying permitted by license only O 1990 Gordon and Breach Science Publishers S.A. Rinted in the United States of America TBSTING METHODS OB MEASUREMENTS OF LIQUID CRYSTAL'20-SOLID SURFACE ANCHORING ENERGY O.LAVRENTOVICH, ToWUSIY, YUeRESNIKOV, VaSERGU Inst.of Phys.Acad.of ScL, 252650, Kiev, USSR Abstract Anchoring energy values were using two testing methods in LC-cell for the pair NLC 5CB - silicon orienting surface coincided within the experimental accuracy. determined the same elastomer limits of Anisotropic intermolecular bteraction at a liquid crystal-non-liquid crystal interface moetly determines NLC uniform alignment. Anchoring induced by LC cell bounded surfaces is characterized by anchoring energy Wo and interaction potential Ws. Theae quantitative characteristics of anchoring produce a decisive effect on LC devices operating parameters: threshold of orientational' effects, relaxation times eta. The development of reliable method8 of the anchoring energy determination is still urgent unresolved problem. A large body of data concerning measurements of Wo has been amassed over the past years, but the spread of YB, values meaau~ red by the available method^ is rather high. even for the ' same NU-surface pair.'~uch a spread in values may be caused by techn.ologica1 inaqulvalenoe of cells or by the difference in techniques based on some external impact. It Ls interesting to measure the ancholring energy by two methods using the same LC cell. The development of testing methods, when LC layer ia subjected only to 76/[5 121 0.LAVRENTOVICH ET AL. W e a l i g n i n g a c t i o n of the c e l l s u b s t r a t e s , e a p e s i a l l y suits t h e s i t u a t i o n . Two t e s t i n g methods were chosen: measurement of the topological-def e c t and t h e r e c e n t l y proposed technique of the small-angle l a s e r l i g h t s c a t t e r i n g on t h e BtLC d i r e c t o r fluctuations3. Using t h e s e two methods we determined t h e value of anchoring energy of 5CB on s i l i c o n elastomer, which a l i g n s t h i s LC homeotropically i n 50pm thiok c e l l . The s i l i c o n elastomer ( [CH3))3SiO( (CH3) 2 ~ i O ) h ~ i ( ~ H 3 ) J , n=2500)! l a y e r was p r e c i p i t a t e d out of 105%s o l u t i o n of elastomer i n toluol. a f t e r t h e p r e c i p i t a t i o n the obtained 100 nm t h i c k l a y e r was d r y i n g a t ~ x > O C . Using both, techniques, the anchoring energy corresponding t o the di,rect o r deviation from i t s av-ge p o a i t i o n on the plane perpendicular t o the o e l l s u b s t r a t e s w e a determined. I n the topological-defect method one needs t o measure the steady-state width D of domain walls, where the d i r e c t o r b i s t s about t h e a x i s p a r a l l e l t~ t h e substrate. Such 8 width %a determined by t h e e q u a l i t y of t h e e l a s t i c and surface energy contrib&ions t o the energy balance. Assuming-a uniform t d s t i i n g and using the surface poitend i a l W ~ ~ ~ c o s where ~ l 3 , f3 i a the angle betaem. the direct o r and s u b e t r a t e surface, and minimizing the sum of t h e e l a s t i c and surface energy with respect t o D, one obtaltins t h e expression f o r Wo: Efere %2 i s t h e txdst e l a s t i c constant, L is t h e c e l l ehicknesa. The measured value of D was about )tlym, K22=4-% ~ - ~ d f~o nr 5CB, e thus Po=( 2 2 ~) 1 ()-3erg/cm2, It i s well known tha% thermal f l u c t u ~ a t i o n sof t h e d i r e c t o r around its equilibrium p o s i t i o n give r i s e t o an i n t e n s e s c a t t e r i n g of l i g h t . The second t e s t i n g method of the anchoring energy determination i s baaed TESTING PbEASUREMENP ' S OF ANCHORING ENERGY [s 131177 on the s u f f i c i e n t b f l u e n c e of a n c h o ~ l n gon the long wavelength s p e c t m of nemath d i r e c t o r ozdentati3anal + -b fluctwt&ona < I ~ ~ ( P , W ~ where ) I ~ >i s the s c a t t e r i n g wave veotor. X a c r o s c o p ~ c ~ lthis y dependence shows i t s e l f in the NLC-cell l i g h t s c a t t e r i n g c h a r a c t ~ r i s ~ i c s , namely i n the angular d i s t r i b u t i o n of the scattered l i g h t i n t e n s i t y i n the region of small $.3 Experimentally the influence of polar anchoring could be noticed, f o r example, i n the s c a t t e r i n g of extraordinary wave without changing, of the s t a t e of po, l a r i e a t i o n Ce-e scatterLng) i n the region of very s m a l l < s c a t t e r i n g angles 6 . Intense e-e s c a t t e r i n g takes place i n the o p t i c a l geometlry when the wave vectoo of the incident l i g h t makes an angle tf'f 0 with the director. Bor t h i s geomet~y, choaeing the d i r e c t o ~to be p a r a l l e l t o the scatterimg plane, t h e expression f o r the soattering cmss-section is:3 where A€ i s the o p t i c a l aniso-py &,-- &,, d is t h e -b angle between E-vector of t h e incident l i g h t and the d i r e c t o r , d = 90' cp f o r the homeotropic alignment, nT, i s the amplitude of the splay-bend mode; i t s explic i t e form i s preeented i n Ref. 3,. To determine the anchoring energy value f o r a LCs o l i d surface p a i r one needs t o reaord the angular d i s t r i b u t i o n of the scattered l i g h t r e l a t i v e i n t e n s i t y i n the region of 8 s 3 115mrad with high s p a t i a l resolut i o n , and f i t the experimenta data t o a s e t of theoret i c a l curves, calculated f o r d i f f e r e n t values of Wo. To achieve high s p a t i a l resolution, l a s e r source of l i g h t has t;r, be used with divergence not higher than 1 1,5 mrad and low power (.liO 115 mW), not t o a f f e c t - - - - 0.LAVRENTOVICH ET AL. 78/[514] t h e LC-layer. Brperiments were performed employing ' z A o r b-Ne TENoo l a s e r s , whose emission wavelengthes a r e n o t absorbed by NLC 5CB. Experimental s e t up w a s described i n prevf;oua papers .3* Measurements were performed using t h e same c e l l , f i l l e d w i t h 5CB, o r i e n t e d by sil i c o n elastomer l a y e r . The obtained anchoring energy value coincides w i t h i n t h e limit8 of experimental accuracy w i t h t h a t measured by t h e topological-defect method. T h i s r e s u l t shows t h e r e l i a b i l i t y of t h e s e two t e s t i n g methods, whiah o f f e r s an advantage t o measure Wo not only i n s p e c i a l l y prepared a m p l e but i n commercial c e l l s . REFERENCES 1. L. Blinov, E. Kats, and A. Sonin, Sov.Phys.-Usp., 604 (1!987)!e 2. F. Ryschenkow and Me Kleman, Journ.Chem.Ph.ya,, 405 ( 1,976)lo 3. T. Marusiy, Yu. Reanikov, V. Reshetnyak e t al., Sov. Ph.ys JETF. 64, 502 (.119861). 4. T. Marusiy, Yu. Resnlkov, V. Reschetnyak e t al., Mol.Crsst.Lia.C~st., 495 (11987),. x, a, . z,