The interaction of THz phonon-polariton waves with microstructures observed using quantitative, phasesensitive imaging The MIT Faculty has made this article openly available. Please share how this access benefits you. Your story matters. Citation Werley, Christopher A. et al. “The Interaction of THz Phononpolariton Waves with Microstructures Observed Using Quantitative, Phase-sensitive Imaging.” IEEE, 2009. 1–2. © Copyright 2009 IEEE As Published http://dx.doi.org/10.1109/ICIMW.2009.5324752 Publisher Institute of Electrical and Electronics Engineers (IEEE) Version Final published version Accessed Thu May 26 23:57:19 EDT 2016 Citable Link http://hdl.handle.net/1721.1/71806 Terms of Use Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. Detailed Terms The interaction of THz phonon-polariton waves with microstructures observed using quantitative, phase-sensitive imaging Christopher A. Werleya, Kebin Fanb, Andrew C. Strikwerdab, Qiang Wuc, Kung-Hsuan Lind, Richard D. Averittb, and Keith A. Nelsona a Massachusetts Institute of Technology, Cambridge, MA 02139 USA b Boston University, Boston, MA 02215 USA c Nankai University, Tianjin 300457, P. R. China d Industrial Technology Research Institute South, Liujia Shiang 73445, Taiwan I. INTRODUCTION AND BACKGROUND P HONON-polarition waves (PPWs) result from the coupling of electromagnetic waves and optic phonons. High amplitude THz frequency PPWs can be generated in the ferroelectric crystal lithium niobate (LN) due to its large electrooptic coefficients. These same coefficients also cause the THz electric field to induce significant changes in the crystal’s optical properties. Because of these characteristics and the simplicity of material patterning with air gaps or metal microstructures, it has been shown that LN slab waveguides provide a particularly versatile platform for PPW generation, manipulation, and detection [1]. Time-resolved imaging, used to generate a movie of PPW propagation, has been a fruitful detection technique because of the wealth of information present when complete spatial and temporal evolution is measured. Previous methods involved out-of-focus imaging [1], which made it impossible to measure quantitative field profiles. An additional drawback of the previous method was that fabricated structures in the waveguide were blurry, obscuring the interaction of the THz field with these structures. We have adapted the technique of phase contrast imaging [2] to enable high sensitivity, in-focus, quantitative measurement of the THz field, E ( x, z , t ) . II. RESULTS The experimental setup is shown in fig 1a. The THz field changes the index of refraction of the LN crystal, which introduces a spatially dependent phase shift in the expanded probe beam. To detect this phase shift, we must perform phase-to-amplitude conversion, which is accomplished by a phase plate located in the focal plane of a lens separated by 1f from the sample. The phase plate introduces a λ/4 shift between the 0th order beam and the light diffracted off of the THz wave, which are spatially separated in this plane. When the 0th order beam and the diffracted light recombine at the camera in the image plane, they interfere, bringing about phase-to-amplitude conversion. Figure 1b shows one frame of a movie recorded using this 978-1-4244-5417-4/09/$26.00 ©2009 IEEE technique, which shows the THz wave undergoing waveguide dispersion as it propagates through a thin LN slab. By extracting the THz field profile from each image in such a movie and placing it in one row of a matrix, it is possible to build up the full spatiotemporal evolution of the wave. The two-dimensional Fourier transform of this matrix gives the waveguide dispersion curve. Figure 1c shows the experimentally measured dispersion curve overlaid with analytical theory. The figure shows the smooth response of the imaging technique and the excellent agreement between experiment and theory. a f1 dichroic mirror f1 f2 f2 camera cyl. lens sample blue filter phase plate diffracted light b 1.5 frequency (THz) Abstract— We apply newly developed, phase-sensitive imaging to enable sharply focused visualization of terahertz waves in electro-optic media. This approach allows quantitative characterization of THz waves as they interact with microstructures on or in the sample, yielding new insight into these interactions. c 1 0.5 0 0 Bulk LN vacuum waveguide modes 50 100 β (rad/mm) Figure 1. The experimental setup is diagramed in (a). (b) shows a typical snapshot from a movie showing propagating THz fields acquired using this setup. The THz propagates as waveguide modes in the thin LN slab. In (c), the theoretical dispersion curves for these modes are overlaid on the experimentally measured ones. 150 In addition to looking at unstructured crystals like the one shown in fig. 1b, the in-focus nature of phase contrast imaging enables us to study structured crystals. One family of structures involves air gaps, which can be cut into the LN with femtosecond laser machining [3]. Because of the very large index contrast between LN ( nTHz = 5.1 ) and air (n = 1), these III. CONCLUSIONS LN slabs are a versatile platform for THz generation, detection, and control. The phase contrast technique enables in –focus imaging and quantitative measurement of the THz field, which makes possible a wide range of experiments studying the interactions between THz fields and structured samples. b c 0.2 0.1 ∆I/I0 structures are very effective for reflecting and guiding THz waves. Figure 2a shows a THz wave propagating through one such structure. In this “Y” coupler, part of the THz wave (incident from the left) is guided down each arm of the Y, and the two parts interfere at the intersection. The superimposed wave is then guided down the stem of the Y. The clear resolution of both the wave and the structure was not possible using previous imaging techniques. Another powerful way to control the field is to deposit metal microstructures onto the crystal surface. Such structures have previously been used to enhance electric fields and confine them to spots smaller than the diffraction limit, as in bowtie antennas [4], and to modify bulk material properties, as in metamaterials [5]. Our imaging technique allows us to directly observe the electric field of the THz wave as it interacts with these exciting structures (fig, 2b,c). We use finite difference time domain (FDTD) simulations to design microstructures resonant at a design frequency, and deposit them onto the surface of a thin LN slab. The evanescent field of the waveguide mode interacts strongly with these structures as the wave propagates down the crystal. Figure 2b shows a single vertical stripe of electrically resonant microstructures (shown in the inset, 40 µm on a side) which has reflected most of a THz wave whose center frequency was tuned to the microstructure resonance. Non-resonant THz waves display only weak interactions with these structures. Figure 2c shows a 200 GHz wave incident on a 200 µm tall bowtie antenna with a 30 µm gap. As has been previously demonstrated at visible frequencies [4], the antenna enhances peak field strengths and localizes the field to a region much smaller than the diffraction limit. Figure 2d shows a time-trace of the field between the lobes of the antenna (blue) and above the microstructure (green), clearly demonstrating that the electric field is enhanced in the gap. a d 0 -0.1 -0.2 -0.3 0 bowtie tip outside bowties 5 10 15 20 25 30 time (ps) Figure 2. a-c show THz fields in structured and patterned samples. a. A Y-coupler cut into a 50 µm thick LN slab. b. A vertical stripe of 40 µm wide, electrically resonant gold microstructures deposited on a 33 µm thick LN slab. c. A 200 µm tall bowtie antenna with a 30 µm gap deposited on a 33 µm thick LN slab showing field enhancement in the gap. d. A time trace of the THz field given by the image intensity above (green) and in (blue) the bowtie gap, showing field enhancement. REFERENCES [1] T. Feurer et al, Annual Review of Materials Research 37, 317-350 (2007). [2] Q. Wu et al, Opt. Express 17, 9219-9225 (2009). [3] D. W. Ward et al, Appl. Phys. A 86, 49-54 (2007). [4] E. Cubukcu et al., IEEE J Sel Top Quant 14, 1448-1461 (2008). [5] W. J. Padilla et al., Phys. Rev. B 75, 041102(R) (2007).