6.776 High Speed Communication Circuits Lecture 6 MOS Transistors, Passive Components, Gain-

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6.776
High Speed Communication Circuits
Lecture 6
MOS Transistors, Passive Components, GainBandwidth Issue for Broadband Amplifiers
Massachusetts Institute of Technology
February 17, 2005
Copyright © 2005 by Hae-Seung Lee and Michael H.
Perrott
Basics of MOS Large Signal Behavior (Qualitative)
Triode
ID
VGS
G
S
Overall I-V Characteristic
VDS=0
D
Cchannel = Cox(VGS-VT)
Pinch-off
ID
ID
Pinch-off
Saturation
VGS
G
S
VD=∆V
D
Saturation
Triode
∆V
ID
VDS
VGS
G
S
H.-S. Lee & M.H. Perrott
VD>∆V
D
MIT OCW
Basics of MOS Large Signal Behavior (Quantitative)
Triode
ID
VGS
G
S
VDS=0
ID = µnCox W (VGS - VT - VDS/2)VDS
L
for VDS << VGS - VT
D
ID
Cchannel = Cox(VGS-VT)
Pinch-off
µnCox W (VGS - VT)VDS
L
ID
∆V = VGS-VT
VGS
G
S
VD=∆V
∆V =
D
Saturation
G
H.-S. Lee & M.H. Perrott
µnCoxW
ID
VGS
S
2IDL
VD>∆V
D
ID =
1 µ C W
(VGS-VT)2(1+λVDS)
n ox
2
L
(where λ corresponds to
channel length modulation)
MIT OCW
Analysis of Amplifier Behavior
ƒ
Typically focus on small signal behavior
ƒ
To do small signal analysis:
- Work with a linearized model such as hybrid-π
Small Signal Analysis Steps
ID
RD
1) Solve for bias current Id
RG
vout
vin
Vbias
H.-S. Lee & M.H. Perrott
RS
2) Calculate small signal
parameters (such as gm, ro)
3) Solve for small signal response
using transistor hybrid-π small
signal model
MIT OCW
MOS DC Small Signal Model
ƒ
Assume transistor in saturation:
ID
RD
RD
RG
RG
vgs
gmvgs
ro
-gmbvs
RS
vs
RS
gm = µnCox(W/L)(VGS - VT)(1 + λVDS)
= 2µnCox(W/L)ID (assuming λVDS << 1)
gmb =
γg m
2 2|Φp| + VSB
where γ =
2qεsNA
Cox
In practice: gmb = gm/5 to gm/3
ro =
H.-S. Lee & M.H. Perrott
1
λID
MIT OCW
Capacitors For MOS Device In Saturation
Top View
Side View
ID
E
VGS
G
Cov
S
D
Cov
Cgc
Ccb
S
W
Cjsb
LD
B
E
VD>∆V
D
Cjdb
LD
L
E
junction bottom wall
cap (per area)
L
source to bulk cap: Cjsb =
drain to bulk cap: Cjdb =
Cj(0)
ΦB
1 + VSB
Cj(0)
1 + VDB
ΦB
overlap cap: Cov = WLDCox + WCfringe
WE +
junction sidewall
cap (per length)
Cjsw(0)
ΦB
1 + VSB
WE +
Cjsw(0)
1 + VDB
ΦB
(W + 2E)
(make 2W for "4 sided"
perimeter in some cases)
(W + 2E)
gate to channel cap: Cgc =
2
C W(L-2LD)
3 ox
channel to bulk cap: Ccb - ignore in this class
H.-S. Lee & M.H. Perrott
MIT OCW
MOS AC Small Signal Model (Device in Saturation)
RD
RG
ID
RD
Cgd
vgs
RG
Cgs
gmvgs
-gmbvs
ro
Cdb
Csb
RS
vs
Cgs = Cgc + Cov =
RS
2
C W(L-2LD) + Cov
3 ox
Cgd = Cov
Csb = Cjsb
(area + perimeter junction capacitance)
Cdb = Cjdb
(area + perimeter junction capacitance)
H.-S. Lee & M.H. Perrott
MIT OCW
Wiring Parasitics
ƒ
Capacitance
- Gate: cap from poly to substrate and metal layers
- Drain and source: cap from metal routing path to
substrate and other metal layers
ƒ
Resistance
- Gate: poly gate has resistance (reduce by silicide) long
metal lines can add resistance
- Drain and source: some resistance in diffusion region
(reduce by silicide), and from routing long metal lines
ƒ
Inductance
- Gate: poly gate has negligible inductance, but long
wires can add inductance
- Drain and source: becomes an issue for long wires
Extract these parasitics from circuit layout
H.-S. Lee & M.H. Perrott
MIT OCW
Frequency Performance of a CMOS Device
ƒ
Two figures of merit in common use
- f : frequency for which current gain is unity
- f : frequency for which power gain is unity
t
max
ƒ
Common intuition about ft
- Gain, bandwidth product is conserved
- We will see that MOS devices have an f that is a
t
function of bias
ƒ This effect strongly impacts high frequency amplifier
topology selection
H.-S. Lee & M.H. Perrott
MIT OCW
Derivation of ft for MOS Device in Saturation
id
ID+id
RLARGE
Vbias
Cgd
iin
vgs
Cgs
gmvgs
-gmbvs
Cdb
ro
iin
Csb
ƒ
Assumption is that input is current, output of device
is short circuited to a supply voltage
- Note that voltage bias is required at gate
ƒ The calculated value of ft is a function of this bias voltage
H.-S. Lee & M.H. Perrott
MIT OCW
Derivation of ft for MOS Device in Saturation
id
ID+id
RLARGE
Vbias
Cgd
iin
vgs
Cgs
gmvgs
-gmbvs
ro
Cdb
iin
Csb
H.-S. Lee & M.H. Perrott
MIT OCW
Derivation of ft for MOS Device in Saturation
id
iin
slope = -20 dB/dec
1
H.-S. Lee & M.H. Perrott
ft
f
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Why is ft a Function of Voltage Bias?
ƒ
ft is a ratio of gm to gate capacitance
-g
is a function of gate bias, while gate cap is not (in strong
inversion)
m
ƒ
ƒ
First order relationship between gm and gate bias:
- The larger the gate bias, the higher the value for f
t
Alternately, ft is a function of current density
- So f maximized at max current density (and minimum L)
t
H.-S. Lee & M.H. Perrott
MIT OCW
Unity Power Gain Frequency fmax
From pages 176-178 (2nd ed.) 70-72 (1st ed.) of text book
for derivation on fmax
ƒ
ƒ
ƒ
rg is the series parasitic gate resistance
fmax can be much higher than fT: make gate resistance
small (by careful layout)
Output capacitance has no effect (can be tuned out by
inductor)
H.-S. Lee & M.H. Perrott
MIT OCW
Speed of NMOS Versus PMOS Devices
ƒ
NMOS devices have much higher mobility than PMOS
devices (in typical bulk CMOS processes)
- NMOS devices provide approximately 2.5 x g for a given
amount of capacitance and gate bias voltage
- Also, NMOS devices provide approximately 2.5 x I for a
m
d
given amount of capacitance and gate bias voltage
H.-S. Lee & M.H. Perrott
MIT OCW
Integrated Passive Components for RF Circuits
ƒ
ƒ
ƒ
We will only consider passive components
appropriate for RF use
High Q, low parasitics, and good linearity are
generally desired (bias circuit is an exception)
Well resistors, diffused resistors, poly-n+ capacitors
even poly-poly capacitors do not perform very well in
these regards
H.-S. Lee & M.H. Perrott
MIT OCW
Polysilicon Resistors
ƒ
Use unsilicided polysilicon to create resistor
A
Rpoly
A
B
B
ƒ
Key parameters
- Resistance (usually 100- 200 Ohms per square)
- Parasitic capacitance (usually small)
ƒ Appropriate for high speed amplifiers
- Linearity (excellent)
- Accuracy (usually can be set within ± 15%)
H.-S. Lee & M.H. Perrott
MIT OCW
MOS Resistors
ƒ
Bias a MOS device in its triode region
Rds
A
ƒ
ƒ
ƒ
W/L
B
A
B
High resistance values can be achieved in a small
area (MegaOhms within tens of square microns)
Parasitic capacitance is large (gate capacitance!)
Resistance is quite nonlinear
- Appropriate for small swing circuits or DC (bias) circuits
H.-S. Lee & M.H. Perrott
MIT OCW
High Density Capacitors (Biasing, Decoupling)
ƒ
MOS devices offer the highest capacitance per unit area
- Voltage must be high enough to invert the channel
A
A
C1=CoxWL
ƒ
W/L
Key parameters
- Capacitance value
-
ƒ Raw cap value from MOS device is about 8-8.5 fF/µ2 for
0.18u CMOS
Q (i.e., amount of series resistance)
ƒ Maximized with minimum L (tradeoff with area efficiency)
H.-S. Lee & M.H. Perrott
MIT OCW
MOS Capacitors, Cnt’d
ƒ
Putting NMOS capacitor in NWell allows operation at
lower voltage
+
C
COX
V
NMOS in N-well
COV
poly
n+
VT
ƒ
-
NMOS on
substrate
V
Nwell
n+
The non-linearity is often exploited in VCO designs as
varactors
H.-S. Lee & M.H. Perrott
MIT OCW
High Q Capacitors (Signal Path)
ƒ
Lateral metal capacitors offer high Q and reasonably
large capacitance per unit area
- Stack many levels of metal on top of each other (best
layers are the top ones), via them at maximum density
A
A
C1
B
- Accuracy often better than ±10%
- Parasitic cap is symmetric, typically less than 10% of cap
B
value
H.-S. Lee & M.H. Perrott
MIT OCW
Stacked Lateral Flux Capacitor
ƒExample:
CT = 1.5 fF/µm2 for 0.24µm process with 7
metals, Lmin = Wmin = 0.24µm, tmetal = 0.53µm
-See “Capacity Limits and Matching Properties of Integrated
Capacitors”, Aparicio et. al., JSSC, Mar 2002
H.-S. Lee & M.H. Perrott
MIT OCW
Fractal Capacitor
Figure by MIT OCW.
ƒMaximizes perimeter area: up to 10x increase in unit
capacitance
ƒLimited by lithography
See A. Shanhani et. al., “A 12 mW, Wdie Dynamic Range CMOS Fron-End Circuit
for Portable GPS Receiver,” Digest of Technical Papers, ISSCC 1997
H.-S. Lee & M.H. Perrott
MIT OCW
Spiral Inductors
ƒ
Create integrated inductor using spiral shape on top level
metals (may also want a patterned ground shield)
A
A
Lm
B
B
- Key parameters are Q (< 10), L (1-10 nH), self resonant freq.
- Usually implemented in top metal layers to minimize series
resistance, coupling to substrate
- See using Mohan et. al, “Simple, Accurate Expressions for
Planar Spiral Inductances, JSSC, Oct, 1999, pp 1419-1424
- Verify inductor parameters (L, Q, etc.) using ASITIC
http://formosa.eecs.berkeley.edu/~niknejad/asitic.html
H.-S. Lee & M.H. Perrott
MIT OCW
Bondwire Inductors
ƒ
Used to bond from the package to die
- Can be used to advantage
package
Adjoining pins
From board
die
Lbondwire
Cpin
ƒ
To chip circuits
Cbonding_pad
Properties
- Inductance ( ≈ 1 nH/mm – usually achieve 1-5 nH)
- Inductance value is difficult to control (chip-package
alignment, bondwire height, etc.)
- Q (much higher than spiral inductors – typically > 40)
H.-S. Lee & M.H. Perrott
MIT OCW
Integrated Transformers
ƒ
Utilize magnetic coupling between adjoining wires
A
B
Cpar1
k
L1
L2
C
ƒ
Cpar2
C
D
Key parameters
- L (self inductance for primary and secondary windings)
- k (coupling coefficient between primary and secondary)
A
ƒ
D
B
Design – ASITIC, other CAD packages
H.-S. Lee & M.H. Perrott
MIT OCW
High Speed Transformer Example – A T-Coil Network
ƒ
A T-coil consists of a center-tapped inductor with
mutual coupling between each inductor half
B
L2
CB
X
k
L1
X
A
ƒ
A
B
Used for bandwidth enhancement
- See S. Galal, B. Ravazi, “10 Gb/s Limiting Amplifier and
Laser/Modulator Driver in 0.18u CMOS”, ISSCC 2003, pp
188-189 and “Broadband ESD Protection …”, pp. 182-183
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Broadband Amplifiers
H.-S. Lee & M.H. Perrott
MIT OCW
High Frequency, Broadband Amplifiers
ƒ
The first thing that you typically do to the input signal
package
is amplify it
Connector
Adjoining pins
die
Controlled Impedance
PCB trace
Driving
Source
Z1
Vin
On-Chip
L1
Delay = x
Characteristic Impedance = Zo
Transmission Line
ƒ
Function
ƒ
Key performance parameters
Amp
C1
C2
RL
Vout
VL
- Boosts signal levels to acceptable values
- Provides reverse isolation
- Gain, bandwidth, noise, linearity
H.-S. Lee & M.H. Perrott
MIT OCW
Gain-bandwidth Trade-off
ƒ
Common-source amplifier example
Vdd
RL
vo
vin
Vbias
+
+
-
Ctot
Ctot: total capacitance at output node
DC gain
3 dBbandwidth
Gain-bandwidth
H.-S. Lee & M.H. Perrott
MIT OCW
Gain-bandwidth Trade-off
ƒ
Common-source amplifier example
RL=RL1
RL=RL3
RL=RL3
ƒ
ƒ
Given the ‘origin pole’ gm/Ctot, higher bandwidth is
achieved only at the expense of gain
The ‘origin pole’ gm/Ctot must be improved for better
GB
H.-S. Lee & M.H. Perrott
MIT OCW
Gain-bandwidth Improvement
ƒ
ƒ
ƒ
How do we improve gm/Ctot?
Assume that amplifier is loaded by an identical amplifier
and fixed wiring capacitance is negligible
Since
and
ƒ
To achieve maximum GB in a given technology, use
minimum gate length, bias the transistor at maximum
ƒ
When velocity saturation is reached, higher
not yield higher gm
In case fixed wiring capacitance is large, power
consumption must be also considered
ƒ
H.-S. Lee & M.H. Perrott
does
MIT OCW
Gain-bandwidth Observations
ƒ
ƒ
ƒ
Constant gain-bandwidth is simply the result of singlepole role off – it’s not fundamental!
It implies a single-pole frequency response may not be
the best for obtaining gain and bandwidth
simultaneously
Single-pole role off is necessary for some circuits, e.g.
for stability, but not for broad-band amplifiers
H.-S. Lee & M.H. Perrott
MIT OCW
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