Edmund K. Banghart, James P. Lavine, Eugene A. Trabke, Edward T. Nelson and Bruce
C. Burkey, A Model for Charge Transfer in Buried-Channel Charge-Coupled Devices at
Low Temperature , IEEE Trans. on Electron Devices, Vol. 38, No.5, May 1991.
Summary: Presentation of a 1D Shockley-Read-Hall (SRH) based numerical model for charge transfer. Discusses the low temperature Poole-Frankel potential barrier lowering phenomenon. Comparison to empirical data for a number of generic
(vendor/foundry not identified) CCD devices.
B. E. Burke and G. L. Durant, Calculations of CCD Charge-Transfer Inefficiency vs
Packet Size , MIT Lincoln Laboratory Solid State Research Quarterly Technical Report,
Section 6.1, 1993.
Summary: Comparison of psuedo-3D numerical modeling and expe rimental CTI versus signal level data for a proton irradiated frame transfer CCD with a 2 micron mini-channel. Data and modeling is for a temperature of -115
°
C.
B. E. Burke, J. A. Gregory, R. W. Mountain, J. C. M. Huang, M. J. Cooper and V. S.
Dolat, High-Performance Visible/UV CCD Imagers for Space-Based Applications , SPIE
Proceedings, Vol. 1693, 1992.
Summary: Report on a MIT Lincoln Laboratory research program to develop a radiation hardened frame -transfer CCD imager. Presentation of a parametric expe rimental study of vertical register mini-channel CTE performance as a function of mini-channel width. Data shows improvement in small signal level CTE as minichannel width decreases. Trend in data is in accordance with prediction.
C. J. Dale, L. Chen, P. J. McNulty, P. W. Marshall and E. A. Burke, A Comparison of
Monte Carlo and Analytic Treatments of Displacement Damage in Si Microvolumes ,
IEEE Trans. on Nuclear Science, Vol. 41, No. 6, December 1994.
Summary: Important discussion of the role of displacement damage equilibrium for high energy proton recoils. Recommendation regarding the use of the Non-Ionizing
Energy Loss (NIEL) technique for the projection of on-orbit performance of shielded CCDs. Tabulated NIEL data for protons in silicon.
Cheryl Dale, Paul Marshall, Brent Cummings, Louis Shamey and Andrew Holland,
Displacement Damage Effects in Mixed Particle Environments for Shielded Spacecraft
CCDs , IEEE Trans. on Nuclear Science, Vol. 40, No. 6, December 1993.
Summary: Seminal paper on the use of the Non-Ionizing Energy Loss (NIEL) technique for the analysis of displacement damage in shielded CCDs. Worked example for a real-world LEO charged particle environment. Presentation of a simplified CTE model.

E. J. Daly, J. Lemaire, D. Heynderickx and D. J. Rodgers, Problems with Models of the
Radiation Belts , IEEE Trans. on Nuclear Science, Vol. 43, No. 2, April 1996.
Summary: Excellent review and critique of currently available models of the radiation belts. Critical information on the correct geomagnetic field models to be used for extraction of the AP8 (trapped protons) and AE8 (trapped electrons) flux maps. Renormalization of the McIlwain B parameter for improved numerical accuracy of the AP8 and AE8 models. Mandatory reading for workers in the field.
J. Feynman, G. Spitale and J. Wang, Interplanetary Proton Fluence Model: JPL 1991 ,
Journal of Geophysical Research, Vol. 98, No. A8, August 1, 1993.
Summary: Recent and widely used statistical model of the solar flare proton environment. Based on a re latively large database spanning more than three solar cycles. Limited energy range.
James S. Flores, CTE Model for Estimating CCD Image Smear , SPIE Proceedings, Vol.
2551, July 1995.
Summary: Presentation of a 1D CTE image smear algorithm. Combines Shockley-
Read-Hall (SRH) charge transfer theory with a model for the charge packet volume as a function of signal level. Excellent 1D worked example showing PSF distortion due to poor charge transfer.
D. J. Gallagher, R. Demara, G. Emerson, W. W. Frame, A. W. Delamere, Monte Carlo
Model for Describing Charge transfer in Irradiated CCDs , SPIE Proceedings, Vol. 3301,
January 1998.
Summary: Presentation of results using a 1D Shockley-Read-Hall (SRH) based
Monte-Carlo charge transfer model. Comparison of model to experimental Fe data. Fe
55
55
CTE versus temperature data for proton damaged SITe CCDs. Energy level and number density data for three species of radiation induced traps.
J. A. Gregory, B. E. Burke and M. J. Cooper, Variation of Charge-Transfer Inefficiency with Charge Packet Size in Proton-Irradiated CCDs , MIT Lincoln Laboratory Solid State
Research Quarterly Technical Report, Section 6.2, 1993.
Summary: CTI versus signal level measurements for a proton irradiated frame transfer CCD with a 2 micron mini-channel. Data is presented for temperatures of -
75
°
C and -115
°
C.
A. D. Holland, The Effect of Bulk Traps in Proton Irradiated EEV CCDs , Nuclear
Instruments and Methods in Physics Research A326, Elsevier Science Publishers B.V.,
1993.

Summary: Comparison of Shockley-Read-Hall (SRH) CTE model to empirical data for irradiated and unirradiated EEV CCDs. Presentation of data for three empirically identified trap species. Widely cited work.
G. R. Hopkinson, Radiation Effects on Solid State Imaging Devices , Radiat. Phys. Chem.,
Vol. 43, No. 1/2, 1994.
Summary: Comprehensive review of radiation effects in CCDs. Discussion of permanent ionization damage, bulk displacement damage and transient effects.
Description of Non-Ionizing Energy Loss (NIEL) equivalence method for the prediction of on-orbit performance. Brief mention of annealing to reduce bulk damage.
Jim Janesick, Tom Elliott, Rusty Winzenread, Jeff Pinter and Rudolph Dyck, Sandbox
CCDs , SPIE Symposium on Electronic Imaging: Science & Technology,
Document No. 2415-01, February 1995.
Summary: Comprehensive paper presenting data and information on seven new
CCDs. Post-rad CTE, well capacity optimization (surface and bloomed), MPP operation, high speed clocking, QE and read noise. Discussion of impact of ionizing radiation damage on full well, MPP inversion (flat band shift and 'birds beak') and very important information on reverse annealing.
James Janesick, George Soli, Tom Elliott and Stewart Collins, The Effects of Proton
Damage on Charge-Coupled Devices , SPIE Electronic Imaging Science and Technology
Conference, Volume 1147, 1991.
Summary: Experimental CTE data for proton irradiated Loral-Fairchild
CRAF/Cassini CCDs. Presentation of the TRIM (TRansport of Ions in Matter) based Radiation Trap Inefficiency (RTI) technique for the prediction of performance in the space radiation environment. Experimental 3 micron serial mini-channel data. Trap energy data.
Joseph H. King, Solar Proton Fluences for 1977-1983 Space Missions , Journal of
Spacecraft and Rockets, Vol. 11, No. 6, June 1974.
Summary: Classic paper on the solar flare proton environment. Source of the King
Anomalously Large (AL) solar flare model widely cited in the literature. Now superceded by the Feynman et al. statistical model.
James D. Kinnison, Richard H. Maurer and Thomas M. Jordan, Estimation of the
Charged Particle Environment for Earth Orbits , Johns Hopkins APL Technical Digest,
Vol. 11, Numbers 3 and 4, 1990.
Summary: Fine paper that provides an overview of the space charged particle environment. Discussion of the impact of the charged particle environment on

spacecraft systems. Provides a nice complement to the Stassinopoulos and Raymond paper.
Amr M. Mohsen and Michael F. Tompsett, The Effects of Bulk Traps on the Performance of Bulk Channel Charge-Coupled Devices , IEEE Trans. on Electron Devices, Vol. ED-
21, No. 11, November 1974.
Summary: Comprehensive and rigorous presentation of the Shockley-Read-Hall
(SRH) theory of charge transfer. Fine discussion of 'CTE noise'. Presentation of empirical data for a linear three-phase buried channel CCD. Density and emission time constant data for two species of bulk traps. Discussion of the signal level-charge packet volume relationship.
E. G. Stassinopoulos and James P. Raymond, The Space Radiation Environment for
Electronics, Proceedings of the IEEE , Vol. 76, No. 11, November 1988.
Summary: Excellent survey paper on the space radiation environment. Discussion of transport of radiation through shielding and impact on spacecraft systems.
Recommended for anyone who would like a top-level understanding of the space radiation environment.
Geoffrey P. Summers, Edward A. Burke and Robert J. Walters, Damage Correlations in
Semiconductors Exposed to Gamma, Electron and Proton Radiations , IEEE Trans. on
Nuclear Science, Vol. 40, No. 6, December 1993.
Summary: Tabulated Non-Ionizing Energy Loss (NIEL) calculations for electrons and protons in Si, GaAs and InP. More recent NIEL data for protons in silicon can be found in Dale, Chen et al.
A. Van Ginneken, Non Ionizing Energy Deposition in Silicon for Radiation Damage
Studies , Fermi National Accelerator Laboratory Report FN-522, October 1989.
Summary: Non-Ionizing Energy Loss (NIEL) curves for electrons, protons, neutrons and photons in silicon. More recent calculations for electrons and protons in silicon can be found in Summers et al.
A. Yamashita, T. Dotani, M. Bautz, G. Crew, H. Ezuka, K. Gendreau, T. Kotani, K.
Mitsuda, C. Otani, A. Rasmussen, G. Ricker and H. Tsunemi, Radiation Damage to
Charge Coupled Devices in the Space Environment , IEEE Trans. on Nuclear Science,
Vol. 44, No. 3, June 1997.
Summary: Important study of the degradation of the Solid-state Imaging
Spectrometer (SIS) x-ray CCD cameras on-board the ASCA satellite. CTE measured by observing an x-ray emission line in Cas A. Possible evidence for nonuniform parallel CTI reported. Trap energy level and trap density data.